Mechanical standardization of semiconductor devices - Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor devices packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages

IEC 60191-6-2:2001 covers the requirements for the preparation of drawings of integrated circuit outlines for the various ball terminal packages, e.g. ceramic ball grid array (C-BGA), plastic ball grid array (P-BGA), tape ball grid array (T-BGA) and others as well as column terminal packages, e.g. ceramic column grid array (C-CGA).

Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-2: Règles générales pour la préparation des dessins d'encombrement des dispositifs à semiconducteurs pour montage en surface - Guide de conception pour les boîtiers à broches en forme de billes et de colonnes, avec des pas de 1,50 mm, 1,27 mm et 1,00 mm

La CEI 60191-6-2:2001 couvre les exigences de préparation des dessins d'encombrement de circuits intégrés pour les divers boîtiers à bornes en forme de billes, par exemple boîtiers matriciels à billes en céramique (C-BGA), boîtiers matriciels à billes en plastique (P-BGA), boîtiers matriciels à billes sur bande (T-BGA) et autres, et aussi boîtiers à bornes en forme de colonnes, par exemple boîtiers matriciels à colonnes en céramique (C-CGA).

General Information

Status
Published
Publication Date
10-Dec-2001
Current Stage
PPUB - Publication issued
Start Date
15-Jan-2002
Completion Date
11-Dec-2001
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IEC 60191-6-2:2001 - Mechanical standardization of semiconductor devices - Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor devices packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages Released:12/11/2001 Isbn:2831860873
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IEC 60191-6-2:2001 - Mechanical standardization of semiconductor devices - Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor devices packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages
English and French language
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INTERNATIONAL IEC
STANDARD
60191-6-2
First edition
2001-12
Mechanical standardization of semiconductor
devices –
Part 6-2:
General rules for the preparation of outline
drawings of surface mounted semiconductor
device packages –
Design guide for 1,50 mm, 1,27 mm and 1,00 mm
pitch ball and column terminal packages
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-2:
Règles générales pour la préparation des dessins
d'encombrement des dispositifs à semiconducteurs
pour montage en surface –
Guide de conception pour les boîtiers à broches
en forme de billes et de colonnes, avec des pas
de 1,50 mm, 1,27 mm et 1,00 mm
Reference number
Publication numbering
As from 1 January 1997 all IEC publications are issued with a designation in the
60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.
Consolidated editions
The IEC is now publishing consolidated versions of its publications. For example,
edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the
base publication incorporating amendment 1 and the base publication incorporating
amendments 1 and 2.
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INTERNATIONAL IEC
STANDARD
60191-6-2
First edition
2001-12
Mechanical standardization of semiconductor
devices –
Part 6-2:
General rules for the preparation of outline
drawings of surface mounted semiconductor
device packages –
Design guide for 1,50 mm, 1,27 mm and 1,00 mm
pitch ball and column terminal packages
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-2:
Règles générales pour la préparation des dessins
d'encombrement des dispositifs à semiconducteurs
pour montage en surface –
Guide de conception pour les boîtiers à broches
en forme de billes et de colonnes, avec des pas
de 1,50 mm, 1,27 mm et 1,00 mm
 IEC 2001  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
Commission Electrotechnique Internationale
PRICE CODE
K
International Electrotechnical Commission
For price, see current catalogue

– 2 – 60191-6-2  IEC:2001(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –
Part 6-2: General rules for the preparation of outline drawings
of surface mounted semiconductor device packages –
Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball
and column terminal packages
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60191-6-2 has been prepared by subcommittee SC 47D: Mechanical
standardization of semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this standard is based on the following documents:
FDIS Report on voting
47D/460//FDIS 47D/471/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
The committee has decided that the contents of this publication will remain unchanged until
2004. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of October 2002 have been included in this copy.

60191-6-2  IEC:2001(E) – 3 –
INTRODUCTION
This design guide is intended to standardize the requirements for all ball and column terminal
packages in orde
...


IEC 60191-6-2 ®
Edition 1.0 2001-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Mechanical standardization of semiconductor devices –
Part 6-2: General rules for the preparation of outline drawings of surface
mounted semiconductor device packages – Design guide for 1,50 mm, 1,27 mm
and 1,00 mm pitch ball and column terminal packages

Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-2: Règles générales pour la préparation des dessins d'encombrement
des dispositifs à semiconducteurs pour montage en surface – Guide de
conception pour les boîtiers à broches en forme de billes et de colonnes, avec
des pas de 1,50 mm, 1,27 mm et 1,00 mm

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IEC 60191-6-2 ®
Edition 1.0 2001-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Mechanical standardization of semiconductor devices –

Part 6-2: General rules for the preparation of outline drawings of surface

mounted semiconductor device packages – Design guide for 1,50 mm, 1,27 mm

and 1,00 mm pitch ball and column terminal packages

Normalisation mécanique des dispositifs à semiconducteurs –

Partie 6-2: Règles générales pour la préparation des dessins d'encombrement

des dispositifs à semiconducteurs pour montage en surface – Guide de

conception pour les boîtiers à broches en forme de billes et de colonnes, avec

des pas de 1,50 mm, 1,27 mm et 1,00 mm

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX K
ICS 31.080.01 ISBN 978-2-83220-532-7

– 2 – 60191-6-2  IEC:2001
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –

Part 6-2: General rules for the preparation of outline drawings
of surface mounted semiconductor device packages –
Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball
and column terminal packages
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60191-6-2 has been prepared by subcommittee SC 47D: Mechanical
standardization of semiconductor devices, of IEC technical committee 47: Semiconductor devices.
This bilingual version (2012-12) corresponds to the monolingual English version, published in
2001-12.
The text of this standard is based on the following documents:
FDIS Report on voting
47D/460/FDIS 47D/471/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
The committee has decided that the contents of this publication will remain unchanged until
2004. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or

60191-6-2  IEC:2001 – 3 –
• amended.
The contents of the corrigendum of October 2002 have been included in this copy.

– 4 – 60191-6-2  IEC:2001
INTRODUCTION
This design guide is intended to standardize the requirements for all ball and column terminal
packages in order to establish common rules for terminal shapes, irrespective of device and
package types.
60191-6-2  IEC:2001 – 5 –
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –

Part 6-2: General rules for the preparation of outline drawings
of surface mounted semiconductor device packages –
Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball
and column terminal packages
1 Scope
This part of IEC 60191 covers the requirements for the preparation of drawings of integrated
circuit outlines for the various ball terminal packages, e.g. ceramic ball grid array (C-BGA),
plastic ball grid array (P-BGA), tape ball grid array (T-BGA) and others as well as column
terminal packages, e.g. ceramic column grid array (C-CGA).
2 Normative references
The following normative documents contain provisions, which, through reference in this text,
constitute provisions of this part of IEC 60191. For dated references, subsequent amend-
ments to, or revisions of, any of these publications do not apply. However, parties to
agreements based on this part of IEC 60191 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. For undated
references, the latest edition of the normative document referred to applies. Members of IEC
and ISO maintain registers of currently valid International Standards.
IEC 60191 (all parts), Mechanical standardization of semiconductor devices
3 Definitions
For the purpose of this part of IEC 60191, the following definitions apply.
3.1
ball terminal packages
packages that have solder balls attached to a ceramic/laminate/tape substrate for mounting
on a PCB surface, e.g. C-BGA, P-BGA and T-BGA
3.2
column terminal packages
packages that have solder columns attached to a ceramic/laminate/tape substrate for
mounting on a PCB surface, e.g. C-CGA

– 6 – 60191-6-2  IEC:2001
4 Ball terminal packages, 1,50 mm, 1,27 mm and 1,00 mm pitch
Reference characters and drawings
v S
D
A
B
Terminal
index area
v S
S S
S
y S
e
bp

X1 S A B
SD
X2 S
1 2 3
IEC  2699/01
A
A2
A B C
A3
SE
E
A1
e
60191-6-2  IEC:2001 – 7 –
4.1 Outline dimensions
The ball terminal dimensions are shown in the tables below.
4.2 Package height
The package height (A) is the thickness of the package body, including the lid and ball
heights. For all BGA packages, the package body thickness (A2) is considered to be design
specific.
4.3 Ball terminal diameter
Table 1 – Solder terminal
Ball diameter
nominal
b
Terminal
p
pitch
C-BGA P-BGA T-BGA
e
a b
LMP HMP LMP HMP
LMP HMP
1,00 0,60 0,70 0,60 – 0,60 0,63
1,27 0,75 0,89 0,75 – 0,75 0,63
1,50 0,75 0,89 0,75 – 0,75 0,63
a
LMP = Low melting point.
b
HMP = High melting point.
4.4 Tolerance of ball centre position
Table 2 – Tolerance of ball centre position

Tolerance of solder ball centre position Coplanarity
Terminal pitch
y
e X1 X2
a b
LMP HMP
1,00 0,25 0,10 0,15 0,15
1,27 0,30 0,15 0,20 0,15
1,50 0,30 0,15 0,20 0,15
a
LMP = Low melting point.
b
HMP = High melting point.
4.5 Package body thickness and stand-off heights
The relationship between the package body thickness and stand-off heights for each package
is shown in the table below.
– 8 – 60191-6-2  IEC:2001
Table 3 – Package body thickness and stand-off heights
Stand-off height
Package body
Terminal pitch
thickness A1 nominal
Package type
e
A2 nominal
a b
LMP HMP
0,50 0,70 1,00
C-BGA Design specific 0,60 0,90 1,27
0,60 0,90 1,50
0,50 – 1,00
P-BGA Design specific 0,60 – 1,27
0,60 – 1,50
0,50 0,55 1,00
T-BGA Design specific 0,60 0,55 1,27
0,60 0,55 1,50
a
LMP = Low melting point.
b
HMP = High melting point.
4.6 Tolerance of terminal centre position and coplanarity
Table 4 – Tolerance of terminal centre position and coplanarity
Tolerance of solder ball
Terminal Coplanarity
Centre position
pitch
Package type
y
X1 X2
e
a b
LMP HMP
C-BGA, P-BGA, T-BGA 1,00 0,25 0,10 0,15 0,15
C-BGA, P-BGA, T-BGA 1,27 0,30 0,15 0,20 0,15
C-BGA, P-BGA, T-BGA 1,50 0,30 0,15 0,20 0,15
a
LMP = Low melting point.
b
HMP = High melting point.
4.7 Explanatory notes
4.7.1 Objective of establishment
This part of IEC 60191 is intended to standardize the requirements of all types of ball terminal
packages and to establish common rules, regardless of package type.
4.7.2 Conventional design rules for ball terminal packages
Dimensions for the packages with solder ball are listed in
...

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