IEC 61671-2:2016

Standard for automatic test markup language (ATML) instrument description

IEC 61671-2:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

General Information

• Status: Published
• Publication Date: 07-Apr-2016
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 25.040.01 - Industrial automation systems in general
• ICS: 35.060 - Languages used in information technology
• Technical Committee: TC 91 - Electronics assembly technology
• Drafting Committee: WG 15 - TC 91/WG 15
• Current Stage: PPUB - Publication issued
• Start Date: 08-Apr-2016
• Completion Date: 15-Feb-2016
• Directive: 2019-01-2566 - Pravilnik o registraciji, tehničnih pregledih, označevanju in barvi vojaških vozil Slovenske vojske, o označevanju in barvi vozil Civilne zaščite ter o označevanju določenih sredstev iz popisa

Overview

IEC 61671-2:2016 / IEEE Std 1671.2-2012 specifies an exchange format, based on Extensible Markup Language (XML), for describing test and measurement instruments used in automatic test systems (ATS). The standard defines both the static model description (InstrumentDescription) and the concrete instrument instance information (InstrumentInstance), expressed as XML schemas. It is published as an IEC/IEEE dual-logo standard and forms part of the Automatic Test Markup Language (ATML) family.

Key topics and technical requirements

• XML schema-based exchange format: Formal XML schemas for InstrumentDescription and InstrumentInstance to standardize how instruments are represented and exchanged.
• Schema structure: Definitions cover schema elements, child elements, complex types and simple types to capture instrument attributes and capabilities.
• Instance vs. model: Separation of reusable instrument model descriptions (static) from specific instance data (serial numbers, configuration).
• Extensibility: Mechanisms to extend ATML InstrumentDescription schemas to accommodate vendor-specific or domain-specific attributes.
• Conformance and validation: Rules for conformance, schema locations and validation to ensure interoperability between tools and systems.
• Supporting material: Informative annexes, downloadable template instance documents and examples (including legacy synthetic-instrument templates) to guide implementation.
• Terminology and references: Glossary and normative references to align definitions and usage across the ATML framework.

Practical applications

IEC 61671-2 is designed to enable consistent machine-readable documentation and integration of instrumentation across automated test environments:

• Integrating instruments (PXI, VXI, LXI, USB, etc.) into automatic test equipment (ATE) and ATS configuration tools.
• Exchanging instrument capability and configuration data between instrument vendors, system integrators, and test software.
• Automating test-bed discovery, resource allocation and diagnostics by reading InstrumentInstance documents.
• Documenting synthetic instruments and vendor-supplied instrument templates for rapid system upgrade or lifecycle management.
• Supporting test data management, calibration tracking and logistics by linking instance metadata to enterprise systems.

Who should use this standard

• Test system integrators and ATE/ATS designers
• Instrument vendors providing machine-readable device descriptions
• Test software and middleware developers (test sequencers, resource managers)
• Maintenance, calibration and logistics teams requiring standardized device metadata
• Defense, aerospace, automotive and electronics manufacturers with automated test needs

Related standards

• IEEE Std 1671.2-2012 (same technical content)
• Other ATML component standards (part of the ATML framework)
• Referenced normative IEC/IEEE documents and downloadable template materials (see annexes and schema locations in the standard)

Keywords: IEC 61671-2, IEEE 1671.2, ATML, InstrumentDescription, InstrumentInstance, XML schema, automatic test system, ATE, instrument description, synthetic instrument.

Standards Content (Sample)

IEC 61671-2 ®
Edition 1.0 2016-04
™
IEEE Std 1671.2
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) instrument description
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IEC 61671-2 ®
Edition 1.0 2016-04
IEEE Std 1671.2™
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) instrument description

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040; 35.060 ISBN 978-2-8322-3265-1

IEEE Std 1671.2-2012 - ii -
Contents
1. Overview . 1
1.1 General . 1
1.2 Application of this document’s annexes . 2
1.3 Scope . 2
1.4 Application . 2
1.5 Conventions used within this document . 3
2. Normative references . 4
3. Definitions, abbreviations, and acronyms . 4
3.1 Definitions . 4
3.2 Abbreviations and acronyms . 5
4. InstrumentDescription schema . 7
4.1 General . 7
4.2 Elements . 7
4.3 Child elements .10
4.4 Complex types .13
4.5 Simple types .28
5. InstrumentDescription instance schema .28
5.1 Elements .28
5.2 Complex types .29
5.3 Simple types .31
6. ATML InstrumentDescription XML schema names and locations .31
7. ATML XML schema extensibility .33
8. Conformance .33
Annex A (informative) IEEE download Web site material associated with this document .34
Annex B (informative) Users information and examples .35
Annex C (informative) Glossary .38
Annex D (informative) Bibliography .39
Annex E (informative) IEEE List of Participants .41

ix
- iii -
IEEE Std 1671.2-2012
STANDARD FOR AUTOMATIC TEST
MARKUP LANGUAGE (ATML) INSTRUMENT
DESCRIPTION
FOREWORD
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Published by IEC under license from IEEE. © 2012 IEEE. All rights reserved.

- iv -
IEEE Std 1671.2-2012
International Standard IEC 61671-2/IEEE Std 1671.2-2012 has been processed through IEC
technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo
Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1671.2-2012 91/1314/FDIS 91/1338/RVD
Full information on the voting for the approval of this standard can be found in the report on
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Published by IEC under license from IEEE. © 2012 IEEE. All rights reserved.

- v - IEEE Std 1671.2-2012
IEEE Std 1671.2™-2012
(Revision of
IEEE Std 1671.2-2008)

IEEE Standard for Automatic Test
Markup Language (ATML) Instrument
Description
Sponsor
IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems

Approved 5 December 2012
IEEE-SA Standards Board
IEEE Std 1671.2-2012 - vi -
Abstract: An exchange format is specified in this standard, using extensible markup language
(XML), for identifying instrumentation that may be integrated in an automatic test system (ATS)
that is to be used to test and diagnose a unit under test (UUT).

Keywords: ATML instance document, ATS, automatic test equipment (ATE), Automatic Test
Markup Language (ATML), automatic test system, IEEE 1671.2, instrument, instrumentation,
synthetic instrument, XML schema
•
LXI is a trademark of the LXI Consortium Inc.

PCI, PCI-SIG and PCIe are registered trademarks and/or servicemarks of PCI-SIG.

PXI and PXIe are registered trademarks of the PXI Systems Alliance.

VMEbus is a registered trademark in the U.S. Patent & Trademark Office, owned by VITA.

VXIbus is a registered trademark in the U.S. Patent & Trademark Office, owned by the VXIbus Consortium.
®
W3C is a trademark (registered in numerous countries) of the World Wide Web Consortium.

- vii - IEEE Std 1671.2-2012
IEEE Introduction
This introduction is not part of IEEE Std 1671.2-2012, IEEE Standard for Automatic Test Markup Language (ATML)
Instrument Description.
This child, or “dot,” standard, also known as an ATML component standard, provides for the definition of
the InstrumentDescription and InstrumentInstance XML schemas, and contains references to examples.
These XML schemas and examples accompany this standard and provide for the identification and
definition of an instrument.
XML schemas define the basic information required within any test application and provide a vehicle for
formally defining the test environment by defining a class hierarchy corresponding to these basic
information entities and providing several methods within each to enable basic operations to be performed
on these entities. ATML component standards within the ATML framework define the particular
requirements within the test environment.
The Synthetic Instrument Working Group (SIWG) was formed, at Department of Defense request, to define
synthetic instrumentation and its attributes and develop a framework that balances user and supplier
objectives, facilitates rapid technology advancements and adaptation throughout the test life cycle, and
complements/supports other relevant test and measurement industry activities.
The goals or desired effects of the SIWG activities were to:
a) Reduce the total cost of ownership of the automatic test system (ATS).
b) Reduce time to develop and field new or upgraded ATSs.
c) Provide greater flexibility to the war fighter through U.S. and coalition partner’s interoperable
ATSs.
d) Reduce the ATS’s logistics footprint.
e) Reduce the ATS’s physical footprint.
f) Improve the quality of test.

The SIWG addressed the reductions from the test and measurement perspective. The SIWG efforts resulted
in both the definition of synthetic instruments and the specifications of their respective attributes.
Synthetic instruments were originally part of the IEEE Std 1671.2™-2008 standard, as both an example of
InstrumentDescription instances as well as to provide a definition of the necessary parameters/attributes to
document a synthetic instrument as defined by the SIWG. These synthetic instrument definitions have now
been incorporated into their own IEEE project (P1871.2), and therefore their associated Annexes have been
removed from later revisions of IEEE Std 1671.2. The InstrumentDescription template instance example
for synthetic instruments are still provided as downloads of this standard to ensure continuity and support
for existing users.
Template instance documents are used by vendors developing/providing synthetic instruments as the basis
for documenting the synthetic instrument. The template instance document provides examples for each
instrument vendor to follow. These templates will not validate against the schemas documented within this
standard until actual values for the specifications are incorporated into the SI-based InstrumentDescription
instance document.
IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855,
USA (http://standards.ieee.org/).

viii
IEEE Std 1671.2-2012 - viii -
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iv
- ix - IEEE Std 1671.2-2012
Patents
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v
IEEE Std 1671.2-2012 - x -
- 1 - IEEE Std 1671.2-2012
Standard for Automatic Test
Markup Language (ATML) Instrument
Description
IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or
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1. Overview
1.1 General
Automatic test markup language (ATML) is a collection of IEEE standards and associated extensible
markup language (XML) schemas that allows automatic test system (ATS) and test information to be
exchanged in a common format adhering to the XML standard.
The ATML framework and the ATML family of standards have been developed and are maintained under
the guidance of the Test Information Integration (TII) Subcommittee of IEEE Standards Coordinating
Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test
strategies, test requirements, test procedures, test results management, and test system implementations,
while allowing test program (TP), test asset interoperability, and unit under test (UUT) data to be
interchanged between heterogeneous systems.
This standard (as well as the XML schemas and XML instance document examples that accompany this
standard) is intended to be used in identifying and documenting instrumentation which may be utilized

This information is given for the convenience of users of this standard and does not constitute an endorsement by the IEEE of this
consortium standard. Equivalent standards or products may be used if they can be shown to lead to the same results.
The schemas and examples that accompany this standard are available at http://standards.ieee.org/downloads/1671/1671.2-2012/.

IEEE Std 1671.2-2012 - 2 -
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
during the testing of a particular unit under test. This information includes the mechanical, electrical, and
software interfaces of the instrument.
1.2 Application of this document’s annexes
This document includes four annexes.
Annex A, Annex B, Annex C, and Annex D are informative, and thus are provided strictly as information,
for users, implementers, and maintainers of this document.
1.3 Scope
This standard defines an exchange format, utilizing extensible markup language (XML), for both the static
description of instrument models, and the specific description of instrument instance information.
1.4 Application
This standard provides for the specification and identification of instrumentation that will be used for the
purposes of testing a UUT. The specification and identification consist of, but are not limited to: physical
characteristics, power requirements, operational requirements, calibration requirements, factory defaults,
configuration options, capabilities, and interfaces (both hardware [HW] and software [SW]). This
collection of information represents an entire “data package” for either a class or type of instrument (as
represented by the InstrumentDescription.xsd schema defined in Clause 4 or a specific instrument (as
represented by the InstrumentInstance.xsd schema defined in Clause 5).
Identifying an instrument provides for the unambiguous specification of a particular instrument, which may
be utilized in a bench-test scenario, a piece of manual test equipment, or within automatic test equipment
(ATE). This unambiguous specification shall be readable by both humans and machines. Humans may use
the specification to identify and assemble the instrument into their test application. Machines may use the
specification to verify that the testing need can be accomplished by the instrument in place.
Synthetic instruments link a series of HW and SW components with standardized interfaces to generate
signals or make measurements using algorithmic numeric processing techniques. The goal is to decrease
the total cost of ownership of ATS, to lessen the time to develop and field new or upgraded ATS, to reduce
the test system logistics footprint, and finally, to improve the quality of test.
The information contained in XML documents conforming to this standard will be useful to the following:
a) Test program set (TPS) developers
b) TPS maintainers
c) ATE system developers
d) ATE system maintainers
e) Developers of ATML-based tools and systems
f) Instrument manufactures
- 3 - IEEE Std 1671.2-2012
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
1.5 Conventions used within this document
1.5.1 General
In accordance with the IEEE Standards Style Manual [B6] , any schema examples will be shown in
Courier font. In cases where instance document examples are necessary to depict the use of a schema
type or element, such examples will also be shown in Courier font. When the characters “.” appear in
an example, it indicates that the example component is incomplete.
All simple types, complex types, attribute groups, and elements will be listed; explanatory information will
be provided, along with examples, if additional clarification is needed. The explanatory information will
include information on the intended use of the elements and/or attributes where the name of the entity does
not clearly indicate its intended use. For elements derived from another source type (e.g., an abstract type),
only attributes that extend the source type will be listed; details regarding the base type will be listed along
with the base type.
When referring to an attribute of an XML element, the convention of [element]@[attribute] will be used.
In cases where an attribute name is referred to with no associated element, the attribute name will be
enclosed in single quotes. Element and type names will always be set in italics when appearing in text.
This standard uses the vocabulary and definitions of relevant IEEE standards. In case of conflict of
definitions, except for those portions quoted from standards, the following precedence shall be observed: 1)
Clause 3, 2) The IEEE Standards Dictionary Online.[B5]
1.5.2 Precedence
The InstrumentDescription schema (InstrumentDescription.xsd) element, child element, and annotation
information shall take precedence over the descriptive information contained in Clause 4.
The InstrumentDescription schema and the material contained in Clause 4 shall take precedence over the
InstrumentDescription instance document information represented in Clause 5 as well as the examples in
Annex B.
The InstrumentInstance schema (InstrumentInstance.xsd) element, child element, and annotation
information shall take precedence over the descriptive information contained in Clause 5.
The InstrumentInstance schema and the material contained in Clause 5 shall take precedence over the
InstrumentDescription instance document information represented in Clause 5 as well as the examples in
Annex B.
1.5.3 Word usage
In accordance with the IEEE Standards Style Manual [B6], the word shall is used to indicate mandatory
requirements strictly to be followed in order to conform to the standard and from which no deviation is
permitted (shall equals is required to). The use of the word must is used only to describe unavoidable
situations. The use of the word will is only used in statements of fact.
The word should is used to indicate that among several possibilities one is recommended as particularly
suitable, without mentioning or excluding others (should equals is recommended that).

The numbers in brackets correspond to those of the bibliography in Annex D.

IEEE Std 1671.2-2012 - 4 -
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
The word may is used to indicate a course of action permissible within the limits of the standard (may
equals is permitted to).
The word can is used for statements of possibility and capability (can equals is able to).
2. Normative references
The following referenced document is indispensable for the application of this document (i.e., they must be
understood and used, so each referenced document is cited in text and its relationship to this document is
explained). For dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments or corrigenda) applies.
IEEE Std 1671™, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging
4,5
Automatic Test Equipment and Test Information via XML.
3. Definitions, abbreviations, and acronyms
3.1 Definitions
For the purposes of this document, the following terms and definitions apply. The IEEE Standards
Dictionary Online [B5] should be consulted for terms not defined in this clause. In the event a term is
explicitly redefined, or defined in more detail in an ATML component standard, the component standards
definition shall be normative for that ATML component standard.
abstract type: A declared type that can be used to define other types through derivation. Only non-abstract
types derived from the declared type can be used in instance documents. When such a type is used, it must
be identified by the xsi:type attribute.
automatic test markup language (ATML) instance document: See: instance document.
dynamic current: The rated current capacity of a particular VersaModule Eurocard (VME) extensions for
instrumentation (VXI) or Peripheral Component Interconnect (PCI®) extensions for instrumentation
(PXI®) backplane voltage for the frequencies from 20 Hz to 1 GHz.
element: A bounded component of the logical structure of an extensible markup language (XML)
document that has a type and that may have XML attributes and content.
entity: Something that has a distinct separate existence.
extensible markup language (XML) attribute: Name-value pair associated with an XML element.

IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855,
USA (http://standards.ieee.org/).
The standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc.
IEEE Standards Dictionary Online subscription is available at:
http://www.ieee.org/portal/innovate/products/standard/standards_dictionary.html
Adapted from VXI-1, VXIbus System Specification, Revision 3, 24 Nov. 2003.
Adapted from Extensible Markup Language (XML) 1.0 (Fifth Edition). This document is available from the World Wide Web
Consortium (W3C®) (http://www.w3.org/xml).

- 5 - IEEE Std 1671.2-2012
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
extensible markup language (XML) document: A data object that conforms to the XML requirements
for being well formed. In addition, the data object is valid if it additionally conforms to semantic rules of
the XML schema.
extensible markup language (XML) schema: The definition of a class of XML document, typically
expressed in terms of constraints on the structure and the content of documents of that class, above and
beyond the basic syntax constraints imposed by XML itself.
instance document: An extensible markup language (XML) document which conforms to a particular
XML schema.
instrument: Devices (chemical, electrical, hydraulic, magnetic, mechanical, optical, pneumatic) that may
be utilized to test, observe, measure, monitor, alter, generate, record, calibrate, manage, or control physical
properties, movements, or other characteristics.
object: An object consists of state and behavior. An object stores its states in fields (variables in some
programming languages) and exposes it behavior through methods (functions in some programming
languages).
peak current: The rated dc current of a particular VersaModule Eurocard extensions for instrumentation
(VXI) or peripheral component interconnect extensions for instrumentation (PXI) backplane voltage.
synthetic instrument: A series of hardware and software components, with standardized interfaces, to
generate signals or make measurements using algorithmic/numeric processing techniques.
well formed: Conforming to all extensible markup language (XML) syntax rules.
3.2 Abbreviations and acronyms
ANSI American National Standards Institute
ATE automatic test equipment
ATML automatic test markup language
ATS automatic test system
dc direct current
DHCP dynamic host configuration protocol
ECL emitter coupled logic
ECLTRIG0-1 ECL triggers 0 and 1
EIA Electronics Industry Association
GHz gigahertz
HW hardware
Hz hertz
I/O input/output
ID identifier
Adapted from MIL-STD-1309D, Definitions of Terms for Test, Measurement and Diagnostic Equipment, Naval Electronics Systems
Command (ELEX-8111), Washington, DC, 12 Feb. 1992.
Adapted from VXI-1, VXIbus System Specification, Revision 3, 24 Nov. 2003.

IEEE Std 1671.2-2012 - 6 -
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
IF intermediate frequency
kg kilogram
lb pound(s)
®11
LXI local area networks (LAN) extensions for instrumentation
PCI peripheral component interconnect ®
PCIe peripheral component interconnect express ®
PCI-SIG peripheral component interconnect (PCI) special interest group
PXI peripheral component interconnect (PCI) extensions for instrumentation ®
PXIe peripheral component interconnect (PCI) extensions for instrumentation express
RFI receiver fixture interface
RS-232 Recommended Standard 232
SCC20 Standards Coordinating Committee 20
SIWG Synthetic Instrument Working Group
SI system of units
SW software
TIA Telecommunications Industry Association
TII test information integration
TPS test program set
TTLTRIG0-7 transistor-transistor logic (TTL) triggers 0 through 7
URL uniform resource locator
USB universal serial bus
UTF-8 8-bit Unicode transformation format
UUT unit under test
VME VersaModule Eurocard
VXI VME extensions for instrumentation
VXI-1 VXI system specification
W3C World Wide Web Consortium
XML extensible markup language

11 ®
Registered products (indicated by ) listed in 3.2 are given for the convenience of users of this standard and do not constitute an
endorsement by the IEEE of these products. Equivalent products may be used if they can be shown to lead to the same results.

- 7 - IEEE Std 1671.2-2012
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
4. InstrumentDescription schema
4.1 General
Should the reader not have a general understanding of XML schemas or XML terminology, an XML
Schema Tutorial [B26] is available on the World Wide Web. This tutorial will help with the general
understanding of the contents of both this clause and the ATML common schemas (Annex B of IEEE Std
1671), of which this clause makes reference.
In addition to the conventions specified in 1.5.1, c: identifies that the type or attribute group is contained in
B.1 of IEEE Std 1671, hc: identifies that the type or attribute group is contained in B.2 of IEEE Std 1671,
and te: identifies that the type or attribute group is contained in B.3 of IEEE Std 1671.
4.2 Elements
4.2.1 InstrumentDescription root (or document)
Exactly one element exists, called the root, or document element, of which no part appears in the content of
any other element. This root element serves as the parent for all other elements of the
InstrumentDescription schema.
The InstrumentDescription schemas root element is defined as follows:
Name Set to
Attribute form default Unqualified (see NOTE)
Element form default Qualified (see NOTE)
Encoding UTF-8
Included schema None
urn:IEEE-1671:2010:Common
Imported schema urn:IEEE-1671:2010:HardwareCommon
urn:IEEE-1671:2010:TestEquipment
Target namespace urn:IEEE-1671.2:2012:InstrumentDescription
Version 2.00
a
XML schema namespace reference
NOTE—Qualified and unqualified are described in A.3.7 of IEEE Std 1671.
a
The namespace reference URL is: http://www.w3.org/2001/XMLSchema.

Notes in text, tables, and figures of a standard are given for information only and do not contain requirements needed to implement
this standard.
IEEE Std 1671.2-2012 - 8 -
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
4.2.1.1 InstrumentDescription
Base type: Extension of inst:InstrumentDescription
Properties: content complex
The InstrumentDescription element shall define a class or type of instrument.
4.2.1.1.1 Attributes
The InstrumentDescription element inherits the attributes from InstrumentDescription complex type (see
4.2.2).
4.2.1.1.2 Child elements
The InstrumentDescription element inherits the child elements from InstrumentDescription complex type
(see 4.2.2).
4.2.2 InstrumentDescription complex type
Base type: Extension of hc:HardwareItemDescription
Properties: content complex
Instruments may be represented as individual entities or as logical groups that represent an overall source,
sensor, or load capability.
Figure 1 illustrates the XML types inherited and the XML types (both simple and complex) that shall be
defined in this standard, which together comprise the InstrumentDescription.
Within Figure 1, solid lined boxes indicate that the XML element shall be required, whereas dotted lined
boxes indicate that the XML element may be used. The referenced subclause identifies where the definition
of the element is located within this standard or IEEE Std 1671.

- 9 - IEEE Std 1671.2-2012
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
InstrumentDescription
hc: HardwareItemDescription
(Annex B of IEEE Std 1671)
Buses
(subclause 4.3.1)
PowerOnDefaults
(subclause 4.3.5)
Paths
(subclause 4.3.4)
Specifications
(subclause 4.3.8)
Resources
(subclause 4.3.7)
Switching
(subclause 4.3.9)
Capabilities
(subclause 4.3.3)
Figure 1 —InstrumentDescription complex type content
4.2.2.1 Attributes
InstrumentDescription contains the following attribute, in addition to those inherited from the
hc:HardwareItemDescription complex type and the c:DocumentRootAttributes attribute group defined in
Annex B of IEEE Std 1671.
Name Type Description Use
type xs:string An enumeration used to identify whether the Required
InstrumentDescription is describing an
“Instrument,” “Module,” or instrument “Option.”

4.2.2.2 Child elements
InstrumentDescription contains the following child elements, in addition to those inherited from
hc:HardwareItemDescription contained in Annex B of IEEE Std 1671.
Name Type Description Use
Buses See 4.3.1 Optional
Capabilities hc:Capabilities See 4.3.3 Optional
Paths te:Paths See 4.3.4 Optional
PowerOnDefaults  See 4.3.5 Optional
Resources hc:Resources See 4.3.7 Optional
Specifications hc:Specifications See 4.3.8 Optional
Switching hc:Switching See 4.3.9 Optional

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