IEC 61671-2:2016

Standard for automatic test markup language (ATML) instrument description

IEC 61671-2:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

General Information

• Status: Published
• Publication Date: 07-Apr-2016
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 25.040.01 - Industrial automation systems in general
• ICS: 35.060 - Languages used in information technology
• Technical Committee: TC 91 - Electronics assembly technology
• Current Stage: PPUB - Publication issued
• Start Date: 08-Apr-2016
• Completion Date: 08-Apr-2016

Standards Content (sample)

IEC 61671-2
Edition 1.0 2016-04
IEEE Std 1671.2
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) instrument description
IEC 61671-2:2016-04(en) IEEE Std 1671.2-2012
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IEC 61671-2
Edition 1.0 2016-04
IEEE Std 1671.2™
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) instrument description
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040; 35.060 ISBN 978-2-8322-3265-1

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
IEC 61671-2:2016
IEEE Std 1671.2-2012 - ii -
Contents

1. Overview .................................................................................................................................................... 1

1.1 General ................................................................................................................................................ 1

1.2 Application of this document’s annexes .............................................................................................. 2

1.3 Scope ................................................................................................................................................... 2

1.4 Application .......................................................................................................................................... 2

1.5 Conventions used within this document .............................................................................................. 3

2. Normative references .................................................................................................................................. 4

3. Definitions, abbreviations, and acronyms .................................................................................................. 4

3.1 Definitions ........................................................................................................................................... 4

3.2 Abbreviations and acronyms ............................................................................................................... 5

4. InstrumentDescription schema ................................................................................................................... 7

4.1 General ................................................................................................................................................ 7

4.2 Elements .............................................................................................................................................. 7

4.3 Child elements ....................................................................................................................................10

4.4 Complex types ....................................................................................................................................13

4.5 Simple types .......................................................................................................................................28

5. InstrumentDescription instance schema ....................................................................................................28

5.1 Elements .............................................................................................................................................28

5.2 Complex types ....................................................................................................................................29

5.3 Simple types .......................................................................................................................................31

6. ATML InstrumentDescription XML schema names and locations ...........................................................31

7. ATML XML schema extensibility ............................................................................................................33

8. Conformance .............................................................................................................................................33

Annex A (informative) IEEE download Web site material associated with this document ..........................34

Annex B (informative) Users information and examples ..............................................................................35

Annex C (informative) Glossary ...................................................................................................................38

Annex D (informative) Bibliography ............................................................................................................39

Annex E (informative) IEEE List of Participants .........................................................................................41

Copyright © 2013 IEEE. All rights reserved.
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- iii -
IEC 61671-2:2016
IEEE Std 1671.2-2012
STANDARD FOR AUTOMATIC TEST
MARKUP LANGUAGE (ATML) INSTRUMENT
DESCRIPTION
FOREWORD

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Published by IEC under license from IEEE. © 2012 IEEE. All rights reserved.
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- iv -
IEC 61671-2:2016
IEEE Std 1671.2-2012

International Standard IEC 61671-2/IEEE Std 1671.2-2012 has been processed through IEC

technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo

Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1671.2-2012 91/1314/FDIS 91/1338/RVD

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

The IEC Technical Committee and IEEE Technical Committee have decided that the contents

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Published by IEC under license from IEEE. © 2012 IEEE. All rights reserved.
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IEC 61671-2:2016
- v - IEEE Std 1671.2-2012
IEEE Std 1671.2™-2012
(Revision of
IEEE Std 1671.2-2008)
IEEE Standard for Automatic Test
Markup Language (ATML) Instrument
Description
Sponsor
IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems
Approved 5 December 2012
IEEE-SA Standards Board
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IEC 61671-2:2016
IEEE Std 1671.2-2012 - vi -

Abstract: An exchange format is specified in this standard, using extensible markup language

(XML), for identifying instrumentation that may be integrated in an automatic test system (ATS)

that is to be used to test and diagnose a unit under test (UUT).

Keywords: ATML instance document, ATS, automatic test equipment (ATE), Automatic Test

Markup Language (ATML), automatic test system, IEEE 1671.2, instrument, instrumentation,

synthetic instrument, XML schema
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IEC 61671-2:2016
- vii - IEEE Std 1671.2-2012
IEEE Introduction

This introduction is not part of IEEE Std 1671.2-2012, IEEE Standard for Automatic Test Markup Language (ATML)

Instrument Description.

This child, or “dot,” standard, also known as an ATML component standard, provides for the definition of

the InstrumentDescription and InstrumentInstance XML schemas, and contains references to examples.

These XML schemas and examples accompany this standard and provide for the identification and

definition of an instrument.

XML schemas define the basic information required within any test application and provide a vehicle for

formally defining the test environment by defining a class hierarchy corresponding to these basic

information entities and providing several methods within each to enable basic operations to be performed

on these entities. ATML component standards within the ATML framework define the particular

requirements within the test environment.

The Synthetic Instrument Working Group (SIWG) was formed, at Department of Defense request, to define

synthetic instrumentation and its attributes and develop a framework that balances user and supplier

objectives, facilitates rapid technology advancements and adaptation throughout the test life cycle, and

complements/supports other relevant test and measurement industry activities.
The goals or desired effects of the SIWG activities were to:
a) Reduce the total cost of ownership of the automatic test system (ATS).
b) Reduce time to develop and field new or upgraded ATSs.

c) Provide greater flexibility to the war fighter through U.S. and coalition partner’s interoperable

ATSs.
d) Reduce the ATS’s logistics footprint.
e) Reduce the ATS’s physical footprint.
f) Improve the quality of test.

The SIWG addressed the reductions from the test and measurement perspective. The SIWG efforts resulted

in both the definition of synthetic instruments and the specifications of their respective attributes.

Synthetic instruments were originally part of the IEEE Std 1671.2™-2008 standard, as both an example of

InstrumentDescription instances as well as to provide a definition of the necessary parameters/attributes to

document a synthetic instrument as defined by the SIWG. These synthetic instrument definitions have now

been incorporated into their own IEEE project (P1871.2), and therefore their associated Annexes have been

removed from later revisions of IEEE Std 1671.2. The InstrumentDescription template instance example

for synthetic instruments are still provided as downloads of this standard to ensure continuity and support

for existing users.

Template instance documents are used by vendors developing/providing synthetic instruments as the basis

for documenting the synthetic instrument. The template instance document provides examples for each

instrument vendor to follow. These templates will not validate against the schemas documented within this

standard until actual values for the specifications are incorporated into the SI-based InstrumentDescription

instance document.

IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855,

USA (http://standards.ieee.org/).
viii
Copyright © 2013 IEEE. All rights reserved.
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IEC 61671-2:2016
IEEE Std 1671.2-2012 - viii -
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Copyright © 2013 IEEE. All rights reserved.
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IEC 61671-2:2016
- ix - IEEE Std 1671.2-2012
Patents

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Copyright © 2013 IEEE. All rights reserved.
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IEC 61671-2:2016
IEEE Std 1671.2-2012 - x -
---------------------- Page: 12 ----------------------
IEC 61671-2:2016
- 1 - IEEE Std 1671.2-2012
Standard for Automatic Test
Markup Language (ATML) Instrument
Description

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1. Overview
1.1 General

Automatic test markup language (ATML) is a collection of IEEE standards and associated extensible

markup language (XML) schemas that allows automatic test system (ATS) and test information to be

exchanged in a common format adhering to the XML standard.

The ATML framework and the ATML family of standards have been developed and are maintained under

the guidance of the Test Information Integration (TII) Subcommittee of IEEE Standards Coordinating

Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test

strategies, test requirements, test procedures, test results management, and test system implementations,

while allowing test program (TP), test asset interoperability, and unit under test (UUT) data to be

interchanged between heterogeneous systems.

This standard (as well as the XML schemas and XML instance document examples that accompany this

standard) is intended to be used in identifying and documenting instrumentation which may be utilized

This information is given for the convenience of users of this standard and does not constitute an endorsement by the IEEE of this

consortium standard. Equivalent standards or products may be used if they can be shown to lead to the same results.

The schemas and examples that accompany this standard are available at http://standards.ieee.org/downloads/1671/1671.2-2012/.

Copyright © 2013 IEEE. All rights reserved.
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IEC 61671-2:2016
IEEE Std 1671.2-2012 - 2 -
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description

during the testing of a particular unit under test. This information includes the mechanical, electrical, and

software interfaces of the instrument.
1.2 Application of this document’s annexes
This document includes four annexes.

Annex A, Annex B, Annex C, and Annex D are informative, and thus are provided strictly as information,

for users, implementers, and maintainers of this document.
1.3 Scope

This standard defines an exchange format, utilizing extensible markup language (XML), for both the static

description of instrument models, and the specific description of instrument instance information.

1.4 Application

This standard provides for the specification and identification of instrumentation that will be used for the

purposes of testing a UUT. The specification and identification consist of, but are not limited to: physical

characteristics, power requirements, operational requirements, calibration requirements, factory defaults,

configuration options, capabilities, and interfaces (both hardware [HW] and software [SW]). This

collection of information represents an entire “data package” for either a class or type of instrument (as

represented by the InstrumentDescription.xsd schema defined in Clause 4 or a specific instrument (as

represented by the InstrumentInstance.xsd schema defined in Clause 5).

Identifying an instrument provides for the unambiguous specification of a particular instrument, which may

be utilized in a bench-test scenario, a piece of manual test equipment, or within automatic test equipment

(ATE). This unambiguous specification shall be readable by both humans and machines. Humans may use

the specification to identify and assemble the instrument into their test application. Machines may use the

specification to verify that the testing need can be accomplished by the instrument in place.

Synthetic instruments link a series of HW and SW components with standardized interfaces to generate

signals or make measurements using algorithmic numeric processing techniques. The goal is to decrease

the total cost of ownership of ATS, to lessen the time to develop and field new or upgraded ATS, to reduce

the test system logistics footprint, and finally, to improve the quality of test.

The information contained in XML documents conforming to this standard will be useful to the following:

a) Test program set (TPS) developers
b) TPS maintainers
c) ATE system developers
d) ATE system maintainers
e) Developers of ATML-based tools and systems
f) Instrument manufactures
Copyright © 2013 IEEE. All rights reserved.
---------------------- Page: 14 ----------------------
IEC 61671-2:2016
- 3 - IEEE Std 1671.2-2012
IEEE Std 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
1.5 Conventions used within this document
1.5.1 General

In accordance with the IEEE Standards Style Manual [B6] , any schema examples will be shown in

Courier font. In cases where instance document examples are necessary to depict the use of a schema

type or element, such examples will also be shown in Courier font. When the characters “...” appear in

an example, it indicates that the example component is incomplete.

All simple types, complex types, attribute groups, and elements will be listed; explanatory information will

be provided, a
...