IEC 60384-22:2004/COR1:2004

Corrigendum 1 - Fixed capacitors for use in electronic equipment - Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2

General Information

• Status: Published
• Publication Date: 28-Sep-2004
• ICS: 31.060.10 - Fixed capacitors
• Technical Committee: TC 40 - Capacitors and resistors for electronic equipment
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 09-Dec-2011

Relations

• Corrects: IEC 60384-22:2004 - Fixed capacitors for use in electronic equipment - Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
• Effective Date: 05-Sep-2023
• Revised: IEC 60384-22:2011 - Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60384-22
(First edition – 2004-06)
Fixed capacitors for use in electronic equipment –
Part 22: Sectional specification: Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 2
CORRIGENDUM 1
Page 8
1.5.6
rated voltage (DC)
Replace, in the note, ‘AC’ by ‘a.c.’.

Page 8
1.5.6
rated voltage (DC)
Replace, in the title and text, ‘DC’ by ‘d.c.’.

Page 9
1.6.1
Replace, in item b), ‘DC’ by ‘d.c.’.

Page 10
2.2.5 Temperature characteristic of capacitance
Replace, in the first paragraph, ‘DC’ by ‘d.c.’.

Page 11
Table 3 – Temperature characteristic of capacitance
Replace, throughout the table, ‘DC’ by ‘d.c.’.

September 2004
Page 14
Table 4 – Fixed sample size test plan for qualification approval, assessment level EZ
Replace the column headers by the following:
Group Test Subclause of this Number of Permissible
publication specimens number of
No.
non conforming
e
n
items
c
Page 15
Table 5 – Tests schedule for qualification approval
Replace GROUP 1 A by the following:

GROUP 1A D See Table 4
4.15 Robustness of Test Ua1, force: 2,5 N
termination
Test Ub, method 1, force: 2,5 N
(if applicable)
Number of bends: 1
Visual examination No visible damage
4.9.2 Initial measurement Capacitance
4.9 Resistance to Special preconditioning as in 4.1
soldering heat
See detail specification for the
method
Recovery: (24 ± 2) h
4.9.5 Final measurement Visual examination As in 4.9.5
Capacitance As in 4.9.5
4.16 C
...