IEC TS 62396-4:2008

Process management for avionics - Atmospheric radiation effects - Part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects

IEC/TS 62396-4:2008(E) is intended to provide guidance on atmospheric radiation effects on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). To be used in conjunction with IEC/TS 62396-1. Defines the effects of that environment on high voltage electronics and provides design considerations for the accommodation of those effects within avionics systems. Is intended to help aerospace equipment manufacturers and designers to standardise their approach to single event effects on high voltage avionics by providing guidance, leading to a standard methodology.

General Information

• Status: Replaced
• Publication Date: 24-Jul-2008
• ICS: 03.100.50 - Production. Production management
• ICS: 31.020 - Electronic components in general
• ICS: 49.060 - Aerospace electric equipment and systems
• Technical Committee: TC 107 - Process management for avionics
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 25-Sep-2013

Relations

• Replaces: IEC PAS 62396-4:2007 - Process management for avionics - Atmospheric radiation effects - Part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects
• Effective Date: 05-Sep-2023
• Replaced By: IEC 62396-4:2013 - Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC/TS 62396-4
Edition 1.0 2008-07
TECHNICAL
SPECIFICATION
Process management for avionics – Atmospheric radiation effects –
Part 4: Guidelines for designing with high voltage aircraft electronics and
potential single event effects

IEC/TS 62396-4:2008(E)
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IEC/TS 62396-4
Edition 1.0 2008-07
TECHNICAL
SPECIFICATION
Process management for avionics – Atmospheric radiation effects –
Part 4: Guidelines for designing with high voltage aircraft electronics and
potential single event effects

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
P
ICS 03.100.50; 31.020; 49.060 ISBN 2-8318-9934-6
– 2 – TS 62396-4 © IEC:2008(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5
1 Scope.6
2 Normative references .6
3 Terms and definitions .6
4 Potential high voltage single event effects .6
5 Quantifying single event burnout in avionics for high voltage devices .7
6 Relevant SEB data and applying it to avionics .9
6.1 SEB data from heavy ion testing is not relevant.9
6.2 SEB data from high energy neutron and proton testing.9
6.3 Calculating the SEB rate at aircraft altitudes .12
6.4 Measurement of high voltage component radiation characteristics, EPICS .12
7 Conclusion .15
Bibliography.16

Figure 1 – SEB cross sections measured in 400 V and 500 V MOSFETs for WNR
neutron and proton beams .10
Figure 2 – SEB cross sections measured in 1 000 V MOSFETs and 1 200 V IGBTs
with WNR neutron and 200 MeV proton beams .11
Figure 3a – Application of EPICS to the measurement of radiation event induced
charge .13
Figure 3b – Application of EPICS to the measurement of radiation event induced
current .13
Figure 3 – Measurement of radiation event charge and current.13
Figure 4 – EPICS plot of 1 200 V diode numbers of events at currents taken at different
9 2
applied voltages for a neutron fluence of approximately 3,5 × 10 neutrons per cm
measured at energies greater than 10 MeV.14
Figure 5 – EPICS plot of 1 200 V diode numbers of events at currents taken at 675 V
(56 %) and 900 V (75 %) applied voltage (stress) demonstrating the difference
between low and high voltage stress – Fluence as per Figure 4 .14

TS 62396-4 © IEC:2008(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
______________
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 4: Guidelines for designing with high voltage aircraft
electronics and potential single event effects

FOREWORD
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The main task of IEC technical committees is to prepare International Standards. In
exceptional circumstances, a technical committee may propose the publication of a technical
specification when
• the required support cannot be obtained for the publication of an International Standard,
despite repeated efforts, or
• the subject is still under technical development or where, for any other reason, there is the
future but no immediate possibility of an agreement on an International Standard.
Technical specifications are subject to review within three years of publication to decide
whether they can be transformed into International Standards.
IEC 62396-4, which is a technical specification, has been prepared by IEC technical
committee 107: Process management for avionics.

– 4 – TS 62396-4 © IEC:2008(E)
This standard cancels and replaces IEC/PAS 62396-4 published in 2007. This first edition
constitutes a technical revision. It is to be read in conjunction with IEC/TS 62396-1.
The text of this technical specification is based on the following documents:
Enquiry draft Report on voting
107/81/DTS 107/88/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62396 series, under the general title Process management for
avionics – Atmospheric radiation effects, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until

the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the
data related to the specific publication. At this date, the publication will be
• transformed into an International standard,
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended
A bilingual edition of this document may be issued at a later date.

TS 62396-4 © IEC:2008(E) – 5 –
INTRODUCTION
This industry-wide technical specification provides additional guidance to avionics systems
designers, electronic equipment, component manufacturers and their customers about the
single event effects produced in semiconductor devices operating at high voltage (nominally
above 200 V) by atmospheric radiation. It expands on the information and guidance provided
in IEC/TS 62396-1.
The internal elements of semiconductor devices operating at high applied voltage will be
subject to high voltage stress. The incident radiation causes ionisation charge within the
device, and the high voltage stress may cause a large increase (avalanche) in this charge,
which may be destructive. Within this technical specification two effects are considered:
single event burn-out, SEB, and single event gate rupture, SEGR.

– 6 – TS 62396-4 © IEC:2008(E)
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 4: Guidelines for designing with high voltage aircraft
electronics and potential single event effects

1 Scope
This technical specification is intended to provide guidance on atmospheric radiation effects
on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at
altitudes up to 60 000 ft (18,3 km). It is intended to be used in conjunction with IEC/TS 62396-
1. This specification defines the effects of that environment on high voltage electronics and
provides design considerations for the accommodation of those effects within avionics
systems.
This technical specification is intended to help aerospace equipment manufacturers and
designers to standardise their approach to single event effects on high voltage avionics by
providing guidance, leading to a standard methodology.
Details are given of the types of single event effects relevant to the operation of high voltage
avionics electronics, methods of quantifying those effects, appropriate methods to assist
design and methods to demonstrate the suitability of the electronics for the application.
2 Normative references
The following referenced documents are indispensable for the application of this document,
only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
IEC/TS 62396-1, Process management for avionics – Atmospheric radiation effects – Part 1:
Accommodation of atmospheric radiation effects via single event effects within avionics
electronic equipment
3 Terms and definitions
For the purpose of this document, the terms and definitions of IEC/TS 62396-1 apply.
4 Potential high voltage single event effects
An N-channel power MOSFET can have two different types of destructive effects induced by
the deposition of charge from a single energetic particle, single event burnout (SEB) and
single event gate rupture (SEGR). Different tests performed on several devices show that is
1)
difficult to induce SEB in P-channel MOSFET [1, 2] . In addition to this kind of power
MO
...