IEC 61967-4:2002/COR1:2017

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 Ω/150 Ω direct coupling method

Corrigendum 1 - Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie 4 : Mesure des émissions conduites - Méthode par couplage direct 1 Ω/150 Ω

General Information

• Status: Published
• Publication Date: 28-Jun-2017
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: SC 47A - Integrated circuits
• Drafting Committee: WG 9 - TC 47/SC 47A/WG 9
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 16-Mar-2021

Relations

• Corrects: IEC 61967-4:2002 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
• Effective Date: 05-Sep-2023
• Revised: IEC 61967-4:2021 - Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
• Effective Date: 05-Sep-2023

Standards Content (Sample)

 IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION

COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE

____________
IEC 61967-4 IEC 61967-4
Edition 1.0  2002-04 Édition 1.0  2002-04

Integrated circuits – Measurement of Circuits intégrés – Mesure des émissions
electromagnetic emissions, 150 kHz to 1 GHz électromagnétiques, 150 kHz à 1 GHz

Part 4: Partie 4:
Measurement of conducted emissions – Mesure des émissions conduites –
1 Ω/150 Ω direct coupling method Méthode par couplage direct 1 Ω/150 Ω

CO RRI G E NDUM 1
Corrections to the French version appear after the English text.
Les corrections à la version française sont données après le texte anglais.

7.1 General test configuration
Replace the existing Figure 5 by the following new Figure 5:
Impedance
C3
matching Z = 50 Ω
L
network
Z = 150 Ω
L
IC
I/O
Q
R3
V
supply C4
Gnd
120 Ω V
RF
6,8 nF
...