Liquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules

IEC 61747-6-3:2011 applies to transmissive type active matrix liquid crystal displays. This standard defines general procedures for quality assessment related to the motion performance of LCDs. It defines artifacts in the motion contents and methods for motion artifact measurement. NOTE: Motion blur measurement methods and analysis methods introduced in this standard could not be universal tools for all different LCD motion enhancement technologies due to its complexity. Users shall be notified of these circumstances.

Dispositifs d'affichage à cristaux liquides - Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux liquides - Mesure de l'artefact de mouvement dans les modules d'affichage à cristaux liquides à matrice active

La CEI 61747-6-3:2011 s'applique aux afficheurs à cristaux liquides à matrice active de type transmissifs. Cette norme définit les procédures générales pour l'évaluation de la qualité en ce qui concerne les performances du mouvement des afficheurs LCD. Elle définit les artefacts dans les contenus en mouvement et les méthodes de mesure de l'artefact de mouvement. NOTE: Les méthodes de mesure du flou de mouvement et les méthodes d'analyse introduites dans la présente norme ne sauraient être des outils universels pour toutes les différentes technologies de mesure de l'amélioration du mouvement LCD en raison de sa complexité. Les utilisateurs doivent être informés de ces circonstances.

General Information

Status
Replaced
Publication Date
12-Jul-2011
Technical Committee
Drafting Committee
Current Stage
DELPUB - Deleted Publication
Start Date
16-Mar-2018
Completion Date
21-Aug-2019
Ref Project

Relations

Buy Standard

Standard
IEC 61747-6-3:2011 - Liquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules Released:7/13/2011
English and French language
48 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)

IEC 61747-6-3


®


Edition 1.0 2011-07



INTERNATIONAL



STANDARD



NORME
INTERNATIONALE
colour
inside


Liquid crystal display devices –
Part 6-3: Measuring methods for liquid crystal display modules – Motion artifact
measurement of active matrix liquid crystal display modules

Dispositifs d'affichage à cristaux liquides –
Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux
liquides – Mesure de l'artefact de mouvement dans les modules d'affichage
à cristaux liquides à matrice active


IEC 61747-6-3:2011

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED


Copyright © 2011 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by

any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or

IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.




Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.

Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette

publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch

About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
 Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
 IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
 Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
 Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: csc@iec.ch
Tel.: +41 22 919 02 11
Fax: +41 22 919 03 00


A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI

Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
 Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
 Just Published CEI: www.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
 Electropedia: www.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
 Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: csc@iec.ch
Tél.: +41 22 919 02 11
Fax: +41 22 919 03 00

---------------------- Page: 2 ----------------------
IEC 61747-6-3


®


Edition 1.0 2011-07



INTERNATIONAL



STANDARD



NORME
INTERNATIONALE
colour
inside


Liquid crystal display devices –
Part 6-3: Measuring methods for liquid crystal display modules – Motion artifact
measurement of active matrix liquid crystal display modules

Dispositifs d'affichage à cristaux liquides –
Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux
liquides – Mesure de l'artefact de mouvement dans les modules d'affichage
à cristaux liquides à matrice active


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX T
ICS 31.120 ISBN 978-2-88912-586-9

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

---------------------- Page: 3 ----------------------
– 2 – 61747-6-3  IEC:2011



CONTENTS

FOREWORD . 4


1 Scope . 6

2 Normative references . 6

3 Terms and definitions . 6


4 Abbreviations . 7

5 Standard measuring conditions . 7

5.1 Temperature, humidity and pressure conditions . 7

5.2 Illumination condition . 7
6 Standard motion-blur measuring methods . 8
6.1 General . 8
6.2 Direct measurement method . 8
6.2.1 Standard measuring process . 8
6.2.2 Test patterns . 8
6.2.3 Analysis method . 10
6.3 Indirect measurement method . 12
6.3.1 Temporal step response . 12
6.3.2 High speed camera . 15
7 Test report. 16
7.1 General . 16
7.2 Items to be reported . 16
7.2.1 Environmental conditions . 16
7.2.2 Display parameters . 16
7.2.3 Measuring method and conditions . 16
7.2.4 Analysis method . 16
Annex A (informative) Subjective test method . 18
Annex B (informative) Motion contrast degradation . 19
Annex C (informative) Dynamic modulation transfer function . 21
Bibliography . 23

Figure 1 – Examples of edge blur test pattern . 8
Figure 2 – Example of a pivoting pursuit camera system . 9

Figure 3 – Example of a linear pursuit camera system . 9
Figure 4 – Example of luminance cross section profile of blurred edge . 11
Figure 5 – Example of luminance cross section profile of blurred edge . 11
Figure 6 – PBET calculation . 12
Figure 7 – Set-up to measure the temporal step response . 13
Figure 8 – Example of a LC response time measurement . 14
Figure 9 – Example of a motion picture response curve derived from the response
measurement presented in Figure 8, and a convolution with a one frame wide window
function. 15
Figure 10 – Example of measurement data reporting . 17
Figure B.1 – Example of motion contrast degradation test pattern . 19
Figure B.2 – Example of motion contrast degradation due to line spreading . 20
Figure C.1 – Example of motion contrast degradation . 21

---------------------- Page: 4 ----------------------
61747-6-3  IEC:2011 – 3 –


Figure C.2 – Example of DMTF properties for different motion speeds (V) . 22




Table 1 – Step response data for different luminance transitions . 10

---------------------- Page: 5 ----------------------
– 4 – 61747-6-3  IEC:2011


INTERNATIONAL ELECTROTECHNICAL COMMISSION

___________



LIQUID CRYSTAL DISPLAY DEVICES –



Part 6-3: Measuring methods for liquid crystal display modules –

Motion artifact measurement of

active matrix liquid crystal display modules





FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61747-6-3 has been prepared by IEC technical committee 110:
Flat panel display devices.
The text of this standard is based on the following documents:
FDIS Report on voting
110/296/FDIS 110/313/RVD

Full information on the voting for the approval on this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

---------------------- Page: 6 ----------------------
61747-6-3  IEC:2011 – 5 –


A list of all parts of the IEC 61747 series, under the general title Liquid crystal display devices,
can be found on the IEC website.


Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.

The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data

related to the specific publication. At this date, the publication will be


• reconfirmed,

• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.

---------------------- Page: 7 ----------------------
– 6 – 61747-6-3  IEC:2011


LIQUID CRYSTAL DISPLAY DEVICES –



Part 6-3: Measuring methods for liquid crystal display modules –

Motion artifact measurement of

active matrix liquid crystal display modules








1 Scope

This part of IEC 61747 applies to transmissive type active matrix liquid crystal displays.
This standard defines general procedures for quality assessment related to the motion
performance of LCDs. It defines artifacts in the motion contents and methods for motion
artifact measurement.
NOTE Motion blur measurement methods and analysis methods introduced in this standard could not be universal
tools for all different LCD motion enhancement technologies due to its complexity. Users shall be notified of these
circumstances.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 61747-6, Liquid crystal and solid-state display devices – Part 6: Measuring methods for
liquid crystal modules – Transmissive type
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
motion picture response curve
a curve, representing the convolution of the temporal step response with a moving window
function of 1-frame wide. It shows how the luminance is integrated over time during smooth
pursuit eye tracking and combines the effects of the LCD response time and the hold-type
characteristics of the device under test

3.2
motion induced edge profile
luminance profile of an intrinsically sharp moving luminance transition when this transition is
followed with smooth pursuit eye tracking along its motion trajectory
NOTE The profile can be calculated from the motion picture response curve for any given motion speed.
3.3
edge blur
blur that becomes visible on an intrinsically sharp transition between two adjacent areas, with
a different luminance level, when the transition smoothly moves across the display as a
function of time.
NOTE Preconditions for this type of edge blur are smooth pursuit eye tracking of the object, and no obvious
flicker, indicating that luminance integration with a frame period is allowed. This blur phenomenon is mainly caused
by a slow response time of the liquid crystal cell in combination with the hold-type characteristics.

---------------------- Page: 8 ----------------------
61747-6-3  IEC:2011 – 7 –


3.4

perceived blurred edge time

time-related equivalent of the perceived blurred edge width. The latter one is derived from the

motion induced edge profile by means of filtering the edge profile with the contrast sensitivity

function of the human eye


4 Abbreviations


For the purpose of this document, the following abbreviations apply.


BET blurred edge time

BEW blurred edge width
CCD charge-coupled device
CIE Commission Internationale de l’Eclairage (international commission on
illumination)
CMOS complimentary metal-oxide semiconductor
CSF contrast sensitivity function
DMTF dynamic modulation transfer function
DUT display under test
DVI digital visual interface
EBET extended blurred edge time
FFT fast Fourier transform
IEC International Electrotechnical Commission
ISO International Organization for Standardization
JND just noticeable difference
LCD liquid crystal display
LMD light measuring device
LVDS low-voltage differential signaling
MCD motion contrast degradation
MPRC motion picture response curve
MTF modulation transfer function
PBET perceived blurred edge time
PBEW perceived blurred edge width
TN-LCD twisted nematic liquid crystal display
VA-LCD vertically-aligned liquid crystal display
5 Standard measuring conditions
5.1 Temperature, humidity and pressure conditions
The standard environmental condition for the motion artifact measurement is (25 ± 3) °C for
temperature, 25 % to 85 % for relative humidity, and 86kPa to 106kPa for air pressure. All
visual inspection tests shall be tested in (25 ± 5) °C.
5.2 Illumination condition
The illuminance at the measuring spot of the DUT shall be below 1 lx (standard dark room
condition as defined in IEC 61747-6).

---------------------- Page: 9 ----------------------
– 8 – 61747-6-3  IEC:2011


6 Standard motion-blur measuring methods


6.1 General


Motion induced object blur is the result of a slow response of the liquid crystal cells and a

stationary representation of the temporal image (related to the hold time of the display), in

combination with smooth pursuit eye-tracking of an object over the display surface. When an

object moves across the display and the eye is tracking this object, a spatiotemporal

integration of the object luminance is taken place at the human retina. There are several ways
to measure and characterize this spatiotemporal integration, via a direct measurement or via
an indirect measurement technique. For direct measurements a pursuit camera system can be

used, and the indirect measurement is based on measuring the temporal response curves and

from those curves the motion induced object blur that will occur on the retina can be
calculated. Both direct and indirect measurements will be described in this standard.
6.2 Direct measurement method
6.2.1 Standard measuring process
6.2.2 Test patterns
There are several patterns that can be used to measure motion induced object blur, such as
full test pattern, box test pattern, and line bar test pattern (see Figure 1). The details of the
used test pattern(s) shall be reported. When using a pursuit system, the width of the test
pattern should be sufficiently wide, e.g. 5 time the advancement (step-width) per frame, to
capture the total temporal response of the display. It is recommended that a minimum of
seven gray shades, including black and white, are used for gray level of each part of a test
pattern in Figure 1. The lightness function, specified in CIE 1976 (L*u*v*) and CIE 1976
(L*a*b*) color spaces, can be used to space the intermediate gray shades equally on the
lightness scale. One of gray level data that are available at the LCD modules input, e.g. 0 to
255 for an 8-bit LCD module, also can be used as this gray level.
(A) Full test pattern (B) Box test pattern (C) Line bar test pattern

IEC  1605/11


Figure 1 – Examples of edge blur test pattern
6.2.2.1 Pursuit detection system
Measuring edge blur of the LCD module should be done by using CCD camera with the
pursuit measurement system shown in Figure 2 and Figure 3. Relevant literature on these
1
systems can be found in the bibliography, references [1] to [5].
___________
1
 Figures in square brackets refer to the Bibliography.

---------------------- Page: 10 ----------------------
61747-6-3  IEC:2011 – 9 –







Pursuing speed (v)





Moving pattern      LMD with pursuing system

scroll speed (v)
    Captured image on CCD

IEC  1606/11

Figure 2 – Example of a pivoting pursuit camera system
LCD module
Moving test pattern
Linear pursuing LMD system
Captured image

IEC  1607/11


Figure 3 – Example of a linear pursuit camera system
The following guidelines are recommended when implementing the pursuit measuring system:
a) LMD: CCD or CMOS type surface measurement devices (CCD camera), with preferably an
integrated CIE 1931 photopic luminous sensitivity function (measuring luminance).
b) Scroll speed: the scroll speed of test pattern and the pursuing speed of LMD shall be
synchronized accurately to prevent integration errors.
c) Pursuing system: either pivoting or linear pursuit system shown in Figure 2 and Figure 3,
respectively. The angular rotation shall be limited to avoid viewing-angle related
dependencies (less than ±5˚).

---------------------- Page: 11 ----------------------
– 10 – 61747-6-3  IEC:2011


6.2.2.2 Specified conditions


a) Any deviations from the standard measurement conditions shall be reported: “Full test

pattern” shown in Figure 1(A) shall be used as the test pattern for this test method. Other

test patterns, such as “Box test pattern” shown in Figure 1(B) or “Line bar test pattern”

shown in Figure 1(C), can be used additionally depending on the requirements. The used
patterns shall be reported.


NOTE When other test patterns other than the standard “Full test pattern” are used, special care should be taken

because the size of the pattern can alter the luminance level of some of the LCD modules equipped with automatic

luminance level control function, or some long tails of the blurred edge can fall on the adjacent edge causing

ambiguity in the data analysis.

b) The signal level (the start level and the end level) for the test pattern is summarized Table
1.
Table 1 – Step response data for different luminance transitions
Data per color End level
(e.g. R,G,B,W)
L L L . . L
1 2 3 N
L  L (t) L (t)  L (t)
1 1-2 1-3 1-N
L L (t) L (t)  L (t)
2 2-1 2-3 2-N
L L (t) L (t)  L (t)
3 3-1 3-2 3-N
..
..
L L (t) L (t) L (t)
N N-1 N-2 N-3

c) Standard measuring conditions
1) Scroll speed : 4, 8, 12 pixel/frame
2) Shutter speed of camera : 1/20 sec.
6.2.3 Analysis method
6.2.3.1 Blurred edge time
The time between the transition from 10 % to 90 % in the luminance transition curve (see
Figure 4) is used to represent blurred edge time. Other ranges, such as 40 % to 60 %, can be
used, but they shall be reported.

Start level

---------------------- Page: 12 ----------------------
61747-6-3  IEC:2011 – 11 –




Luminance transition curve

1,4

1,2



1,0
90 %


0,8


0,6

0,4
0,2
10 %
0
0 5 10 15 20 25 30 35 40 45 50
Time  (ms)
IEC  1608/11

Figure 4 – Example of luminance cross section profile of blurred edge
6.2.3.2 Extended blurred edge time
The extended blurred edge time is defined as EBET = BET/0.8, which linearly extends the
BET to the 0 % to 100 % levels (see Figure 5).

Luminance transition curve

1,4
1,2
100 %
1,0
90 %
0,8
0,6
0 % - 100 %

0,4
0,2
10 %
0 %
0
0 5 10 15 20 25 30 35 40 45 50
Time  (ms)
IEC  1609/11

Figure 5 – Example of luminance cross-section profile of blurred edge
6.2.3.3 Perceived blurred edge time
The process to obtain a PBET curve is described in bibliographic reference [6], and
summarized in Figure 6. Luminance blurred edge is converted to a spectrum by a fast Fourier
transformation (FFT). The spectrum is multiplied by values given by CSF. After then a PBET
Relative luminance intensity
Relative luminance intensity

---------------------- Page: 13 ----------------------
– 12 – 61747-6-3  IEC:2011


curve is obtained by an inverse FFT. The value of the PBET is the distance between the

peaks of PBET curve (expressed in ms).




CSF PBEW PBET
Luminance profile





Inverse
Fourier Transform
Spatial Spatial
Time
CCD pixel Fourier Width
transform

frequency frequency
transform

IEC  1610/11

Figure 6 – PBET calculation
NOTE This standard recommends Peter Barten’s CSF (reference [7]), although other CSFs could be used.
2 2 2
−2π σ u
1 e / k
S(u) = =
Barten’s CSF formulae:
m (u)
2
t
  
 Φ
2 1 1 u 1
0
 

+ +  +
2

2 2 2 
  −(u/ u )
T ηpE 0
X X N

1− e 
 0 max max 

where
S(u)  is the spatial contrast sensitivity function for binocular vision;
m (u) is the modulation threshold;
t
u  is the spatial frequency;
σ  is the standard deviation of the line-spread function of the eye ;
K  is the signal-to-noise ratio (3,0);
T  is the integration time of the eye (0,1 s);
X  is the angular size of the object;
O
X  is the maximum angular filed size of the object (12˚);
max
N  is the maximum number of cycles over which the eye can integrate (15 cycles);
max
η  is the quantum efficiency of the eye (0,03);
p  is the photon conversion factor, depending on the light source
6
(e.g. 1,2 10 photons/sec/deg2/Td) ;

E  is the retinal illumination (Td);
-8 2
Φ  is the spectral density of the neural noise (3,10 sec deg );
0
U is the spatial frequency above which the lateral inhibition ceases (7
o
cycles/degree).
For the calculations, the viewing distance is set to 1.5 times the diagonal screen size of the
active display area (approximately 3 x height of display active area)
6.3 Indirect measurement method
6.3.1 Temporal step response
The temporal step response measurement method is based on the literature, indicated in the
Bibliography, i.e., references [9] to [15].
Relative luminance
Sensitivity
Relative stimuli
Relative stimuli

---------------------- Page: 14 ----------------------
61747-6-3  IEC:2011 – 13 –


6.3.1.1 Measurement system


A schematic representation of the measurement set-up to measure the temporal step

response is shown in Figure 7.




1) DUT

4) Amplifier v(t) 5) Data

      acquisition


3) Photo
Trigger
diode
Data transfer
LVDS/DVI 2) Pattern Control Monitor
generator

6) Luminance 7) Control
    meter   system
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.