IEC 61300-3-16:2003

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-16: Examinations and measurements - Endface radius of spherically polished ferrules

Describes a procedure to measure the endface radius of a spherically polished ferrule and angled ferrule or an angled spherically polished ferrule.

Dispositifs d'interconnexion et composants passifs à fibres optiques - Méthodes fondamentales d'essais et de mesures - Partie 3-16: Examens et mesures - Rayon de la face terminale des ferrules polies sphériquement

Describes a procedure to measure the endface radius of a spherically polished ferrule and angled ferrule or an angled spherically polished ferrule.

General Information

• Status: Replaced
• Publication Date: 14-Jan-2003
• ICS: 33.180.20 - Fibre optic interconnecting devices
• Technical Committee: SC 86B - Fibre optic interconnecting devices and passive components
• Drafting Committee: WG 4 - TC 86/SC 86B/WG 4
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 24-Jul-2014

Relations

• Replaced By: IEC 61300-3-47:2014 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47: Examinations and measurements - End face geometry of PC/APC spherically polished ferrules using interferometry
• Effective Date: 05-Sep-2023

Standards Content (Sample)

INTERNATIONAL IEC
STANDARD
61300-3-16
Second edition
2003-01
Fibre optic interconnecting devices
and passive components –
Basic test and measurement procedures –
Part 3-16:
Examinations and measurements –
Endface radius of spherically polished ferrules
Dispositifs d'interconnexion et composants passifs
à fibres optiques –
Méthodes fondamentales d'essais et de mesures –
Partie 3-16:
Examens et mesures –
Rayon de la face terminale des embouts polis sphériquement
Reference number
Publication numbering
As from 1 January 1997 all IEC publications are issued with a designation in the
60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.
Consolidated editions
The IEC is now publishing consolidated versions of its publications. For example,
edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the
base publication incorporating amendment 1 and the base publication incorporating
amendments 1 and 2.
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INTERNATIONAL IEC
STANDARD
61300-3-16
Second edition
2003-01
Fibre optic interconnecting devices
and passive components –
Basic test and measurement procedures –
Part 3-16:
Examinations and measurements –
Endface radius of spherically polished ferrules
Dispositifs d'interconnexion et composants passifs
à fibres optiques –
Méthodes fondamentales d'essais et de mesures –
Partie 3-16:
Examens et mesures –
Rayon de la face terminale des embouts polis sphériquement
 IEC 2003  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail]  Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale
N
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

– 2 – 61300-3-16  IEC:2003(E)
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative reference . 5
3 General description. 5
4 Apparatus . 6
4.1 Method 1 – Two-dimensional surface analysis . 6
4.2 Method 2 – Two-dimensional surface analysis by interferometry system . 7
4.3 Method 3 – Three-dimensional surface analysis by interferometry system . 8
5 Procedure.10
5.1 Measurement region .10
5.2 Method 1 – Two-dimensional surface analysis .11
5.3 Method 2 – Two-dimensional surface analysis by interferometry system .12
5.4 Method 3 – Three dimensional surface analysis by interferometry system.13
6 Details to be specified .13
6.1 Method 1 – Two-dimensional surface analysis .13
6.2 Method 2 – Two-dimensional surface analysis by interferometry system .13
6.3 Method 3 – Three-dimensional surface analysis by interferometry system .14

61300-3-16  IEC:2003(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-16: Examinations and measurements –
Endface radius of spherically polished ferrules
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
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Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
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2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
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from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
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Standards transparently to the maximum extent possible in their national and regional standards. Any
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5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-16 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This second edition of IEC 61300-3-16 cancel and replaces the first edition published in 1995.
It constitutes a technical revision.
The text of this standard is based on the following documents:
FDIS Report on voting
86B/1746/FDIS 86B/1772/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
IEC 61300 consists of the following parts, under the general title: Fibre optic interconnecting
devices and passive components – Basic test and measurement procedures:
− Part 1: General and guidance
− Part 2: Tests
− Part 3: Examinations and measurements

– 4 – 61300-3-16  IEC:2003(E)
The committee has decided that the contents of this publication will remain unchanged
until 2007. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
61300-3-16  IEC:2003(E) – 5 –
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-16: Examinations and measurements –
Endface radius of spherically polished ferrules
1 Scope
This part of IEC 61300 describes a procedure to measure the endface radius of a spherically
polished ferrule and angled ferrule or an angled spherically polished ferrule.
2 Normative reference
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
None.
3 General description
The ferrule endface radius R is defined as the radius of curvature of the portion of the endface
which is domed for physical contact. It is assumed that the endface is spherical, although in
practice the endface is often aspherical (see figure 1).
R
IEC  2657/02
Figure 1 – Radius of curvature of the endface
Three methods are described in this standard for measuring the radius of curvature:
a) method 1: analyzing the endface with a two-dimensional surface analyzer;
b) method 2: analyzing the endface with a two-dimensional interferometry type surface
analyzer;
c) method 3: analyzing the endface with a three dimensional interferometry type surface
analyzer.
(Method 3 is a reference method.)

– 6 – 61300-3-16  IEC:2003(E)
4 Apparatus
4.1 Method 1 – Two-dimensional surface analysis
The apparatus shown in figure 2 consists of a suitable ferrule holder, a positioning stage and
a two-dimensional surface analyzer.
4.1.1 Ferrule holder
This is a suitable device to hold the ferrule in a fixed vertical position, or tilted in the case of
an angled ferrule type.
4.1.2 Positioning stage
The ferrule holder is fixed to the positioning stage, which shall enable the holder to be moved
to the appropriate position. The stage shall have sufficient rigidity to allow the ferrule endface
to be measured accurately.
Two dimensional surface analyzer
Moving from left to right
Profilometer
Probe
Ferrule endface
Ferrule holder
Ferrule
Profile data
processing unit
Monitor
Moving from
front to rear
Positioning stage
IEC  2658/02
Figure 2 – Apparatus for two-dimensional surface analysis
4.1.3 Two-dimensional surface analyzer
The two-dimensional surface analyzer shall have an ability to measure the radius of curvature
with an accuracy better than ±0,1 mm. The analyzer shall consist of a profilometer, a profile
data processing unit and a monitor.
The profilometer shall be equipped with a wedge-shaped type probe. The motion of the probe
shall be perpendicular to the ferrule axis.
The profile data processing unit shall be able to process the profile data so as to measure the
radius of curvature: the unit calculates an ideal circle fitted to the spherical ferrule endface

61300-3-16  IEC:2003(E) – 7 –
from the measured profile data, and calculates a converted data from the measured profile
data by extracting the ideal circle data.
The monitor shall display the measured and the calculated profiles.
4.2 Method 2 – Two-dimensional surface analysis by interferometry system
An apparatus is shown in figure 3. The apparatus consists of a suitable ferrule holder, a
positioning stage and a two-dimensional interferometry analyzer.
4.2.1 Ferrule holder
This is a suitable device to hold the ferrule in a fixed vertical position (or tilted in the case of
an angled ferrule type).
4.2.2 Positioning stage
The ferrule holder is fixed to the positioning stage, which shall be able to move the holder to
the appropriate position. The stage shall have sufficient rigidity to allow the ferrule endface
to be measured accurately.
4.2.3 Two-dimensional interferometry analyzer
The two-dimensional interferometry analyzer shall have the ability to measure the radius of
curvature with an accuracy better than ±0,1 mm. The analyzer shall consist of a microscope
unit with a monochromatic light source, an image data processing unit and a monitor.
The microscope unit shall consist of an interference microscope equipped with a video
camera to send the interference image of the ferrule surface to the video board of the image
data processing unit.
The image data processing unit shall be able to process a row (or a group of adjacent rows to
cover a narrow stripe) of the video image passing across a fibre diameter. The unit calculates
the characteristic parameters (frequency and phase) of the interference light intensity curve of
the analyzed row by fitting the acquired data with a theoretical function. The radius of
curvature is evaluated from the phase shift of the interference fringes in the ferrule zone. The
system must be able to recognize the 2π phase shifts.
The monitor shall display the light intensity curve, the fitting functions and the measurement
results.
– 8 – 61300-3-16  IEC:2003(E)
Two-dimensional interferometry analyzer
Microscope unit
Interference
microscope
Image data
processing unit
with video board
Objective
Monitor
Ferrule endface
Ferrule holder
Ferrule
Positioning stage
IEC  2659/02
Figure 3 – Apparatus for two-dimensional surface analysis by interferometry system
4.3 Method 3 – Three-dimensional surface analysis by interferometry system
The apparatus shown in figure 4 consists of a suitable ferrule holder, a positioning stage and
a three-dimensional interferometry analyzer.

61300-3-16
...

IEC 61300-3-16
Edition 2.0 2003-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-16: Examinations and measurements – Endface radius of spherically
polished ferrules
Dispositifs d’interconnexion et composants passifs à fibres optiques –
Procédures fondamentales d’essais et de mesures –
Partie 3-16: Examens et mesures – Rayon de la face terminale des ferrules polies
sphériquement
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IEC 61300-3-16
Edition 2.0 2003-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-16: Examinations and measurements – Endface radius of spherically
polished ferrules
Dispositifs d’interconnexion et composants passifs à fibres optiques –
Procédures fondamentales d’essais et de mesures –
Partie 3-16: Examens et mesures – Rayon de la face terminale des ferrules
polies sphériquement
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
N
CODE PRIX
ICS 33.180.20 ISBN 2-8318-7313-4
– 2 – 61300-3-16 © CEI:2003
SOMMAIRE
AVANT-PROPOS .4

1 Domaine d'application .8
2 Références normatives.8
3 Description générale.8
4 Appareillage.10
4.1 Méthode 1 – Analyse de surface bidimensionnelle.10
4.1.1 Support de ferrule.10
4.1.2 Etage de positionnement.10
4.1.3 Analyseur de surface bidimensionnel.10
4.2 Méthode 2 – Analyse de surface bidimensionnelle par système
d'interférométrie .12
4.2.1 Support de ferrule.12
4.2.2 Etage de positionnement.12
4.2.3 Analyseur bidimensionnel d’interférométrie.12
4.3 Méthode 3 – Analyse de surface tridimensionnelle par système
d'interférométrie .16
4.3.1 Support de ferrule.16
4.3.2 Etage de positionnement.16
4.3.3 Analyse tridimensionnelle d’interférométrie.18
5 Procédure.18
5.1 Régions de mesure .18
5.2 Méthode 1 – Analyse de surface bidimensionnelle.20
5.3 Méthode 2 – Analyse de surface bidimensionnelle par système
d'interférométrie .24
5.4 Méthode 3 – Analyse de surface tridimensionnelle par système
d'interférométrie .24
6 Détails à spécifier.26
6.1 Méthode 1 – Analyse de surface bidimensionnelle.26
6.2 Méthode 2 – Analyse de surface bidimensionnelle par système
d'interférométrie .26
6.3 Méthode 3 – Analyse de surface tridimensionnelle par système
d'interférométrie .26

Figure 1 – Rayon de courbure de la face terminale .8
Figure 2 – Appareillage pour l’analyse de surface bidimensionnelle .10
Figure 3 – Appareillage pour l'analyse de surface bidimensionnelle par système
d'interférométrie.14
Figure 4 – Appareillage pour l'analyse de surface tridimensionnelle par système
d'interférométrie.16
Figure 5 – Face terminale de la ferrule et régions de mesure.20
Figure 6 – Mesures pour le calcul du rayon de courbure par la méthode 1 .22
Figure 7 – Mesures pour le calcul du rayon de courbure .24

61300-3-16 © IEC:2003 – 3 –
CONTENTS
FOREWORD.5

1 Scope.9
2 Normative references.9
3 General description.9
4 Apparatus.11
4.1 Method 1 – Two-dimensional surface analysis .11
4.1.1 Ferrule holder.11
4.1.2 Positioning stage.11
4.1.3 Two-dimensional surface analyzer .11
4.2 Method 2 – Two-dimensional surface analysis by interferometry system.13
4.2.1 Ferrule holder.13
4.2.2 Positioning stage.13
4.2.3 Two-dimensional interferometry analyzer.13
4.3 Method 3 – Three-dimensional surface analysis by interferometry system .17
4.3.1 Ferrule holder.17
4.3.2 Positioning stage.17
4.3.3 Three-dimensional interferometry analyzer .19
5 Procedure.19
5.1 Measurement region.19
5.2 Method 1 – Two-dimensional surface analysis .21
5.3 Method 2 – Two-dimensional surface analysis by interferometry system.25
5.4 Method 3 – Three dimensional surface analysis by interferometry system .25
6 Details to be specified .27
6.1 Method 1 – Two-dimensional surface analysis .27
6.2 Method 2 – Two-dimensional surface analysis by interferometry system.27
6.3 Method 3 – Three-dimensional surface analysis by interferometry system .27

Figure 1 – Radius of curvature of the endface.9
Figure 2 – Apparatus for two-dimensional surface analysis .11
Figure 3 – Apparatus for two-dimensional surface analysis by interferometry system .15
Figure 4 – Apparatus for three-dimensional surface analysis by interferometry system .17
Figure 5 – Ferrule endface and measurement regions.21
Figure 6 – Measurements for calculating the radius of curvature with method 1 .23
Figure 7 – Measurements for calculating the radius of curvature.25

– 4 – 61300-3-16 © CEI:2003
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
___________
DISPOSITIFS D'INTERCONNEXION
ET COMPOSANTS PASSIFS À FIBRES OPTIQUES –
MÉTHODES FONDAMENTALES D'ESSAIS ET DE MESURES –

Partie 3-16: Examens et mesures –
Rayon de la face terminale des ferrules polies sphériquement

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