IEC TS 62396-2:2008

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

General Information

• Status: Replaced
• Publication Date: 18-Aug-2008
• ICS: 03.100.50 - Production. Production management
• ICS: 31.020 - Electronic components in general
• ICS: 49.060 - Aerospace electric equipment and systems
• Technical Committee: TC 107 - Process management for avionics
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 27-Sep-2012

Relations

• Replaces: IEC PAS 62396-2:2007 - Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
• Effective Date: 05-Sep-2023
• Replaced By: IEC 62396-2:2012 - Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
• Effective Date: 05-Sep-2023
• Revised: IEC 62396-2:2017 - Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC/TS 62396-2
Edition 1.0 2008-08
TECHNICAL
SPECIFICATION
Process management for avionics – Atmospheric radiation effects –
Part 2: Guidelines for single event effects testing for avionics systems

IEC/TS 62396-2:2008(E)
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IEC/TS 62396-2
Edition 1.0 2008-08
TECHNICAL
SPECIFICATION
Process management for avionics – Atmospheric radiation effects –
Part 2: Guidelines for single event effects testing for avionics systems

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
U
ICS 03.100.50; 31.020; 49.060 ISBN 2-8318-9958-3
– 2 – TS 62396-2 © IEC:2008(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5
1 Scope.6
2 Normative references .6
3 Terms and definitions .6
4 Abbreviations used in the document .6
5 Obtaining SEE data .7
5.1 Types of SEE data .7
5.2 Use of existing SEE data.7
5.3 Deciding to perform dedicated SEE tests.8
6 Availability of existing SEE data for avionics applications .8
6.1 Variability of SEE data .8
6.2 Types of existing SEE data that may be used.8
6.2.1 Sources of data, proprietary versus published data .9
6.2.2 Data based on the use of different sources.11
6.2.3 Ground level versus avionics applications .14
6.3 Sources of existing data .15
7 Considerations for SEE testing .16
7.1 General .16
7.2 Selection of hardware to be tested .17
7.3 Selection of test method.17
7.4 Selection of facility providing energetic particles .18
7.4.1 Radiation sources.18
7.4.2 Spallation neutron source .18
7.4.3 Monoenergetic and quasi-monoenergetic beam sources.19
7.4.4 Thermal neutron sources .20
8 Converting test results to avionics SEE rates .20
8.1 General .20
8.2 Use of spallation neutron source .20
8.3 Use of SEU cross section curve over energy .21

Bibliography.24

Figure 1 – Comparison of Los Alamos and TRIUMF neutron spectra with terrestrial
neutron spectrum.12
Figure 2 – Variation of high energy neutron SEU cross section per bit as a function of
device feature size.13
Figure 3 – Comparison of mono-energetic SEU cross sections with Weibull and Piece-
Wise Linear Fits.23

Table 1 – Sources of existing data .16

TS 62396-2 © IEC:2008(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 2: Guidelines for single event effects
testing for avionics systems
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
The main task of IEC technical committees is to prepare International Standards. In
exceptional circumstances, a technical committee may propose the publication of a technical
specification when
• the required support cannot be obtained for the publication of an International Standard,
despite repeated efforts, or
• the subject is still under technical development or where, for any other reason, there is the
future but no immediate possibility of an agreement on an International Standard.
Technical specifications are subject to review within three years of publication to decide
whether they can be transformed into International Standards.
IEC 62396-2, which is a technical specification, has been prepared by IEC technical
committee 107: Process management for avionics.

– 4 – TS 62396-2 © IEC:2008(E)
This standard cancels and replaces IEC/PAS 62396-2 published in 2007. This first edition
constitutes a technical revision.
The text of this standard is based on the following documents:
Enquiry draft Report on voting
107/80/DTS 107/86/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62396 series, under the general title Process management for
avionics – Atmospheric radiation effects, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• transformed into an International standard,
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended
A bilingual edition of this document may be issued at a later date.

TS 62396-2 © IEC:2008(E) – 5 –
INTRODUCTION
This industry-wide technical specification provides additional guidance to avionics systems
designers, electronic equipment component manufacturers and their customers to determine
the susceptibility of microelectronic devices to single event effects. It expands on the
information and guidance provided in IEC/TS 62396-1.
Guidance is provided on the use of existing single event effects (SEE), SEE data, sources of
data and the types of accelerated radiation sources used. Where SEE data is not available
considerations for testing is introduced including the suitable radiation sources for providing
avionics SEE data. The conversion of data obtained from differing radiation sources into
avionics SEE rates is detailed.

– 6 – TS 62396-2 © IEC:2008(E)
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 2: Guidelines for single event effects
testing for avionics systems
1 Scope
The purpose of this technical specification is to provide guidance related to the testing of
microelectronic devices for purposes of measuring their susceptibility to single event effects
(SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number
of different ways, using different kinds of radiation sources, it also shows how the test data
can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons
in the atmosphere at aircraft altitudes.
2 Normative references
The following referenced documents are indispensable for the application of this document,
only the edition cited applies. For undate
...