Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes

IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.

General Information

Status
Published
Publication Date
10-Dec-2019
Current Stage
PPUB - Publication issued
Completion Date
11-Dec-2019
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IEC 60747-5-11
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of
radiative and nonradiative currents of light emitting diodes
IEC 60747-5-11:2019-12(en)
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 60747-5-11
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of
radiative and nonradiative currents of light emitting diodes
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-7657-0

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – IEC 60747-5-11:2019 © IEC:2019
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms, definitions and abbreviated terms ........................................................................ 5

3.1 Terms and definitions .............................................................................................. 5

3.2 Abbreviated terms ................................................................................................... 6

4 Measuring methods ......................................................................................................... 7

4.1 Basic requirements ................................................................................................. 7

4.1.1 Measuring conditions ....................................................................................... 7

4.1.2 Measuring instruments and equipment ............................................................. 7

4.2 Radiative current (I ) measurement ..................................................................... 7

rad

4.2.1 Purpose ........................................................................................................... 7

4.2.2 Measurement procedure .................................................................................. 7

4.3 Nonradiative current (I ) measurement .......................................................... 7

nonrad

4.3.1 Purpose ........................................................................................................... 7

4.3.2 Measurement procedure .................................................................................. 7

4.4 Measurement sequence .......................................................................................... 8

5 Test report ....................................................................................................................... 8

Annex A (informative) Test example....................................................................................... 9

Annex B (informative) Background information ..................................................................... 12

Bibliography .......................................................................................................................... 13

Figure 1 – Sequence of the radiative and nonradiative current measurements ........................ 8

Figure A.1 – IQE and forward voltage as a function of forward current .................................... 9

Figure A.2 – Radiative current and forward voltage as a function of forward current ............. 10

Figure A.3 – Nonradiative current and forward voltage as a function of forward current ........ 10

Figure A.4 – Total forward current, radiative current, and nonradiative current plotted

as a function of forward voltage ............................................................................................ 11

Table A.1 – Summary of test report ....................................................................................... 11

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IEC 60747-5-11:2019 © IEC:2019 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-11: Optoelectronic devices – Light emitting diodes –
Test method of radiative and nonradiative currents
of light emitting diodes
FOREWORD

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International Standard IEC 60747-5-11 has been prepared by subcommittee 47E: Discrete

semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this International Standard is based on the following documents:
CDV Report on voting
47E/653/CDV 47E/678/RVC

Full information on the voting for the approval of this International Standard can be found in

the report on voting indicated in the above table.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

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– 4 – IEC 60747-5-11:2019 © IEC:2019

A list of all parts in the IEC 60747 series, published under the general title Semiconductor

devices, can be found on the IEC website.

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IEC 60747-5-11:2019 © IEC:2019 – 5 –
SEMICONDUCTOR DEVICES –
Part 5-11: Optoelectronic devices – Light emitting diodes –
Test method of radiative and nonradiative currents
of light emitting diodes
1 Scope

This part of IEC 60747 specifies the measuring methods of radiative and nonradiative currents

of single light emitting diode (LED) chips or packages without phosphor. White LEDs for

lighting applications are out of the scope of this document.
...

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