IEC 60747-5-11:2019
(Main)Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.
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IEC 60747-5-11 ®
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of
radiative and nonradiative currents of light emitting diodes
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IEC 60747-5-11 ®
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of
radiative and nonradiative currents of light emitting diodes
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-7657-0
– 2 – IEC 60747-5-11:2019 © IEC:2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 6
4 Measuring methods . 7
4.1 Basic requirements . 7
4.1.1 Measuring conditions . 7
4.1.2 Measuring instruments and equipment . 7
4.2 Radiative current (I ) measurement . 7
rad
4.2.1 Purpose . 7
4.2.2 Measurement procedure . 7
4.3 Nonradiative current (I ) measurement . 7
nonrad
4.3.1 Purpose . 7
4.3.2 Measurement procedure . 7
4.4 Measurement sequence . 8
5 Test report . 8
Annex A (informative) Test example. 9
Annex B (informative) Background information . 12
Bibliography . 13
Figure 1 – Sequence of the radiative and nonradiative current measurements . 8
Figure A.1 – IQE and forward voltage as a function of forward current . 9
Figure A.2 – Radiative current and forward voltage as a function of forward current . 10
Figure A.3 – Nonradiative current and forward voltage as a function of forward current . 10
Figure A.4 – Total forward current, radiative current, and nonradiative current plotted
as a function of forward voltage . 11
Table A.1 – Summary of test report . 11
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-11: Optoelectronic devices – Light emitting diodes –
Test method of radiative and nonradiative currents
of light emitting diodes
FOREWORD
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International Standard IEC 60747-5-11 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this International Standard is based on the following documents:
CDV Report on voting
47E/653/CDV 47E/678/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
– 4 – IEC 60747-5-11:2019 © IEC:2019
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
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SEMICONDUCTOR DEVICES –
Part 5-11: Optoelectronic devices – Light emitting diodes –
Test method of radiative and nonradiative currents
of light emitting diodes
1 Scope
This part of IEC 60747 specifies the measuring methods of radiative and nonradiative currents
of single light emitting diode (LED) chips or packages without phosphor. White LEDs for
lighting applications are out of the scope of this document. This document utilizes the internal
quantum efficiency (IQE) as a function of current, whose measurement methods are
discussed in other documents.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60747-5-6:2016, Semiconductor devices – Part 5-6: Optoelectronic devices – Light
emitting diodes
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1
internal quantum efficiency
η
IQE
ratio of the number of photons emitted from the active region per unit time to the number of
electrons injected into the LED per unit time
Φ hν
e,active
η =
IQE
Iq
F
where
Φ is the radiant power emitted from the active region
e,active
hν is the mean photon energy
I is the forward current
F
q is the elementary charge
[SOURCE: IEC 60747-5-8:2019, 3.2.4]
– 6 – IEC 60747-5-11:2019 © IEC:2019
3.1.2
radiative current
I
rad
current that is consumed by the radiative recombination process in the LED
3.1.3
nonradiative current
I
nonrad
current that is consumed by the nonradiative processes in the LED
Note 1 to entry: The nonradiative processes in the LED include the nonradiative recombination in the active
region and the carrier leakage outside the active region.
Note 2 to entry: The total forward current I supplied to the LED can be decomposed into radiative and
F
nonradiative currents:
II+ I .
F rad nonrad
Using the radiative and nonradiative currents, the IQE can be re-expressed as follows:
II
rad rad
η .
IQE
I II+
F rad nonrad
Using the above relations, the radiative and nonradiative currents can be expressed as follows:
I =ηI ;
rad IQE F
I =II−=(1−η )I .
nonrad F rad IQE F
Electrical power consumed by the radiative process (P ) in the LED can be expressed as follows:
rad
P IV η IV
rad rad F IQE
...
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