Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation

IEC/TS 62396-3:2008(E) provides guidance to those involved in the design of avionic systems and equipment and the resultant affects of atmospheric radiation induced Single Event Effects (SEE) on those avionic systems. The outputs of the activities and objectives described in this Technical Specification will become inputs to higher level certification activities and required evidences. It builds on the initial guidance on the system level approach to SEE in IEC/TS 62396-1, considers some avionic systems and provides basic methods to accommodate SEE so that system development assurance levels may be met.

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Status
Replaced
Publication Date
27-Aug-2008
Current Stage
DELPUB - Deleted Publication
Completion Date
25-Sep-2013
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IEC TS 62396-3:2008 - Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation Released:8/28/2008 Isbn:2831899923
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IEC/TS 62396-3
Edition 1.0 2008-08
TECHNICAL
SPECIFICATION
Process management for avionics – Atmospheric radiation effects –
Part 3: Optimising system design to accommodate the single event effects (SEE)
of atmospheric radiation
IEC/TS 62396-3:2008(E)
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IEC/TS 62396-3
Edition 1.0 2008-08
TECHNICAL
SPECIFICATION
Process management for avionics – Atmospheric radiation effects –
Part 3: Optimising system design to accommodate the single event effects
(SEE) of atmospheric radiation

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
T
ICS 03.100.50; 31.020; 49.060 ISBN 2-8318-9992-3
– 2 – TS 62396-3 © IEC:2008(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5
1 Scope and object.6
2 Normative references .6
3 Terms and definitions .6
4 Process guidance (see Annex A) .9
5 Atmospheric radiation and electronic system faults.10
5.1 Atmospheric radiation effects on avionics.10
5.2 Hard faults .11
5.3 Soft faults.12
6 Aircraft safety assessment.12
6.1 Methodology.12
6.2 Mitigation (see Annex B) .13
6.3 Specific electronic systems (see Annex C) .13
6.3.1 Level A systems .13
6.3.2 Level B systems .16
6.3.3 Level C systems .17
6.3.4 Level D and E systems .17
Annex A (informative) Design process flow diagram for SEE rates.18
Annex B (informative) Some mitigation method considerations for single event effects .19
Annex C (informative) Example systems .22
Bibliography.25

Figure C.1 – Electronic equipment (flight control computers) .22
Figure C.2 – Electronic equipment (flight director computers) .23
Figure C.3 – Electronic equipment (engine control).23
Figure C.4 – Electronically powered surface .24
Figure C.5 – Hydromechanical drive of surface – electronic valve control .24

Table 1 – Failure effect and occurrence probability .13

TS 62396-3 © IEC:2008(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 3: Optimising system design to accommodate
the single event effects (SEE) of atmospheric radiation

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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agreement between the two organizations.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
The main task of IEC technical committees is to prepare International Standards. In
exceptional circumstances, a technical committee may propose the publication of a technical
specification when
• the required support cannot be obtained for the publication of an International Standard,
despite repeated efforts, or
• The subject is still under technical development or where, for any other reason, there is
the future but no immediate possibility of an agreement on an International Standard.
Technical specifications are subject to review within three years of publication to decide
whether they can be transformed into International Standards.
IEC 62396-3, which is a Technical Specification, has been prepared by IEC technical
committee 107: Process management for avionics.

– 4 – TS 62396-3 © IEC:2008(E)
This technical specification cancels and replaces IEC/PAS 62396-3 published in 2007. This
first edition constitutes a technical revision.
The text of this standard is based on the following documents:
Enquiry draft Report on voting
107/84/DTS 107/87/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62396 series, under the general title Process management for
avionics – Atmospheric radiation effects, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• transformed into an International standard,
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended
A bilingual version of this publication may be issued at a later date.

TS 62396-3 © IEC:2008(E) – 5 –
INTRODUCTION
This industry-wide Technical Specification provides additional guidance to avionics systems
designers, electronic equipment, component manufacturers and their customers to adopt a
standard approach to optimise system design to accommodate atmospheric radiation single
event effects. It builds on the information and guidance on the system level approach to
Single Event Effects in IEC/TS 62396-1, considers some avionic systems and provides basic
methods to accommodate SEE so that System Hardware Assurance levels may be met.
Atmospheric radiation effects are one factor that could contribute to equipment hard and soft
fault rates. From a system safety perspective, using derived fault rate values, the existing
methodology described in ARP4754 (accommodation of hard and soft fault rates in general)
will also accommodate atmospheric radiation effect rates.

– 6 – TS 62396-3 © IEC:2008(E)
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 3: Optimising system design to accommodate
the single event effects (SEE) of atmospheric radiation

1 Scope and object
This Technical Specification is intended to provide guidance to those involved in the design of
avionic systems and equipment and the resultant affects of Atmospheric Radiation induced
Single Event Effects (SEE) on those avionic systems. The outputs of the activities and
objectives described in this Technical Specification will become inputs to higher level
certification activities and required evidences. It builds on the initial guidance on the system
level approach to Single Event Effects in IEC/TS 62396-1, considers some avionic systems
and provides basic methods to accommodate SEE so that System Development Assurance
levels may be met.
2 Normative references
The following referenced documents are indispensable for the application of this document,
only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
IEC/TS 62396-1, Process management for avionics – Atmospheric radiation effects – Part 1:
Accommodation of atmospheric radiation effects via single event effects within avionics
electronic equipment
IEC/TS 62239, Process management for avionics – Preparation of an electronic components
management plan
3 Terms and definitions
For the purpose of this document, the terms and definitions of the IEC/TS 62396-1,
IEC/TS 62239 and the following apply
3.1
Analogue Single Event Transient
ASET
deviation away from the expected operating output of the analogue
...

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