IEC 61010-031:2015/AMD1:2018

Amendment 1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement.

Amendement 1 - Règles de sécurité pour appareils électriques de mesurage, de régulation et de laboratoire - Partie 031: Exigences de sécurité pour sondes équipées portatives et manipulées à la main pour mesurage et essais électriques

General Information

• Status: Published
• Publication Date: 28-May-2018
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 19.080 - Electrical and electronic testing
• Technical Committee: TC 66 - Safety of measuring, control and laboratory equipment
• Drafting Committee: WG 2 - TC 66/WG 2
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 22-Dec-2022

Relations

• Amends: IEC 61010-031:2015 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test
• Effective Date: 05-Sep-2023
• Revised: IEC 61010-031:2022 - Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
GROUP SAFETY PUBLICATION
AMENDMENT 1
Safety requirements for electrical equipment for measurement, control and
laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe
assemblies for electrical test and measurement

IEC 61010-031:2015-05/AMD1:2018-05(en)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.

IEC Central Office Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

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bibliographical information on IEC International Standards, electrical terms containing 21 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.

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The advanced search enables to find IEC publications by a 67 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

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IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
GROUP SAFETY PUBLICATION
AMENDMENT 1
Safety requirements for electrical equipment for measurement, control and

laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe

assemblies for electrical test and measurement

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 19.080
ISBN 978-2-8322-5745-6
– 2 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
FOREWORD
This amendment has been prepared by IEC technical committee 66: Safety of measuring,

control and laboratory equipment.

The text of this standard is based on the following documents:

FDIS Report on voting
66/664/FDIS 66/670/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

_____________
Title
Replace the part title as follows:
Part 031: Safety requirements for hand-held and hand-manipulated
probe assemblies for electrical test and measurement

1 Scope and object
1.1.1 Probe assemblies included in scope
Figure 4 – Examples of Type D probe assemblies
Delete, in key 3, the words “or clamp”.

© IEC 2018
3 Terms and definitions
3.1.1
TERMINAL
Note 1 to entry:
Delete the word “connectors,”.

3.1.5
CONNECTOR
Delete, in the definition, the words “a CONNECTOR of” so that the end of the sentence will read:

“…to connect to a TERMINAL of the equipment or to another probe assembly”.
3.4.11
MEASUREMENT CATEGORY
Replace the existing text of the definition with the following:
classification of testing and measuring circuits according to the types of mains to which they
are intended to be connected
4 Tests
4.3.9 Duty cycle
Replace the existing title of 4.3.9 with the following:
4.3.9 Short-term or intermittent operation

4.4.4.2 Temperature
Replace the existing second paragraph with the following:
This temperature is determined by measuring the temperature rise of the surface or part and
adding it to the ambient temperature of 40 °C, or to the maximum RATED ambient temperature
if higher.
4.5.2 Fuses
Replace, in the fourth sentence of the second paragraph, the word “MAINS” (in SMALL CAPS)
with “mains” (in regular font).

5 Marking and documentation
5.1.5 RATING
Replace, in list item a) of the first paragraph, the words “(see also 5.4.3 f) and g))” with “(see
also 5.4.3 k))”.
– 4 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
6 Protection against electric shock

6.2.2 Examination
Figure 6 – Methods for determination of ACCESSIBLE parts (see 6.2) and for voltage tests

(see 6.4.2)
Replace the existing subfigures 6c and 6d with the following new subfigures:

Connecting parts are partially mated so as just to make electrical contact while allowing maximum access to the
test finger.
Note the two possible positions of the test finger.
Figure 6c – Partially mated probe assemblies (see 6.2 and 6.4.2 b))

Key
F rigid test finger (see Figure B.1)
H potentially HAZARDOUS LIVE part

Note the two possible positions of the test finger.
Figure 6d – Unmated parts of a probe assembly (see 6.2 and 6.4.2 c))

6.3.4.1 General
Replace, in the first paragraph, the existing list with the following:
a) the probe body;
b) hand-held or hand-manipulated parts of each CONNECTOR;
± 20 mm of the PROBE WIRE or the maximum length of the cable whichever is
c) 150 mm
shorter;
d) other hand-held or hand-manipulated parts.

© IEC 2018
Figure 8 – Voltage and touch current measurement

Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.2 Probe assemblies with floating outer conductors

Figure 10 – Voltage and touch current measurement with shielded test probe

Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.3 High frequency test probes
Replace, in the fourth paragraph, “the circuit from A.3” with “the circuit from Figure A.3”.

6.4.1 General
Replace, in the third paragraph, the existing list with the following list:
a) DOUBLE INSULATION, consisting of BASIC INSULATION plus SUPPLEMENTARY INSULATION (see
6.4.6)
b) BASIC INSULATION plus impedance (see 6.4.4);
c) REINFORCED INSULATION (see 6.4.6);
d) PROTECTIVE IMPEDANCE (see 6.4.5).

6.4.2 CONNECTORS
Add, at the end of the sentence of 6.4.2 c) 2), “(see Figure 5)”.

6.4.3.2 Protection by a PROTECTIVE FINGERGUARD
Replace the existing third paragraph with the following:

The height of the PROTECTIVE FINGERGUARD from the side where the fingers are intended to be
applied shall be at least 2 mm.

6.4.3.4 Protection by tactile indicator
Replace the existing first paragraph with the following:
SPRING-LOADED CLIPS RATED for MEASUREMENT CATEGORY II or without MEASUREMENT CATEGORY
for maximum 300 V which require finger pressure at about 90° to the axis of the clip are
acceptable without a PROTECTIVE FINGERGUARD, provided that there is a tactile indicator to
indicate the limit of safe access for the OPERATOR.

– 6 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
6.4.3.5 PROBE TIPS used as CONNECTORS

Replace the text with the following text:

PROBE TIPS which can be used as CONNECTORS and are intended to be connected to specified

accessories (for example to a SPRING-LOADED CLIP) shall, in combination with those

accessories, also meet the requirements for CONNECTORS in fully-mated position and partially-

mated position (see 6.4.2 a) and b)).

6.5.1.2.4 SOLID INSULATION
Delete the entire subclause including Table 4, Table 5, Figure 15, Figure 16 and Figure 17.

Add the following new subclause:
6.5.1.3 Solid insulation
The term “solid insulation” is used to describe many different types of construction, including
monolithic blocks of insulating material and insulation subsystems composed of multiple
insulating materials, organized in layers or otherwise.
The electric strength of a thickness of solid insulation is considerably greater than that of the
same thickness of air. The insulating distances through solid insulation are therefore typically
smaller than the distances through air. As a result, electric fields in solid insulation are
typically higher, and often are less homogeneous.
Solid insulation material may contain gaps or voids. When a solid insulation system is
constructed from layers of solid materials, there are also likely to be gaps or voids between
layers. These voids will perturb the electric field so that a disproportionately large part of the
electric field is located in the void, potentially causing ionization within the void, resulting in
partial discharge. These partial discharges will influence the adjacent solid insulation and may
reduce its service life.
Solid insulation is not a renewable medium: damage is cumulative over the life of the
equipment. Solid insulation is also subject to ageing and to degradation from repeated high
voltage testing.
Conformity is checked as specified in 6.5.2.5 and 6.5.2.6.

6.5.2.2 CLEARANCES for probe assemblies of MEASUREMENT CATEGORIES II, III and IV
Replace the existing Table 6 with the following:

© IEC 2018
Table 6 – CLEARANCES of probe assemblies RATED for MEASUREMENT CATEGORIES

Nominal a.c. r.m.s. CLEARANCE
line-to-neutral or
d.c. voltage of mm
mains to which the
BASIC INSULATION
probe assembly is
REINFORCED INSULATION
and SUPPLEMENTARY INSULATION
designed to be
connected
MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT

CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
V
0,04 0,1 0,5 0,10 0,32 1,4
≤ 50
> 50 ≤ 100 0,1 0,5 1,5 0,32 1,4 3,0

> 100 ≤ 150 0,5 1,5 3,0 1,4 3,0 6,0
1,5 3,0 5,5 3,0 6,0 10,4
> 150 ≤ 300
3,0 5,5 8 6,0 10,4 15
> 300 ≤ 600
> 600 ≤ 1 000 5,5 8 14 10,4 15 23,9
8 11 18 16 22 36
> 1 000 ≤ 1 500
14 18 22 28 36 44
> 1 500 ≤ 2 000
> 2 000 ≤ 3 000 18 22 25 36 44 50

Replace, in the conformity statement, the word “clearance” with “CLEARANCE” (in SMALL CAPS).

6.5.2.3.1 General
Replace, in the second paragraph, the words “required clearance” with “required CLEARANCE”.
Add the following two new subclauses, Table 4, Table 5, Table 14, Figure 15, Figure 16 and
Figure 17:
6.5.2.5 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES
6.5.2.5.1 General
6.5.2.5.1.1 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES shall
withstand the electrical and mechanical stresses that may occur in NORMAL USE and in all
RATED environmental conditions (see 1.4) during the intended life of the probe assembly.

The manufacturer should take the expected life of the probe assembly into account when
selecting insulating materials.
Conformity is checked by both of the following tests:
a) the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s using the applicable test
voltage of Table 4 or the impulse voltage test of 6.6.5.3 using the applicable test voltage
of Table 14;
b) the a.c. voltage test of 6.6.5.1 or if stressed only by d.c., the d.c. voltage test of 6.6.5.2,
with a duration of at least 1 min using the test voltage determined by 6.5.2.5.1.2.
NOTE Test a) checks the effects of transient overvoltages, while test b) checks the effects of long-term stress of
solid insulation.
– 8 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
Table 4 – a.c. test voltages for testing electric strength

of solid insulation in probe assemblies RATED for MEASUREMENT CATEGORIES

a.c. test voltage
Nominal a.c. r.m.s.
line-to-neutral or
V r.m.s
d.c. voltage of
mains being BASIC INSULATION
REINFORCED INSULATION
measured and SUPPLEMENTARY INSULATION

MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
V
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV

370 500 840 500 720 1300
≤ 50
> 50 ≤ 100 500 840 1 400 720 1 300 2 200
840 1 400 2 200 1 300 2 200 3 500
> 100 ≤ 150
1 400 2 200 3 300 2 200 3 500 5 100
> 150 ≤ 300
2 200 3 300 4 300 3 500 5 100 7 000
> 300 ≤ 600
> 600 ≤ 1 000 3 300 4 300 6 600 5 100 7 000 10 000
4 300 5 400 8 200 7 400 9 700 15 000
> 1 000 ≤ 1 500
6 600 8 200 9 700 12 000 15 000 18 000
> 1 500 ≤ 2 000
> 2 000 ≤ 3 000 8 200 9 700 11 000 15 000 18 000 20 000

Table 14 – Impulse test voltages for testing electric strength
of solid insulation in probe as
...

IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ

AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and
laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe
assemblies for electrical test and measurement

Règles de sécurité pour appareils électriques de mesurage, de régulation et de
laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et
manipulées à la main pour mesurage et essais électriques

IEC 61010-031:2015-05/AMD1:2018-05(en-fr)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

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and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

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IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ

AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and

laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe

assemblies for electrical test and measurement

Règles de sécurité pour appareils électriques de mesurage, de régulation et de

laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et

manipulées à la main pour mesurage et essais électriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 19.080 ISBN 978-2-8322-6159-0

– 2 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
FOREWORD
This amendment has been prepared by IEC technical committee 66: Safety of measuring,
control and laboratory equipment.
This bilingual version (2018-10) corresponds to the monolingual English version, published in
2018-05.
The text of this standard is based on the following documents:
FDIS Report on voting
66/664/FDIS 66/670/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The French version of this amendment has not been voted upon.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Title
Replace the part title as follows:
Part 031: Safety requirements for hand-held and hand-manipulated
probe assemblies for electrical test and measurement

1 Scope and object
1.1.1 Probe assemblies included in scope
Figure 4 – Examples of Type D probe assemblies
Delete, in key 3, the words “or clamp”.

© IEC 2018
3 Terms and definitions
3.1.1
TERMINAL
Note 1 to entry:
Delete the word “connectors,”.
3.1.5
CONNECTOR
Delete, in the definition, the words “a CONNECTOR of” so that the end of the sentence will read:
“…to connect to a TERMINAL of the equipment or to another probe assembly”.
3.4.11
MEASUREMENT CATEGORY
Replace the existing text of the definition with the following:
classification of testing and measuring circuits according to the types of mains to which they
are intended to be connected
4 Tests
4.3.9 Duty cycle
Replace the existing title of 4.3.9 with the following:
4.3.9 Short-term or intermittent operation

4.4.4.2 Temperature
Replace the existing second paragraph with the following:
This temperature is determined by measuring the temperature rise of the surface or part and
adding it to the ambient temperature of 40 °C, or to the maximum RATED ambient temperature
if higher.
4.5.2 Fuses
Replace, in the fourth sentence of the second paragraph, the word “MAINS” (in SMALL CAPS)
with “mains” (in regular font).

5 Marking and documentation
5.1.5 RATING
Replace, in list item a) of the first paragraph, the words “(see also 5.4.3 f) and g))” with “(see
also 5.4.3 k))”.
– 4 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6 Protection against electric shock
6.2.2 Examination
Figure 6 – Methods for determination of ACCESSIBLE parts (see 6.2) and for voltage tests
(see 6.4.2)
Replace the existing subfigures 6c and 6d with the following new subfigures:

Connecting parts are partially mated so as just to make electrical contact while allowing maximum access to the
test finger.
Note the two possible positions of the test finger.
Figure 6c – Partially mated probe assemblies (see 6.2 and 6.4.2 b))

Key
F rigid test finger (see Figure B.1)
H potentially HAZARDOUS LIVE part
Note the two possible positions of the test finger.
Figure 6d – Unmated parts of a probe assembly (see 6.2 and 6.4.2 c))

6.3.4.1 General
Replace, in the first paragraph, the existing list with the following:
a) the probe body;
b) hand-held or hand-manipulated parts of each CONNECTOR;
c) 150 mm ± 20 mm of the PROBE WIRE or the maximum length of the cable whichever is
shorter;
d) other hand-held or hand-manipulated parts.

© IEC 2018
Figure 8 – Voltage and touch current measurement
Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.2 Probe assemblies with floating outer conductors
Figure 10 – Voltage and touch current measurement with shielded test probe
Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.3 High frequency test probes
Replace, in the fourth paragraph, “the circuit from A.3” with “the circuit from Figure A.3”.

6.4.1 General
Replace, in the third paragraph, the existing list with the following list:
a) DOUBLE INSULATION, consisting of BASIC INSULATION plus SUPPLEMENTARY INSULATION (see
6.4.6)
b) BASIC INSULATION plus impedance (see 6.4.4);
c) REINFORCED INSULATION (see 6.4.6);
d) PROTECTIVE IMPEDANCE (see 6.4.5).

6.4.2 CONNECTORS
Add, at the end of the sentence of 6.4.2 c) 2), “(see Figure 5)”.

6.4.3.2 Protection by a PROTECTIVE FINGERGUARD
Replace the existing third paragraph with the following:
The height of the PROTECTIVE FINGERGUARD from the side where the fingers are intended to be
applied shall be at least 2 mm.

6.4.3.4 Protection by tactile indicator
Replace the existing first paragraph with the following:
SPRING-LOADED CLIPS RATED for MEASUREMENT CATEGORY II or without MEASUREMENT CATEGORY
for maximum 300 V which require finger pressure at about 90° to the axis of the clip are
acceptable without a PROTECTIVE FINGERGUARD, provided that there is a tactile indicator to
indicate the limit of safe access for the OPERATOR.

– 6 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6.4.3.5 PROBE TIPS used as CONNECTORS
Replace the text with the following text:
PROBE TIPS which can be used as CONNECTORS and are intended to be connected to specified
accessories (for example to a SPRING-LOADED CLIP) shall, in combination with those
accessories, also meet the requirements for CONNECTORS in fully-mated position and partially-
mated position (see 6.4.2 a) and b)).

OLID INSULATION
6.5.1.2.4 S
Delete the entire subclause including Table 4, Table 5, Figure 15, Figure 16 and Figure 17.

Add the following new subclause:
6.5.1.3 Solid insulation
The term “solid insulation” is used to describe many different types of construction, including
monolithic blocks of insulating material and insulation subsystems composed of multiple
insulating materials, organized in layers or otherwise.
The electric strength of a thickness of solid insulation is considerably greater than that of the
same thickness of air. The insulating distances through solid insulation are therefore typically
smaller than the distances through air. As a result, electric fields in solid insulation are
typically higher, and often are less homogeneous.
Solid insulation material may contain gaps or voids. When a solid insulation system is
constructed from layers of solid materials, there are also likely to be gaps or voids between
layers. These voids will perturb the electric field so that a disproportionately large part of the
electric field is located in the void, potentially causing ionization within the void, resulting in
partial discharge. These partial discharges will influence the adjacent solid insulation and may
reduce its service life.
Solid insulation is not a renewable medium: damage is cumulative over the life of the
equipment. Solid insulation is also subject to ageing and to degradation from repeated high
voltage testing.
Conformity is checked as specified in 6.5.2.5 and 6.5.2.6.

6.5.2.2 CLEARANCES for probe assemblies of MEASUREMENT CATEGORIES II, III and IV
Replace the existing Table 6 with the following:

IEC 61010-031:2015
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