IEC 61671:2012
(Main)Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEC 61671:2012(E) defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.
General Information
Standards Content (Sample)
IEC 61671
Edition 1.0 2012-06
™
IEEE Std 1671
INTERNATIONAL
STANDARD
Automatic Test Markup Language (ATML) for Exchanging Automatic Test
Equipment and Test Information via XML
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IEC 61671
Edition 1.0 2012-06
IEEE Std 1671™
INTERNATIONAL
STANDARD
Automatic Test Markup Language (ATML) for Exchanging Automatic Test
Equipment and Test Information via XML
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XH
ICS 25.040; 35.060 ISBN 978-2-83220-104-6
– ii – IEEE Std 1671-2010
Contents
1. Overview . 1
1.1 General . 1
1.2 Scope . 2
1.3 Purpose . 2
1.4 Application . 3
1.5 Conventions used in this document . 4
2. Normative references . 6
3. Definitions, acronyms, and abbreviations. 7
3.1 Definitions . 7
3.2 Acronyms and abbreviations . 10
4. Automatic test system (ATS) architecture . 12
4.1 Automatic test equipment (ATE) . 12
4.2 Test program set (TPS) . 15
4.3 Automatic diagnosis and testing . 18
5. Automatic test markup language (ATML) . 19
5.1 ATS architecture elements addressed by ATML . 20
6. The ATML framework . 22
6.1 External interfaces . 22
6.2 Internal models . 23
6.3 Services . 23
7. ATML specification techniques . 25
7.1 ATML common element partitioning . 25
7.2 ATML XML schemas . 28
7.3 XML schemas and their use in ATML . 28
7.4 UML models . 28
8. The ATML framework subdomains . 29
8.1 The ATML framework and ATML family component standards . 29
8.2 ATML subdomains . 29
9. ATML XML schema names and locations . 36
10. ATML XML schema extensibility . 39
11. Conformance . 40
11.1 ATML family XML schemas . 40
11.2 The ATML framework . 40
Annex A (normative) XML schema style guidelines . 46
A.1 Naming conventions . 46
A.2 XML declaration . 48
A.3 ATML namespaces . 48
A.4 Versioning. 50
A.5 Documentation . 51
A.6 Design . 52
Published by IEC under license from IEEE. © 2010 IEEE. All rights reserved.
IEEE Std 1671-2010 – iii –
Annex B (normative) ATML common element schemas . 55
B.1 Common element schema—Common.xsd . 55
B.2 Common element schema—HardwareCommon.xsd . 136
B.3 Common element schema—TestEquipment.xsd . 227
Annex C (normative) ATML internal model schemas . 258
C.1 ATML internal model schema—Capabilities.xsd . 258
C.2 ATML internal model schema—WireLists.xsd . 260
Annex D (normative) ATML runtime services . 267
D.1 Messages . 267
D.2 Executive system service . 267
D.3 Example WSDL service definition . 268
Annex E (informative) Pins, ports, connectors, and wire lists in ATML . 269
E.1 Introduction . 269
E.2 Overview of the base types . 270
E.3 Using ports, pins, and connectors together . 273
E.4 Ports, pins, and capabilities . 275
E.5 Wire lists . 278
Annex F (informative) ATML capabilities . 283
F.1 Introduction . 283
F.2 Overview . 285
F.3 Describing instrument capabilities . 289
F.4 Describing ATS capabilities . 328
F.5 Capability information in ATML Test Description . 332
Annex G (informative) IEEE download Web site material associated with this document . 339
Annex H (informative) ATS architectures. 340
H.1 ATS architectures utilization of published standards . 340
H.2 ATS architectural relationships to IEEE SCC20-based standards . 343
H.3 ATS architectural ATML subdomain relationship to SIMICA standards. 343
Annex I (informative) Architecture examples . 347
I.1 Instruments . 347
I.2 Test descriptions . 348
I.3 Complete testing scenario . 350
I.4 Integrated ATML system . 363
Annex J (informative) UML models . 367
J.1 Generic ATS testing of a UUT . 367
J.2 ATML XML schema relationships . 369
Annex K (informative) Glossary . 372
Annex L (informative) Bibliography . 375
Annex M (informative) IEEE List of Participants . 380
Published by IEC
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