ISO 24465:2023

Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device

This document describes a method for determining the minimum detectability of surface plasmon resonance device. This document is applicable to surface plasmon resonance devices of the white-light illumination type and the laser illumination type with the angle scanning capability.

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General Information

• Status: Published
• Publication Date: 09-Jan-2023
• ICS: 71.040.40 - Chemical analysis
• Technical Committee: ISO/TC 201 - Surface chemical analysis
• Drafting Committee: ISO/TC 201/WG 5 - Optical interface analysis
• Current Stage: 6060 - International Standard published
• Start Date: 10-Jan-2023
• Due Date: 10-Oct-2022
• Completion Date: 10-Jan-2023

Standards Content (Sample)

INTERNATIONAL ISO
STANDARD 24465
First edition
2023-01
Surface chemical analysis —
Determination of the minimum
detectability of surface plasmon
resonance device
Reference number
ISO 24465:2023(E)
© ISO 2023

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ISO 24465:2023(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2023
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
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Published in Switzerland
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ISO 24465:2023(E)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms, definitions and abbreviated terms . 1
3.1 Terms and definitions . 1
3.2 Abbreviated terms . 1
4 General information . 1
4.1 Overview . 1
4.2 White light excitation type . 2
4.3 Laser illumination type . 3
5 Outline of proposed method .3
6 Instrument of operation conditions . 4
6.1 General . 4
6.2 Alignment of optics including incident light . 4
6.3 Sensor chip . 4
6.4 Cleanness of optics . 5
6.5 Temperature . 5
6.6 Flow rate . 5
7 Standard sample preparation . 5
8 Data acquisition .6
8.1 Data collection and analysis . 6
8.2 Recording of the data . . 8
Bibliography . 9
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ISO 24465:2023(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
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ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
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www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 201, Surface chemical analysis.
Any feedback or questions on this document should be directed to the user’s national standards body. A
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ISO 24465:2023(E)
Introduction
The surface plasmon resonance (SPR) is the term used for the real time chemical contents analysing
device. The chemical ingredient dissolved in buffer solvent causes the dielectric constant change
compared to the buffer solvent. Changes in the dielectric constant of the solution modify the resonance
condition of the surface plasmon coupling at the interface between metal (mostly gold or functionalized
gold) and solution channel. So the reflection from the interface has the dip corresponding to the surface
plasmon components which is evanescent. The change of the reflection spectrum is analysed by a
charge coupled device (CCD) and the change of the spectrum dip represents the absolute amount of
the surface existing chemical component at the interface. The determination of the dynamic range of
the chemical analysis depends on the upper limit and lower limit of the detectability of the SPR device.
The objective of this document is to provide the standardized definition of lower limit of detection and
experimental protocol of measuring the lowest detectability of the SPR device. To avoid the complex
and unwanted chemical interaction between the metal surface and the analyte, a single chemical
solute method is presented, suitable for use by non-expert operators. That provides users with the
fundamental capability of the SPR device.
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INTERNATIONAL STANDARD ISO 24465:2023(E)
Surface chemical analysis — Determination of the
minimum detectability of surface plasmon resonance
device
1 Scope
This document describes a method for determining the minimum detectability of surface plasmon
resonance device. This document is applicable to surface plasmon resonance devices of the white-light
illumination type and the laser illumination type with the angle scanning capability.
2 Normative references
There are no normative references in this document.
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
3.1.1
sensorgram
graph of responses versus time in surface plasmon resonance studies
3.2 Abbreviated terms
SPR surface plasmon resonance
RU response unit
CCD charge coupled device
SD standard deviation
DI deionized
4 General information
4.1 Overview
Surface plasmon is the light-matter interaction due to the collective longitudinal coupling between the
surface electrons and the excitation light at the metal/dielectric interface. The dispersion relation of
surface plasmon mainly depends on the dielectric functions of metal and dielectric materials, thus the
change of the dielectric constant of the dielectric material can change the resonant coupling of surface
plasmon in different wavelength ranges. The coupled surface plasmon is basically an evanescent wave,
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ISO 24465:2023(E)
so it does not propagate into the far field. Finally, spectral analysis of the reflected light reveals the
wavelength range which the surface plasmon is coupled resonantly. The most widely-used geometry
of the SPR is known as Kretschmann geometry. In the white light illumination type, the position of the
dip tells the changes of the dielectric constant; and in the case of laser illumination, the reflected laser
intensity or the resonant angle is changed by dielectric constant of the analyte. Both measurements
provide with the dielectric constant changes of the targeted analyte. For example, the Kretschmann
geometry is composed of a metal-coated prism as shown in Figure 1.
Key
1 light source
2 molecular layer
3 glass prism
4 photodiode
5 metal film
a
Incidence angle.
NOTE Kretschmann gemeotry with total internal reflection in the glass prism. The evanescent field on the
metal film interacts with the molecular layer via surface plasmon coupling.
Figure 1 — Schematic diagram of Kretschmann geometry
The excitation light is incident on the side surface of the prism and totally reflected at the interface
be
...