Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device

This document describes a method for determining the minimum detectability of surface plasmon resonance device. This document is applicable to surface plasmon resonance devices of the white-light illumination type and the laser illumination type with the angle scanning capability.

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Status
Published
Publication Date
09-Jan-2023
Current Stage
6060 - International Standard published
Due Date
10-Oct-2022
Completion Date
10-Jan-2023
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ISO 24465:2023 - Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device Released:10. 01. 2023
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INTERNATIONAL ISO
STANDARD 24465
First edition
2023-01
Surface chemical analysis —
Determination of the minimum
detectability of surface plasmon
resonance device
Reference number
ISO 24465:2023(E)
© ISO 2023
---------------------- Page: 1 ----------------------
ISO 24465:2023(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2023

All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may

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Published in Switzerland
© ISO 2023 – All rights reserved
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ISO 24465:2023(E)
Contents Page

Foreword ........................................................................................................................................................................................................................................iv

Introduction .................................................................................................................................................................................................................................v

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ..................................................................................................................................................................................... 1

3 Terms, definitions and abbreviated terms .............................................................................................................................. 1

3.1 Terms and definitions ...................................................................................................................................................................... 1

3.2 Abbreviated terms .............................................................................................................................................................................. 1

4 General information ......................................................................................................................................................................................... 1

4.1 Overview ...................................................................................................................................................................................................... 1

4.2 White light excitation type .......................................................................................................................................................... 2

4.3 Laser illumination type .................................................................................................................................................................. 3

5 Outline of proposed method ....................................................................................................................................................................3

6 Instrument of operation conditions ................................................................................................................................................ 4

6.1 General ........................................................................................................................................................................................................... 4

6.2 Alignment of optics including incident light ................................................................................................................ 4

6.3 Sensor chip ................................................................................................................................................................................................. 4

6.4 Cleanness of optics .............................................................................................................................................................................. 5

6.5 Temperature ............................................................................................................................................................................................. 5

6.6 Flow rate ...................................................................................................................................................................................................... 5

7 Standard sample preparation ................................................................................................................................................................ 5

8 Data acquisition ....................................................................................................................................................................................................6

8.1 Data collection and analysis ....................................................................................................................................................... 6

8.2 Recording of the data ........................................................................................................................................... ............................. 8

Bibliography ................................................................................................................................................................................................................................ 9

iii
© ISO 2023 – All rights reserved
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ISO 24465:2023(E)
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards

bodies (ISO member bodies). The work of preparing International Standards is normally carried out

through ISO technical committees. Each member body interested in a subject for which a technical

committee has been established has the right to be represented on that committee. International

organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.

ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of

electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the

different types of ISO documents should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of

any patent rights identified during the development of the document will be in the Introduction and/or

on the ISO list of patent declarations received (see www.iso.org/patents).

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expressions related to conformity assessment, as well as information about ISO's adherence to

the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see

www.iso.org/iso/foreword.html.

This document was prepared by Technical Committee ISO/TC 201, Surface chemical analysis.

Any feedback or questions on this document should be directed to the user’s national standards body. A

complete listing of these bodies can be found at www.iso.org/members.html.
© ISO 2023 – All rights reserved
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ISO 24465:2023(E)
Introduction

The surface plasmon resonance (SPR) is the term used for the real time chemical contents analysing

device. The chemical ingredient dissolved in buffer solvent causes the dielectric constant change

compared to the buffer solvent. Changes in the dielectric constant of the solution modify the resonance

condition of the surface plasmon coupling at the interface between metal (mostly gold or functionalized

gold) and solution channel. So the reflection from the interface has the dip corresponding to the surface

plasmon components which is evanescent. The change of the reflection spectrum is analysed by a

charge coupled device (CCD) and the change of the spectrum dip represents the absolute amount of

the surface existing chemical component at the interface. The determination of the dynamic range of

the chemical analysis depends on the upper limit and lower limit of the detectability of the SPR device.

The objective of this document is to provide the standardized definition of lower limit of detection and

experimental protocol of measuring the lowest detectability of the SPR device. To avoid the complex

and unwanted chemical interaction between the metal surface and the analyte, a single chemical

solute method is presented, suitable for use by non-expert operators. That provides users with the

fundamental capability of the SPR device.
© ISO 2023 – All rights reserved
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INTERNATIONAL STANDARD ISO 24465:2023(E)
Surface chemical analysis — Determination of the
minimum detectability of surface plasmon resonance
device
1 Scope

This document describes a method for determining the minimum detectability of surface plasmon

resonance device. This document is applicable to surface plasmon resonance devices of the white-light

illumination type and the laser illumination type with the angle scanning capability.

2 Normative references
There are no normative references in this document.
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminology databases for use in standardization at the following addresses:

— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
3.1.1
sensorgram
graph of responses versus time in surface plasmon resonance studies
3.2 Abbreviated terms
SPR surface plasmon resonance
RU response unit
CCD charge coupled device
SD standard deviation
DI deionized
4 General information
4.1 Overview

Surface plasmon is the light-matter interaction due to the collective longitudinal coupling between the

surface electrons and the excitation light at the metal/dielectric interface. The dispersion relation of

surface plasmon mainly depends on the dielectric functions of metal and dielectric materials, thus the

change of the dielectric constant of the dielectric material can change the resonant coupling of surface

plasmon in different wavelength ranges. The coupled surface plasmon is basically an evanescent wave,

© ISO 2023 – All rights reserved
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ISO 24465:2023(E)

so it does not propagate into the far field. Finally, spectral analysis of the reflected light reveals the

wavelength range which the surface plasmon is coupled resonantly. The most widely-used geometry

of the SPR is known as Kretschmann geometry. In the white light illumination type, the position of the

dip tells the changes of the dielectric constant; and in the case of laser illumination, the reflected laser

intensity or the resonant angle is changed by dielectric constant of the analyte. Both measurements

provide with the dielectric constant changes of the targeted analyte. For example, the Kretschmann

geometry is composed of a metal-coated prism as shown in Figure 1.
Key
1 light source
2 molecular layer
3 glass prism
4 photodiode
5 metal film
Incidence angle.

NOTE Kretschmann gemeotry with total internal reflection in the glass prism. The evanescent field on the

metal film interacts with the molecular layer via surface plasmon coupling.
Figure 1 — Schematic diagram of Kretschmann geometry

The excitation light is incident on the side surface of the prism and totally reflected at the interface

...

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