ISO/TS 18507:2015

Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis

ISO/TS 18507:2015 provides a framework on the uses of Total Reflection X-Ray Fluorescence (TXRF) spectroscopy for elemental qualitative and quantitative analysis of biological and environmental samples. It is meant to help technicians, biologist, doctors, environmental scientists, and environmental engineers to understand the possible uses of TXRF for elemental analysis by providing the guidelines for the characterization of biological and environmental samples with TXRF spectroscopy. Measurements can be made on equipment of various configurations, from laboratory instruments to synchrotron radiation beamlines or automated systems used in industry. ISO/TS 18507:2015 provides guidelines for the characterization of biological and environmental samples with TXRF spectroscopy. It includes the following: (a) description of the relevant terms; (b) sample preparation; (c) experimental procedure; (d) discussions on data analysis and result interpretation; (e) uncertainty; (f) case studies; and (g) references.

Analyse chimique des surfaces — Utilisation de réflexion spectroscopie des rayons X de fluorescence totale dans l'analyse biologique et de l'environnement

General Information

• Status: Published
• Publication Date: 21-Jul-2015
• ICS: 71.040.40 - Chemical analysis
• Technical Committee: ISO/TC 201 - Surface chemical analysis
• Drafting Committee: ISO/TC 201 - Surface chemical analysis
• Current Stage: 9093 - International Standard confirmed
• Completion Date: 07-Nov-2023

Standards Content (Sample)

TECHNICAL ISO/TS
SPECIFICATION 18507
First edition
2015-07-15
Surface chemical analysis — Use of
Total Reflection X-ray Fluorescence
spectroscopy in biological and
environmental analysis
Analyse chimique des surfaces — Utilisation de réflexion
spectroscopie des rayons X de fluorescence totale dans l’analyse
biologique et de l’environnement
Reference number
ISO/TS 18507:2015(E)
©
ISO 2015

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ISO/TS 18507:2015(E)

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ii © ISO 2015 – All rights reserved

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ISO/TS 18507:2015(E)

Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols, and abbreviated terms . 1
3.1 Terms and definitions . 1
3.2 Symbols and abbreviated terms. 2
4 Background . 2
4.1 Preliminary remarks . 2
5 Instrumentation . 4
5.1 Instrumental requirements. 4
5.1.1 X-ray sources of radiation . 4
5.1.2 Monochromator . 5
5.1.3 Detector . 5
5.1.4 Sample station . . . 6
5.1.5 Critical and glancing angle . 6
5.2 Quality control of TXRF spectrometer . 7
5.2.1 Stability check of X-ray beam . 7
5.2.2 Spectroscopic resolution . 7
5.2.3 Energy calibration .
...