ISO 23124:2024
(Main)Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
This document describes a method for measuring the spatial resolutions, lateral and axial, of the Raman microscope.
Analyse chimique des surfaces — Mesurage des résolutions latérale et axiale d'un microscope Raman
General Information
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Standards Content (Sample)
International
Standard
ISO 23124
First edition
Surface chemical analysis —
2024-04
Measurement of lateral and axial
resolutions of a Raman microscope
Analyse chimique des surfaces — Mesurage des résolutions
latérale et axiale d'un microscope Raman
Reference number
ISO 23124:2024(en) © ISO 2024
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ISO 23124:2024(en)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
© ISO 2024 – All rights reserved
ii
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ISO 23124:2024(en)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 General information . 1
4.1 Outline of the method . .1
4.2 Lateral resolution . .2
4.3 Axial resolution .2
5 Sample requirements . 3
5.1 Selection of the sample and sample requirement to measure the lateral resolution .3
5.2 Selection of the sample and sample requirement to measure the axial resolution .3
6 Experimental parameters to be specified . 3
6.1 Overview .3
6.2 Numerical aperture of objective lens .3
6.3 Size of confocal pinhole or the optics which works with similar function .4
6.4 Setting the parameters before the operation of the instrument .4
7 Data acquisition . 5
7.1 Data collection and analysis for lateral resolution .5
7.2 Data collection and analysis for axial resolution .
...
FINAL DRAFT
International
Standard
ISO/FDIS 23124
ISO/TC 201
Surface chemical analysis —
Secretariat: JISC
Measurement of lateral and axial
Voting begins on:
resolutions of a Raman microscope
2024-01-25
Voting terminates on:
2024-03-21
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
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AND TO PROVIDE SUPPOR TING DOCUMENTATION.
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BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
Reference number
ISO/FDIS 23124:2024(en) © ISO 2024
---------------------- Page: 1 ----------------------
FINAL DRAFT
ISO/FDIS 23124:2024(en)
International
Standard
ISO/FDIS 23124
ISO/TC 201
Surface chemical analysis —
Secretariat: JISC
Measurement of lateral and axial
Voting begins on:
resolutions of a Raman microscope
Voting terminates on:
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
COPYRIGHT PROTECTED DOCUMENT
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
© ISO 2024
IN ADDITION TO THEIR EVALUATION AS
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
or ISO’s member body in the country of the requester.
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland Reference number
ISO/FDIS 23124:2024(en) © ISO 2024
© ISO 2024 – All rights reserved
ii
---------------------- Page: 2 ----------------------
ISO/FDIS 23124:2024(en)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 General information . 1
4.1 Outline of proposed method .1
4.2 Lateral resolution . .2
4.3 Axial resolution .2
5 Sample requirements . 3
5.1 Selection of the sample and sample requirement to measure the lateral resolution .3
5.2 Selection of the sample and sample requirement to measure the axial resolution .3
6 Experimental parameters to be specified .
...
ISO/DIS FDIS 23124 :2023(E)
Date: 2023-11-05
ISO /TC 201/ WG 5
Secretariat: JISC
Date: 2024-01-11
Surface chemical analysis — Measurement of lateral and axial
resolutions of a Raman microscope
FDIS stage
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ISO/DIS FDIS 23124:20232024(E)
© ISO 20232024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this
publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical,
including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can
be requested from either ISO at the address below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: + 41 22 749 01 11
Fax: +41 22 749 09 47
EmailE-mail: copyright@iso.org
Website: www.iso.orgwww.iso.org
Published in Switzerland
ii © ISO 2023 – All rights reserved
© ISO 2024 – All rights reserved
ii
---------------------- Page: 2 ----------------------
ISO/DIS FDIS 23124:20232024(E)
Contents
Foreword . v
Introduction . vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 General information . 2
4.1 Outline of proposed method . 2
4.2 Lateral resolution . 2
4.3 Axial resolution . 3
5 Sample requirements . 4
5.1 Selection of the sample and sample requirement to measure the lateral resolution . 4
5.2 Selection of the sample and sample requirement to measure the axial resolution . 4
6 Experimental parameters to be specified . 5
6.1 Overview . 5
6.2 Numerical aperture of objective lens . 5
6.3 Size of confocal pinhole or the optics which works with similar function . 5
6.4 Setting the parameters before the operation of the instrument . 5
7 Data acquisition . 6
7.1 Data collection and analysis for lateral resolution . 6
7.2 Data collection and analysis for axial resolution . 6
7.3 Recording of the data . 6
Annex A (informative) Examples using dispersed carbon nanotubes and suspended graphene as samples
.
...
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