Optics and photonics — Test methods for telescopic systems — Part 6: Test methods for veiling glare index

ISO 14490-6:2014 specifies the test methods for the determination of the veiling glare index of telescopic systems and observational telescopic instruments.

Optique et photonique — Méthodes d'essai pour systèmes télescopiques — Partie 6: Méthodes d'essai de l'indice de lumière parasite

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Status
Published
Publication Date
16-Oct-2014
Current Stage
9093 - International Standard confirmed
Completion Date
20-Aug-2020
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ISO 14490-6:2014 - Optics and photonics -- Test methods for telescopic systems
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INTERNATIONAL ISO
STANDARD 14490-6
Second edition
2014-10-15
Optics and photonics — Test methods
for telescopic systems —
Part 6:
Test methods for veiling glare index
Optique et photonique — Méthodes d’essai pour systèmes
télescopiques —
Partie 6: Méthodes d’essai de l’indice de lumière parasite
Reference number
ISO 14490-6:2014(E)
©
ISO 2014

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ISO 14490-6:2014(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2014
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
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Published in Switzerland
ii © ISO 2014 – All rights reserved

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ISO 14490-6:2014(E)

Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 General considerations . 1
5 Principle . 2
6 Test arrangement . 2
6.1 General . 2
6.2 Integrating sphere . 3
6.3 Object-side collimator. 3
6.4 Test specimen mounting . 4
6.5 Limiting stop . 4
6.6 Measurement and evaluation unit . 4
7 Procedure. 4
7.1 Adjustment of the measurement set-up . 4
7.2 Determination of results . 4
8 Presentation of results . 5
9 Repeatability . 5
10 Test report . 5
Annex A (informative) Method for determination of the luminance ratio of the black
reference surface to the internal surface of the integrating sphere .6
Bibliography . 8
© ISO ISO pub-date year – All rights reserved iii

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ISO 14490-6:2014(E)

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical Barriers
to Trade (TBT) see the following URL: Foreword - Supplementary information
The committee responsible for this document is ISO/TC 172, Optics and photonics, Subcommittee SC 4,
Telescopic systems.
This second edition cancels and replaces the first edition (ISO 14490-6:2005), of which it constitutes a
minor revision. ISO 14490 consists of the following parts, under the general title Optics and photonics —
Test methods for telescopic systems:
— Part 1: Test methods for basic characteristics
— Part 2: Test methods for binocular systems
— Part 3: Test methods for telescopic sights
— Part 4: Test methods for astronomical telescopes
— Part 5: Test methods for transmittance
— Part 6: Test methods for veiling glare index
— Part 7: Test methods for limit of resolution
— Part 8: Test methods for night-vision devices
iv © ISO ISO pub-date year – All rights reserved

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INTERNATIONAL STANDARD ISO 14490-6:2014(E)
Optics and photonics — Test methods for telescopic
systems —
Part 6:
Test methods for veiling glare index
1 Scope
This part of ISO 14490 specifies the test methods for the determination of the veiling glare index of
telescopic systems and observational telescopic instruments.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
ISO 9358:1994, Optics and optical instruments — Veiling glare of image forming systems — Definitions and
methods of measurement
ISO 14132-1, Optics and photonics — Vocabulary for telescopic systems — Part 1: General terms and
alphabetical indexes of terms in ISO 14132
ISO 14490-1:2005, Optics and photonics — Test methods for telescopic systems — Part 1: Test methods for
basic characteristics
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 14132-1 apply.
4 General considerations
The veiling glare test methods are generally described in ISO 9358:1994. ISO 9358:1994 deals with
arbitrary optical instruments and contains two basic approaches to measuring the veiling glare, namely
integral (or black patch) method and analytical (or glare spread function) method.
For terrestrial telescopes with which this part of ISO 14490 deals, the black patch method is more
adequate while the glare spread function might prove to be better for astronomical telescopes. For the
moment, consideration in this part of ISO 14490 is given only to the black patch method. If need of
measuring the glare spread function arises, the reference shall be made directly to appropriate clauses
of ISO 9358:1994.
From the classification given in ISO 9358:1994, Clause 3, the case where both the object and the image
are at infinity will usually apply to telescopic systems. Clauses 6 and 7 give detailed and more specific
descriptions of the general test method given in ISO 9358:1994, 4.1 and of test conditions given in
ISO 9358:1994, 5.1.
© ISO 2014 – All rights reserved 1

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ISO 14490-6:2014(E)

5 Principle
The determination of the veiling glare index, S, is based upon the measurement of the illuminance of the
image of a black surface in diffuse scattered white light and the measurement of the illuminance of the
image of the white background.
The veiling
...

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