Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g (IEC 60512-26-100:2008)

This part of IEC 60512 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission.

Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 26-100: Messaufbau, Prüf- und Referenzanordnung und Messverfahren für Steckverbinder nach IEC 60603 7 -Prüfungen 26a bis 26g (IEC 60512-26-100:2008)

Connecteurs pour équipements électroniques - Essais et mesures - Partie 26-100: Montage de mesure, dispositifs d'essai et de référence et mesures pour les connecteurs conformes à la CEI 60603-7 - Essais 26a à 26g (CEI 60512-26-100:2008)

La CEI 60512-26-100:2008 spécifie les essais et mesures ainsi que le montage de mesure et les dispositifs de référence associés pour les essais d'interopérabilité et de compatibilité amont pour le développement et la qualification des embases et des fiches à 8 voies pour la transmissions des données. Les méthodes d'essai suivantes sont spécifiées: perte d'insertion, essai 26a; affaiblissement de réflexion, essai 26b; paradiaphonie, essai 26c; télédiaphonie, essai 26d; impédance de transfert, essai 26e; perte de conversion transverse, essai 26f; perte de transfert de conversion transverse, essai 26g.

Konektorji za elektronsko opremo - Preskušanje in meritve - 26-100. del: Merilna postavitev, določitev preskusov in referenc ter meritve konektorjev v skladu z IEC 60603-7 - Preskusi od 26a do 26g (IEC 60512-26-100:2008)

General Information

Status
Published
Publication Date
10-Nov-2008
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
29-Oct-2008
Due Date
03-Jan-2009
Completion Date
11-Nov-2008

Relations

Buy Standard

Standard
EN 60512-26-100:2008
English language
58 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60512-26-100:2008
01-december-2008
.RQHNWRUML]DHOHNWURQVNRRSUHPR3UHVNXãDQMHLQPHULWYHGHO0HULOQD
SRVWDYLWHYGRORþLWHYSUHVNXVRYLQUHIHUHQFWHUPHULWYHNRQHNWRUMHYYVNODGX],(&
3UHVNXVLRGDGRJ ,(&
Connectors for electronic equipment - Tests and measurements - Part 26-100:
Measurement setup, test and reference arrangements and measurements for connectors
according to IEC 60603-7 - Tests 26a to 26g (IEC 60512-26-100:2008)
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 26-100:
Messaufbau, Prüf- und Referenzanordnung und Messverfahren für Steckverbinder nach
IEC 60603 7 -Prüfungen 26a bis 26g (IEC 60512-26-100:2008)
Connecteurs pour équipements électroniques - Essais et mesures - Partie 26-100:
Montage de mesure, dispositifs d'essai et de référence et mesures pour les connecteurs
conformes à la CEI 60603-7 - Essais 26a à 26g (CEI 60512-26-100:2008)
Ta slovenski standard je istoveten z: EN 60512-26-100:2008
ICS:
31.220.10 9WLþLLQYWLþQLFHNRQHNWRUML Plug-and-socket devices.
Connectors
SIST EN 60512-26-100:2008 en,fr
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 60512-26-100:2008

---------------------- Page: 2 ----------------------

SIST EN 60512-26-100:2008

EUROPEAN STANDARD
EN 60512-26-100

NORME EUROPÉENNE
October 2008
EUROPÄISCHE NORM

ICS 31.220.10

English version


Connectors for electronic equipment -
Tests and measurements -
Part 26-100: Measurement setup, test and reference arrangements
and measurements for connectors according to IEC 60603-7 -
Tests 26a to 26g
(IEC 60512-26-100:2008)


Connecteurs  Steckverbinder
pour équipements électroniques - für elektronische Einrichtungen -
Essais et mesures - Mess- und Prüfverfahren -
Partie 26-100: Montage de mesure, Teil 26-100: Messaufbau,
dispositifs d'essai et de référence Prüf- und Referenzanordnung
et mesures pour les connecteurs und Messverfahren für Steckverbinder
conformes à la CEI 60603-7 - nach IEC 60603-7 -
Essais 26a à 26g Prüfungen 26a bis 26g
(CEI 60512-26-100:2008) (IEC 60512-26-100:2008)


This European Standard was approved by CENELEC on 2008-10-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60512-26-100:2008 E

---------------------- Page: 3 ----------------------

SIST EN 60512-26-100:2008
EN 60512-26-100:2008 - 2 -
Foreword
The text of document 48B/1892/FDIS, future edition 1 of IEC 60512-26-100, prepared by SC 48B,
Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic
equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 60512-26-100 on 2008-10-01.
This European Standard cancels and replaces the annexes of EN 60603-7-x documents dealing with
transmission characteristics for interoperability and backward compatibility.
This standard is to be read in conjunction with EN 60512-1 and EN 60512-1-100 which explains the
structure of the EN 60512 series.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2009-07-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2011-10-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60512-26-100:2008 was approved by CENELEC as a
European Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60068-1 NOTE  Harmonized as EN 60068-1:1994 (not modified).
IEC 60512-25 NOTE  Harmonized in EN 60512-25 series (not modified).
__________

---------------------- Page: 4 ----------------------

SIST EN 60512-26-100:2008
- 3 - EN 60512-26-100:2008
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE 1  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

NOTE 2 Where a standard cited below belongs to the EN 50000 series, the European Standard applies instead of the relevant
International Standard.

Publication Year Title EN/HD Year

1)
- - Communication cables - EN 50289-1-14 -
Specifications for test methods -
Part 1-14: Electrical test methods - Coupling
attenuation or screening attenuation of
connecting hardware


1)
IEC 60169-15 - Radio-frequency connectors - - -
Part 15: R.F. coaxial connectors with inner
diameter of outer conductor 4,13 mm
(0,163 in) with screw coupling - Characteristic
impedance 50 ohms (Type SMA)


1) 2)
IEC 60512-1 - Connectors for electronic equipment - EN 60512-1 2001
Tests and measurements -
Part 1: General


1) 2)
IEC 60512-1-100 - Connectors for electronic equipment - EN 60512-1-100 2006
Tests and measurements -
Part 1-100: General - Applicable publications


1) 3)
IEC 60603-7 - Connectors for electronic equipment - EN 60603-7 200X
Part 7: Detail specification for 8-way,
unshielded, free and fixed connectors


1) 3)
IEC 60603-7-2 - Connectors for electronic equipment - EN 60603-7-2 200X
Part 7-2: Detail specification for 8-way,
unshielded, free and fixed connectors, for data
transmissions with frequencies up to 100 MHz


1) 3)
IEC 60603-7-3 - Connectors for electronic equipment - EN 60603-7-3 200X
Part 7-3: Detail specification for 8-way,
shielded, free and fixed connectors, for data
transmission with frequencies up to 100 MHz


IEC 60603-7-4 2005 Connectors for electronic equipment - EN 60603-7-4 2005
Part 7-4: Detail specification for 8-way,
unshielded, free and fixed connectors, for data
transmissions with frequencies up to 250 MHz


3)
IEC 60603-7-5 2007 Connectors for electronic equipment - EN 60603-7-5 200X
Part 7-5: Detail specification for 8-way,
shielded, free and fixed connectors, for data
transmissions with frequencies up to 250 MHz



1)
Undated reference.
2)
Valid edition at date of issue.
3)
To be ratified.

---------------------- Page: 5 ----------------------

SIST EN 60512-26-100:2008
EN 60512-26-100:2008 - 4 -
Publication Year Title EN/HD Year

IEC 61156 Series Multicore and symmetrical pair/quad cables - -
for digital communications


1) 2)
IEC 61169-16 - Radio-frequency connectors - EN 61169-16 2007
Part 16: Sectional specification - RF coaxial
connectors with inner diameter of outer
conductor 7 mm (0,276 in) with screw
coupling - Characteristics impedance 50 ohms
(75 ohms) (type N)


4)
ISO/IEC 11801 2002 Information technology - EN 50173-1 and 2007
5)
Generic cabling for customer premises EN 50173-2 2007


1)
ITU-T - Transmission aspects of unbalance - -
Recommendation about earth
G.117


1)
ITU-T - Measuring arrangements to assess - -
Recommendation the degree of unbalance about earth
O.9




4)
The title of EN 50173-1 is: Information technology - Generic cabling systems – Part 1: General requirements.
5)
The title of EN 50173-2 is: Information technology - Generic cabling systems – Part 2: Office premises.

---------------------- Page: 6 ----------------------

SIST EN 60512-26-100:2008

IEC 60512-26-100
Edition 1.0 2008-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Connectors for electronic equipment – Tests and measurements –
Part 26-100: Measurement setup, test and reference arrangements and
measurements for connectors according to IEC 60603-7 – Tests 26a to 26g

Connecteurs pour équipements électroniques – Essais et mesures –
Partie 26-100: Montage de mesure, dispositifs d’essai et de référence et
mesures pour les connecteurs conformes à la CEI 60603-7 – Essais 26a à 26g

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XA
CODE PRIX
ICS 31.220.10 ISBN 2-8318-9892-7
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

---------------------- Page: 7 ----------------------

SIST EN 60512-26-100:2008
– 2 – 60512-26-100 © IEC:2008
CONTENTS
FOREWORD.6
INTRODUCTION.8
1 Scope.9
2 Normative reference .9
3 General requirements for measurement setup .10
3.1 Test instrumentation.10
3.2 Coaxial cables and test leads for network analysers.10
3.3 Measurement precautions .10
3.4 Balun requirements .11
3.5 Reference components for calibrations.12
3.5.1 Reference loads for calibration .12
3.5.2 Reference cables for calibration .12
3.6 Termination loads for termination of conductor pairs .12
3.7 Termination of screens .13
3.8 Test specimen and reference planes .13
3.9 Termination of balun with low return loss for common mode .14
3.9.1 General .14
3.9.2 Centre tap connected to ground.14
3.9.3 Centre tap open.14
4 Connector measurement up to 250 MHz .15
4.1 Insertion loss (IL), Test 26a.15
4.1.1 Object .15
4.1.2 Free connector for insertion loss.15
4.1.3 Test method .15
4.1.4 Test set-up .15
4.1.5 Procedure.15
4.1.6 Test report.17
4.1.7 Accuracy .17
4.2 Return loss (RL), Test 26b .17
4.2.1 Object .17
4.2.2 Free connector for return loss.17
4.2.3 Test method .17
4.2.4 Test set-up .17
4.2.5 Procedure.17
4.2.6 Test report.17
4.2.7 Accuracy .17
4.3 Near-end crosstalk (NEXT), Test 26c .18
4.3.1 Object .18
4.3.2 Fixed and free connector combinations to be tested .18
4.3.3 Test method .18
4.3.4 Test set-up .18
4.3.5 Procedure.19
4.3.6 Test report.20
4.3.7 Accuracy .20
4.4 Far-end crosstalk (FEXT), Test 26d.20
4.4.1 Object .20

---------------------- Page: 8 ----------------------

SIST EN 60512-26-100:2008
60512-26-100 © IEC:2008 – 3 –
4.4.2 Fixed and free connector combinations to be tested .20
4.4.3 Test method .20
4.4.4 Test set-up .20
4.4.5 Procedure.21
4.4.6 Test report.22
4.4.7 Accuracy .22
4.5 Transfer impedance (Z ), Test 26e .22
T
4.5.1 Object .22
4.5.2 Test method .22
4.5.3 Definitions .22
4.5.4 Test set-up .23
4.5.5 Procedure.26
4.5.6 Test report.27
4.5.7 Accuracy .27
4.6 Transverse Conversion Loss (TCL), Test 26f.28
4.6.1 Object .28
4.6.2 Test method .28
4.6.3 Test set-up .28
4.6.4 Procedure.28
4.6.5 Test report.29
4.6.6 Accuracy .29
4.7 Transverse Conversion Transfer Loss (TCTL), Test 26g.29
4.7.1 Object .29
4.7.2 Test method .29
4.7.3 Test set-up .30
4.7.4 Procedure.30
4.7.5 Test report.30
4.7.6 Accuracy .31
5 Construction and qualification of test plugs.31
5.1 De-embedding near-end crosstalk (NEXT) test plug .31
5.1.1 Set-up and calibration of reference plug .31
5.1.2 Test plug construction .32
5.1.3 Test plug NEXT measurement .33
5.1.4 Test plug NEXT requirements.34
5.1.5 Test plug balance .36
5.2 Far-end crosstalk (FEXT) test plug .37
5.2.1 General .37
5.2.2 Test plug FEXT measurement – de-embedding method .38
5.2.3 Test plug FEXT measurement – direct method .38
5.2.4 FEXT test plug requirements .39
5.3 Return loss test plug .39
6 Reference plug and jack construction and measurement – the basics of the de-
embedding test method .39
6.1 De-embedding near-end crosstalk (NEXT) reference plug and jack .39
6.1.1 Reference plug construction .39
6.1.2 Return loss reference plug.40
6.1.3 Set-up and calibration of reference plug .41
6.1.4 De-embedding reference plug NEXT measurement.41
6.1.5 Delay adjustment in lieu of port extension.41

---------------------- Page: 9 ----------------------

SIST EN 60512-26-100:2008
– 4 – 60512-26-100 © IEC:2008
6.2 De-embedding near-end crosstalk (NEXT) reference jack.41
6.2.1 Reference jack construction.41
6.2.2 De-embedding reference jack NEXT measurement .43
6.2.3 Differential mode jack vector .43
6.3 Determining reference jack FEXT vector .43
6.3.1 FEXT reference plug details .43
6.3.2 FEXT reference jack assembly .46
6.3.3 De-embedding reference jack FEXT assembly measurement.47
Annex A (informative) Example test fixtures in support .48
Bibliography.54

Figure 1 – Optional 180° hybrid used instead of a balun .11
Figure 2 – Example of calibration of reference loads.12
Figure 3 – Resistor load.13
Figure 4 – Definition of reference planes.14
Figure 5 – Balanced attenuator for balun centre tap grounded .14
Figure 6 – Balanced attenuator for balun centre tap open .15
Figure 7 – Calibration .16
Figure 8 – Measuring set-up .16
Figure 9 – NEXT measurement for differential and common mode terminations .19
Figure 10 – FEXT measurement for differential and common mode terminations.21
Figure 11 – Preparation of test specimen.23
Figure 12 – Triaxial test set-up .24
Figure 13 – Impedance matching for R < 50 Ω .25
1
Figure 14 – Impedance matching for R > 50 Ω .26
1
Figure 15 – TCL measurement.28
Figure 16 – TCTL measurement.30
Figure 17 – Back-to-back through calibration (for more information see Annex A).31
Figure 18 – Mated test plug/direct fixture test configuration .38
Figure 19 – De-embedding reference plug .40
Figure 20 – De-embedding reference jack.42
Figure 21 – De-embedding reference FEXT plug without sockets.43
Figure 22 – De-embedding reference FEXT plug with sockets.44
Figure 23 – Reference FEXT plug mated to PWB.44
Figure 24 – Reference FEXT plug-test lead position .45
Figure 25 – Reference FEXT plug assembly .45
Figure 26 – Test leads connected to de-embedded reference jack/PWB assembly.47
Figure 27 – Reference FEXT plug mated to reference jack/PWB assembly .47
Figure A.1 – THI3KIT test head interface with baluns attached .48
Figure A.2 – Alternative to item 3.1 in Table A.2 .50
Figure A.3 – Pyramid test setup for shielded connectors.50
Figure A.4 – Exploded assembly of the coaxial termination reference test head.52
Figure A.5 – Detailed view of the coaxial termination reference test-head interface .52

---------------------- Page: 10 ----------------------

SIST EN 60512-26-100:2008
60512-26-100 © IEC:2008 – 5 –
Table 1 – Test balun performance characteristics .11
Table 2 – Uncertainty band of return loss measurement at frequencies below 100 MHz.18
Table 3 – Uncertainty band of return loss measurement at frequencies above 100 MHz.18
Table 4 – De-embedded NEXT real and imaginary reference jack vectors.33
Table 5 – Differential mode reference jack vectors.34
Table 6 – Test plug NEXT loss limits for connectors specified up to 100 MHz according
to IEC 60603-7-2 or IEC 60603-7-3.35
Table 7 – Test plug NEXT loss limits for connectors specified up to 250 MHz according
to IEC 60603-7-4 or IEC 60603-7-5.36
Table 8 – Test-plug differential and differential with common-mode consistency .37
Table 9 – Test plug FEXT requirements – De-embedding method .39
Table 10 – Return loss requirements for return loss reference plug.41
Table A.1 – Coaxial termination reference head component list .48
Table A.2 – Coaxial termination reference head, additional parts .49
Table A.3 – Coaxial termination reference head component list .51

---------------------- Page: 11 ----------------------

SIST EN 60512-26-100:2008
– 6 – 60512-26-100 © IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –

Part 26-100: Measurement setup, test and reference arrangements and
measurements for connectors according to IEC 60603-7 – Tests 26a to 26g


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regiona
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.