SIST EN ISO 4518:1999
(Main)Metallic coatings - Measurement of coating thickness - Profilometric method (ISO 4518:1980)
Metallic coatings - Measurement of coating thickness - Profilometric method (ISO 4518:1980)
Metallische Überzüge - Messen der Schichtdicke - Profilometrisches Verfahren (ISO 4518:1980)
In dieser Internationalen Norm ist ein Verfahren für die Messung der Dicke eines Metallüberzugs festgelegt. Das Verfahren beinhaltet, daß zunächst eine Stufe zwischen der Oberfläche der Schutzschicht und der Oberfläche ihres Grundwerkstoffs gebildet wird, deren Höhe danach mit einem Profilaufzeichnungs-gerät gemessen wird. Die Norm umfaßt die Kennwerte der gerätemäßigen Ausstattung und die geeignete Durchführung, die für diese spezifische Anwendung der profilometrischen Verfahren geeignet ist.
Revetements métalliques - Mesurage profilométrique (ISO 4518:1980)
1.1 La présente Norme internationale spécifie une méthode de mesurage des épaisseurs de revêtements métalliques consistant à former tout d'abord un gradin entre la surface du revêtement et la surface de son substrat, puis à mesurer ce gradin à l'aide d'un instrument à enregistreur de profil. Elle indique les caractéristiques d'appareillage et le mode opératoire convenant à cette application particulière des méthodes profilométriques. 1.2 La méthode est applicable au mesurage d'épaisseurs de revêtements métalliques de 0,01 µm à 1 000 µm sur des surfaces planes et, en prenant des précautions convenables, sur des surfaces cylindriques. Elle convient particulièrement au mesurage de très faibles épaisseurs; toutefois, pour des épaisseurs inférieures à 0,01 µ, la planéité et le poli de la surface sont très critiques, de sorte que la méthode n'est pas recommandée pour être utilisée en-dessous du niveau minimal de mesurage habituel pour des mesureurs de profil à contact. Cette méthode conv
Kovinske prevleke - Merjenje debeline prevleke - Profilometrijska metoda (ISO 4518:1980)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN ISO 4518:1999
01-oktober-1999
Kovinske prevleke - Merjenje debeline prevleke - Profilometrijska metoda (ISO
4518:1980)
Metallic coatings - Measurement of coating thickness - Profilometric method (ISO
4518:1980)
Metallische Überzüge - Messen der Schichtdicke - Profilometrisches Verfahren (ISO
4518:1980)
Revetements métalliques - Mesurage profilométrique (ISO 4518:1980)
Ta slovenski standard je istoveten z: EN ISO 4518:1995
ICS:
17.040.20 Lastnosti površin Properties of surfaces
25.220.40 Kovinske prevleke Metallic coatings
SIST EN ISO 4518:1999 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN ISO 4518:1999
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SIST EN ISO 4518:1999
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SIST EN ISO 4518:1999
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SIST EN ISO 4518:1999
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SIST EN ISO 4518:1999
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SIST EN ISO 4518:1999
International Standard
INTERNATIONAL ORGANIZATION FOR STANDARDIZATION.MEIK~YHAPO,QHAFI OPl-AHM3AUMR l-l0 CTAH~APTM3AL&lkl.ORGANISATION INTERNATIONALE DE NORMALISATION
Measurement of coating thickness -
Metallic coatings -
Profilometric method
Revetements m&alliques - Mesurage de l’epaisseur - Methode profilomktrique
First edition - 1980-07-15
UDC 669.058 : 531.717 Ref. No. ISO 45184980 (E)
Descriptors : metal coatings, dimensional measurement, thickness, measuring instruments, Profile meters.
Price based on 4 pages
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SIST EN ISO 4518:1999
Foreword
ISO (the international Organization for Standardization) is a worldwide federation of
national Standards institutes (ISO member bodies). The work of developing Interna-
tional Standards is carried out through ISO technical committees. Every member body
interested in a subject for which a technical committee has been set up has the right to
be represented on that committee. International organizations, governmental and non-
governmental, in liaison with ISO, also take part in the work.
Draft International Standards adopted by the technical committees are circulated to
the member bodies for approval before their acceptance as International Standards by
the ISO Council.
International Standard ISO 4518 was developed by Technical Committee ISO/TC 107,
Metallic and other non-organic coatings, and was circulated to the member bodies in
June 1978.
lt has been approved by the member bodies of the following countries :
Czechoslovakia Italy Switzerland
France Mexico Turkey
Germany, F. R. New Zealand United Kingdom
Hungary Poland USA
India Romania USSR
Ireland South Africa, Rep. of
Sweden
Israel
The member bodies of the following countries expressed disapproval of the document
on technical grounds :
Japan
Netherlands
0 International Organkation for Standardkation, 1980
Printed in Switzerland
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SIST EN ISO 4518:1999
ISO 4518-1980 (E)
INTERNATIONALSTANDARD
Metallic coatings - Measurement of coating thickness -
Profilometric method
1 Scope and field of application measure surface roughness but which, for the purposes of
this International Standard, are used to record the Profile of
a Step;
1.1 This international Standard specifies a method for the
measurement of metal coating thickness by first forming a step
b) electronie inductive comparators equipped with styli
between the surface of the coating and the surface of its
and capable of recording the Profile of a Step.
Substrate and then measuring the step height using a Profile
instrument. It covers the instrumentation
recording
Electronie stylus instruments may have a greater Utility, being
characteristics and the procedure appropriate to this specific
suitable for roughness measurements, while electronie induc-
application of profilometric methods.
tive comparators may be simpler in construction. The two
types of instrument generally cover different ranges of coating
1.2 The method is applicable to the measurement of
thickness : 0,005 to 250 Pm for electronie stylus instruments,
thicknesses of metal coatings from 0,Ol Pm to 1 000 Pm on flat
and 1 to 1 000 vrn for electronie inductive comparators.
surfaces and, if appropriate precautions are taken, on cylin-
drical surfaces. lt is highly suitable for the measurement of
minute thicknesses but, for thicknesses of less than 0,Ol vrn,
4.2 Electronie stylus instruments
surface flatness and surface smoothness are very critical and
accordingly, the method is not recommended for use down to
4.2.1 These instruments are used to record the Profile of a
the lowest level of measurement usual for electronie stylus in-
surface and have the following components.
struments. The method is suitable for measuring coating
thicknesses when preparing coating thickness reference stan-
dards.
4.2.1.1 A pick-up with a conical or pyramidal stylus having an
included angle of 1,57 rad (9OO) and a nominal tip radius, in the
direction of the traverse, of 2, 5, IO or 50 Pm. The forte of con-
2 References
tact on the test surface shall not exceed the appropriate value
given in the table.
ISO 2064, Metallic and other non-organic coatings - Defini-
tions and conventions concerning the measurement of
Table - Fotze on stylus
thickness. t
Nominal value of stylus
2 5 IO 50””
tip radius, Fm
ISO 2177, Metallic coatings - Measurement of coating
thickness - Coulometric method b y anodic dissolution.
Maximum static forte at
the mean level of the
stylus, m N *
3 Principle
*
1 mN M 0,l gf
Formation of a step either by dissolving part of the coating (ac-
** Values useful for low-hardness metals such as tin and lead.
ceptance testing) or by masking a Portion of the Substrate Prior
to coating (production inspection). Measurement of the height
of the step using a Profile recording instrument.
4.2.4.2 A traverse unit that moves the pick-up relative to a
datum skid or, in those cases where the skid may result in
darnage to the surface or introduce distortion of the step to be
4 lnstrumentation : Operational Parameters
measured, a datum surface having nominal form of the Profile.
and measurement characteristics
4.2.1.3 An amplifying unit giving nominal values of the ver-
tical ( V’J magnifications of the Profile selected from the follow-
4.1 Types of Profile recording instruments
ing series :
Either of two types may be used :
100 - 200 500
- - 1000 - 2000 - 5000 - 10000 -
a) electronie stylus instruments, known as surface 20 000 - 50 000 - 100000 -
200 000 - 500 000 -
1 000 000.
analysers and surface Profile recorders, generally used to
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SIST EN ISO 4518:1999
Cl 4518-1980 (El
4.2.1.4 A recording instrument that Plots the amplified varia- 5.2 Vertical magnification
tions of the Profile which, when operated in conjunction with
the traverse unit, permits nominal values of the horizontal (V,) 16 the vertical magnificati on is too low, measu rement precision
magnifications of the Profile selected from the following ill be poor. I t should be to take maximum advantage of the
W set
serses : Chart width.
10 - 20 - 50 - 100 - 200
- 500 - 1 000 - 2 000 -
GraphkaI measurements
5.3
5 000.
If the test surface is not parallel to the reference (datum) sur-
face, the recording of the horizontal surface is sloped with
GZ.2 Profile recording instrume nts will furnish the following
respect to the Chart grid; the vertical Portion of the step is also
measu r ing characteristics :
sloped but it may still be vertical on the Chart grid, depending
on the vertical and horizontal magnifications, on the radius of
-
traverse length : 1 to 100 mm
the stylus and finally on the height of the step (i.e. thickness).
When the Profile is sloped, a common error is to measure the
-
range of thickness measurement : 0,005 to 250 Pm
perpendicular distance between the mean lines of the Profile
without correcting for
...
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