oSIST prEN IEC 61290-11-1:2026

• Status: Not Published
• Public Enquiry End Date: 30-Sep-2026
• ICS: 33.180.30 - Optic amplifiers
• Technical Committee: MOC - Mobile Communications
• Current Stage: 4020 - Public enquire (PE) (Adopted Project)
• Start Date: 23-Jul-2026
• Due Date: 10-Dec-2026
• Completion Date: 29-Sep-2026
• Ref Project: prEN IEC 61290-11-1:2026 - Optical amplifiers - Test methods - Part 11-1: Polarization mode dispersion parameter - Jones matrix eigenanalysis (JME)

• Revises: SIST EN 61290-11-1:2008 - Optical amplifiers - Test methods -- Part 11-1: Polarization mode dispersion parameter - Jones matrix eigenanalysis (JME)
• Effective Date: 02-Dec-2025

oSIST prEN IEC 61290-11-1:2026 is the Slovenian publication identical to prEN IEC 61290-11-1:2026. It specifies an IEC test method for measuring polarization-mode dispersion (PMD) in optical amplifiers using Jones matrix eigenanalysis (JME). The document applies to commercially available optical amplifiers, including optical fibre amplifiers (OFA), semiconductor optical amplifiers (SOA), and planar waveguide optical amplifiers (PWOA).

What does oSIST prEN IEC 61290-11-1:2026 specify?

oSIST prEN IEC 61290-11-1:2026 specifies a laboratory test procedure for determining PMD in optical amplifiers. The method is based on measuring normalized Stokes parameters at closely spaced wavelengths and converting those measurements into differential group delay (DGD).

The document is organized into:

• Clause 1 - Scope
• Clause 2 - Normative references
• Clause 3 - Terms, definitions, abbreviated terms, and symbols
• Clause 4 - Apparatus
• Clause 5 - Procedure
• Clause 6 - Calculations
• Clause 7 - Test results
• Annex A - Informative analysis of degree of polarization reduction due to amplified spontaneous emission (ASE)

Annex	What it covers
Annex A	Degree of polarization reduction due to optical amplifier ASE in test systems with a tuneable narrowband light source

In practice, this structure tells a reader where to find the setup, how to run the measurement, how to calculate DGD, and what to report.

What are the key requirements of oSIST prEN IEC 61290-11-1:2026?

oSIST prEN IEC 61290-11-1:2026 defines one measurement route for PMD and gives practical limits so the result is valid. The most important points are about the allowed devices, the test setup, the wavelength spacing, and the validity check on polarization.

What the method applies to

Clause 1 applies the test to all commercially available optical amplifiers, including OFA, SOA, and PWOA. The JME technique is described for pumped optical amplifiers only.

For a test engineer, this means the method is aimed at powered amplifier characterization, not general optical links or passive components.

What source and analyser combinations may be used

Clause 4 allows two measurement system families:

• a tuneable narrowband light source, such as a tuneable laser, with a spectrally broadband polarimeter
• a broadband light source with a spectrally selective polarization analyser

Clause 4 also describes the supporting optics: a polarization controller for polarized sources, three linear polarizers at approximately 45 degrees, input optics to excite the device under test, and output optics that couple the light to the analyser.

In practice, this gives laboratories two workable test architectures. The choice affects how the wavelength selection and analyser bandwidth are handled.

How to handle polarization at the input

Clause 4 requires the source polarization to be adjusted when a polarized source is used, so the three polarizers do not fully extinguish the beam. The procedure aims for roughly circularly polarized input light.

This matters because the measurement needs a stable input state. If the source is already unpolarized, a polarization controller is not needed.

How to choose the wavelength interval

Clause 5 limits the wavelength interval used for the JME measurement. The maximum interval depends on the expected DGD, and the text gives a product limit so the state of polarization does not rotate too far between adjacent wavelengths.

For broadband-source measurements, Clause 5 also limits the resolution bandwidth (RBW) of the spectrally selective analyser.

In practice, the wavelength step or analyser bandwidth has to be fine enough to resolve the PMD behavior, but not so coarse that the calculation becomes unreliable.

How to confirm the measurement is valid

Clause 5 requires the degree of polarization (DOP) to be checked from the measured normalized Stokes parameters. For the tuneable narrowband source setup, the DOP must be at least 25 %.

If the DOP is too low, the procedure calls for increasing the tuneable laser power and repeating the measurement. This is important because ASE from the amplifier can depolarize the signal and distort the Stokes-parameter reading.

How the DGD is calculated and summarized

Clause 6 converts the measured normalized Stokes parameters into the response Jones matrix and then into DGD using the eigenvalues of the Jones-matrix product at two close wavelengths. The calculated DGD is assigned to the midpoint of each wavelength interval.

Clause 6 also requires summary values:

• average DGD
• root-mean-square (RMS) DGD
• maximum DGD
• minimum DGD

For a buyer, lab, or quality team, these summary values are what usually enter a test report or product comparison.

What the test report shall include

Clause 7 lists the information to report for each test, including the wavelength range, wavelength step size, DGD at each wavelength, average DGD, RMS DGD, the test setup arrangement, the source type and spectral bandwidth, analyser RBW if used, operating conditions such as pump power, and ambient temperature if required.

That reporting set makes the test repeatable and lets another lab understand the conditions behind the result.

What terms does oSIST prEN IEC 61290-11-1:2026 define?

oSIST prEN IEC 61290-11-1:2026 uses a compact set of abbreviations for the optical test method.

• ASE - amplified spontaneous emission, the unpolarized light generated by the amplifier that can lower DOP.
• DGD - differential group delay, the measured time delay used as the PMD result.
• DOP - degree of polarization, the value used to check whether the measured signal is suitable for analysis.
• DUT - device (optical amplifier) under test, the amplifier being measured.
• JME - Jones matrix eigenanalysis, the calculation method used in this standard.
• OA - optical amplifier, the general device category covered by the method.
• PSP - principal states of polarization, the orthogonal polarization states between which DGD is defined.

Who uses oSIST prEN IEC 61290-11-1:2026?

oSIST prEN IEC 61290-11-1:2026 is used by people who measure, specify, or verify PMD in optical amplifiers. That includes test laboratories, amplifier manufacturers, and quality teams that need a repeatable method and a clear report format.

It is also relevant to engineers working with fibre optic systems, sensing and active devices, because the document addresses amplifier behavior in telecom-related measurement conditions. Buyers and evaluators can use it to compare test reports from different suppliers when PMD performance matters.

What changed in oSIST prEN IEC 61290-11-1:2026 from the previous edition?

oSIST prEN IEC 61290-11-1:2026 is the third edition and it cancels and replaces the second edition published in 2008. The stated technical changes are:

• addition of an alternative test setup using a broadband light source
• addition of RMS DGD to the test results

For users, this means the document now covers an additional measurement configuration and requires one more summary value in the reported results.

Which standards are used with oSIST prEN IEC 61290-11-1:2026?

oSIST prEN IEC 61290-11-1:2026 points readers to related IEC publications that support the method:

• IEC TR 61282-9:2016 - guidance on PMD measurements and theory
• IEC TR 61292-5:2004 - general information on PMD parameter measurements for optical amplifiers
• IEC 61290-11-2:2005 - Poincaré sphere analysis method, cited for apodization in the broadband-source procedure

These references help readers place the JME method in the wider PMD measurement framework and support the broadband-source workflow.

What does the oSIST prEN IEC 61290-11-1:2026 document contain?

oSIST prEN IEC 61290-11-1:2026 contains two apparatus arrangements shown in Figures 1 and 2, one measurement example in Figure 3, and an informative annex figure in Annex A. It also contains the equations needed to determine DOP, DGD, average DGD, RMS DGD, maximum DGD, and minimum DGD.

Clause 4 describes the light source, polarizers, polarization controller, fibre pigtail or lens coupling, output optics, and analyser. Clause 5 gives the step-by-step measurement sequence, including wavelength selection and the special handling for broadband-source measurements with a scanning interferometer. Clause 6 turns the measurements into DGD results, and Clause 7 defines the reporting items that should accompany the test data.

Annex A gives a worked technical explanation of how ASE from the optical amplifier reduces DOP in tuneable narrowband source systems. That annex helps the reader understand why amplifier saturation and source polarization quality matter in practice.

SLOVENSKI STANDARD
01-september-2026
Optični ojačevalniki - Preskusne metode - 11-1. del: Disperzija polarizacijskega
načina - Analiza lastnih vektorjev Jonesove matrike (JME)
Optical amplifiers - Test methods - Part 11-1: Polarization mode dispersion parameter -
Jones matrix eigenanalysis (JME)
Prüfverfahren für Lichtwellenleiter-Verstärker - Teil 11-1:
Polarisationsmodendispersionsparameter - Jones-Matrix-Eigenanalyse (JME)
Amplificateurs optiques - Méthodes d'essais - Partie 11-1: Paramètre de dispersion du
mode de polarisation - Analyse des vecteurs propres de la matrice de jones (JME)
Ta slovenski standard je istoveten z: prEN IEC 61290-11-1:2026
ICS:
33.180.30 Optični ojačevalniki Optic amplifiers
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

86C/2024/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61290-11-1 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2026-07-17 2026-10-09
SUPERSEDES DOCUMENTS:
86C/2009/CD, 86C/2015A/CC
IEC SC 86C : FIBRE OPTIC SYSTEMS, SENSING AND ACTIVE DEVICES
SECRETARIAT: SECRETARY:
United States of America Mr Fred Heismann
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):

TC 100
ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some
Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is
the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Optical amplifiers - Test methods - Part 11-1: Polarization mode dispersion parameter - Jones
matrix eigenanalysis (JME)
PROPOSED STABILITY DATE: 2030
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
Committee positions. You may not copy or "mirror" the file or printed version of the document, o r any part of it,
for any other purpose without permission in writing from IEC.

NOTE FROM TC/SC OFFICERS:
Link to Committee Draft for Vote (CDV) online document:
Click here
How to access
This link leads you to the Online Standards Development (OSD) platform for National Mirror
Committee’s (NMC) comments. The project draft may be found further down this document.

Resource materials
We recommend NCs to review the available materials to better understand the member commenting
on the OSD platform. This includes the:
• OSD NC roles overview
• How to add and submit comments to the IEC

Contact
Should you require any assistance, please contact the IEC IT Helpdesk.

IEC CDV 61290-11-1 © IEC 2026
CONTENTS
Contact . 3
CONTENTS . 1
FOREWORD . 2
INTRODUCTION . 4
1 Scope . 5
2 Normative references . 5
3 Terms, definitions, abbreviated terms, and symbols . 5
3.1 Terms and definitions. 5
3.2 Abbreviated terms . 5
3.3 Symbols . 6
4 Apparatus . 6
4.1 General . 6
4.2 Light source . 2
4.3 Polarization controller . 3
4.4 Polarizers . 3
4.5 Input optics . 3
4.6 Fibre pigtail . 3
4.7 Optical lens system . 3
4.8 Output optics . 3
4.9 Polarization analyser . 3
5 Procedure . 4
6 Calculations. 5
6.1 Jones matrix eigenanalysis calculations . 5
6.2 Display of DGD versus wavelength . 6
6.3 Average DGD and RMS DGD . 6
6.4 Maximum and minimum DGD . 6
7 Test results . 6
Annex A (informative) Degree of polarization reduction due to optical amplifier ASE in
test systems with tuneable narrowband light source . 8
Bibliography . 10

Figure 1 – Schematic diagram of test equipment using a tuneable laser . 1
Figure 2 – Schematic diagram of test equipment using a broadband light source . 2
Figure 3 – Measurement example of the DGD for a typical optical amplifier . 6
Figure A.1 – Spectrum of optical amplifier output . 8

IEC CDV 61290-11-1 © IEC 2026
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Optical amplifiers - Test methods -
Part 11-1: Polarization mode dispersion parameter - Jones matrix
eigenanalysis (JME)
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for
standardization comprising all national electrotechnical committees (IEC National Committees).
The object of IEC is to promote international co-operation on all questions concerning
standardization in the electrical and electronic fields. To this end and in addition to other
activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC
Publication(s)"). Their preparation is entrusted to technical committees; any IEC National
Committee interested in the subject dealt with may participate in this preparatory work.
International, governmental and non-governmental organizations liaising with the IEC also
participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as
possible, an international consensus of opinion on the relevant subjects since each technical
committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted
by IEC National Committees in that sense. While all reasonable efforts are made to ensure that
the technical content of IEC Publications is accurate, IEC cannot be held responsible for the
way in which they are used or for any misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC
Publications transparently to the maximum extent possible in their national and regional
publications. Any divergence between any IEC Publication and the corres ponding national or
regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies
provide conformity assessment services and, in some areas, access to IEC marks of conformity.
IEC is not responsible for any services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including
individual experts and members of its technical committees and IEC National Committees for
any personal injury, property damage or other damage of any nature whatsoever, whether direct
or indirect, or for costs (including legal fees) and expenses arising out of the publication, use
of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced
publications is indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve
the use of (a) patent(s). IEC takes no position concerning the evidence, validity or applicability
of any claimed patent rights in respect thereof. As of the date of publication of this document,
IEC [had/had not] received notice of (a) patent(s), which may be required to implement this
IEC CDV 61290-11-1 © IEC 2026
document. However, implementers are cautioned that this may not represent the latest
information, which may be obtained from the patent database available at https://patents.iec.ch
and 9) IEC draws attention to the possibility that the implementation of this document may
involve the use of (a) patent(s). IEC takes no position concerning the evidence, validity or
applicability of any claimed patent rights in respect thereof. As of the dat e of publication of this
document, IEC [had/had not] received notice of (a) patent(s), which may be required to
implement this document. However, implementers are cautioned that this may not represent the
latest information, which may be obtained from the patent database available at
https://patents.iec.ch and www.iso.org/patents. IEC shall not be held responsible for identifying
any or all such patent rights. IEC shall not be held responsible for identifying any or all such
patent rights.
IEC 61290-11-1 has been prepared by subcommittee 86C: Fibre optic systems, sensors and
active devices, of IEC technical committee 86: Fibre optics. It is an International Standard.
This third edition cancels and replaces the second edition published in 2008. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) Addition of an alternative test setup using a broadband light source (Figure 2);
b) Addition of root-mean-square DGD to the test results.
The text of this International Standard is based on the following documents:
Draft Report on voting
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English [change
language if necessary].
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at https://www.iec.ch/members_experts/refdocs. The main document types developed by IEC
are described in greater detail at https://www.iec.ch/publications.
A list of all parts of IEC 61290 series, published under the general title Optical amplifiers – Test
methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under https://webstore.iec.ch in the data related to
the specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
IEC CDV 61290-11-1 © IEC 2026
INTRODUCTION
Polarization-mode dispersion (PMD) causes an optical pulse to spread in the time domain. This
dispersion could impair the performance of a telecommunications system. The effect can be
related to differential group velocity and corresponding arrival times of different polarization
components of the signal. For a narrowband light source, the effect can be related to a
differential group delay (DGD) between pairs of orthogonally polarized principal states of
polarization (PSP). Other information about PMD may be found in IEC TR 61282-9:2016 [1] in
general and in IEC TR 61292-5:2004 [2] on OAs in particular.
IEC CDV 61290-11-1 © IEC 2026
1 Scope
This part of IEC 61290 applies to all commercially available optical amplifiers (OAs), including
optical fibre amplifiers (OFAs) using active fibres, semiconductor optical amplifiers (SOAs), and
planar waveguide optical amplifiers (PWOAs).
This document describes a test procedure for measuring the polarization-mode dispersion
(PMD) of OAs using the Jones matrix eigenanalysis (JME) method. The measurement result is
obtained from the measurement of the normalized Stokes parameters at two close ly spaced
wavelengths.
The test method described in this doccument requires a polarized signal at the input of the
polarimeter with a degree of polarization (DOP) of at least 25 %. Although the test source is
highly polarized, the DOP at the output of the OA is reduced by amplified spontaneous emission
(ASE). Annex A analyses the impact of ASE on the DOP when using a tuneable narrowband
light source. In order to assure an accurate measurement, the DOP is measured as part of the
measurement procedure.
The JME test method described in this document has been shown to be immune to polarization-
dependent gain (PDG) and polarization dependent loss (PDL) up to approximately 1 dB.
Although the JME method is in principle also applicable to unpumped (that is, unpowered) OAs,
the JME technique in this document applies to pumped (that is, powered) OAs only.
2 Normative references
There are no normative references in this document.
3 Terms, definitions, abbreviated terms, and symbols
3.1 Terms and definitions
No terms and definitions are listed in this document.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.2 Abbreviated terms
ASE Amplified spontaneous emission
DGD Differential group delay
DOP Degree of polarization
DUT Device (optical amplifier) under test
JME Jones matrix eigenanalysis
OA Optical amplifier
OFA Optical fibre amplifier
OPD Optical path difference
PDG Polarization-dependent gain
PDL Polarization-dependent loss
PMD Polarization-mode dispersion
IEC CDV 61290-11-1 © IEC 2026
PSP Principal states of polarization
PWOA Planar waveguide optical amplifier
SOA Semiconductor optical amplifier
3.3 Symbols
ΔL Maximum optical path difference
max
Δλ Wavelength interval
Δτ Differential group delay (DGD)
λ Wavelength
ν
...