SIST EN 300 494-1 V1.2.1:2003
(Main)Digital Enhanced Cordless Telecommunications (DECT); Generic Access Profile (GAP); Profile Test Specification (PTS); Part 1: Summary
General Information
- Abstract
This EN provides update of ETS 300 494-1 the Profile Test Specification (PTS) summary referencing all the ENs necessary for the conformance testing of the Generic Access Profile. It reflects the changes into the new editions of all relevant standards, e.g EN 300 497, EN 300 444, etc. Supporting members: Ascom, Ericsson, Siemens, Tele Denmark.
- Status
- Published
- Publication Date
- 30-Nov-2003
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 01-Dec-2003
- Due Date
- 01-Dec-2003
- Completion Date
- 01-Dec-2003
- Mandate
- BC-T-341
Overview
SIST EN 300 494-1 V1.2.1:2003, titled "Digital Enhanced Cordless Telecommunications (DECT); Generic Access Profile (GAP); Profile Test Specification (PTS); Part 1: Summary," establishes a summary and guidelines for conformance testing of the DECT Generic Access Profile (GAP). This standard, published by SIST and harmonized with EN 300 494-1, provides updates to the prior version (ETS 300 494-1) and references essential European Norms (ENs) required for compliant DECT GAP implementations.
The DECT GAP ensures interoperability across DECT devices from different manufacturers, enabling reliable voice and data communication through standardized interfaces and protocols. The Profile Test Specification (PTS) defines a structured approach to testing conformance, focusing on multiple protocol layers crucial for the effective functioning of DECT wireless communication systems.
Key Topics
- Conformance Testing for DECT GAP: Provides a summary referencing all necessary ENs for conformance testing of the DECT GAP, including the physical (PH), medium access control (MAC), data link control (DLC), and network (NWK) protocol layers.
- Reference to Up-to-date Standards: Incorporates references to newer editions of related standards such as EN 300 497, EN 300 444, and additional ISO/IEC documents that detail test case libraries and conformance testing methodologies.
- Structured Test Specification: Divides test requirements by protocol layers, outlining relevant test suites, proformas (such as PICS and IXIT), and abstract test suites (ATS).
- GAP Profile Identification: Defines clear identification for the GAP, referencing EN 300 444 for the profile specification and associated proforma documents for both portable and fixed radio terminations.
- Test Realizer and Laboratory Compliance: Mandates that testing laboratories and means of testing comply with ISO/IEC conformance testing requirements, ensuring consistent assessment across implementations.
Applications
Implementing SIST EN 300 494-1 V1.2.1:2003 provides practical value in several key areas within the DECT ecosystem:
- Product Development: Manufacturers of DECT equipment (base stations, handsets, system components) apply this standard to ensure their devices meet GAP conformance requirements, supporting smooth integration and robust interoperability.
- Interoperability Assurance: By conforming to the detailed test specifications, equipment from different vendors can operate together seamlessly in mixed environments, reducing the risk of compatibility issues.
- Certification and Quality Assurance: Accredited laboratories utilize the referenced test cases and conformance procedures to validate products against the DECT GAP, reinforcing product reliability, user safety, and performance.
- Regulatory Compliance: Facilitates alignment with European telecommunications regulations, promoting wider market access for certified devices.
- System Integrators and Network Operators: Ensures deployments using DECT technologies meet standardized communication requirements, improving system scalability and maintenance.
Related Standards
A comprehensive approach to DECT GAP testing requires referencing multiple interconnected standards alongside SIST EN 300 494-1 V1.2.1:2003, including:
- EN 300 444: DECT Generic Access Profile (GAP) specification.
- EN 300 497 Series: Test case libraries for DECT Common Interface (CI), covering MAC, DLC, and NWK protocol layers.
- EN 300 175 Series: DECT CI Parts 1-8 covering interface overview, protocol layers, security, and addressing.
- ISO/IEC 9646 Series: Frameworks and requirements for open systems conformance testing.
- EN 300 494-2 & EN 300 494-3: Profile Specific Test Specifications for portable and fixed radio terminations.
Utilizing these references ensures comprehensive conformance testing and full compliance with the DECT GAP requirements, supporting the reliable deployment of digital cordless telecommunications systems.
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Frequently Asked Questions
SIST EN 300 494-1 V1.2.1:2003 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Digital Enhanced Cordless Telecommunications (DECT); Generic Access Profile (GAP); Profile Test Specification (PTS); Part 1: Summary". This standard covers: This EN provides update of ETS 300 494-1 the Profile Test Specification (PTS) summary referencing all the ENs necessary for the conformance testing of the Generic Access Profile. It reflects the changes into the new editions of all relevant standards, e.g EN 300 497, EN 300 444, etc. Supporting members: Ascom, Ericsson, Siemens, Tele Denmark.
This EN provides update of ETS 300 494-1 the Profile Test Specification (PTS) summary referencing all the ENs necessary for the conformance testing of the Generic Access Profile. It reflects the changes into the new editions of all relevant standards, e.g EN 300 497, EN 300 444, etc. Supporting members: Ascom, Ericsson, Siemens, Tele Denmark.
SIST EN 300 494-1 V1.2.1:2003 is classified under the following ICS (International Classification for Standards) categories: 33.070.30 - Digital Enhanced Cordless Telecommunications (DECT). The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 300 494-1 V1.2.1:2003 is associated with the following European legislation: Standardization Mandates: BC-T-341. When a standard is cited in the Official Journal of the European Union, products manufactured in conformity with it benefit from a presumption of conformity with the essential requirements of the corresponding EU directive or regulation.
SIST EN 300 494-1 V1.2.1:2003 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.3RY]HWHNDigital Enhanced Cordless Telecommunications (DECT); Generic Access Profile (GAP); Profile Test Specification (PTS); Part 1: Summary33.070.30'(&7Digital Enhanced Cordless Telecommunications (DECT)ICS:Ta slovenski standard je istoveten z:EN 300 494-1 Version 1.2.1SIST EN 300 494-1 V1.2.1:2003en01-december-2003SIST EN 300 494-1 V1.2.1:2003SLOVENSKI
STANDARD
ETSIETSI EN 300 494-1 V1.2.1 (1999-08)2ReferenceREN/DECT-040143-1 (4ko90ioo.PDF)KeywordsDECT, GAP, PTS, testingETSIPostal addressF-06921 Sophia Antipolis Cedex - FRANCEOffice address650 Route des Lucioles - Sophia AntipolisValbonne - FRANCETel.: +33 4 92 94 42 00
Fax: +33 4 93 65 47 16Siret N° 348 623 562 00017 - NAF 742 CAssociation à but non lucratif enregistrée à laSous-Préfecture de Grasse (06) N° 7803/88Internetsecretariat@etsi.frIndividual copies of this ETSI deliverablecan be downloaded fromhttp://www.etsi.orgIf you find errors in the present document, send yourcomment to: editor@etsi.frCopyright NotificationNo part may be reproduced except as authorized by written permission.The copyright and the foregoing restriction extend to reproduction in all media.© European Telecommunications Standards Institute 1999.All rights reserved.SIST EN 300 494-1 V1.2.1:2003
ETSIETSI EN 300 494-1 V1.2.1 (1999-08)3ContentsIntellectual Property Rights.4Foreword.41Scope.52References.53Definitions and abbreviations.73.1Definitions.73.2Abbreviations.74Profile identification.85Elements of the PTS.85.1Conformance testing for NWK layer.85.2Conformance testing for DLC layer.95.3Conformance testing for MAC layer.95.4Conformance testing for PH layer.106Conformance.10Bibliography.11History.12SIST EN 300 494-1 V1.2.1:2003
ETSIETSI EN 300 494-1 V1.2.1 (1999-08)4Intellectual Property RightsIPRs essential or potentially essential to the present document may have been declared to ETSI. The informationpertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be foundin SR 000 314: "Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in respectof ETSI standards", which is available from the ETSI Secretariat. Latest updates are available on the ETSI Web server(http://www.etsi.org/ipr).Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guaranteecan be given as to the existence of other IPRs not referenced in SR 000 314 (or the updates on the ETSI Web server)which are, or may be, or may become, essential to the present document.ForewordThis European Standard (Telecommunications series) has been produced by ETSI Project Digital Enhanced CordlessTelecommunications (DECT).The present document is part 1 of a multi-part EN covering the Generic Access Profile (GAP) as identified below:Part 1:"Summary";Part 2:"Profile Specific Test Specification (PSTS) - Portable radio Termination (PT)";Part 3:"Profile Specific Test Specification (PSTS) - Fixed radio Termination (FT)".National transposition datesDate of adoption of this EN:6 August 1999Date of latest announcement of this EN (doa):30 November 1999Date of latest publication of new National Standardor endorsement of this EN (dop/e):31 May 2000Date of withdrawal of any conflicting National Standard (dow):31 May 2000SIST EN 300 494-1 V1.2.1:2003
ETSIETSI EN 300 494-1 V1.2.1 (1999-08)51ScopeThe present document specifies the Profile Test Specification (PTS) summary referencing all the ENs necessary for theconformance testing of the DECT Generic Access Profile (GAP).This GAP PTS summary together with the ENs it references constitute the GAP PTS.The present document has the following structure:-clause 4 contains general information relative to the profile including references to the related ENs;-clause 5 contains a summary and references to the ENs relevant for each of DECT protocol layers to be tested.2ReferencesThe following documents contain provisions which, through reference in this text, constitute provisions of the presentdocument.· References are either specific (identified by date of publication, edition number, version number, etc.) ornon-specific.· For a specific reference, subsequent revisions do not apply.· For a non-specific reference, the latest version applies.· A non-specific reference to an ETS shall also be taken to refer to later versions published as an EN with the samenumber.[1]EN 300 175-1: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 1: Overview".[2]EN 300 175-2: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 2: Physical Layer (PHL)".[3]EN 300 175-3: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 3: Medium Access Control (MAC) layer".[4]EN 300 175-4: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 4: Data Link Control (DLC) layer".[5]EN 300 175-5: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 5: Network (NWK) layer".[6]EN 300 175-6: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 6: Identities and addressing".[7]EN 300 175-7: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 7: Security features".[8]EN 300 175-8: "Digital Enhanced Cordless Telecommunications (DECT); Common Interface (CI);Part 8: Speech coding and transmission".[9]Void.[10]EN 300 444: "Digital Enhanced Cordless Telecommunications (DECT); Generic Access Profile(GAP)".[11]ISO/IEC 9646-1: "Information technology; Open Systems Interconnection; Conformance testingmethodology and framework; Part 1: General concepts".[12]ISO/IEC 9646-2: "Information technology; Open Systems Interconnection; Conformance testingmethodology and framework; Part 2: Abstract test suite specification".SIST EN 300 494-1 V1.2.1:2003
ETSIETSI EN 300 494-1 V1.2.1 (1999-08)6[13]ISO/IEC 9646-3: "Information technology; Open Systems Interconnection; Conformance testingmethodology and framework; Part 3: The Tree and Tabular Combined Notation (TTCN)".[14]ISO/IEC 9646-4: "Information technology; Open Systems Interconnection; Conformance testingmethodology and framework; Part 4: Test realization".[15]ISO/IEC 9646-5: "Information technology; Open Systems Interconnection; Conformance testingmethodology and framework; Part 5: Requirements on test laboratories and clients for theConformance Assessment process".[16]ISO/IEC 9646-6: "Information technology; Open Systems Interconnection; Conformance testingmethodology and framework; Part 6: Protocol Profile Test Specification".[17]ISO/IEC 9646-7: "Information technology; Open Systems Interconnection; Conformance testingmethodology and framework; Part 7: Implementation Conformance Statements ".[18]TR 101 101: "Methods for Testing and Specifi
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