SIST EN 61076-5:2002
(Main)Connectors for use in d.c., low-frequency analogue and digital high-speed data applications -- Part 5: In-line sockets with assessed quality - Sectional Specification
Connectors for use in d.c., low-frequency analogue and digital high-speed data applications -- Part 5: In-line sockets with assessed quality - Sectional Specification
Defines functional levels, standard test methods and gauges for use in the examination of sockets designed for in-line electronic packages. Lays down appropriate reference dimensions of the mating device and board layout to establish intermateability and interchangeability criteria. Lays down test severity and performance requirements.
Steckverbinder für Gleichspannungs- und Niederfrequenzanwendungen sowie digitale Anwendungen mit hoher Übertragungsrate -- Teil 5: In-Line-Fassungen mit bewerteter Qualität - Rahmenspezifikation
Connecteurs pour applications analogiques en courant continu et basse fréquence et pour applications numériques utilisant des débits élevés pour le transfert de données -- Partie 5: Supports pour microboîtiers sous assurance de la qualité - Spécification intermédiaire
Définit des niveaux fonctionnels et des méthodes d'essais normalisées, ainsi que des calibres pour utilisation dans l'examen des supports conçus pour les boîtiers électroniques en ligne. Définit des dimensions de référence appropriées du dispositif d'accouplement et de la présentation des composants pour établir les critères de compatibilité d'accouplement et d'interchangeabilité. Donne les prescriptions de performance et de sévérité des essais des spécifications particulières.
Connectors with assessed quality, for use in d.c., low frequency analogue and digital high-speed data applications - Part 5: In-line sockets with assessed quality - Sectional specification (IEC 61076-5:2001)
General Information
Standards Content (Sample)
SLOVENSKI SIST EN 61076-5:2002
prva izdaja
STANDARD
september 2002
Connectors with assessed quality, for use in d.c., low frequency analogue and
digital high-speed data applications - Part 5: In-line sockets with assessed quality -
Sectional specification (IEC 61076-5:2001)
ICS 31.220.10 Referenčna številka
SIST EN 61076-5:2002(en)
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
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EUROPEAN STANDARD EN 61076-5
NORME EUROPÉENNE
EUROPÄISCHE NORM October 2001
ICS 31.220.10
English version
Connectors for use in d.c., low-frequency analogue and
digital high-speed data applications
Part 5: In-line sockets with assessed quality -
Sectional Specification
(IEC 61076-5:2001)
Connecteurs pour applications Steckverbinder für Gleichspannungs- und
analogiques en courant continu et Niederfrequenzanwendungen sowie
basse fréquence et pour applications digitale Anwendungen mit hoher
numériques utilisant des débits élevés Übertragungsrate
pour le transfert de données Teil 5: In-Line-Fassungen mit bewerteter
Partie 5: Supports pour microboîtiers sous Qualität -
assurance de la qualité - Rahmenspezifikation
Spécification intermédiaire (IEC 61076-5:2001)
(CEI 61076-5:2001)
This European Standard was approved by CENELEC on 2001-10-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands,
Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2001 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61076-5:2001 E
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EN 61076-5:2001 - 2 -
Foreword
The text of document 48B/980/FDIS, future edition 1 of IEC 61076-5, prepared by SC 48B,
Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic
equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 61076-5 on 2001-10-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2002-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2004-10-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes B and ZA are normative and annex A is informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61076-5:2001 was approved by CENELEC as a European
Standard without any modification.
__________
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- 3 - EN 61076-5:2001
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1)
IEC 60068-1 1988 Environmental testing EN 60068-1 1994
Part 1: General and guidance
IEC 60352 Series Solderless connections EN 60352 Series
IEC 60410 1973 Sampling plans and procedures for--
inspection by attributes
IEC 60512-1-100 2001 Connectors for electronic equipment - EN 60512-1-100 2001
Tests and measurements
Part 1-100: General - Applicable
publications
IEC 60512-2 1985 Part 2: General examination, electrical--
continuity and contact resistance tests,
insulation tests and voltage stress tests
IEC 60512-4 1976 Part 4: Dynamic stress tests - -
IEC 60512-5 1992 Part 5: Impact tests (free components),--
static load tests (fixed components),
endurance tests and overload tests
IEC 60512-6 1984 Part 6: Climatic tests and soldering tests - -
IEC 60512-7 1993 Part 7: Mechanical operating tests and--
sealing tests
IEC 60512-8 1993 Part 8: Connector tests (mechanical)--
and mechanical tests on contacts and
terminations
IEC 60512-9 1992 Part 9: Miscellaneous tests - -
IEC 60512-11 Series Part 11: Climatic tests EN 60512-11 Series
1)
EN 60068-1 includes the corrigendum October 1988 and A1:1992 to IEC 60068-1.
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EN 61076-5:2001 - 4 -
Publication Year Title EN/HD Year
IEC 60512-11-7 1996 Part 11: Climatic tests -- Section 7: Test EN 60512-11-7 1996
11g: Flowing mixed gas corrosion test
ISO 1302 1992 Technical drawings - Method of --
indicating surface texture
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NORME
CEI
INTERNATIONALE IEC
61076-5
INTERNATIONAL
QC 480400
STANDARD
Première édition
First edition
2001-03
Connecteurs pour applications analogiques en
courant continu et basse fréquence et pour
applications numériques utilisant des débits
élevés pour le transfert de données –
Partie 5:
Supports pour microboîtiers sous assurance de la
qualité – Spécification intermédiaire
Connectors for use in d.c., low-frequency analogue
and digital high-speed data applications –
Part 5:
In-line sockets with assessed quality –
Sectional specification
© IEC 2001 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun procédé, any form or by any means, electronic or mechanical,
électronique ou mécanique, y compris la photocopie et les including photocopying and microfilm, without permission in
microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
V
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue
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61076-5 © IEC:2001 – 3 –
CONTENTS
FOREWORD . 7
1 Scope and object . 11
2 General. 11
2.1 Normative references. 11
2.2 Marking. 13
2.3 Information to be given in a detail specification. 15
2.4 Standard values. 15
2.5 Classification . 15
2.5.1 Termination types . 15
2.5.2 Contact style. 15
2.5.3 Insulator body configuration . 15
2.5.4 Decoupling capacitor. 17
3 Quality assessment procedures . 17
3.1 General. 17
3.2 Primary stage of manufacturing . 17
3.3 Structurally similar sockets . 17
3.4 Lot-by-lot inspection tests . 17
3.5 Periodic inspection tests . 17
3.6 Alternative test methods . 17
4 Test methods and procedures . 19
4.1 General aspects. 19
4.2 Pre-conditioning. 19
4.3 Mounting of specimens . 19
5 Supplementary test information. 19
5.1 Test conditions . 19
5.2 Mechanical tests . 19
5.2.1 Mating force for all socket sizes (insertion and withdrawal forces). 19
5.2.2 Mechanical operation . 21
5.2.3 Contact retention . 21
5.2.4 Vibration . 21
5.2.5 Mechanical shock . 21
5.2.6 Terminal strength (robustness of terminations). 23
5.2.7 Solder wicking (under consideration). 23
5.3 Electrical tests . 23
5.3.1 Insulation resistance . 23
5.3.2 Voltage proof . 23
5.3.3 Contact resistance – Millivolt level method. 25
5.3.4 Capacitance. 25
5.3.5 Inductance (under consideration) . 25
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61076-5 © IEC:2001 – 5 –
5.4 Environmental tests . 27
5.4.1 Solderability. 27
5.4.2 Resistance to soldering heat . 27
5.4.3 Damp heat . 27
5.4.4 Dry heat. 27
5.4.5 Rapid change of temperature (thermal shock) . 29
5.4.6 Corrosive atmosphere or mixed flowing gas or harsh environment
(gas tightness) . 29
5.4.7 Mould growth (fungus) . 31
5.4.8 Porosity (under consideration) . 31
5.4.9 Examination of dimensions and mass. 31
5.4.10 Visual examination. 31
6 Packaging requirements. 31
6.1 Unit packing. 31
7 Test schedule . 31
7.1 General. 31
7.1.1 Basic (minimum) test schedule. 33
7.1.2 Full test schedule. 35
Annex A (informative) Terminology. 53
Annex B (normative) Test method for determination of gas-tight characteristics
for electrical connectors, sockets and/or contact systems. 55
Figure 1 – Contact resistance test points. 25
Figure 2 – Insertion and withdrawal force test gauge. 45
Figure 3 – Retention force gauge . 47
Table 1 – Basic test schedule. 33
Table 2 – Test group P. 35
Table 3 – Test group AP. 37
Table 4 – Test group BP. 37
Table 5 – Test group CP . 39
Table 6 – Test group DP . 39
Table 7 – Test group EP. 41
Table 8 – Test group FP – electrical characteristics . 41
Table 9 – Test group GP – destructive test. 43
Table 10 – Flat pin test gauge dimensions. 45
Table 11 – Quality conformance inspection, lot-by-lot tests . 49
Table 12 – Quality conformance inspection, periodic tests. 51
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61076-5 © IEC:2001 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
––––––––––––
CONNECTORS FOR USE IN DC,
LOW-FREQUENCY ANALOGUE AND DIGITAL HIGH-SPEED
DATA APPLICATIONS –
Part 5: In-line sockets with assessed quality –
Sectional specification
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61076-5 has been prepared by subcommittee 48B: Connectors,
of IEC technical committee 48: Electromechanical components and mechanical structures
for electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
48B/980/FDIS 48B/1009/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annex A is for information only.
Annex B forms an integral part of this standard.
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61076-5 © IEC:2001 – 9 –
This part 5 constitutes the sectional specification in the IEC quality assessment system for
electronic components (IECQ) for in-line sockets.
The QC number that appears on the cover of this publication is the specification number of
the IEC Quality Assessment System for Electronic Components (IECQ).
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
IEC 61076 consists of the following parts, under the general title, Connectors for use in d.c.,
low-frequency analogue and digital high-speed data applications:
Part 1: Generic specification
Part 2: Circular connectors with assessed quality – Sectional specification
Part 3: Rectangular connectors with assessed quality – Sectional specification
Part 4: Printed board connectors with assessed quality – Sectional specification
Part 5: In-line sockets with assessed quality – Sectional specification
1)
Part 6: Loose part contacts with assessed quality – Sectional specification
Part 7: Cable outlet accessories with assessed quality, including qualification and capability
approval – Sectional specification
The committee has decided that the contents of this publication will remain unchanged until 2005.
At this date, the publication will be
reconfirmed;
withdrawn;
replaced by a revised edition, or
amended.
________
1)
Under consideration.
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61076-5 © IEC:2001 – 11 –
CONNECTORS FOR USE IN DC,
LOW-FREQUENCY ANALOGUE AND DIGITAL HIGH-SPEED
DATA APPLICATIONS –
Part 5: In-line sockets with assessed quality –
Sectional specification
1 Scope and object
This part of IEC 61076 relates to the plug-in sockets designed for in-line electronic packages
of assessed quality. Sockets covered by this specification are devices which provide a means
of interchangeability between devices and compliance between mating limits.
The scope of this specification covers sockets for packages with contacts having one of the
following in-line formats.
a) Single in-line sockets.
b) Dual in-line sockets.
c) Quad in-line sockets.
d) Zig-zag in-line (staggered) sockets.
The object of this specification is to define
• a unified numbering system;
• functional levels and standard test methods and gauges for use in the examination of
these sockets;
• appropriate reference dimensions of the mating device and board layout to establish
intermateability and interchangeability criteria. Test severity and performance require-
ments prescribed in detail specifications referring to this sectional specification shall be
equal to, or greater than, those specified herein; degradations are not permitted.
2 General
2.1 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 61076. For dated references, subsequent
amendments to, or revisions of, any of these publications do not apply. However, parties to
agreements based on this part of IEC 61076 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. For undated
references, the latest edition of the normative document referred to applies. Members of IEC
and ISO maintain registers of currently valid International Standards.
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60352 (all parts), Solderless connections
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
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61076-5 © IEC:2001 – 13 –
IEC 60512-1-100, Electromechanical components for electronic equipment – Basic testing
procedures and measuring methods – Part 1-100: General – Applicable publications
IEC 60512-2:1985, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 2: General examination, electrical continuity and
contact resistance tests, insulation tests and voltage stress tests
IEC 60512-4:1976, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 4: Dynamic stress tests
IEC 60512-5:1992, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 5: Impact tests (free components), static load tests
(fixed components), endurance tests and overload tests
IEC 60512-6:1984, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 6: Climatic tests and soldering tests
IEC 60512-7:1993, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 7: Mechanical operating tests and sealing tests
IEC 60512-8:1993, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 8: Connector tests (mechanical) and mechanical
tests on contacts and terminations
IEC 60512-9:1992, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 9: Miscellaneous tests
IEC 60512-11 (all parts), Electromechanical components for electronic equipment; basic
testing procedures and measuring methods – Part 11: Climatic tests
IEC 60512-11-7:1996, Electromechanical components for electronic equipment; basic testing
procedures and measuring methods – Part 11: Climatic tests – Section 7: Test 11g: Flowing
mixed gas corrosion test
ISO 1302:1992, Technical drawings – Method of indicating surface texture
2.2 Marking
The socket shall be legibly marked with the following information.
• Terminal identification whenever specified by the detail specification.
• Manufacturer's name, trade mark, or code identification number.
• Identifying number (IEC part number, manufacturer's part number, etc.).
• Date code.
The date code is a four-digit code number. The first two digits shall denote the last two digits
of the year. The last two digits shall specify the week of manufacture. For example, a date
of 9232 denotes that the sockets were manufactured during the 32nd week of 1992. Other
markings may be applied to the socket, provided they do not interfere with, obscure, or
confuse those markings required above. Where size, surface conditions or other design
considerations do not allow full marking on the part, the markings shall use the order of
preference given above. Any required markings which cannot be applied to the socket shall
be applied to the package containing the sockets.
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61076-5 © IEC:2001 – 15 –
2.3 Information to be given in a detail specification
The detail specification shall be derived from the relevant blank detail specification and shall
contain all required information. Detail specifications shall not specify requirements inferior to
those of the generic or sectional specifications. When more severe requirements are included,
they shall be listed in the detail specification and indicated in the test schedules; for example,
by an asterisk.
The detail specification shall contain the complete technical requirements for inspection,
including the quality conformance test schedule. If the technical requirements of the generic
and/or sectional specification relative to inspection are not entirely suitable (either for
technical reasons or for special applications) to the component described in the detail
specification, the detail specification shall set out clearly the various amendments which are
to be made to these requirements.
2.4 Standard values
The range for voltage shall not exceed 1 000 V (d.c. or peak a.c.). The current rating shall not
exceed 2 A. Specific voltage and current ratings shall be as defined in the detail specification.
2.5 Classification
Sockets covered by this sectional specification shall be classified with respect to termination
type, contact style, insulator body configuration, and decoupling capacitor style.
2.5.1 Termination types
a) Solderless wrap terminals.
b) Printed circuit terminals.
c) Surface mount terminals.
2.5.2 Contact style
a) Two-piece contact. A contact assembly with a closed-bottom seamless outer sleeve and a
multifinger inner spring contact.
b) Stamped and formed contact. A contact which in its entirety is made by stamping and
forming.
c) Two-piece sealed entry contact. A two-piece contact assembly with a multifinger inner
contact and a closed bottom seamless outer sleeve. The lead entry is sealed against
external contaminants.
2.5.3 Insulator body configuration
a) Solid body – no mounting holes.
b) Open frame.
c) Solid body with mounting holes.
d) Flexible plastic socket carrier.
e) Rigid plastic socket carrier.
f) Rigid metal socket carrier.
g) Rigid plastic with metal-pin socket carrier.
h) Angled mounting.
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61076-5 © IEC:2001 – 17 –
2.5.4 Decoupling capacitor
a) Axial lead moulded.
b) Axial lead ceramic.
c) Parallel lead moulded.
d) Parallel lead ceramic.
e) Surface mount chip.
f) Surface mount flatpack.
The complete classification of an in-line socket shall consist of all three primary
characteristics and decoupling capacitor style where applicable. For example, a DIP (Dual In-
line Package) socket with printed circuit terminals, stamped and formed contact, open-frame
insulator body configuration and axial lead ceramic decoupling capacitor shall have a
classification B2B2.
3 Quality assessment procedures
3.1 General
The qualification inspection tests are prescribed in table 2. When additional test groups are
prescribed by the detail specification, the identity of the test group, the sequence of tests, and
the minimum sample quantity shall be in accordance with table 2. When the detail
specification prescribes tests not in table 2, it shall include the additional test either within an
existing test group or as an additional test group. No failures are permitted. In the event that
qualification is sought on a variant of a previously qualified socket, qualification inspection
shall be limited to those tests for which the test results on previously qualified sockets are not
valid for the variant.
3.2 Primary stage of manufacturing
The primary stage of manufacture is the first process subsequent to the manufacture of
finished piece parts and subassemblies. A subassembly is defined as the permanent
assembly of two or more piece parts.
3.3 Structurally similar sockets
...
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