SIST EN 61300-3-17:2001
(Main)Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 3-17: Examinations and measurements - Endface angle of angle-polished ferrules
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 3-17: Examinations and measurements - Endface angle of angle-polished ferrules
Describes the methods to measure the endface angle of flat or convex angle-polished ferrule.
Lichtwellenleiter - Verbindungselemente und passive Bauteile - Grundlegende Prüf- und Meßverfahren -- Teil 3-17: Untersuchungen und Messungen - Anschliffwinkel schräg polierter Stifte
Dispositifs d'interconnexion et composants passifs à fibres optiques - Méthodes fondamentales d'essais et de mesures -- Partie 3-17: Examens et mesures - Angle de la face terminale des embouts polis angulairement
Définit des méthodes permettant de mesurer l'angle de la face terminale des embouts polis angulairement, convexes ou plats.
Fibre optic interconnecting devices and passive componets - Basic test and mesurement procedure - Part 3-17: Examinations and measurements - Endface angle of angle-polished ferrules (IEC 61300-3-17:1999)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 61300-3-17:2001
01-februar-2001
1DGRPHãþD
SIST EN 61300-3-17:1999
Fibre optic interconnecting devices and passive componets - Basic test and
mesurement procedure - Part 3-17: Examinations and measurements - Endface
angle of angle-polished ferrules (IEC 61300-3-17:1999)
Fibre optic interconnecting devices and passive components - Basic test and
measurement procedures -- Part 3-17: Examinations and measurements - Endface angle
of angle-polished ferrules
Lichtwellenleiter - Verbindungselemente und passive Bauteile - Grundlegende Prüf- und
Meßverfahren -- Teil 3-17: Untersuchungen und Messungen - Anschliffwinkel schräg
polierter Stifte
Dispositifs d'interconnexion et composants passifs à fibres optiques - Méthodes
fondamentales d'essais et de mesures -- Partie 3-17: Examens et mesures - Angle de la
face terminale des embouts polis angulairement
Ta slovenski standard je istoveten z: EN 61300-3-17:1999
ICS:
33.180.20 3RYH]RYDOQHQDSUDYH]D Fibre optic interconnecting
RSWLþQDYODNQD devices
SIST EN 61300-3-17:2001 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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NORME CEI
INTERNATIONALE IEC
61300-3-17
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
1999-09
Dispositifs d'interconnexion et composants
passifs à fibres optiques –
Méthodes fondamentales d'essais
et de mesures –
Partie 3-17:
Examens et mesures – Angle de la face terminale
des embouts polis angulairement
Fibre optic interconnecting devices and
passive components – Basic test and
measurement procedures –
Part 3-17:
Examinations and measurements –
Endface angle of angle-polished ferrules
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Pour prix, voir catalogue en vigueur
For price, see current catalogue
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61300-3-17 © IEC:1999 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 General.9
1.1 Scope and object . 9
1.2 Normative references.9
2 General description. 9
2.1 Method 1 – Automatic interferometric method. 11
2.2 Method 2 – Manual interferometric method . 13
2.3 Method 3 – Mechanical profilometer method. 13
2.4 Method 4 – Reflected light method . 15
3 Apparatus.17
3.1 Method 1 – Automatic interferometric method. 17
3.2 Method 2 – Manual interferometric method . 17
3.3 Method 3 – Mechanical profilometer method. 19
3.4 Method 4 – Reflected light method . 21
4 Procedure.21
4.1 Method 1 – Automatic interferometric method. 21
4.2 Method 2 – Manual interferometric method . 23
4.3 Method 3 – Mechanical profilometer method. 23
4.4 Method 4 – Reflected light method . 29
5 Details to be specified . 29
5.1 Method 1 – Automatic interferometric method. 29
5.2 Method 2 – Manual interferometric method . 29
5.3 Method 3 – Mechanical profilometer method. 29
5.4 Method 4 – Reflected light method . 31
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61300-3-17 © IEC:1999 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-17: Examinations and measurements –
Endface angle of angle-polished ferrules
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-17 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This second edition of IEC 61300-3-17 cancels and replaces the first edition, published in
1995, and constitutes a technical revision.
The text of this standard is based on the following documents:
FDIS Report on voting
86B/1225/FDIS 86B/1261/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
IEC 61300 consists of the following parts, under the general title Fibre optic interconnecting
devices and passive components – Basic test and measurement procedures:
– Part 1: General and guidance
– Part 2: Tests
– Part 3: Examination and measurements
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61300-3-17 © IEC:1999 – 7 –
The committee has decided that the contents of this publication will remain unchanged until 2006.
At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
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61300-3-17 © IEC:1999 – 9 –
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-17: Examinations and measurements –
Endface angle of angle-polished ferrules
1 General
1.1 Scope and object
The object of this part of IEC 61300 is to describe the methods to measure the endface angle
of flat or convex angle-polished ferrules.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 61300. For dated references, subsequent amendments
to, or revisions of, any of these publications do not apply. However, parties to agreements
based on this part of IEC 61300 are encouraged to investigate the possibility of applying the
most recent editions of the normative documents indicated below. For undated references, the
latest edition of the normative document referred to applies. Members of IEC and ISO maintain
registers of currently valid International Standards.
ISO 2538:1998, Geometrical Product Specifications (GPS) – Series of angles and slopes on
prisms
2 General description
The ferrule endface angle θ for flat endface angle-polished ferrules is defined as the angle
between the plane perpendicular to the axis of the ferrule and the plane of the flat endface. The
endface angle θ for spherically polished angled endface ferrules is the angle between the plane
perpendicular to the axis of the ferrule and the straight line tangent to the polished surface at
the fibre core in the direction of the nominal angle (see figure 1).
Plane perpendicular Plane perpendicular
to this fibre axis to this fibre axis
Fibre axis Fibre axis
Ferrule Ferrule
θ θ
Plane of the
Straight line tangent to
flat endface
the polished surface
IEC 1047/99
Figure 1a – Convex polished ferrules Figure 1b – Flat polished ferrules
Figure 1 – Definition of ferrule endface angle for convex and flat polished ferrules
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61300-3-17 © IEC:1999 – 11 –
Four methods are described for measuring the ferrule endface angle:
– method 1: automatic interferometric method (reference method);
– method 2: manual interferometric method;
– method 3: mechanical profilometer method;
– method 4: reflected light method.
2.1 Method 1 – Automatic interferometric method
Due to its greater accuracy, method 1 is considered to be the reference method.
In this method, the ferrule endface is placed in a tiltable micropositioner under a microscope
with interferometric capability.
NOTE – A fixed holder at the nominal value of the angle that has to be measured may be used, but in this case the
alignment procedure described is not applicable and it is necessary to use a reference angled plug measured with
other methods.
Interferometer
objective
Angular
micropositioner
θθ
0
IEC 1048/99
Figure 2 – Example of set-up of angle measurement by means of interferometer
Phase differences between the reference wavefront and the wavefront from the surface of the
ferrule under test create a fringe pattern.
The ferrule is tilted by a micropositioner at the nominal value θ of the angle that has to be
0
measured. For a convex polished ferrule, the curvature radius and the apex offset
R
component in the direction of the angle E are measured from the analysis of the
x
interferometric pattern (see figure 3). The value of the angle is evaluated from the values of
R
and E .
x
Fringes centre
(polishing vertex)
Fibre axis
Interferometric
E
y
fringes
Fibre
E
x
IEC 1049/99
Figure 3 – Example of interference pattern of a convex polished ferrule
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61300-3-17 © IEC:1999 – 13 –
For a flat polished ferrule, the angle is evaluated from the frequency of the interferometric
fringes in the angle direction (see figure 4), that is, from the number of waves in the length unit
1/Λ.
Λ
Λ
IEC 1050/99
Figure 4 – Example of interference pattern of a flat polished ferrule
2.2 Method 2 – Manual interferometric method
As in method 1, the ferrule endface is placed in a tiltable micropositioner under a microscope
with interferometric capability. In this method, however, the ferrule is tilted by a micro-
positioner until the surface of the endface is normal to the optical axis of the interferometer:
this happens when the real value of the angle is reached. In the case of a convex polished
ferrule endface, this position is reached when the interference rings and the fibre are both
symmetrical to the rotation axis (see figure 5). In the case of a flat polished ferrule, this
position is reached when the interference fringes disappear or are at a minimum number.
Fringes centre
Fibre axis
Interferometric
fringes
Fibre
Rotation
axis
IEC 1051/99
Figure 5 – Example of interference pattern of a convex polished ferrule
adjusted for method 2 measurement
The endface angle of the ferrule can be read at the dial of the micropositioner.
2.3 Method 3 – Mechanical profilometer method
In this method, the endface angle is evaluated by profiling the endface ferrule with a surface
analyser.
The ferrule is placed in a fixed holder under the stylus of mechanical profilometer. The ferrule
axis shall be parallel to the stylus axis and the plug shall be positioned with the angle in the
direction of the stylus scan.
The endface angle of the ferrule is evaluated from the analysis of the acquired profile.
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61300-3-17 © IEC:1999 – 15 –
2.4 Method 4 – Reflected light method
In this method, a visible light He-Ne beam aligned along the ferrule axis is reflected by the
ferrule endface to impinge upon a screen as a spot pattern. The screen is normal to and
surrounding the ferrule axis (see figure 6).
V-groove or precision sleeve
He-Ne laser
D
Screen
Ferrule
L (see note)
Spot pattern
IEC 1052/99
NOTE – For convex polished ferrules, a suitable length L may be between 20 cm and 50 cm and may be recorded in
the test result.
Figure 6 – Example of set-up for ferrule endface angle measurement
In the case of a flatly polished ferrule endface, the spot pattern is typically a small visible,
approximately uniformly illuminated circle showing l
...
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