kSIST FprEN IEC 61290-3-2:2026

• Status: Not Published
• Public Enquiry End Date: 31-Dec-2025
• ICS: 33.180.30 - Optic amplifiers
• Technical Committee: MOC - Mobile Communications
• Current Stage: 5020 - Formal vote (FV) (Adopted Project)
• Start Date: 23-Jun-2026
• Due Date: 11-Aug-2026
• Completion Date: 08-Jul-2026
• Ref Project: FprEN IEC 61290-3-2:2026 - Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method

• Revises: SIST EN 61290-3-2:2008 - Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008)
• Effective Date: 13-May-2025

kSIST FprEN IEC 61290-3-2:2026 is a Slovenian standard published by SIST for optical amplifiers. It specifies an electrical spectrum analyzer (ESA) method for measuring noise figure parameters of commercially available optical amplifiers, including OFAs, SOAs and PWOAs. The document is written for engineers, test laboratories and quality teams that need repeatable noise-figure measurements and comparable test reports.

What does kSIST FprEN IEC 61290-3-2:2026 specify?

kSIST FprEN IEC 61290-3-2:2026 specifies how to measure noise figure parameters of optical amplifiers by the ESA method. It covers the test principle, equipment, specimen conditions, procedures, calculations and reporting items needed to obtain comparable results.

The document is organized into Clauses 1 to 9, plus a bibliography and Figure 1. Clause 1 gives the scope, Clause 2 lists the normative reference, Clause 3 collects terms, abbreviations and symbols, Clause 4 explains the method in general, Clauses 5 and 6 cover apparatus and test specimen, Clause 7 gives the procedure, Clause 8 gives the calculations, and Clause 9 lists the test-result items to report.

What are the key requirements of kSIST FprEN IEC 61290-3-2:2026?

kSIST FprEN IEC 61290-3-2:2026 is built around direct electrical noise measurement. That matters because the method measures the total noise figure and can be used on different OA technologies, including devices where amplified spontaneous emission is not the only relevant noise contribution.

Measurement setup and source conditions

Clause 5 requires a source module with a single-line laser, sinusoidal modulation, isolator protection, input VOA control and polarization control. In practice, this means the source must be stable, low-noise and adjustable without changing its spectrum or polarization behavior in an uncontrolled way.

Clause 5 also requires a modulation source, an optical power meter, a receiver module, optical jumper cables and matching connectors. The setup is designed so the input power, output power and detected noise can all be measured consistently.

Receiver and analyzer behavior

Clause 5 requires the receiver module to combine an output VOA, an optical detector and an ESA with sufficiently low internal noise. In practice, the analyzer noise floor must be low enough that the amplifier noise remains measurable after thermal-noise subtraction.

The document also allows an optical filter as an option. That is useful when the user wants to reduce spontaneous-spontaneous noise contributions before calculating the final noise figures.

Test specimen handling

Clause 6 requires the OA to operate at nominal conditions during the test. The input polarization state must be adjusted so that the noise figure is maximized, because polarization changes can alter both input power and multiple-path-interference behavior.

Procedure and calculation logic

Clause 7 offers two approaches: a frequency-scanning technique and a selected-frequency technique. The frequency-scanning technique is recommended when the noise behavior versus frequency is unknown or changes non-monotonically; the selected-frequency technique is used when the noise is essentially flat or falls steadily with frequency.

Clause 7 first calibrates the setup by separating shot noise from laser relative intensity noise (RIN). It then measures the OA inserted, records output power, noise power and signal power, and uses the same baseband frequencies for calibration and measurement. In practice, this is what lets the user turn raw ESA readings into a calibrated noise figure.

Clause 8 turns those measurements into noise factor and noise figure values. It also allows optional calculation of the multiple path interference (MPI) figure of merit and, when appropriate, the signal-spontaneous noise figure. That is important when a lab needs more than one noise metric from the same test campaign.

What terms does kSIST FprEN IEC 61290-3-2:2026 define?

kSIST FprEN IEC 61290-3-2:2026 uses the terms and definitions from IEC 61291-1, and Clause 3 lists the abbreviations and symbols used in the method.

• ESA - electrical spectrum analyzer, the instrument used to measure the electrical noise spectrum.
• OA - optical amplifier, the device under test.
• OFA - optical fibre amplifier, an OA based on an optically pumped fibre.
• SOA - semiconductor optical amplifier, a semiconductor-based OA.
• PWOA - planar waveguide optical amplifier, a waveguide-based OA.
• MPI - multiple path interference, a noise contribution linked to internal reflections.
• RIN - relative intensity noise, the source intensity fluctuation expressed per bandwidth.
• VOA - variable optical attenuator, used to adjust optical power during calibration and measurement.

Who uses kSIST FprEN IEC 61290-3-2:2026?

kSIST FprEN IEC 61290-3-2:2026 is used by optical amplifier manufacturers, test laboratories, and quality or procurement teams that need a defined method for measuring noise figure parameters. It is relevant in development, verification, acceptance testing and technical comparison of OAs across product types.

What changed in kSIST FprEN IEC 61290-3-2:2026 from the previous edition?

kSIST FprEN IEC 61290-3-2:2026 is the third edition and replaces the second edition published in 2008. The document states these technical changes:

• the scope in Clause 1 was shortened and clarified;
• the normative references in Clause 2 were updated;
• duplicate instructions in 7.2 about measuring time-average input power were removed;
• unused symbols were removed from 3.3 and one new symbol was added.

Which standards are used with kSIST FprEN IEC 61290-3-2:2026?

kSIST FprEN IEC 61290-3-2:2026 uses IEC 61291-1 as its normative reference for terms, definitions and the generic specification of optical amplifiers. It is also read with IEC 61290-3, which provides the general background for noise figure test methods, and with IEC TR 61292-2, which explains the theoretical background for ESA-based noise figure evaluation. IEC 60728-6 is cited for self-heterodyne linewidth measurement.

What does the kSIST FprEN IEC 61290-3-2:2026 document contain?

kSIST FprEN IEC 61290-3-2:2026 contains a full test method, not just a definition of noise figure. It includes a measurement set-up diagram, calibration steps, two alternative measurement procedures, and calculation steps that separate shot noise, RIN and amplifier noise.

Clause 9 gives the reporting items expected in a test record, including the set-up, wavelength, source linewidth, source RIN, modulation conditions, input power, ESA bandwidth and the resulting noise figure values. That makes the document suitable for lab procedures, test reports and product characterization files.

SLOVENSKI STANDARD
oSIST prEN IEC 61290-3-2:2025
01-december-2025
Optični ojačevalniki - Preskusne metode - 3-2. del: Parametri hrupa - Metoda
analizatorja električnega spektra
Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical
spectrum analyzer method
Lichtwellenleiter-Verstärker - Prüfverfahren - Teil 3-2: Rauschzahlparameter - Verfahren
mit elektrischem Spektralanalysator
Amplificateurs optiques - Méthodes d'essais - Partie 3-2: Paramètres du facteur de bruit -
Méthode de l'analyseur spectral électrique
Ta slovenski standard je istoveten z: prEN IEC 61290-3-2:2025
ICS:
33.180.30 Optični ojačevalniki Optic amplifiers
oSIST prEN IEC 61290-3-2:2025 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

oSIST prEN IEC 61290-3-2:2025
oSIST prEN IEC 61290-3-2:2025
86C/1990/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61290-3-2 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-10-24 2026-01-16
SUPERSEDES DOCUMENTS:
86C/1976/CD, 86C/1986/CC
IEC SC 86C : FIBRE OPTIC SYSTEMS, SENSING AND ACTIVE DEVICES
SECRETARIAT: SECRETARY:
United States of America Mr Fred Heismann
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):

ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some
Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is
the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum
analyzer method
PROPOSED STABILITY DATE: 2029
NOTE FROM TC/SC OFFICERS:
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
Committee positions. You may not copy or "mirror" the file or printed version of the document, or any part of it,
for any other purpose without permission in writing from IEC.

oSIST prEN IEC 61290-3-2:2025
Link to Committee Draft for Vote (CDV) online document:
https://osd.iec.ch/#/editor/archive/395708d1-5528-85ae-e063-3012000a5c8e/en/CCDV/1

How to access
This link leads you to the Online Standards Development (OSD) platform for National Mirror
Committee’s (NMC) comments. The project draft may be found further down this document.

Resource materials
We recommend NCs to review the available materials to better understand the member commenting
on the OSD platform. This includes the:
• OSD NC roles overview
• How to add and submit comments to the IEC

Contact
Should you require any assistance, please contact the IEC IT Helpdesk
oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
CONTENTS
How to access . 2
Resource materials . 2
Contact . 2
Should you require any assistance, please contact the IEC IT Helpdesk . 2
CONTENTS . 1
FOREWORD . 2
INTRODUCTION . 4
1 Scope . 5
2 Normative references . 5
3 Terms, definitions, abbreviated terms, and symbols . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 5
3.3 Symbols . 5
4 General . 7
5 Apparatus . 7
6 Test specimen . 9
7 Procedure . 9
7.1 General remark . 9
7.2 Frequency-scanning technique: calibration . 9
7.3 Frequency-scanning technique: measurement . 11
7.4 Selected-frequency technique: calibration and measurement . 12
7.5 Measurement accuracy limitations . 12
8 Calculation . 13
8.1 General . 13
8.2 Calculation of calibration results . 13
8.3 Calculation of test results for the frequency-scanning technique . 14
8.4 Calculation of test results for the selected-frequency technique . 14
9 Test results . 15
Bibliography . 16

Figure 1 – Scheme of a measurement set-up . 8

oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Optical amplifiers - Test methods -
Part 3-2: Noise figure parameters - Electrical spectrum analyzer method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for
standardization comprising all national electrotechnical committees (IEC National Committees).
The object of IEC is to promote international co-operation on all questions concerning
standardization in the electrical and electronic fields. To this end and in addition to other
activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC
Publication(s)"). Their preparation is entrusted to technical committees; any IEC National
Committee interested in the subject dealt with may participate in this preparatory work.
International, governmental and non-governmental organizations liaising with the IEC also
participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as
possible, an international consensus of opinion on the relevant subjects since each technical
committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted
by IEC National Committees in that sense. While all reasonable efforts are made to ensure that
the technical content of IEC Publications is accurate, IEC cannot be held responsible for the
way in which they are used or for any misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC
Publications transparently to the maximum extent possible in their national and regional
publications. Any divergence between any IEC Publication and the corresponding national or
regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies
provide conformity assessment services and, in some areas, access to IEC marks of conformity.
IEC is not responsible for any services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including
individual experts and members of its technical committees and IEC National Committees for
any personal injury, property damage or other damage of any nature whatsoever, whether direct
or indirect, or for costs (including legal fees) and expenses arising out of the publication, use
of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced
publications is indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve
the use of (a) patent(s). IEC takes no position concerning the evidence, validity or applicability
of any claimed patent rights in respect thereof. As of the date of publication of this document,
IEC had not received notice of (a) patent(s), which may be required to implement this document.
However, implementers are cautioned that this may not represent the latest information, which
oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
may be obtained from the patent database available at https://patents.iec.ch. IEC shall not be
held responsible for identifying any or all such patent rights.
IEC 61290-3-2 has been prepared by subcommittee 86C: Fibre optic systems and active
devices, of IEC technical committee 86: Fibre optics. It is an International Standard.
This third edition cancels and replaces the second edition published in 2008. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) Shortened and clarified the scope in Clause 1;
b) Updated the normative references in Clause 2;
c) Deleted duplicate instructions in 7.2 to measure the time-average input power;
d) Removed unused symbols in 3.3 and added a new symbol.
The text of this International Standard is based on the following documents:
Draft Report on voting
XX/XX/FDIS XX/XX/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at http://www.iec.ch/members_experts/refdocs. The main document types developed by IEC
are described in greater detail at http://www.iec.ch/publications.
A list of all parts of IEC 61290 series, published under the general title Optical amplifiers - Test
methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under http://webstore.iec.ch in the data related to
the specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
INTRODUCTION
This part of IEC 61290 is devoted to noise figure measurements of optical amplifiers using the
electrical spectrum analyzer method. The technology of optical amplifiers is still rapidly
evolving, hence amendments and new additions to this standard can be expected.
This document should be read in conjunction with IEC 61290-3 [1] and IEC 61291-1.
Each symbol and abbreviation introduced in this document is generally explained in the text the
first time it appears. However, for an easier understanding of the whole text, a list of all symbols
and abbreviations used in this document is given in Clause 3.
oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
1 Scope
This part of IEC 61290 applies to all commercially available optical amplifiers (OAs), including
OAs using optically pumped fibres (i.e. optical fibre amplifiers (OFAs) based on either rare-
earth doped fibres or on the Raman effect), semiconductor optical amplifiers (SOAs), and planar
waveguide optical amplifiers (PWOAs).
This document establishes requirements for accurate and reliable measurements of the noise
figure parameters of OAs by means of the electrical spectrum analyzer (ESA) method. The
noise figure parameters of OAs are defined in IEC 61291-1.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 61291-1, Optical amplifiers - Part 1: Generic specification
3 Terms, definitions, abbreviated terms, and symbols
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 61291-1 apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.2 Abbreviated terms
CW continuous wave
DFB distributed feedback
ESA electrical spectrum analyzer
FWHM full width at half maximum
MPI multiple path interference
OA optical amplifier
OFA optical fibre amplifier
PWOA planar waveguide optical amplifier
−1
RIN
relative intensity noise (of the source, expressed in Hz )
RMS root mean square
SOA semiconductor optical amplifier
VOA variable optical attenuator
3.3 Symbols
B calibrated, noise equivalent ESA electrical bandwidth (not necessarily the
e
resolution bandwidth)
c speed of light in vacuum
e electron charge
oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
f baseband frequency
F (total) noise factor
F frequency-independent contribution to total noise factor
non-mpi
G OA optical signal gain
h Planck's constant
k optical power reduction factor (default k = 0,5); it can be obtained by taking
the square root of the electrical power reduction factor
v optical frequency = c/λ
∆v source FWHM linewidth with modulation on
−1 2
H ,H (f)
transfer function of receiver in watts (= S /∆P )
0 0
esa in
I multiple path interference figure of merit, the noise factor contribution caused
mpi
by multiple path interference integrated over all baseband frequencies (0 to
infinity)
I photodetector current
pd
λ wavelength in vacuum
m relative modulation amplitude (the ratio of RMS optical power modulation
amplitude to average optical power)
NF(f) (total) noise figure
NF signal-spontaneous noise figure
sig-sp
N (f) (frequency-dependent) ESA noise contribution caused by the laser relative
rin,0
intensity noise, at calibration conditions
N (frequency-independent) shot noise caused by the optical input power, at
shot,0
calibration conditions, measured with ESA
N thermal noise level as measured with ESA (optical input port of receiver
thermal
module closed)
N (f) (frequency-dependent) noise power measured with ESA with input and output
VOA set to 0 dB, thermal noise level subtracted, without OA test device
N '(f) (frequency-dependent) noise power measured with ESA with input VOA set to
3 dB (default) and output VOA set to 0 dB, thermal noise level subtracted,
without OA test device
N (f) frequency-dependent noise power, with OA inserted, thermal noise level
subtracted, measured with ESA
P time-averaged optical input power = T P (with modulation on); optical
in in in,0
power radiated from the end of the input jumper cable
P time-averaged optical input power at 0 dB setting of input VOA (with
in,0
modulation on)
∆P RMS optical power amplitude
in,rms
P total optical power radiated from the output port of the OA, including the ASE
out
r ,r (f) effective photodetector responsivity through output VOA at 0 dB setting
0 0
R (f) source relative intensity noise; generally, the square of the RMS optical power
RIN,source
fluctuation divided by the (baseband) bandwidth and the square of the CW
power
S electrical power of the modulation signal at T = 1, measured with ESA,
0 in
without OA inserted
S electrical power of the modulation signal, with OA inserted, measured with
ESA
oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
T transmission factor of input VOA relative to transmission at 0 dB setting,
in
expressed in linear units
T transmission factor of output attenuator relative to transmission at 0 dB
out
setting, expressed in linear units
4 General
The present test method is based on direct electrical noise measurement, and it is directly
related to its definition including all relevant noise contributions. Therefore, this method can be
used for all types of optical amplifiers, including SOA and Raman amplifiers which can have
significant contributions besides amplified spontaneous emission, because it measures the total
noise figure. For further details of applicability, see the IEC 61290-3 series. An alternative test
method based on optical spectrum analysis can be used, particularly for different noise
parameters (such as the signal-spontaneous noise factor) but it is not included in the scope of
this standard.
All numerical values followed by (‡) are suggested values for which the measurement is
assured. Other values can be acceptable but should be verified.
A measurement accuracy for the average noise factor of ±20% (‡), respectively ±1 dB, should
be attainable with this method (see Clause 7).
NOTE General aspects of noise figure test methods are described in IEC 61290-3.
5 Apparatus
A schematic diagram of a possible implementation of the measurement set-up is shown in
Figure 1.
The test equipment listed below, with the required characteristics, is needed.
a) A source module with the following components.
1) A laser source with a single-line spectrum, for example, a distributed feedback (DFB)
laser diode. The laser source shall be amplitude modulated with a sinusoidal signal of a
single frequency that is higher than the linewidth of the laser source. A modulation
frequency at least 3 times higher than the linewidth is recommended. The relative
modulation amplitude, m (that is, the ratio of root mean square (RMS) of the optical
power modulation amplitude to the average optical power) shall be small enough to
ensure operation in the linear region. A value of m between 2 % and 10 %(‡) is
considered adequate. Direct or external modulation of the laser source may be used.
The average output power, P , of the laser source should be at least 0 dBm, to generate
in,0
the desired OA saturation state.
The linewidth FWHM (full width at half maximum) under modulation shall be between 20
MHz(‡) and 100 MHz(‡). This is considered the best range for accurate determination of the
noise contribution from multiple path interference, because it closely reflects the typical
linewidths of DFB lasers, which is the typical laser source used in conjunction with OAs. A
linewidth of 20 MHz is adequate for a minimum spacing of 7,5 m between the OA internal
reflection points. Using narrower linewidths can lead to the undesired situation that the
internal reflections in the OA interfere coherently and that substantially different noise figure
results are obtained. A linewidth of more than 100 MHz will cause OA noise contributions at
frequencies that are higher than the high end of the ESA bandwidth.
The relative intensity noise (RIN) of the laser source shall be less than −150 dB/Hz(‡) within
the frequency range of interest (for example, 10 MHz to 2 GHz).
The spontaneous emission power, relative to the signal power, shall be less than −40
dB/nm(‡) to avoid large noise contributions from spontaneous-spontaneous mixing of the
source spontaneous emission.
oSIST prEN IEC 61290-3-2:2025
IEC CDV 61290-3-2 © IEC 2025
2) A built-in or external isolator, so that external reflections have no influence on the laser
spectrum and on the laser relative i
...