SIST EN 60747-16-1:2004/A2:2017

Halbleiterbauelemente - Teil 16-1: Integrierte Mikrowellen-Verstärker

Dispositifs à semiconducteurs - Partie 16-1: Circuits intégrés hyperfréquences - Amplificateurs

Polprevodniške naprave - 16-1. del: Mikrovalovna integrirana vezja - Ojačevalniki - Dopolnilo A2 (IEC 60747-16-1:2001/A2:2017)

General Information

• Status: Published
• Publication Date: 01-Jun-2017
• ICS: 31.080.01 - Semiconductor devices in general
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 31-May-2017
• Due Date: 05-Aug-2017
• Completion Date: 02-Jun-2017
• Ref Project: EN 60747-16-1:2002/A2:2017 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

Relations

• Refers: SIST EN 14274:2003 - Automotive fuels - Assessment of petrol and diesel quality - Fuel quality monitoring system (FQMS)
• Effective Date: 09-Feb-2026
• Refers: SIST EN 12476:2000 - Phosphate conversion coatings of metals - Method of specifying requirements
• Effective Date: 09-Feb-2026
• Refers: SIST EN 3475-409:2004 - Aerospace series - Cables, electrical, aircraft use - Test methods - Part 409: Air-excluded ageing
• Effective Date: 09-Feb-2026
• Refers: SIST EN 13059:2003 - Safety of industrial trucks - Test methods for measuring vibration
• Effective Date: 09-Feb-2026
• Refers: SIST EN 12895:2002 - Industrial trucks - Electromagnetic compatibility
• Effective Date: 09-Feb-2026
• Refers: SIST EN IEC 61340-5-1:2024 - Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements (IEC 61340-5-1:2024)
• Effective Date: 03-Feb-2026
• Refers: SIST-TP CLC/TR 61340-5-2:2009 - Electrostatics -- Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
• Effective Date: 03-Feb-2026
• Referred By: SIST EN 61287-1:2014 - Railway applications - Power convertors installed on board rolling stock - Part 1: Characteristics and test methods
• Effective Date: 03-Feb-2026
• Referred By: SIST EN 60747-16-4:2005/A2:2018 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004/A2:2017)
• Effective Date: 03-Feb-2026
• Amends: SIST EN 60747-16-1:2004 - Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers
• Effective Date: 24-Mar-2015

Overview

SIST EN 60747-16-1:2004/A2:2017 defines a harmonized European standard based on IEC 60747-16-1:2001/A2:2017 for microwave integrated circuit amplifiers within the broader field of semiconductor devices. This standard, prepared by IEC Technical Committee 47 (Semiconductor devices) with subsequent adoption by CENELEC, outlines terminology, measurement principles, reference publications, and test procedures focused on microwave amplifier ICs.

Serving sectors such as telecommunications, electronics, and microelectronics, this standard supports product consistency, performance verification, and regulatory compliance for manufacturers and integrators of microwave IC amplifiers.

Key Topics

• Terms and Definitions: The standard clarifies essential terms such as “intermodulation distortion,” “nth order harmonic distortion ratio,” “spurious intensity under specified load VSWR,” “output power,” and “adjacent channel power ratio.” These definitions ensure consistent understanding across the semiconductor and electronics industries.
• Measurement and Test Procedures: SIST EN 60747-16-1:2004/A2:2017 prescribes standardized methods for measuring critical amplifier parameters, including:
  • Intermodulation distortion (two-tone)
  • Harmonic distortion ratios
  • Spurious signal intensity
  • Limiting output power and flatness
  • Power added efficiency
  • Adjacent channel power ratio
• Normative References: The standard lists essential referenced documents, including IEC and EN publications on semiconductors, electrostatics, and graphical symbols for diagrams. References to previous, superseded, or related standards ensure users implement the most current requirements.
• Amendments and Updates: Amendment 2 updates specific clause titles, adds new references, and revises measurement procedures to improve clarity and harmonization with evolving industry practices.

Applications

SIST EN 60747-16-1:2004/A2:2017 is applicable to a range of industries and use cases, including:

• Telecommunications: Supports the design, testing, and procurement of microwave amplifier ICs essential for signal transmission, wireless networks, satellite communications, and point-to-point links.
• Consumer Electronics: Ensures performance and reliability of high-frequency amplifiers in devices such as smartphones, routers, and wireless access points.
• Industrial and Scientific Equipment: Provides a framework for verifying the performance of amplifier modules used in measurement instruments, radar systems, and scientific research.
• Component Manufacturing: Enables semiconductor manufacturers to comply with international standards for amplifier devices, supporting global trade and supply chain transparency.
• Regulatory Compliance: Facilitates the fulfillment of legal and contractual requirements for CE marking and market access in the European Union and beyond.

Related Standards

Organizations working with microwave integrated circuits and semiconductor amplifiers often consult related standards, including:

• IEC 60747-1: Semiconductor devices - Part 1: General
• IEC 60747-4: Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
• IEC 60617: Graphical symbols for diagrams
• IEC 61340-5-1: Electrostatics - Protection of electronic devices from electrostatic phenomena
• IEC/TR 61340-5-2: Guide for protection against electrostatics for electronic devices
• IEC 60748-3: Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
• IEC 60050-702: International Electrotechnical Vocabulary - Oscillations, signals and related devices

Using these standards together with SIST EN 60747-16-1:2004/A2:2017 helps ensure consistent, reliable, and efficient development and evaluation of microwave amplifier ICs, meeting both technical and regulatory criteria.

Standards Content (Sample)

SLOVENSKI STANDARD
01-julij-2017
3ROSUHYRGQLãNHQDSUDYHGHO0LNURYDORYQDLQWHJULUDQDYH]MD2MDþHYDOQLNL
'RSROQLOR$,(&$
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747
-16-1:2001/A2:2017)
Ta slovenski standard je istoveten z: EN 60747-16-1:2002/A2:2017
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 60747-16-1:2002/A2

NORME EUROPÉENNE
EUROPÄISCHE NORM
May 2017
ICS 31.080.99
English Version
Semiconductor devices -
Part 16-1: Microwave integrated circuits - Amplifiers
(IEC 60747-16-1:2001/A2:2017)
Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Partie 16-1: Circuits intégrés hyperfréquences - Teil 16-1: Integrierte Mikrowellen-Verstärker
Amplificateurs (IEC 60747-16-1:2001/A2:2017)
(IEC 60747-16-1:2001/A2:2017)
This amendment A2 modifies the European Standard EN 60747-16-1:2002; it was approved by CENELEC on 2017-03-22. CENELEC
members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this amendment the
status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This amendment exists in three official versions (English, French, German). A version in any other language made by translation under the
responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as
the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60747-16-1:2002/A2:2017 E

European foreword
The text of document 47E/500/CDV, future IEC 60747-16-1:2001/A2, prepared by SC 47E "Discrete
semiconductor devices" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel
vote and approved by CENELEC as EN 60747-16-1:2002/A2:2017.

The following dates are fixed:
(dop) 2017-12-22
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-03-22
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 60747-16-1:2001/A2:2017 was approved by CENELEC as a
European Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu

Publication Year Title EN/HD Year

Replace the existing references to IEC 60617, IEC 60747-1, IEC 60747-4, IEC 61340-5-1 and
IEC 61340-5-2, including modifications done by A1 as follows:
IEC 60617-DB -  Graphical symbols for diagrams - -
IEC 60747-1 2006 Semiconductor devices - - -
Part 1: General
+A1 2010 - -
IEC 60747-4 2007 Semiconductor devices - Discrete devices - - -
Part 4: Microwave diodes and transistors
+A1 2017  - -
IEC 61340-5-1 -  Electrostatics - EN 61340-5-1 -
Part 5-1: Protection of electronic devices from
electrostatic phenomena - General
requirements
IEC/TR 61340-5-2 -  Electrostatics - CLC/TR 61340-5-2 -
Part 5-2: Protection of electronic devices from
electrostatic phenomena - User guide
Replace the existing reference to IEC 60748-3 as follows:
IEC 60748-3 1986 Semiconductors devices - Integrated circuits - - -
Part 3: Analogue integrated circuits
+A1 1991  - -
+A2 1994  - -
Delete the existing references to IEC 60747-7:2000, IEC 60747-16-2:2001 and IEC 60747-16-4:2004
Add the following new reference:
IEC 60050-702 -  International electrotechnical vocabulary (IEV) - -
- Chapter 702: Oscillations, signals and
related devices
IEC 60747-16-1 ®
Edition 1.0 2017-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 2
AM ENDEMENT 2
Semiconductor devices –
Part 16-1: Microwave integrated circuits – Amplifiers

Dispositifs à semiconducteurs –

Partie 16-1: Circuits intégrés hyperfréquences – Amplificateurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-3873-8

– 2 – IEC 60747-16-1:2001/AMD2:2017
 IEC 2017
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/500/CDV 47E/518/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
_____________
CONTENTS
Replace the titles of Clause 3, Subclauses 5.7 and 5.18 with the following new titles:
3 Terms and definitions
5.7 Limiting output power (P ) and limiting output power flatness (∆P )
o(ltg) o(ltg)
5.18 Power added efficiency (η )
add
Replace the titles of Subclauses 5.11, 5.19, 5.21, including the amendments brought to them
by Amendment 1, with the following new titles:
5.11 Intermodulation distortion (two-tone) (P /P )
n 1
5.19 nth order harmonic distortion ratio (P /P )
nth 1
5.21 Spurious intensity under specified load VSWR (P /P )
sp o
Replace the title of Subclause 5.22 added by Amendment 1 with the following new title:
5.22 Adjacent channel power ratio (P /P )
adj o(m
...