oSIST prEN IEC 62475:2025
(Main)High-current test techniques - Definitions and requirements for test currents and measuring systems
High-current test techniques - Definitions and requirements for test currents and measuring systems
2022-05-18 - IEC 62475/Ed1 has been withdrawn and will not be circulated on June 17th, 2022. TC 42 has found technical issues with the contents of the manuscript that need to be addressed. A new CDV will be submitted by TC 42 at a later date.
Techniques des essais à haute intensité - Définitions et exigences relatives aux courants d'essai et systèmes de mesure
Visokotokovne preskusne tehnike - Definicije in zahteve za preskusne toke in merilne sisteme
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Standards Content (Sample)
SLOVENSKI STANDARD
01-junij-2025
Visokotokovne preskusne tehnike - Definicije in zahteve za preskusne toke in
merilne sisteme
High-current test techniques - Definitions and requirements for test currents and
measuring systems
Techniques des essais à haute intensité - Définitions et exigences relatives aux courants
d'essai et systèmes de mesure
Ta slovenski standard je istoveten z: prEN IEC 62475:2025
ICS:
19.080 Električno in elektronsko Electrical and electronic
preskušanje testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
42/455/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62475 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-04-11 2025-07-04
SUPERSEDES DOCUMENTS:
42/439/CD, 42/453/CC
IEC TC 42 : HIGH-VOLTAGE AND HIGH-CURRENT TEST TECHNIQUES
SECRETARIAT: SECRETARY:
Canada Mr Howard G. Sedding
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):
TC 14,TC 17,SC 18A,TC 23,TC 32,TC 36,TC 37,TC 38,TC
73,TC 77,TC 90,TC 96,SC 121A,SC 121B
ASPECTS CONCERNED:
Electricity transmission and distribution
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CENELEC, is drawn to the fact that this Committee Draft for
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The CENELEC members are invited to vote through the
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This document is still under study and subject to change. It should not be used for reference purposes.
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they are aware and to provide supporting documentation.
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clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the final stage for
submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
High-current test techniques - Definitions and requirements for test currents and measuring systems
PROPOSED STABILITY DATE: 2026
NOTE FROM TC/SC OFFICERS:
this electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee
positions. You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose
without permission in writing from IEC.
42/455/CDV – 2 – IEC CDV 62475 © IEC 2025
1 CONTENTS
2 FOREWORD . 8
3 INTRODUCTION . 10
4 1 Scope . 11
5 2 Normative references . 11
6 3 Terms and definitions . 12
7 3.1 Measuring systems . 12
8 3.2 Components of a measuring system . 13
9 3.3 Scale factors . 13
10 3.4 Rated values . 14
11 3.5 Definitions related to the dynamic behaviour . 15
12 3.6 Terms related to uncertainty . 16
13 3.7 Definitions related to tests on measuring systems . 19
14 3.8 Terms related to steady state direct current . 19
15 3.9 Terms related to steady state alternating current . 20
16 3.10 Terms related to short-time direct current . 20
17 3.11 Terms related to short-time alternating current . 21
18 3.12 Terms related to impulse currents . 23
19 4 Procedures for qualification and use of a measuring system . 27
20 4.1 General principles . 27
21 4.2 Schedule of performance tests . 28
22 4.3 Schedule of performance checks . 28
23 4.4 Requirements for the record of performance . 28
24 4.4.1 Contents of the record of performance . 28
25 4.4.2 Exceptions . 29
26 4.5 Operating conditions . 29
27 4.6 Uncertainty . 29
28 5 Tests and test requirements for an approved measuring system . 30
29 5.1 General requirements . 30
30 5.2 Calibration – Determination of the scale factor . 31
31 5.2.1 Calibration of a measuring system by comparison with a reference
32 measuring system (preferred method) . 31
33 5.2.2 Determination of the scale factor of a measuring system from those of
34 its components (alternative method) . 35
35 5.3 Linearity test in addition to comparison over the limited current range . 36
36 5.3.1 Application. 36
37 5.3.2 Alternative methods in order of suitability . 37
38 5.4 Dynamic behaviour . 37
39 5.4.1 General . 37
40 5.4.2 Determination of the amplitude-frequency response of AC
41 measuring systems . 37
42 5.4.3 Reference method for impulse current measuring systems . 38
43 5.5 Short-term stability . 38
44 5.5.1 Method . 38
45 5.5.2 Steady-state current . 39
46 5.5.3 Impulse current and short-time current . 40
47 5.5.4 Periodic impulse current and periodic short-time current . 40
48 5.6 Long-term stability . 41
IEC CDV 62475 © IEC 2025 – 3 – 42/455/CDV
49 5.7 Ambient temperature effect . 42
50 5.8 Effect of nearby current paths . 43
51 5.9 Software effect . 45
52 5.10 Uncertainty calculation . 45
53 5.10.1 General . 45
54 5.10.2 Uncertainty of calibration . 46
55 5.10.3 Uncertainty of measurement using an approved measuring system . 47
56 5.11 Uncertainty calculation of time-parameter measurements (impulse currents
57 only) . 47
58 5.11.1 General . 47
59 5.11.2 Uncertainty of the time-parameter calibration . 48
60 5.11.3 Uncertainty of a time-parameter measurement using an approved
61 measuring system. 49
62 5.12 Interference test. 50
63 5.12.1 Application. 50
64 5.12.2 Current-converting shunts and current transformers with iron . 51
65 5.12.3 Inductive measuring systems without iron (Rogowski coils) . 52
66 5.13 Withstand tests . 53
67 5.13.1 Voltage withstand tests . 53
68 5.13.2 Current withstand tests . 53
69 6 Steady-state direct current . 54
70 6.1 Application . 54
71 6.2 Test current . 54
72 6.2.1 Requirements . 54
73 6.2.2 Tolerances . 54
74 6.3 Measurement of the test current . 54
75 6.3.1 Requirements for an approved measuring system . 54
76 6.3.2 Uncertainty contributions . 54
77 6.3.3 Dynamic behaviour . 54
78 6.3.4 Calibrations and tests on an approved measuring system . 55
79 6.3.5 Performance check . 55
80 6.4 Measurement of ripple amplitude . 56
81 6.4.1 Requirements for an approved measuring system . 56
82 6.4.2 Uncertainty contributions . 56
83 6.4.3 Dynamic behaviour for ripple . 56
84 6.4.4 Calibrations and tests on an approved ripple-current measuring system . 56
85 6.4.5 Measurement of the scale factor at the ripple frequency . 57
86 6.4.6 Performance check for ripple current measuring system . 57
87 6.5 Test procedures . 57
88 7 Steady-state alternating current . 57
89 7.1 Application . 57
90 7.2 Test current . 57
91 7.2.1 Requirements . 57
92 7.2.2 Tolerances . 58
93 7.3 Measurement of the test current . 58
94 7.3.1 Requirements for an approved measuring system . 58
95 7.3.2 Uncertainty contributions . 58
96 7.3.3 Dynamic behaviour . 58
97 7.3.4 Calibrations and tests on an approved measuring system . 60
42/455/CDV – 4 – IEC CDV 62475 © IEC 2025
98 7.3.5 Performance check . 61
99 7.4 Test procedures . 61
100 8 Short-time direct current . 61
101 8.1 Application . 61
102 8.2 Test curr
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