Aerospace series - Cables, electrical, aircraft use - Test methods - Part 508: Plating thickness

This standard specifies the procedures for measuring the plating thickness and centricity of metallic coatings on single conductors.
It shall be used together with EN 3475-100.

Luft- und Raumfahrt - Elektrische Leitungen für Luftfahrtverwendung - Prüfverfahren - Teil 508: Schichtdicke des Uberzugs

Diese Norm legt die Verfahren zum Messen der Schichtdicke und Zentrizität von metallischen Überzügen auf
Einzeldrähten fest.
Sie ist in Verbindung mit EN 3475-100 anzuwenden.

Série aérospatiale - Câbles électriques a usage aéronautique - Méthodes d'essais - Partie 508 : Epaisseur du revetement

Aeronavtika - Električni kabli za uporabo v zračnih plovilih - Preskusne metode - 508. del: Debelina prevleke

General Information

Status
Published
Publication Date
03-Oct-2007
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
21-Sep-2007
Due Date
26-Nov-2007
Completion Date
04-Oct-2007

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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Aerospace series - Cables, electrical, aircraft use - Test methods - Part 508: Plating thicknessSérie aérospatiale - Câbles électriques a usage aéronautique - Méthodes d'essais - Partie 508 : Epaisseur du revetementLuft- und Raumfahrt - Elektrische Leitungen für Luftfahrtverwendung - Prüfverfahren - Teil 508: Schichtdicke des UberzugsTa slovenski standard je istoveten z:EN 3475-508:2007SIST EN 3475-508:2007en49.060Aerospace electric equipment and systemsICS:SIST EN 3475-508:20041DGRPHãþDSLOVENSKI
STANDARDSIST EN 3475-508:200701-november-2007







EUROPEAN STANDARDNORME EUROPÉENNEEUROPÄISCHE NORMEN 3475-508August 2007ICS 49.060Supersedes EN 3475-508:2002
English VersionAerospace series - Cables, electrical, aircraft use - Testmethods - Part 508: Plating thicknessSérie aérospatiale - Câbles électriques à usageaéronautique - Méthodes d'essais - Partie 508 : Epaisseurdu revêtementLuft- und Raumfahrt - Elektrische Leitungen fürLuftfahrtverwendung - Prüfverfahren - Teil 508:Schichtdicke des UberzugsThis European Standard was approved by CEN on 21 June 2007.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such nationalstandards may be obtained on application to the CEN Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A version in any other language made by translationunder the responsibility of a CEN member into its own language and notified to the CEN Management Centre has the same status as theofficial versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland,France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal,Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.EUROPEAN COMMITTEE FOR STANDARDIZATIONCOMITÉ EUROPÉEN DE NORMALISATIONEUROPÄISCHES KOMITEE FÜR NORMUNGManagement Centre: rue de Stassart, 36
B-1050 Brussels© 2007 CENAll rights of exploitation in any form and by any means reservedworldwide for CEN national Members.Ref. No. EN 3475-508:2007: E



EN 3475-508:2007 (E) 2 Contents Page Foreword.3 1 Scope.4 2 Normative references.4 3 Test methods.4 4 Requirements.9



EN 3475-508:2007 (E) 3 Foreword This document (EN 3475-508:2007) has been prepared by the Aerospace and Defence Industries Association of Europe - Standardization (ASD-STAN). After enquiries and votes carried out in accordance with the rules of this Association, this Standard has received the approval of the National Associations and the Official Services of the member countries of ASD, prior to its presentation to CEN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by February 2008, and conflicting national standards shall be withdrawn at the latest by February 2008. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN [and/or CENELEC] shall not be held responsible for identifying any or all such patent rights. This document supersedes EN 3475-508:2002. According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.



EN 3475-508:2007 (E) 4 1 Scope This standard specifies the procedures for measuring the plating thickness and centricity of metallic coatings on single conductors. It shall be used together with EN 3475-100. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 6955, Analytical spectroscopic methods — Flame emission, atomic absorption, and atomic fluorescence — Vocabulary. EN 3475-100, Aerospace series — Cables, electrical, aircraft use — Test methods — Part 100: General. 3 Test methods 3.1 General Five methods may be used. In the event of dispute, method 4 shall be the reference method for the measurement of plating thickness. 3.2 Test method 1 3.2.1 Principle This method uses an analytical procedure for evidence of elements and determining concentration by means of measuring the atomic absorption of optical radiation. The average plating thickness is determined by converting the measured element concentration. The determination of the centricity (distribution of the metal coating) is not possible with this method. 3.2.2 Method A flame AAS (Atome Absorption Spectrometry) is sufficient to determine metal concentrations as defined in ISO 6955. Other procedures, e.g. graphite tube, cold steam or hybrid technique, permit higher resolutions. General instructions on the necessary equipment, such as gas fuels, oxidizers, light sources, etc., and the actual operation of the equipment can be found in the operating instructions for the relevant AAS equipment. Typical detection limits for flame AAS: see Table 1. Table 1 Element mg/l Ag 0,002 Ni 0,01 Sn 0,001



EN 3475-508:2007 (E) 5 3.2.3 Calibration In atomic absorption spectrometry calibration shall take place by the use of reference solutions (standard solutions). Standard solutions are solutions which contain the element to be assessed (e.g. Ag, Ni, Sn) in a known concentration and, if required, the chemicals used in producing the sample solution and the components affecting the measurement in the same or a similar concentration to the samples for analysis. The standard calibration method involves establishing the reference function with several reference solutions starting from extinction A = 0 up to the extinction of the highest anticipated concentration of the solution to be measured. 3.2.4 Preparation for measurement Three samples of a single strand are dissolved in acid (e.g. nitric acid), diluted with H2O and inserted in the (AAS) measuring equipment. 3.2.5 Determining the plating thickness The average value of the plating thickness is determined by conversion of the measured concentration and the length and diameter of the sample which were determined prior to measurement. 3.3 Test method 2 3.3.1 Principle This method uses a procedure for determining the plating thickness and centricity of metallic coatings on single conductors using a scanning electron microscope (SEM). 3.3.2 Method The object to be examined is scanned with electron beams. Because of the short wavelength, this allows high resolution and magnification (up to 3 × 105). A further advantage is the great definition (three-dimensional image). The ge
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