oSIST prEN IEC 60444-11:2025
(Main)Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Mesure des paramètres unitaires quartz - Partie 11: Méthode standard pour la détermination de la fréquence de résonance de charge fl et de la capacité de charge effective cleff à l'aide de techniques d'analyseur de réseau automatiques et de correction d'erreur
Meritev parametrov kvarčnokristanih enot - 11. del: Standardne metode za ugotavljanje obremenitvene resonančne frekvence fL in efektivne obremenitvene kapacitivnosti CLeff z uporabo tehnik z avtomatičnim omrežnim analizatorjem in popravljanjem napak
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SLOVENSKI STANDARD
01-maj-2025
Meritev parametrov kvarčnokristanih enot - 11. del: Standardne metode za
ugotavljanje obremenitvene resonančne frekvence fL in efektivne obremenitvene
kapacitivnosti CLeff z uporabo tehnik z avtomatičnim omrežnim analizatorjem in
popravljanjem napak
Measurement of quartz crystal unit parameters - Part 11: Standard method for the
determination of the load resonance frequency fL and the effective load capacitance
CLeff using automatic network analyzer techniques and error correction
Mesure des paramètres unitaires quartz - Partie 11: Méthode standard pour la
détermination de la fréquence de résonance de charge fl et de la capacité de charge
effective cleff à l'aide de techniques d'analyseur de réseau automatiques et de correction
d'erreur
Ta slovenski standard je istoveten z: prEN IEC 60444-11:2025
ICS:
31.140 Piezoelektrične naprave Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
49/1489/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60444-11 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-03-21 2025-06-13
SUPERSEDES DOCUMENTS:
49/1467/CD, 49/1478/CC
IEC TC 49 : PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY
CONTROL, SELECTION AND DETECTION
SECRETARIAT: SECRETARY:
Japan Mr Masanobu Okazaki
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):
ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
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CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
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Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is
the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
Measurement of quartz crystal unit parameters - Part 11: Standard method for the
determination of the load resonance frequency fL and the effective load capacitance CLeff
using automatic network analyzer techniques and error correction
PROPOSED STABILITY DATE: 2028
NOTE FROM TC/SC OFFICERS:
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
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IEC CDV 60444-11 © IEC 2025 – 2 – 49/1489/CDV
1 CONTENTS
3 FOREWORD . 4
4 INTRODUCTION . 6
5 1 Scope . 7
6 2 Normative references . 7
7 3 Terms and definitions . 7
8 4 General concepts . 8
9 4.1 Load resonance frequencies f and f . 8
Lr La
10 Effective load capacitance C . 9
4.2 Leff
11 5 Reference plane and test conditions . 9
12 5.1 General . 9
13 5.2 Principle of measurement . 9
14 5.3 Evaluation of errors. 12
15 5.3.1 General comments . 12
16 5.3.2 Accuracy of measurement . 12
17 5.3.3 Reproducibility . 13
18 5.3.4 Comparison with the manual method . 15
19 5.3.5 Limitations . 15
20 Annex A (informative) Manual measuring method of the load resonance frequency f ,
L
21 load resonance resistance R using physical load capacitance . 16
L
22 A.1 General . 16
23 A.2 Measuring circuit . 16
24 A.2.1 The measuring circuit of a zero phase -network system . 16
25 A.2.2 An outline description . 16
26 A.2.3 Load capacitor specification . 16
27 A.3 Method of measurement . 17
28 A.3.1 Initial adjustment . 17
29 A.3.2 The method for the measurement of load resonance frequency and
30 resistance . 17
31 A.4 Load capacitor design . 17
32 A.4.1 Mechanical features . 17
33 A.4.2 Insertion into -network . 18
34 A.4.3 Calibration and measurement of load capacitors . 20
35 A.5 Measurement errors . 21
36 A.5.1 General . 21
37 A.5.2 Main sources of measurement errors . 21
38 A.5.3 The effects of the frequency/temperature characteristics of the crystal
39 unit . 22
40 A.5.4 The accuracy of the frequency measurements . 22
41 A.6 Analysis of errors . 22
42 A.6.1 Measurement error of load resonance frequency f . 22
L
43 A.6.2 Measurement error of load resonance resistance R . 22
L
44 A.6.3 Measurement errors of C . 23
45 Bibliography . 27
IEC CDV 60444-11 © IEC 2025 – 3 – 49/1489/CDV
47 Figure 1 – Admittance of a quartz crystal unit . 8
48 Figure 2 – X as a function of frequency (solid line) in the vicinity of f . 11
C L
49 Figure 3 – Level of drive of a crystal in a -network vs. frequency . 11
50 Figure 4 – Error of the load resonance frequency due to the inaccuracy of the
51 measured voltages (dashed line) and the calibration resistances (soft line) . 13
52 Figure 5 – C -error resulting from f error (due to inaccuracy of the measured voltages
L L
53 and the calibration resistances) for the same crystal as in Figure 4. 13
54 Figure 6 – Frequency error due to noise of the measured voltages . 14
55 Figure 7a – Error of load resonance frequency f at 30 pF for typical equivalent
L
56 parameters of quartz crystal units . 14
57 Figure 7b – Error of load resonance frequency f at 10 pF for typical equivalent
L
58 parameters of quartz crystal units . 15
59 Figure A.1 – Typical load capacitor with carrier . 18
60 Figure A.2 – Method of insertion of load capacitor into -network . 19
61 Figure A.3 – Circuit diagram of -network including load capacitor C . 20
L
62 Figure A.4 – Load capacitance inaccuracy as a function of frequency, for a load
63 capacitance of 30 pF inclusive of calibration inaccuracy and residual inductance
64 effects (Worst case situation) . 21
65 Figure A.5 – Relative measurement error of f versus crystal pulling sensitivity for
L
66 various frequencies at a load capacitance of 30 pF . 22
67 Figure A.6 – Relative measurement error of R versus frequency, for various values of
L
68 C . 23
L
69 Figure A.7 – Relative measurement error of C as a function of frequency. 24
70 Figure A.8– Relative measurement error of C as a function of C for various
1 1
71 frequency measurement errors C = 5 pF; C = 15 pF; C = 30 pF . 25
o L1 L2
72 Figure A.9 – Relative measurement error of C as a function of C for various values
1 1
73 of quality factor Q C = 3 pF; C = 15 pF; C = 30 pF . 26
o L1 L2
IEC CDV 60444-11 © IEC 2025 – 4 – 49/1489/CDV
75 INTERNATIONAL ELECTROTECHNICAL COMMISSION
76 ____________
78 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS
80 Part 11: Standard method for the determination of the load resonance
81 frequency 𝒇 and the effective load capacitance 𝑪 using automatic
L Leff
82 network analyzer techniques and error correction
84 FOREWORD
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