oSIST prEN IEC 60384-21:2023

Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1

Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 21: Rahmenspezifikation - Oberflächenmontierbare Vielschichtkeramik-Festkondensatoren, Klasse 1

Condensateurs fixes utilisés dans les équipements électroniques - Partie 21: Spécification intermédiaire - Condensateurs multicouches fixes à diélectriques en céramique pour montage en surface, de Classe 1

Fiksni kondenzatorji za uporabo v elektronski opremi - 21. del: Področna specifikacija - Fiksni večplastni kondenzatorji za površinsko namestitev s keramičnim dielektrikom, razred 1

General Information

• Status: Not Published
• Public Enquiry End Date: 14-Sep-2023
• ICS: 31.060.10 - Fixed capacitors
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 4020 - Public enquire (PE) (Adopted Project)
• Start Date: 03-Jul-2023
• Due Date: 20-Nov-2023
• Ref Project: prEN IEC 60384-21:2023 - Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1

Relations

• Revises: SIST EN IEC 60384-21:2019 - Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1 (IEC 60384-21:2019)
• Effective Date: 22-Mar-2022

Standards Content (Sample)

SLOVENSKI STANDARD
oSIST prEN IEC 60384-21:2023
01-september-2023
Fiksni kondenzatorji za uporabo v elektronski opremi - 21. del: Področna
specifikacija - Fiksni večplastni kondenzatorji za površinsko namestitev s
keramičnim dielektrikom, razred 1
Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed
surface mount multilayer capacitors of ceramic dielectric, Class 1
Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 21:
Rahmenspezifikation - Oberflächenmontierbare Vielschichtkeramik-Festkondensatoren,
Klasse 1
Condensateurs fixes utilisés dans les équipements électroniques - Partie 21:
Spécification intermédiaire - Condensateurs multicouches fixes à diélectriques en
céramique pour montage en surface, de Classe 1
Ta slovenski standard je istoveten z: prEN IEC 60384-21:2023
ICS:
31.060.10 Fiksni kondenzatorji Fixed capacitors
oSIST prEN IEC 60384-21:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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oSIST prEN IEC 60384-21:2023

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oSIST prEN IEC 60384-21:2023
40/3055/CDV

COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60384-21 ED4
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-06-23 2023-09-15
SUPERSEDES DOCUMENTS:
40/2986/CD, 40/3043/CC

IEC TC 40 : CAPACITORS AND RESISTORS FOR ELECTRONIC EQUIPMENT
SECRETARIAT: SECRETARY:
Netherlands Mr Ronald Drenthen
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:


Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.

This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some Countries”
clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the final stage for
submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface
mount multilayer capacitors of ceramic dielectric, Class 1

PROPOSED STABILITY DATE: 2032

NOTE FROM TC/SC OFFICERS:

Copyright © 2023 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

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1

2 CONTENTS
3
4 FOREWORD . 6
5 1 Scope . 8
6 2 Normative references . 8
7 3 Terms and definitions . 8
8 4 Preferred ratings and characteristics . 9
9 4.1 Preferred characteristics . 9
10 4.2 Preferred values of ratings . 10
11 4.2.1 Rated temperature (T ) . 10
R
12 4.2.2 Rated voltage (U ) . 10
R
13 4.2.3 Category voltage (U ) . 10
C
14 4.2.4 Preferred values of nominal capacitance and associated tolerance values . 10
15 4.2.5 Temperature coefficient (α) . 11
16 4.2.6 Dimensions . 12
17 5 Test and measurement procedures . 12
18 5.1 General . 12
19 5.2 Preliminary drying . 13
20 5.3 Measuring conditions . 13
21 5.4 Mounting . 13
22 5.5 Visual examination and check of dimensions . 13
23 5.5.1 General . 13
24 5.5.2 Visual examination . 13
25 5.5.3 Requirements . 13
26 5.6 Electrical tests. 15
27 5.6.1 Capacitance . 15
28 5.6.2 Tangent of loss angle (tan δ) . 15
29 5.6.3 Insulation resistance . 15
30 5.6.4 Voltage proof . 16
31 5.7 Temperature coefficient (α) and temperature cycle drift . 17
32 5.7.1 General . 17
33 5.7.2 Preliminary drying . 17
34 5.7.3 Measuring conditions . 17
35 5.7.4 Requirements . 17
36 5.8 Shear test . 17
37 5.9 Substrate bending test . 17
38 5.9.1 General . 17
39 5.9.2 Initial measurement . 18
40 5.9.3 Final inspection . 18
41 5.10 Resistance to soldering heat . 18
42 5.10.1 General . 18
43 5.10.2 Initial measurement . 18

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44 Test conditions . 18
5.10.3
45 5.10.4 Recovery . 19
46 5.10.5 Final inspection, measurements and requirements . 19
47 5.11 Solderability . 20
48 5.11.1 General . 20
49 5.11.2 Test conditions . 20
50 5.11.3 Recovery . 20
51 5.11.4 Final inspection, measurements and requirements . 21
52 5.12 Rapid change of temperature . 21
53 5.12.1 General . 21
54 5.12.2 Initial measurement . 21
55 5.12.3 Number of cycles . 21
56 5.12.4 Recovery . 21
57 5.12.5 Final inspection, measurements and requirements . 21
58 5.13 Climatic sequence . 21
59 5.13.1 General . 21
60 5.13.2 Initial measurement . 21
61 5.13.3 Dry heat . 22
62 5.13.4 Damp heat, cyclic, Test Db, first cycle . 22
63 5.13.5 Cold . 22
64 5.13.6 Damp heat, cyclic, Test Db, remaining cycles . 22
65 5.13.7 Final inspection, measurements and requirements . 22
66 5.14 Damp heat, steady state . 23
67 5.14.1 General . 23
68 5.14.2 Initial measurement . 23
69 5.14.3 Test conditions . 23
70 5.14.4 Recovery . 23
71 5.14.5 Final inspection, measurements and requirements . 23
72 5.15 Endurance . 24
73 5.15.1 General . 24
74 5.15.2 Initial measurement . 24
75 5.15.3 Test conditions . 24
76 5.15.4 Recovery . 25
77 5.15.5 Final inspection, measurements and requirements . 25
78 5.16 Robustness of terminations (only for capacitors with strip termination) . 25
79 5.16.1 General . 25
80 5.16.2 Test conditions . 25
81 5.16.3 Final inspection and requirements . 25
82 5.17 Component solvent resistance (if required) . 25
83 5.18 Solvent resistance of the marking (if required) . 26
84 5.19 Accelerated damp heat, steady state (if required) . 26
85 5.19.1 General . 26
86 5.19.2 Initial measurement . 26
87 5.19.3 Conditioning . 26
88 5.19.4 Recovery . 26
89 5.19.5 Final measurements . 27

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90 Marking . 27
6
91 6.1 General . 27
92 6.2 Information for marking . 27
93 6.3 Marking on the body . 27
94 6.4 Requirements for marking . 27
95 6.5 Marking of the packaging . 27
96 6.6 Additional marking . 27
97 7 Information to be given in a detail specification . 27
98 7.1 General . 27
99 7.2 Outline drawing and dimensions . 28
100 7.3 Mounting . 28
101 7.4 Rating and characteristics . 28
102 7.4.1 General . 28
103 7.4.2 Nominal capacitance range . 28
104 7.4.3 Particular characteristics . 28
105 7.4.4 Soldering . 28
106 7.5 Marking . 28
107 8 Quality assessment procedures . 28
108 8.1 Primary stage of manufacture . 28
109 8.2 Structurally similar components . 29
110 8.3 Certified records of released lots . 29
111 8.4 Qualification approval . 29
112 8.4.1 General . 29
113 8.4.2 Qualification approval on the basis of the fixed sample size procedures . 29
114 8.4.3 Tests. 29
115 Annex A (normative) Guidance for the specification and coding of dimensions of fixed surface
116 mount multilayer capacitors of ceramic dielectric, Class 1 . 36
117 Annex B (normative) Combination of temperature coefficients and tolerances for the reference
118 temperature of 25 °C . 37
119 Annex C (normative) Quality Conformance inspection . 38
120 C.1 Formation of inspection lots . 38
121 C.1.1 Groups A and B inspection . 38
122 C.1.2 Group C inspection . 38
123 C.2 Test schedule . 38
124 C.3 Delayed delivery. 38
125 C.4 Assessment levels. 38
126 C.5 Test schedule for quality conformance inspection . 39
127 Annex X (informative) Cross-reference for reference to IEC 60384-21:2019 . 46
128 Bibliography . 47
129
130 Figure 1 – Fault: crack or fissure . 13
131 Figure 2 – Fault: crack or fissure . 13
132 Figure 3 – Separation or delamination . 14
133 Figure 4 – Exposed electrodes . 14
134 Figure 5 – Principal faces . 14

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135
Figure 6 – Reflow temperature profile. 19
136 Figure A.1 – Dimensions . 36
137
138 Table 1 – Preferred tolerances on nominal capacitance. 10
139 Table 2 – Nominal temperature coefficient and tolerance . 11
140 Table 3 – Combination of temperature coefficient and tolerance . 12
141 Table 4 – Tangent of loss angle limits . 15
142 Table 5 – Test voltages . 16
143 Table 6 – Temperature cyclic drift limits . 17
144 Table 7 – Reflow temperature profiles for Sn-Ag-Cu alloy . 19
145 Table 8 – Maximum capacitance change . 20
146 Table 9 – Maximum capacitance change . 21
147 Table 10 – Number of damp heat cycles . 22
148 Table 11 – Final inspection, measurements and requirements . 22
149 Table 12 – Test conditions for damp heat, steady state . 23
150 Table 13 – Final inspection, measurements and requirements . 24
151 Table 14 – Endurance test conditions (U = U ) . 24
C R
152 Table 15 – Endurance test conditions (U ≠ U ) . 24
C R
153 Table 16 – Final inspection, measurements and requirements . 25
154 Table 17 – Initial requirements . 26
155 Table 18 – Conditioning . 26
156 Table 19 – Fixed sample size test plan for qualification approval – Assessment level EZ . 31
157 Table 20 – Tests schedule for qualification approval . 32
158 Table A.1 – Dimensions . 36
159 Table B.1 – Combination of temperature coefficients and tolerances for the reference
160 temperature of 25 °C . 37
161 Table C.1 – Lot by lot inspection . 39
162 Table C.2 – Periodic inspection . 39
163 Table C.3 – Test schedule for quality conformance inspection (lot by lot) . 40
164 Table C.4 – Test schedule for quality conformance inspection (Periodic test) . 42
165 Table X.1 – Reference to IEC 60384-21 for clause/annex. 46
166 Table X.2 – Reference to IEC 60384-21 for figure/table . 46
167
168
169

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170 INTERNATIONAL ELECTROTECHNICAL COMMISSION
171 ____________
172
173 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –
174
175 Part 21: Sectional specification –
176 Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
177
178
179 FOREWORD
180 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national
181 electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all
182 questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities,
183 IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS)
184 and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC
185 National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental
186 and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with
187 the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between
188 the two organizations.
189 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus
190 of opinion on the relevant subjects since each technical committee has representation from all interested IEC National
191 Committees.
192 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in
193 that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC
194 cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.
195 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to
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197 the corresponding national or regional publication shall be clearly indicated in the latter.
198 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment
199 services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by
200 independent certification bodies.
201 6) All users should ensure that they have the latest edition of this publication.
202 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of
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204 nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication,
205 use of, or reliance upon, this IEC Publication or any other IEC Publications.
206 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable
207 for the correct application of this publication.
208 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights.
209 IEC shall not be held responsible for identifying any or all such patent rights.
210 IEC 60384-21 has been prepared by IEC technical committee 40: Capacitors and resistors for
211 electronic equipment. It is an International Standard.
212 This fourth edition cancels and replaces the third edition published in 2019. This edition constitutes a
213 technical revision.
214 This edition includes the following significant technical changes with respect to the previous edition:
215 a) The document has been completely restructured to comply with the ISO/IEC Directives, Part 2 and
216 to make it more useable; tables, figures and references have been revised accordingly.
217 b) The terms have been replaced by the letter symbols in Table 3.
218 c) Code of temperature coefficient and tolerance of C0G, U2J have been added in Table 4, Table 6,
219 Table 8, Table 9, Table 11, Table 13, Table 16 and Annex B.

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220
d) The requirement in 5.5.2(visual examination) has been repeated in 5.9.3, 5.10.5, 5.11.4, 5.11.5,
221 5.13.7, 5.14.5 and 5.15.5.
222 e) The deflection D in the very robust designs has been added in 5.9.1.
223 f) Annex B has been changed informative into normative.
224 g) C.5(Test schedule for quality conformance inspection) has been newly added to withdraw the blank
225 detail specification: IEC 60384-21-1.
226
227 The text of this International Standard is based on the following documents:
Draft Report on voting
XX/XX/FDIS XX/XX/RVD
228
229 Full information on the voting for its approval can be found in the report on voting indicated in the above
230 table.
231 The language used for the development of this International Standard is English.
232 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in accordance
233 with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available at
234 https://www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
235 described in greater detail at https://www.iec.ch/standardsdev/publications.
236 The committee has decided that the contents of this document will remain unchanged until the stability
237 date indicated on the IEC website under webstore.iec.ch in the data related to the specific document.
238 At this date, the document will be
239 • reconfirmed,
240 • withdrawn,
241 • replaced by a revised edition, or
242 • amended.
243

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