SIST ISO 4288:2001

Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Rules and procedures for the assessment of surface texture

Specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in ISO 4287, ISO 12085, ISO 13565-2 and ISO 13565-3. It also gives rules for measuring roughness profile parameters by using stylus instruments according to ISO 3274. Replaces the first edition.

Spécification géométrique des produits (GPS) -- État de surface: Méthode du profil -- Règles et procédures pour l'évaluation de l'état de surface

La présente Norme internationale prescrit les règles et les procédures pour la comparaison aux limites de tolérances des valeurs mesurées des paramètres d'état de surface définis dans l'ISO 4287, l'ISO 12085, l'ISO 13565-2 et l'ISO 13565-3. Elle prescrit également les conventions à retenir pour le choix de la longueur d'onde de coupure, λc, lors de la mesure des paramètres de rugosité conformément à l'ISO 4887 à l'aide d'appareils à contact (palpeur) conformément à l'ISO 3274.

Specifikacija geometrijskih veličin izdelka - Tekstura površine: profilna metoda - Pravila in postopki za ocenitev teksture površine

General Information

• Status: Withdrawn
• Publication Date: 30-Jun-2001
• Withdrawal Date: 30-Nov-2000
• ICS: 17.040.20 - Properties of surfaces
• ICS: 17.040.40 - Geometrical Product Specification (GPS)
• Technical Committee: ISEL - Mechanical elements
• Current Stage: 9900 - Withdrawal (Adopted Project)
• Start Date: 01-Dec-2000
• Due Date: 01-Dec-2000
• Completion Date: 01-Dec-2000
• Ref Project: ISO 4288:1996 - Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the assessment of surface texture

Relations

• Parent: ISO 4288:1996/Cor 1:1998 - Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the assessment of surface texture — Technical Corrigendum 1
• Effective Date: 12-May-2008
• Parent: SIST ISO 4288:2001/TC1:2001 - Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the assessment of surface texture - TECHNICAL CORRIGENDUM 1
• Effective Date: 12-May-2008
• Corrected By: SIST ISO 4288:2001/TC1:2001 - Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the assessment of surface texture - TECHNICAL CORRIGENDUM 1
• Effective Date: 06-Jun-2022

Standards Content (Sample)

INTERNATIONAL IS0
STANDARD 4288
Second edition
1996-08-01
Geometrical Product Specifications
(GPS) - Surface texture: Profile method -
Rules and procedures for the assessment
of surface texture
Spkifica tion g6om&rique des produits (GPS) - ita t de surface: M&hode
du profil- Regles et pro&dures pour I’baluation de Y&tat de surface
Reference Number
IS0 4288:1996(E)

---------------------- Page: 1 ----------------------
IS0 4288:1996(E)
Page
Contents
1
1 Scope .
1
2 Normative references .
1
3 Definitions .
2
.................................................................
4 Parameter estimation
2
4.1 Parameters defined over the sampling length .
.......................... 2
4.2 Parameters defined over the evaluation length
2
4.3 Curves and related parameters .
Default evaluation lengths . 2
4.4
5 Rules for comparison of the measured values with
..................................................................... 2
the tolerance limits
5.1 Areas on the feature to be inspected .
2
............................................................................. 2
5.2 The 16 % rule
5.3 The max.-rule . 3
..................................................... 3
5.4 Uncertainty of measurement
3
6 Parameter evaluation . .
3
6.1 General .
6.2 Roughness profile parameters . 3
7 Rules and procedures for inspection using stylus instruments . . 4
7.1 Basic rules for the determination of cut-off wavelength for
the measurement of roughness profile parameters . 4
4
7.2 Measurement of roughness profile parameters .
0 IS0 1996
All rights reserved. Unless otherwise specified, no part of this publication may be repro-
duced or utilized in any form or by any means, electronic or mechanical, including photo-
copying and microfilm, without permission in writing from the publisher.
International Organization for Standardization
Case Postale 56 l CH-1211 Get-We 20 l Switzerland
Printed in Switzerland

---------------------- Page: 2 ----------------------
IS0 4288:1996(E)
Q IS0
Annexes
................................ 6
A Simplified procedure roughness inspection
7
.....................................................
B Relation to GPS matrix model
8
................................................................................
C Bibliography

---------------------- Page: 3 ----------------------
IS0 4288: 1996(E) @ IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide fed-
eration of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be
represented on that committee. International organizations, governmental
and non-governmental, in liaison with ISO, also take part in the work. IS0
collaborates closely with the International Electrotechnical Commission
(IEC) on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are
circulated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 4288 was prepared jointly by Technical Com-
mittees lSO/TC 57, Metrology and properties of surfaces, Subcommittee
SC 1, Geometrical parameters - Instruments and procedures for
measurement of surface roughness and waviness, ISO/TC 3, Limits and
fits and lSO/TC 10, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
This second edition cancels and replaces the first edition (IS0 4288:1985)
which has been technically revised.
It differs from the previous edition in that filter cut-off values are chosen
based on the workpiece texture rather than the drawing indication. Fur-
thermore, this International Standard includes rules for the determination
of parameters other than Ra and Rz. This second edition covers roughness
primary profile parameters and comparison of
profile parameters,
measured motif parameter values with given specification.
It is envisaged that an amendment will be prepared covering M-system
waviness profile parameters, for which there are currently no standardized
rules.
Annexes A, B and C of this International Standard are for information only.

---------------------- Page: 4 ----------------------
IS0 4288: 1996(E)
@ IS0
Introduction
This International Standard is a geometrical product specification (GPS)
standard and is to be regarded as a general GSP standard (see
lSO/TR 14638). It influences the chain links 3 and 4 of the chains of stan-
dards for roughness profile and primary profile.
For more detailed information of the relation of this International Standard
to other standards and the GPS matrix model see annex B.
The discrimination between periodic and non-periodic profiles is subjective
and left to the discretion of the user.

---------------------- Page: 5 ----------------------
This page intentionally left blank

---------------------- Page: 6 ----------------------
NORME INTERNATIONALE 0 IS0 IS0 4288: 1996(E)
Geometrical Product Specifications (GPS) - Surface
texture: Profile method - Rules and procedures for the
assessment of surface texture
IS0 4287: 1996, Geometrical Product Specifications
1 Scope
GW - Surface texture: Profile method - Terms,
This International Standard specifies the rules for definitions and parameters of surface texture.
comparison of the measured values with the tolerance
IS0 12085:1996, Geometrical Product Specifications
limits for surface texture parameters defined in
- Surface texture: Profile method - Motif par-
IS0 4287, IS0 12085, IS0 13565-2 and IS0 13565-3. WV
ame ters.
It also specifies the default rules for selection of cut-
IS0 13565-I :I 996, Geometrical Product Specifi-
off wavelength, ilc, for measuring roughness profile
cations (G PS) - Surface texture: Profile method; sur-
parameters according to IS0 4287 by using stylus
faces having stratified functional properties - Part I:
instruments according to IS0 3274.
Filtering and general measurement conditions.
IS0 13565-2:1996, Geometrical Product Specifi-
cations (G PS) - Surface texture: Profile method; sur-
faces having stratified functional properties - Part 2:
Height characterization using the linear material ratio
curve.
2 Normative references
The following standards contain provisions which,
IS0 13565-3:- 1 1, Geometrical Product Specifications
through reference in this text, constitute provisions of
(GPS) - Surface texture: Profile method; surfaces
this International Standard. At the time of publication, having stratified functional properties - Part 3: Height
the editions indicated were valid. All standards are
characterization using the material probability curve.
subject to revision, and parties to agreements based
IS0 14253-1: - 11, Geometrical Product Specifications
on this International Standard are encouraged to
(GPS) - Inspection by measurement of workpieces
investigate the possibility of applying the most recent
and measuring instruments - Part 7: Decision rules
editions of the standards indicated below. Members
for proving conformance or non-conformance with
of IEC and IS0 maintain registers of currently valid
specifications.
International Standards.
IS0 1302:1992, Technical drawings - Method of indi-
cating surface texture.
3 Definitions
IS0 3274: 1996, Geometrical Product Specifications For the purposes of this International Standard, the
definitions given in IS0 3274, IS0 4287, IS0 12085,
- Surface texture: Profile method - Nominal
W ’S)
IS0 13565-2 and IS0 13565-3 apply.
characteristics of contact (stylus) instruments.
1) To be published.

---------------------- Page: 7 ----------------------
@ IS0
IS0 4288: 1996(E)
4 Parameter estimation 5 Rules for comparison of the measured
values with the tolerance limits
4.1 Parameters defined over the sampling
length
5.1 Areas on the feature to be inspected
The surface texture of the workpiece under inspection
4.1 .I Parameter estimate
can appear homogeneous or be quite different over
An estimate of the parameter ’s value is calculated
various areas. This can be seen by visual examination
using the measured data from only one sampling
of the surface. In cases where the surface texture
length.
appears homogeneous, parameter values determined
over the entire surface shall be used for comparison
with the requirements specified on the drawings or in
4.12. Average parameter estimate
the technical product documentation.
An average parameter estimate is calculated by taking
If there are separate areas with obviously different
the arithmetic mean of the parameter estimates from
surface texture, the parameter values which are de-
all the individual sampling lengths.
termined on each area shall be used separately for
comparison with the requirements specified on the
When the standard number of five sampling lengths is
drawings or in the technical product documentation.
used for roughness profile parameters, no suffix
needs to be added to the symbol. For a parameter
For requirements specified by the upper limit of the
evaluated over a number of sampling lengths other
parameter, those separate areas of the surface shall
than five, that number shall be added as a suffix to the
be used which appear to have the maximum par-
parameter symbol (eg. &I, &3).
ameter value.
4.2 Parameters defined over the evaluation
5.2 The 16 %-rule
length
For requirements specified by the upper limit (see
For parameters defined over the evaluation length (Pt,
IS0 1302:1992, 6.2.3) of a parameter, the surface is
Rt and wt), an estimate of a parameter ’s value is
considered acceptable if not more than 16 % of all the
calculated by using measurement data from an
measured values (see notes 1 and 2) of the selected
evaluation length equal to the standardized number of
parameter, based upon an evaluation length, exceed
sampling lengths.
the value specified on the drawings or in the technical
product documentation.
4.3 Curves and related parameters
For requirements specified by the lower limit of the
surface parameter, the surface is considered accept-
For curves and related parameters, an estimate of a
able if not more than 16 % of all the measured values
parameter ’s val ue is calculated by using measurement
(see notes 1 and 2) of the selected parameter, based
data from one curve, wh ich las been computed based
upon an evaluation length, are less than the value
on the evaluati
on length.
specified on the drawings or in the technical product
documentation.
4.4 Default evaluation engths To designate the upper and the lower limits of the par-
ameter, the symbol of the parameter shall be used
If not otherwise indicated C In the d rawing or in the
without the “max.” index.
technical product documentation,
the evaluation
length is as follows:
NOTES
1 Annex A provides simplified practical guidance for com-
- R-parameters: the evaluation length is defined in
paring measured values with upper and lower limits.
clause 7;
2 In cases where the values of the roughness profile par-
ameter of the surface being inspected follow a normal dis-
- P-parameters: the evaluation length is equal to
tribution, the determination of the upper limit as a limit
the length of the feature being measured;
which may be exceeded by 16 % of the measured values
of the roughness profile parameter conforms with the limit
- motif-parameters: the evaluation length is
determined by the value p + a, where p is the arithmetic
defined in clause 5 of IS0 12085:1996;
mean value of the roughness profile parameter and c is the
standard deviation of the values. The greater the value of o,
- parameters defined in IS0 13565-Z and
the further from the specified limit (the upper value) the
IS0 13565-3: the evaluation length is defined in mean value of the roughness profile parameter needs to
be. (See figure 1.)
clause 7 of IS0 13565-1 :I 996.
2

---------------------- Page: 8 ----------------------
@ IS0 IS0 4288: 1996(E)
Figure 1
fects, e.g. scratches and pores, shall not be
5.3 The max.-rule
considered during inspection of surface texture.
For requirements specified by the maximum value
(see IS0 1302:1992, 6.2.2) of the parameter during
To decide whether or not a workpiece surface is in
inspection, none of the measured values of the par-
accordance with specification, a set of single values of
ameter over the entire surface under inspection shall
the surface texture parameter, each determined from
exceed the value specified on the drawings or in the
an evaluation length, shall be used.
technical product docume
...

SLOVENSKI STANDARD
SIST ISO 4288:2001
01-julij-2001
6SHFLILNDFLMDJHRPHWULMVNLKYHOLþLQL]GHOND7HNVWXUDSRYUãLQHSURILOQDPHWRGD
3UDYLODLQSRVWRSNL]DRFHQLWHYWHNVWXUHSRYUãLQH
Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Rules
and procedures for the assessment of surface texture
Spécification géométrique des produits (GPS) -- État de surface: Méthode du profil --
Règles et procédures pour l'évaluation de l'état de surface
Ta slovenski standard je istoveten z: ISO 4288:1996
ICS:
17.040.20 Lastnosti površin Properties of surfaces
SIST ISO 4288:2001 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST ISO 4288:2001

---------------------- Page: 2 ----------------------

SIST ISO 4288:2001
INTERNATIONAL IS0
STANDARD 4288
Second edition
1996-08-01
Geometrical Product Specifications
(GPS) - Surface texture: Profile method -
Rules and procedures for the assessment
of surface texture
Spkifica tion g6om&rique des produits (GPS) - ita t de surface: M&hode
du profil- Regles et pro&dures pour I’baluation de Y&tat de surface
Reference Number
IS0 4288:1996(E)

---------------------- Page: 3 ----------------------

SIST ISO 4288:2001
IS0 4288:1996(E)
Page
Contents
1
1 Scope .
1
2 Normative references .
1
3 Definitions .
2
.................................................................
4 Parameter estimation
2
4.1 Parameters defined over the sampling length .
.......................... 2
4.2 Parameters defined over the evaluation length
2
4.3 Curves and related parameters .
Default evaluation lengths . 2
4.4
5 Rules for comparison of the measured values with
..................................................................... 2
the tolerance limits
5.1 Areas on the feature to be inspected .
2
............................................................................. 2
5.2 The 16 % rule
5.3 The max.-rule . 3
..................................................... 3
5.4 Uncertainty of measurement
3
6 Parameter evaluation . .
3
6.1 General .
6.2 Roughness profile parameters . 3
7 Rules and procedures for inspection using stylus instruments . . 4
7.1 Basic rules for the determination of cut-off wavelength for
the measurement of roughness profile parameters . 4
4
7.2 Measurement of roughness profile parameters .
0 IS0 1996
All rights reserved. Unless otherwise specified, no part of this publication may be repro-
duced or utilized in any form or by any means, electronic or mechanical, including photo-
copying and microfilm, without permission in writing from the publisher.
International Organization for Standardization
Case Postale 56 l CH-1211 Get-We 20 l Switzerland
Printed in Switzerland

---------------------- Page: 4 ----------------------

SIST ISO 4288:2001
IS0 4288:1996(E)
Q IS0
Annexes
................................ 6
A Simplified procedure roughness inspection
7
.....................................................
B Relation to GPS matrix model
8
................................................................................
C Bibliography

---------------------- Page: 5 ----------------------

SIST ISO 4288:2001
IS0 4288: 1996(E) @ IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide fed-
eration of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be
represented on that committee. International organizations, governmental
and non-governmental, in liaison with ISO, also take part in the work. IS0
collaborates closely with the International Electrotechnical Commission
(IEC) on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are
circulated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 4288 was prepared jointly by Technical Com-
mittees lSO/TC 57, Metrology and properties of surfaces, Subcommittee
SC 1, Geometrical parameters - Instruments and procedures for
measurement of surface roughness and waviness, ISO/TC 3, Limits and
fits and lSO/TC 10, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
This second edition cancels and replaces the first edition (IS0 4288:1985)
which has been technically revised.
It differs from the previous edition in that filter cut-off values are chosen
based on the workpiece texture rather than the drawing indication. Fur-
thermore, this International Standard includes rules for the determination
of parameters other than Ra and Rz. This second edition covers roughness
primary profile parameters and comparison of
profile parameters,
measured motif parameter values with given specification.
It is envisaged that an amendment will be prepared covering M-system
waviness profile parameters, for which there are currently no standardized
rules.
Annexes A, B and C of this International Standard are for information only.

---------------------- Page: 6 ----------------------

SIST ISO 4288:2001
IS0 4288: 1996(E)
@ IS0
Introduction
This International Standard is a geometrical product specification (GPS)
standard and is to be regarded as a general GSP standard (see
lSO/TR 14638). It influences the chain links 3 and 4 of the chains of stan-
dards for roughness profile and primary profile.
For more detailed information of the relation of this International Standard
to other standards and the GPS matrix model see annex B.
The discrimination between periodic and non-periodic profiles is subjective
and left to the discretion of the user.

---------------------- Page: 7 ----------------------

SIST ISO 4288:2001
This page intentionally left blank

---------------------- Page: 8 ----------------------

SIST ISO 4288:2001
NORME INTERNATIONALE 0 IS0 IS0 4288: 1996(E)
Geometrical Product Specifications (GPS) - Surface
texture: Profile method - Rules and procedures for the
assessment of surface texture
IS0 4287: 1996, Geometrical Product Specifications
1 Scope
GW - Surface texture: Profile method - Terms,
This International Standard specifies the rules for definitions and parameters of surface texture.
comparison of the measured values with the tolerance
IS0 12085:1996, Geometrical Product Specifications
limits for surface texture parameters defined in
- Surface texture: Profile method - Motif par-
IS0 4287, IS0 12085, IS0 13565-2 and IS0 13565-3. WV
ame ters.
It also specifies the default rules for selection of cut-
IS0 13565-I :I 996, Geometrical Product Specifi-
off wavelength, ilc, for measuring roughness profile
cations (G PS) - Surface texture: Profile method; sur-
parameters according to IS0 4287 by using stylus
faces having stratified functional properties - Part I:
instruments according to IS0 3274.
Filtering and general measurement conditions.
IS0 13565-2:1996, Geometrical Product Specifi-
cations (G PS) - Surface texture: Profile method; sur-
faces having stratified functional properties - Part 2:
Height characterization using the linear material ratio
curve.
2 Normative references
The following standards contain provisions which,
IS0 13565-3:- 1 1, Geometrical Product Specifications
through reference in this text, constitute provisions of
(GPS) - Surface texture: Profile method; surfaces
this International Standard. At the time of publication, having stratified functional properties - Part 3: Height
the editions indicated were valid. All standards are
characterization using the material probability curve.
subject to revision, and parties to agreements based
IS0 14253-1: - 11, Geometrical Product Specifications
on this International Standard are encouraged to
(GPS) - Inspection by measurement of workpieces
investigate the possibility of applying the most recent
and measuring instruments - Part 7: Decision rules
editions of the standards indicated below. Members
for proving conformance or non-conformance with
of IEC and IS0 maintain registers of currently valid
specifications.
International Standards.
IS0 1302:1992, Technical drawings - Method of indi-
cating surface texture.
3 Definitions
IS0 3274: 1996, Geometrical Product Specifications For the purposes of this International Standard, the
definitions given in IS0 3274, IS0 4287, IS0 12085,
- Surface texture: Profile method - Nominal
W ’S)
IS0 13565-2 and IS0 13565-3 apply.
characteristics of contact (stylus) instruments.
1) To be published.

---------------------- Page: 9 ----------------------

SIST ISO 4288:2001
@ IS0
IS0 4288: 1996(E)
4 Parameter estimation 5 Rules for comparison of the measured
values with the tolerance limits
4.1 Parameters defined over the sampling
length
5.1 Areas on the feature to be inspected
The surface texture of the workpiece under inspection
4.1 .I Parameter estimate
can appear homogeneous or be quite different over
An estimate of the parameter ’s value is calculated
various areas. This can be seen by visual examination
using the measured data from only one sampling
of the surface. In cases where the surface texture
length.
appears homogeneous, parameter values determined
over the entire surface shall be used for comparison
with the requirements specified on the drawings or in
4.12. Average parameter estimate
the technical product documentation.
An average parameter estimate is calculated by taking
If there are separate areas with obviously different
the arithmetic mean of the parameter estimates from
surface texture, the parameter values which are de-
all the individual sampling lengths.
termined on each area shall be used separately for
comparison with the requirements specified on the
When the standard number of five sampling lengths is
drawings or in the technical product documentation.
used for roughness profile parameters, no suffix
needs to be added to the symbol. For a parameter
For requirements specified by the upper limit of the
evaluated over a number of sampling lengths other
parameter, those separate areas of the surface shall
than five, that number shall be added as a suffix to the
be used which appear to have the maximum par-
parameter symbol (eg. &I, &3).
ameter value.
4.2 Parameters defined over the evaluation
5.2 The 16 %-rule
length
For requirements specified by the upper limit (see
For parameters defined over the evaluation length (Pt,
IS0 1302:1992, 6.2.3) of a parameter, the surface is
Rt and wt), an estimate of a parameter ’s value is
considered acceptable if not more than 16 % of all the
calculated by using measurement data from an
measured values (see notes 1 and 2) of the selected
evaluation length equal to the standardized number of
parameter, based upon an evaluation length, exceed
sampling lengths.
the value specified on the drawings or in the technical
product documentation.
4.3 Curves and related parameters
For requirements specified by the lower limit of the
surface parameter, the surface is considered accept-
For curves and related parameters, an estimate of a
able if not more than 16 % of all the measured values
parameter ’s val ue is calculated by using measurement
(see notes 1 and 2) of the selected parameter, based
data from one curve, wh ich las been computed based
upon an evaluation length, are less than the value
on the evaluati
on length.
specified on the drawings or in the technical product
documentation.
4.4 Default evaluation engths To designate the upper and the lower limits of the par-
ameter, the symbol of the parameter shall be used
If not otherwise indicated C In the d rawing or in the
without the “max.” index.
technical product documentation,
the evaluation
length is as follows:
NOTES
1 Annex A provides simplified practical guidance for com-
- R-parameters: the evaluation length is defined in
paring measured values with upper and lower limits.
clause 7;
2 In cases where the values of the roughness profile par-
ameter of the surface being inspected follow a normal dis-
- P-parameters: the evaluation length is equal to
tribution, the determination of the upper limit as a limit
the length of the feature being measured;
which may be exceeded by 16 % of the measured values
of the roughness profile parameter conforms with the limit
- motif-parameters: the evaluation length is
determined by the value p + a, where p is the arithmetic
defined in clause 5 of IS0 12085:1996;
mean value of the roughness profile parameter and c is the
standard deviation of the values. The greater the value of o,
- parameters defined in IS0 13565-Z and
the further from the specified limit (the upper value) the
IS0 13565-3: the evaluation length is defined in mean value of the roughness profile parameter needs to
be. (See figure 1.)
clause 7 of IS0 13565-1 :I 996.
2

---------------------- Page: 10 ----------------------

SIST ISO 4288:2001
@ IS0 IS0 4288: 1996(E)
Figur
...

NORME IS0
INTERNATIONALE 4288
Deuxikme edition
1996-08-o 1
Spbcification gbombtrique des produits
- &at de surface: M&hode
WS)
du profil- Rkgles et procbdures pour
Mraluation de Mat de surface
Geometrical Product Specifications (GPS) - Surface texture: Profile
method - Rules and procedures for the assessment of surface texture
Numero de refkrence
IS0 4288:1996(F)

---------------------- Page: 1 ----------------------
IS0 4288: 1996(F)
Page
Sommaire
1
1 Domaine d ’application . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
2 Rkfkrences normatives
3 Dgfinitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
2
4 Estimation des paramktres .
4.1 Parametres dbfinis sur la longueur de base . 2
......................... 2
4.2 Parametres definis sur la longueur d ’haluation
................................................ 2
4.3 Courbes et paramktres associ&
2
4.4 Valeurs par dkfaut de la longueur d ’haluation .
Rggles pour comparer les valeurs mesurkes aux limites
5
2
de tokrances . .
5.1 Zones de I ’kkment & verifier . .
2
5.2 R&gles des 16 % . 2
R&gle de la valeur maximale . 3
5.3 .
5.4 Incertitude de mesure . . 3
3
6 ivaluation du param&re .
6.1 G&k-alit& . 3
6.2 Parametres du profil de rugositb . 3
Rkgles et procedures de v&ification avec des instruments
7
A palpeur . 4
7.1 R&gles de dktermination de la longueur d ’onde de coupure pour
le mesurage des param&res du profil de rugosite . 4
4
7.2 Mesure des parametres du profil de rugosite .
0 IS0 1996
Droits de reproduction r&e&s. Sauf prescription differente, aucune partie de cette publi-
cation ne peut &re reproduite ni utilisee sous quelque forme que ce soit et par aucun pro-
&d& electronique ou mkanique, y compris la photocopie et les microfilms, sans I ’accord
&it de I ’bditeur.
Organisation internationale de normalisation
Case postale 56 l CH-1211 Gen&e 20 l Suisse
Imprimk en Suisse
ii

---------------------- Page: 2 ----------------------
@ IS0 IS0 4288: 1996(F)
Annexes
A Procbdure simplifiee pour la vgrification de la rugosite
de surface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
B Relation avec la matrice GPS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C Bibliographie . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . .
III

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IS0 4288: 1996(F) 0 IS0
Avant-propos
L ’ISO (Organisation internationale de normalisation) est une federation
mondiale d ’organismes nationaux de normalisation (comites membres de
I ’ISO). L ’elaboration des Normes internationales est en general confiee aux
comites techniques de I ’ISO. Chaque comite membre inter-es& par une
etude a le droit de faire partie du comite technique tree a cet effet. Les
organisations internationales, gouvernementales et non gouvernemen-
tales, en liaison avec I ’ISO participent egalement aux travaux. L ’ISO colla-
bore etroitement avec la Commission electrotechnique internationale (CEI)
en ce qui concerne la normalisation electrotechnique.
Les projets de Normes internationales adopt& par les comites techniques
sont soumis aux comites membres pour vote. Leur publication comme
Normes internationales requiert I ’approbation de 75 % au moins des co-
mites membres votants.
La Norme internationale IS0 4288 a ete elaboree conjointement par les
comites techniques ISOnC 57, Mktrologie et proprY&& des surfaces,
Parami, tres g6om6 triques - Instruments et
sous-comite SC 1,
proc&dures pour la mesure de la rugositg et de I ’ondulation des surfaces,
I ’ISOJTC 3, Ajustements et l’lSO/TC 10, Dessins techniques, dgfinitions de
produits et documentation y relative, sous-comite SC 5, Cotation et
tolkancemen t.
Cette deuxieme edition annule et remplace la premiere edition
(IS0 4288:1985), dont elle constitue une revision technique.
Les differences par rapport a I ’edition precedente portent sur le fait que
les valeurs des longueurs d ’onde de coupure sont choisies en fonction de
I ’etat de surface de la piece plutot qu ’en fonction de I ’indication du dessin.
De plus, la presente Norme internationale comporte des regles pour la
determination d ’autres parametres que Ra et &. Cette deuxieme edition
concerne les parametres du profil de rugosite et du profil primaire, et traite
de la comparaison entre les valeurs mesurees des parametres lies aux
motifs et les specifications.
II est prevu de preparer un amendement concernant les parametres du
profil d ’ondulation du systeme M, pour lesquels il n ’y a aujourd ’hui aucune
regle normalisee.
Les annexes A, B et C de la presente Norme internationale sont donnees
uniquement a titre d ’information.
iv

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IS0 4288:1996(F)
@ IS0
Introduction
La presente Norme internationale qui traite de la specification geometrique
des produits (GPS) est consideree comme une norme GPS g&k-ale (voir
l ’lSO/TR 14638). Elle influence les maillons 3 et 4 des chaPnes de normes
relatives au profil de rugosite et au profil primaire.
Pour de plus amples informations sur la relation de la presente Norme
internationale avec les autres normes et la matrice GPS, voir I ’annexe B.
La discrimination entre profils periodique et non periodique est subjective
et laissee a I ’appreciation de I ’utilisateur.
V

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NORME INTERNATIONALE 0 Is0 IS0 4288: 1996(F)
Spkification geom&rique des produits (GPS) - &at
de surface: M&hode du profil- R&gles et procbdures
pour 1 ’6valuation de Mat de surface
IS0 4287:1996, Specification geometrique des pro-
1 Domaine d ’application
duits (GPS) - ,&at de surface: Methode du profil -
La presente Norme internationale prescrit les regles et
Termes, definitions et parametres d ’etat de surface.
les procedures pour la comparaison aux Iimites de to-
IS0 12085:1996, Specification geometrique des pro-
lerances des valeurs mesurees des parametres d ’etat
duits (G PS) - ita t de surface: Methode du profil -
de surface definis dans I ’ISO 4287, I ’ISO 12085,
Parametres lies aux motifs.
I ’ISO 13565-Z et I ’ISO 13565-3.
IS0 13565-I : 1996, Specification geometrique des
Elle prescrit egalement les conventions a retenir pour
produits (G PS) - &at de surface: Methode du pro fil;
le choix de la longueur d ’onde de coupure, kc, lors de
surfaces a yan t des proprietes fonctionnelles
la mesure des parametres de rugosite conformement
differentes suivant les niveaux - Partie I: Filtrages et
a I ’ISO 4887 a I ’aide d ’appareils a contact (palpeur)
conditions g&Wales de mesurage.
conformement a I ’ISO 3274.
IS0 13565-211996, Specification geometrique des
produits (GPS) - &at de surface: Methode du profil;
surfaces a yan t des proprie tes fonctionnelles
2 Rbfbrences normatives
differentes suivant les niveaux - Partie 2:
Caracterisation des hauteurs par la courbe de taux de
Les normes suivantes contiennent des dispositions
longueur portante.
qui, par suite de la reference qui en est faite, consti-
tuent des dispositions valables pour la presente
IS0 13565-3:- 1 1, Specification geome trique des pro-
Norme internationale. Au moment de la publication,
duits (G PS) -- &at de surface: Methode du profil; sur-
les editions indiquees etaient en vigueur. Toute norme
faces a yan t des proprietes fonctionnelles differ-en tes
est sujette a revision et les parties prenantes des ac-
suivant les niveaux - Partie 3: Caracterisa tion des
cords fond& sur la presente Norme internationale
hauteurs par la courbe de probabilite de mat&e.
sont invitees a rechercher la possibilite d ’appliquer les
IS0 14253-l :- 1 1, Specification geome trique des pro-
editions les plus recentes des normes indiquees ci-
- Verification des pieces et des instru-
duits (G PS)
apres. Les membres de la CEI et de I ’ISO possedent
ments de mesure - Partie I: Regles de decision pour
le registre des Normes internationales en vigueur a un
prouver la conformite ou la non-conformite a la speci-
moment donne.
fication.
IS0 13021992, Dessins techniques - Indications des
etats de surface.
3 Dbfinitions
Pour les besoins de la presente Norme internationale,
IS0 3274: 1996, Specification geometrique des pro-
- ita t de surface: Methode du profil - les definitions donnees dans I ’ISO 3274, I ’ISO 4287,
duits (G PS)
Caracteristiques nominales des appareils a con tact I ’ISO 12085, I ’ISO 13565-2 et I ’ISO 13565-3 s ’appli-
quent.
(palpeur).
1) A publier.

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@ IS0
IS0 4288:1996(F)
4 Estimation des paramhtres 5 Rkgles pour comparer les valeurs
mesurbes aux limites de tokrances
4.1 Paramgtres dbfinis sur la longueur de
base 5.1 Zones de kkment A vkrifier
L ’etat de surface de la piece a verifier peut apparaitre
4.1.1 Estimateur d ’un paramktre
homogene ou peut etre assez different sur diverses
L ’estimateur de la valeur d ’un parametre est calcule
zones. Cela peut etre determine par examen visuel de
avec les donnees de mesurage obtenues sur une
la surface. Dans le cas ou l ’etat de surface apparait
seule longueur de base.
homogene, les valeurs des parametres determinees
sur la surface entiere doivent etre utilisees pour la
comparaison avec les exigences specifiees sur les
4.12. Estimateur moyen d ’un paramktre
dessins ou autre documentation technique du produit.
L ’estimateur moyen d ’un parametre est calculi! en
faisant la moyenne arithmetique des estimateurs du Si des zones differentes presentent manifestement
un &at de surface different, les valeurs des parame-
parametre obtenus sur toutes les longueurs de base
individuelles. tres determinees sur chacune de ces zones doivent
etre utilisees separement pour la comparaison avec
Lorsque la valeur conventionnelle de cinq longueurs
les exigences specifiees sur les dessins ou autre do-
de base est utilisee pour les parametres du profil de
cumentation technique du produit.
rugosite, il nest pas besoin d ’ajouter de suffixe au
Lorsque les exigences sont specifiees par la Iimite su-
symbole de base. Pour un parametre evalue sur un
perieure du parametre, il faut utiliser la ou les zones
nombre de longueurs de base different de cinq, ce
de la surface qui semblent presenter la valeur maxi-
nombre doit etre ajoute comme suffixe au symbole du
male du parametre.
parametre (par exemple R:l, R:3).
5.2 Rhgle des 16 %
4.2 Paramktres dkfinis sur la longueur
d ’haluation
Lorsque les exigences sont specifiees par la limite su-
perieure du parametre (voir 6.23 de I ’ISO 1302:1992),
Pour les parametres definis sur la longueur d ’evalua-
la surface est consideree comme etant acceptable si
tion (Pr, Rt et Wt), un estimateur de la valeur du para-
au maximum 16 % de toutes les valeurs mesurees du
metre est calcule avec les donnees de mesurage
parametre considere (voir notes 1 et 2), obtenues sur
obtenues sur une longueur d ’evaluation comprenant le
une longueur d ’evaluation, depassent la valeur speci-
nombre normalise de longueurs de base.
fiee sur les dessins ou autre documentation technique
du produit.
4.3. Courbes et paramhtres associks
Lorsque les exigences sont specifiees par la Iimite in-
ferieure du parametre, la surface est consideree
Pour les courbes et parametres associes, un estima-
comme &ant acceptable si au maximum 16 % de tou-
teur de la valeur du parametre est calcule avec les
tes les valeurs mesurees du parametre (voir notes 1
donnees de mesure de la courbe en question, tracee
et 2), obtenues sur une longueur d ’evaluation sont
pour une longueur d ’evaluation.
depassees par la valeur specifiee sur les dessins ou
autre documentation technique du produit.
urs par dhfaut de la longueur
4.4 Vale
Pour designer les limites superieure et inferieure des
d ’haluat ion
parametres, il faut utiliser le symbole du parametre
sans le suffixe ((max. ))
Sauf indication contraire sur le dessin ou dans la do-
cumentation technique du produit, la longueur d ’eva-
NOTES
Iuation est definie comme suit:
1 L ’an nexe A prop ose un guide pratique pou . compar er les
- parametre R: la longueur d ’evaluation est definie ux Iimites superieure et in erieure.
valeurs mesurees a
a I ’article 7;
2 Lorsque les valeurs du parametre de rugosite de la sur-
face a verifier sont distribuees suivant une loi normale, la
- parametre P: la longueur d ’evaluation est 6gale 3
determination de la Iimite superieure, comme une Iimite qui
la longueur de I ’element a mesurer;
peut etre depassee par 16 % des valeurs mesurees du pa-
- parametres lies aux motifs: la longueur d ’evalua- rametre du profil de rugosite, est conforme a la Iimite de-
terminee par la valeur p + 0 ou p est la moyenne
tion est definie a I ’article 5 de I ’ISO 12085:1996;
arithmetique du parametre du profil de rugosite et 0 I ’ecart-
- parametres definis dans I ’ISO 13565-2 et
type de ces valeurs. Plus la valeur de 0 est grande, plus la
I ’ISO 13565-3: la longueur d ’evaluation est definie
valeur moyenne du parametre du profil de rugosite est eloi-
a I ’article 7 de I ’ISO 13565-l :I 996.
gnee de la Iimite specifiee (limite superieure). Voir figure 1.
2

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IS0 4288: 1996(F)
Limite supkrieure du parametre
d ’etat de surface
L cfl
Vateur du parametre d%tat des
...