SIST EN 62884-1:2017
(Main)Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017)
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017)
This part of IEC 62884 specifies the measurement techniques for piezoelectric, dielectric and
electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators
using FBAR (hereinafter referred to as "Oscillator").
NOTE Dielectric Resonator Oscillators (DROs) and oscillators using FBAR are under consideration.
Messverfahren für piezoelektrische, dielektrische und elektrostatische Oszillatoren - Teil 1: Grundlegende Messverfahren
Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 1 : Méthodes fondamentales pour le mesurage
L'IEC 62884-1:2017 spécifie les techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques, y compris les oscillateurs à résonateur diélectrique (DRO – Dielectric Resonator Oscillators) et les oscillateurs utilisant des résonateurs et filtres à ondes de volume sur couches minces (FBAR) (ici appelé "Oscillateur").
NOTE: Les oscillateurs à résonateur diélectrique (DRO) et les oscillateurs utilisant FBAR sont à l'étude.
Merilne tehnike za piezoelektrične, dielektrične in elektrostatične oscilatorje - 1. del: Osnovne merilne metode (IEC 62884-1:2017)
Ta del standarda IEC 62884 določa merilne tehnike za piezoelektrične, dielektrične in elektrostatične oscilatorje, vključno z oscilatorji z dielektričnim resonatorjem (DRO) in oscilatorji, ki uporabljajo resonator FBAR (v nadaljevanju »oscilator«).
OPOMBA: Upoštevajo se oscilatorji z dielektričnim resonatorjem (DRO) in oscilatorji, ki uporabljajo resonator FBAR.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 62884-1:2017
01-november-2017
0HULOQHWHKQLNH]DSLH]RHOHNWULþQHGLHOHNWULþQHLQHOHNWURVWDWLþQHRVFLODWRUMH
GHO2VQRYQHPHULOQHPHWRGH,(&
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1:
Basic methods for the measurement (IEC 62884-1:2017)
Ta slovenski standard je istoveten z: EN 62884-1:2017
ICS:
31.140 3LH]RHOHNWULþQHQDSUDYH Piezoelectric devices
SIST EN 62884-1:2017 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 62884-1:2017
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SIST EN 62884-1:2017
EUROPEAN STANDARD EN 62884-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
September 2017
ICS 31.140
English Version
Measurement techniques of piezoelectric,
dielectric and electrostatic oscillators -
Part 1: Basic methods for the measurement
(IEC 62884-1:2017)
Techniques de mesure des oscillateurs piézoélectriques, Messverfahren für piezoelektrische, dielektrische
diélectriques et électrostatiques - und elektrostatische Oszillatoren -
Partie 1 : Méthodes fondamentales pour le mesurage Teil 1: Grundlegende Messverfahren
(IEC 62884-1:2017) (IEC 62884-1:2017)
This European Standard was approved by CENELEC on 2017-07-13. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62884-1:2017 E
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SIST EN 62884-1:2017
EN 62884-1:2017
European foreword
The text of document 49/1187A/CDV, future edition 1 of IEC 62884-1, prepared by IEC/TC 49
"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 62884-1:2017.
The following dates are fixed:
• latest date by which the document has to be implemented at (dop) 2018-04-13
national level by publication of an identical national
standard or by endorsement
• latest date by which the national standards conflicting with (dow) 2020-07-13
the document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62884-1:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60122-1:2002 NOTE Harmonized as EN 60122-1:2002 (not modified).
IEC 60679-3:2012 NOTE Harmonized as EN 60679-3:2013 (not modified).
IEC 60679-4 NOTE Harmonized as EN 60679-4.
IEC 60679-5 NOTE Harmonized as EN 60679-5.
IEC 60749-26 NOTE Harmonized as EN 60749-26.
IEC 60749-27 NOTE Harmonized as EN 60749-27.
IEC 61000-4-2 NOTE Harmonized as EN 61000-4-2.
IEC 61019-1:2004 NOTE Harmonized as EN 61019-1:2005 (not modified).
IEC 61019-2:2005 NOTE Harmonized as EN 61019-2:2005 (not modified).
IEC 61837-1:2012 NOTE Harmonized as EN 61837-1:2012 (not modified).
IEC 61837-2:2011 NOTE Harmonized as EN 61837-2:2011 (not modified).
IEC 61837-4:2015 NOTE Harmonized as EN 61837-4:2015 (not modified).
ISO 80000-4:2006 NOTE Harmonized as EN ISO 80000-4:2013 (not modified).
2
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SIST EN 62884-1:2017
EN 62884-1:2017
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is
available here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60027 series Letter symbols to be used in electrical EN 60027 series
technology
IEC 60050-561 - International electrotechnical - -
vocabulary - Part 561: Piezoelectric,
dielectric and electrostatic devices and
associated materials for frequency
control, selection and detection
IEC 60068-1 2013 Environmental testing - Part 1: General EN 60068-1 2014
and guidance
IEC 60068-2-1 - Environmental testing - Part 2-1: Tests - EN 60068-2-1 -
Test A: Cold
IEC 60068-2-2 - Environmental testing - Part 2-2: Tests - EN 60068-2-2 -
Test B: Dry heat
IEC 60068-2-6 - Environmental testing - Part 2-6: Tests - EN 60068-2-6 -
Test Fc: Vibration (sinusoidal)
IEC 60068-2-7 - Basic environmental testing EN 60068-2-7 -
procedures - Part 2-7: Tests - Test Ga
and guidance: Acceleration, steady state
IEC 60068-2-10 2005 Environmental testing - Part 2-10: EN 60068-2-10 2005
Tests - Test J and guidance: Mould
growth
IEC 60068-2-13 - Basic environmental testing EN 60068-2-13 -
procedures - Part 2-13: Tests - Test M:
Low air pressure
IEC 60068-2-14 - Environmental testing - Part 2-14: EN 60068-2-14 -
Tests - Test N: Change of temperature
IEC 60068-2-17 1994 Basic environmental testing EN 60068-2-17 1994
procedures - Part 2-17: Tests - Test Q:
Sealing
3
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SIST EN 62884-1:2017
EN 62884-1:2017
Publication Year Title EN/HD Year
IEC 60068-2-20 - Environmental testing - Part 2-20: EN 60068-2-20 -
Tests - Test T: Test methods for
solderability and resistance to soldering
heat of devices with leads
IEC 60068-2-21 - Environmental testing - Part 2-21: EN 60068-2-21 -
Tests - Test U: Robustness of
terminations and integral mounting
devices
IEC 60068-2-27 - Environmental testing - Part 2-27: EN 60068-2-27 -
Tests - Test Ea and guidance: Shock
IEC 60068-2-30 - Environmental testing - Part 2-30: EN 60068-2-30 -
Tests - Test Db: Damp heat, cyclic (12 h
+ 12 h cycle)
IEC 60068-2-31 - Environmental testing - Part 2-31: EN 60068-2-31 -
Tests - Test Ec: Rough handling shocks,
primarily for equipment-type specimens
IEC 60068-2-45 - Basic environmental testing EN 60068-2-45 -
procedures - Part 2-45: Tests - Test XA
and guidance: Immersion in cleaning
solvents
IEC 60068-2-52 - Environmental testing - Part 2-52: EN 60068-2-52 -
Tests - Test Kb: Salt mist, cyclic (sodium
chloride solution)
IEC 60068-2-58 - Environmental testing - Part 2-58: EN 60068-2-58 -
Tests - Test Td: Test methods for
solderability, resistance to dissolution of
metallization and to soldering heat of
surface mounting devices (SMD)
IEC 60068-2-64 - Environmental testing - Part 2-64: EN 60068-2-64 -
Tests - Test Fh: Vibration, broadband
random and guidance
IEC 60068-2-78 - Environmental testing - Part 2-78: EN 60068-2-78 -
Tests - Test Cab: Damp heat, steady
state
IEC 60469 - Transitions, pulses and related EN 60469 -
waveforms - Terms, definitions and
algorithms
IEC 60617-DB - Graphical symbols for diagrams - -
1)
IEC 60679-1 2017 Piezoelectric, dielectric and electrostatic EN 60679-1 —
oscillators of assessed quality - Part 1 :
Generic specification
ISO 80000-1 - Quantities and units - Part 1: General EN ISO 80000-1 -
1) To be published.
4
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SIST EN 62884-1:2017
IEC 62884-1
®
Edition 1.0 2017-06
INTERNATIONAL
STANDARD
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic
oscillators –
Part 1: Basic methods for the measurement
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-4395-4
Warning! Make sure that you obtained this publication from an authorized distributor.
® Registered trademark of the International Electrotechnical Commission
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SIST EN 62884-1:2017
– 2 – IEC 62884-1:2017 IEC 2017
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 9
3.1 General . 9
3.2 Terms and definitions . 10
4 Test and measurement procedures . 10
4.1 General . 10
4.2 Test and measurement conditions . 10
4.2.1 Standard conditions for testing . 10
4.2.2 Equilibrium conditions . 10
4.2.3 Air flow conditions for temperature tests . 10
4.2.4 Power supplies . 11
4.2.5 Precision of measurement . 11
4.2.6 Precautions . 11
4.2.7 Alternative test methods . 11
4.3 Visual inspection . 11
4.3.1 General . 11
4.3.2 Visual test A . 11
4.3.3 Visual test B . 11
4.3.4 Visual test C . 12
4.4 Dimensions and gauging procedures . 12
4.4.1 Dimensions – Test A . 12
4.4.2 Dimensions – Test B . 12
4.5 Electrical test procedures . 12
4.5.1 Insulation resistance . 12
4.5.2 Voltage proof . 12
4.5.3 Input power . 13
4.5.4 Output frequency . 14
4.5.5 Frequency/temperature characteristics . 15
4.5.6 Frequency/load coefficient . 16
4.5.7 Frequency/voltage coefficient . 17
4.5.8 Frequency stability with thermal transient . 17
4.5.9 Oscillation start-up. 18
4.5.10 Stabilization time . 22
4.5.11 Frequency adjustment range. 22
4.5.12 Retrace characteristics . 22
4.5.13 Oscillator output voltage (sinusoidal) . 23
4.5.14 Oscillator output voltage (pulse waveform) . 24
4.5.15 Oscillator output waveform (sinusoidal) . 25
4.5.16 Oscillator output waveform (pulse) . 27
4.5.17 Oscillator output power (sinusoidal) . 27
4.5.18 Oscillator output impedance (sinusoidal) . 27
4.5.19 Re-entrant isolation . 28
4.5.20 Output suppression of gated oscillators . 28
4.5.21 3-state output characteristics . 29
4.5.22 Amplitude modulation characteristics . 30
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IEC 62884-1:2017 IEC 2017 – 3 –
4.5.23 Frequency modulation characteristics . 36
4.5.24 Spurious response . 40
4.5.25 Phase noise . 40
4.5.26 Phase noise – vibration . 41
4.5.27 Phase noise – acoustic . 41
4.5.28 Noise pedestal . 42
4.5.29 Spectral purity . 43
4.5.30 Incidental frequency modulation . 43
4.5.31 RMS fractional frequency fluctuations . 44
4.5.32 Electromagnetic interference (radiated) . 48
4.6 Mechanical and environmental test procedures . 52
4.6.1 Robustness of terminations (destructive) . 52
4.6.2 Sealing test (non-destructive) . 54
4.6.3 Soldering (solderability and resistance to soldering heat) (destructive) . 54
4.6.4 Rapid change of temperature: severe shock by liquid immersion (non-
destructive). 57
4.6.5 Rapid change of temperature: thermal shock in air (non-destructive) . 57
4.6.6 Bump (destructive) . 57
4.6.7 Vibration (destructive). 58
4.6.8 Shock (destructive) . 58
4.6.9 Free fall (destructive) . 59
4.6.10 Acceleration, steady-state (non-destructive) . 59
4.6.11 Acceleration – 2g tip over . 59
4.6.12 Acceleration noise . 59
4.6.13 Low air pressure (non-destructive) . 59
4.6.14 Dry heat (non-destructive) . 59
4.6.15 Damp heat, cyclic (destructive) . 59
4.6.16 Cold (non-destructive) . 60
4.6.17 Climatic sequence (destructive) . 60
4.6.18 Damp heat, steady-state (destructive) . 60
4.6.19 Salt mist, cyclic (destructive) . 60
4.6.20 Mould growth (non-destructive) . 60
4.6.21 Immersion in cleaning solvent (non-destructive) . 60
4.6.22 Radiation hardness . 60
Bibliography . 61
Figure 1 – Test circuits for insulation resistance measurements . 12
Figure 2 – Test circuit for voltage proof test . 13
Figure 3 – Test circuit for oscillator input power measurement . 13
Figure 4 – Test circuit for oven and oscillator input power measurement . 14
Figure 5 – Test circuit for measurement of output frequency, method1 . 15
Figure 6 – Test circuit for measurement of output frequency, method 2 . 15
Figure 7 – Test circuit for measurement of frequency/temperature characteristics . 16
Figure 8 – Thermal transient behaviour of typical oscillator . 18
Figure 9 – Generalized oscillator circuit . 19
Figure 10 – Test circuit for start-up behaviour and start-up time measurement. 20
Figure 11 – Typical start-up behaviour with slow supply voltage ramp . 20
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Figure 12 – Definition of start-up time . 21
Figure 13 – Supply voltage waveform for periodical t measurement . 22
SU
Figure 14 – Typical oscillator stabilization characteristic . 22
Figure 15 – Example of retrace characteristic . 23
Figure 16 – Test circuit for the measurement of output voltage . 24
Figure 17 – Test circuit for the measurement of pulse outputs . 24
Figure 18 – Characteristics of an output waveform . 24
Figure 19 – Test circuit for harmonic distortion measurement . 25
Figure 20 – Quasi-sinusoidal output waveforms . 25
Figure 21 – Frequency spectrum for harmonic distortion . 26
Figure 22 – Test circuit for the determination of isolation between output ports . 28
Figure 23 – Test circuit for measuring suppression of gated oscillators . 29
Figure 24 – Test circuit for 3-state disable mode output current . 29
Figure 25 – Test circuit for output gating time – 3-state . 30
Figure 26 – Test circuit for modulation index measurement . 31
Figure 27 – Modulation waveform for index calculation . 31
Figure 28 – Logarithmic signal amplitude scale . 31
Figure 29 – Test circuit to determine amplitude modulation sensitivity . 33
Figure 30 – Frequency spectrum of amplitude modulation distortion . 33
Figure 31 – Test circuit to determine pulse amplitude modulation . 34
Figure 32 – Pulse modulation characteristic . 35
Figure 33 – Test circuit for the determination of modulation input impedance . 36
Figure 34 – Test circuit for the measurement of f.m. deviation . 36
Figure 35 – Test circuit for the measurement of f.m. sensitivity . 38
Figure 36 – Test circuit for the measurement of frequency modulation distortion . 39
Figure 37 – Test circuit for the measurement of single-sideband phase noise . 40
Figure 38 – Typical noise pedestal spectrum . 42
Figure 39 – Test circuit for the measurement of incidental frequency modulation . 44
Figure 40 – Test circuit for method 1 . 45
Figure 41 – Test circuit for method 2 . 46
Figure 42 – Circuit modifications for methods 1 and 2 . 47
Figure 43 – Time-domain short-term frequency stability of a typical 5 MHz precision
oscillator . 48
Figure 44 – Radiated interference tests . 49
Figure 45 – Characteristics of line impedance of stabilizing network . 50
Figure 46 – Circuit diagram of line impedance of stabilizing network . 51
Figure 47 – Reflow temperature profile for solderability . 55
Figure 48 – Reflow temperature profile for resistance to soldering heat . 56
Table 1 – Measuring sets bandwidth . 52
Table 2 – Tensile force . 52
Table 3 – Thrust force . 53
Table 4 – Bending force . 53
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IEC 62884-1:2017 IEC 2017 – 5 –
Table 5 – Torque force . 54
Table 6 – Solderability – Test condition, reflow method . 55
Table 7 – Resistance to soldering heat – Test condition and severity, reflow method . 57
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC,
DIELECTRIC AND ELECTROSTATIC OSCILLATORS –
Part 1: Basic methods for the measurement
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62884-1 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and de
...
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