SIST EN ISO 16610-1:2015
(Main)Geometrical product specifications (GPS) - Filtration - Part 1: Overview and basic concepts (ISO 16610-1:2015)
Geometrical product specifications (GPS) - Filtration - Part 1: Overview and basic concepts (ISO 16610-1:2015)
This part of ISO/TS 16610 sets out the basic terminology for GPS filtration and the framework for the fundamental procedures used in GPS filtration
Geometrische Produktspezifikation (GPS) - Filterung - Teil 1: Überblick und grundlegende Konzepte (ISO 16610-1:2015)
Spécification géométrique des produits (GPS) - Filtrage - Partie 1: Vue d'ensemble et concepts de base (ISO 16610-1:2015)
L'ISO 16610-1:2015 définit la terminologie de base et la structure des principales méthodes utilisées pour le filtrage GPS.
Specifikacija geometrijskih veličin izdelka (GPS) - Filtriranje - 1. del: Pregled in osnovni pojmi (ISO 16610-1:2015)
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN ISO 16610-1:2015
01-julij-2015
6SHFLILNDFLMDJHRPHWULMVNLKYHOLþLQL]GHOND *36 )LOWULUDQMHGHO 3UHJOHGLQ
RVQRYQLSRMPL ,62
Geometrical product specifications (GPS) - Filtration - Part 1: Overview and basic
concepts (ISO 16610-1:2015)
Geometrische Produktspezifikation (GPS) - Filterung - Teil 1: Überblick und
grundlegende Konzepte (ISO 16610-1:2015)
Spécification géométrique des produits (GPS) - Filtrage - Partie 1: Vue d'ensemble et
concepts de base (ISO 16610-1:2015)
Ta slovenski standard je istoveten z: EN ISO 16610-1:2015
ICS:
17.040.20 Lastnosti površin Properties of surfaces
SIST EN ISO 16610-1:2015 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN ISO 16610-1:2015
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SIST EN ISO 16610-1:2015
EUROPEAN STANDARD
EN ISO 16610-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
April 2015
ICS 17.040.20
English Version
Geometrical product specifications (GPS) - Filtration - Part 1:
Overview and basic concepts (ISO 16610-1:2015)
Spécification géométrique des produits (GPS) - Filtrage - Geometrische Produktspezifikation (GPS) - Filterung - Teil
Partie 1: Vue d'ensemble et concepts de base (ISO 16610- 1: Überblick und grundlegende Konzepte (ISO 16610-
1:2015) 1:2015)
This European Standard was approved by CEN on 14 February 2015.
CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national
standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management Centre has the same
status as the official versions.
CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
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Kingdom.
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© 2015 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 16610-1:2015 E
worldwide for CEN national Members.
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SIST EN ISO 16610-1:2015
EN ISO 16610-1:2015 (E)
Contents Page
Foreword .3
2
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SIST EN ISO 16610-1:2015
EN ISO 16610-1:2015 (E)
Foreword
This document (EN ISO 16610-1:2015) has been prepared by Technical Committee ISO/TC 213 “Dimensional
and geometrical product specifications and verification” in collaboration with Technical Committee
CEN/TC 290 “Dimensional and geometrical product specification and verification” the secretariat of which is
held by AFNOR.
This European Standard shall be given the status of a national standard, either by publication of an identical
text or by endorsement, at the latest by October 2015, and conflicting national standards shall be withdrawn at
the latest by October 2015.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CEN [and/or CENELEC] shall not be held responsible for identifying any or all such patent rights.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following
countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech
Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece,
Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal,
Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Endorsement notice
The text of ISO 16610-1:2015 has been approved by CEN as EN ISO 16610-1:2015 without any modification.
3
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SIST EN ISO 16610-1:2015
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SIST EN ISO 16610-1:2015
INTERNATIONAL ISO
STANDARD 16610-1
First edition
2015-04-15
Geometrical product specifications
(GPS) — Filtration —
Part 1:
Overview and basic concepts
Spécification géométrique des produits (GPS) — Filtrage —
Partie 1: Vue d’ensemble et concepts de base
Reference number
ISO 16610-1:2015(E)
©
ISO 2015
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SIST EN ISO 16610-1:2015
ISO 16610-1:2015(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2015
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
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Published in Switzerland
ii © ISO 2015 – All rights reserved
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SIST EN ISO 16610-1:2015
ISO 16610-1:2015(E)
Contents Page
Foreword .iv
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 General discussion. 5
4.1 General . 5
4.2 Primary mathematical models . 5
5 Filter designations . 6
Annex A (informative) Illustrative examples . 8
Annex B (informative) Masterplan for filtration standards — ISO 16610- series .14
Annex C (informative) Advantages and disadvantages of different filter types .17
Annex D (informative) Concept diagram .20
Annex E (informative) Relationship to the filtration matrix model .21
Annex F (informative) Relationship to the GPS matrix model .22
Bibliography .24
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SIST EN ISO 16610-1:2015
ISO 16610-1:2015(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any
patent rights identified during the development of the document will be in the Introduction and/or on
the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical Barriers
to Trade (TBT) see the following URL: Foreword - Supplementary Information
The committee responsible for this document is ISO/TC 213, Dimensional and geometrical product
specifications and verification.
This first edition cancels and replaces ISO/TS 16610-1:2006 which has been technically revised.
ISO 16610 consists of the following parts, under the general title Geometrical product specifications
(GPS) — Filtration:
— Part 1: Overview and basic concepts
— Part 20: Linear profile filters: Basic concepts
— Part 21: Linear profile filters: Gaussian filters
— Part 22: Linear profile filters: Spline filters
— Part 28: Profile filters: End effects
— Part 29: Linear profile filters: Spline wavelets
— Part 30: Robust profile filters: Basic concepts
— Part 31: Robust profile filters: Gaussian regression filters
— Part 32: Robust profile filters: Spline filters
— Part 40: Morphological profile filters: Basic concepts
— Part 41: Morphological profile filters: Disk and horizontal line-segment filters
— Part 49: Morphological profile filters: Scale space techniques
— Part 60: Linear areal filters — Basic concepts
— Part 61: Linear areal filters — Gaussian filters
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SIST EN ISO 16610-1:2015
ISO 16610-1:2015(E)
— Part 71: Robust areal filters: Gaussian regression filters
— Part 85: Morphological areal filters: Segmentation
The following parts are planned:
— Part 26: Linear profile filters: Filtration on nominally orthogonal grid planar data sets
— Part 27: Linear profile filters: Filtration on nominally orthogonal grid cylindrical data sets
— Part 45: Morphological profile filters: Segmentation
— Part 62: Linear areal filters: Spline filters
— Part 69: Linear areal filters: Spline wavelets
— Part 70: Robust areal filters: Basic concepts
— Part 72: Robust areal filters: Spline filters
— Part 80: Morphological areal filters: Basic concepts
— Part 81: Morphological areal filters: Sphere and horizontal planar segment filters
— Part 89: Morphological areal filters: Scale space techniques
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SIST EN ISO 16610-1:2015
ISO 16610-1:2015(E)
Introduction
This part of ISO 16610 is a geometrical product specification (GPS) standard and is to be regarded as a
general GPS standard (see ISO/TR 14638). It influences chain links 3 and 6 in the GPS matrix structure.
The ISO/GPS Masterplan given in ISO 14638 gives an overview of the ISO/GPS system of which this
part of ISO 16610 is a part of. The fundamental rules of ISO/GPS given in ISO 8015 apply to this part
of ISO 16610 and the default decision rules given in ISO 14253-1 apply to the specifications made in
accordance with this part of ISO 16610, unless otherwise indicated.
For more detailed information about the relation of this part of ISO 16610 to the GPS matrix model, see
Annex F.
This part of ISO 16610 also develops the terminology and concepts for GPS filtration. This part of
ISO 16610 generalizes the concept of filtration. The series of ISO 16610 presents a toolbox of filtration
techniques to enable the user to choose an appropriate filter for the functional requirements. They are
fundamental International Standards upon which other ISO documents are built.
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SIST EN ISO 16610-1:2015
INTERNATIONAL STANDARD ISO 16610-1:2015(E)
Geometrical product specifications (GPS) — Filtration —
Part 1:
Overview and basic concepts
1 Scope
This part of ISO 16610 defines the basic terminology for GPS filtration and the framework for the
fundamental procedures used in GPS filtration.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
ISO 17450-1:2011, Geometrical product specifications (GPS) — General concepts — Part 1: Model for
geometrical specification and verification
ISO 17450-2:2012, Geometrical product specifications (GPS) — General concepts — Part 2: Basic tenets,
specifications, operators, uncertainties and ambiguities
ISO/IEC Guide 99:2007, International vocabulary of metrology — Basic and general concepts and associated
terms (VIM)
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO/IEC Guide 99, ISO 17450-1,
ISO 17450-2, and the following apply.
3.1
integral feature
geometrical feature belonging to the real surface of the workpiece or to a surface model
Note 1 to entry: An integral feature is intrinsically defined, e.g. skin of the workpiece.
Note 2 to entry: For a statement of specifications, geometrical features obtained from partition of the surface
model or of real surface of workpiece shall be defined. These features, called “integral features”, are models of the
different physical parts of the workpiece that have specific functions, especially those in contact with adjacent
workpieces.
Note 3 to entry: An integral feature can be identified, for example, by
— a partition of the surface model,
— a partition of another integral feature, or
— a collection of other integral features.
[SOURCE: ISO 17450-1:2011, 3.3.5]
3.1.1
surface portion
SP
portion of a partitioned integral feature (3.1)
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ISO 16610-1:2015(E)
3.1.2
surface profile
line resulting from the intersection between a surface portion (3.1.1) and an ideal plane
Note 1 to entry: The orientation of the ideal plane is usually perpendicular to the tangent plane of the surface
portion.
Note 2 to entry: The concept of profiles is under development and it is possible that the definition of surface
profile will be revised.
3.2
primary mathematical model
set of nested hierarchical mathematical models of the surface portion (3.1.1), wherein each model in the
set can be described by a finite number of parameters
Note 1 to entry: Examples include truncated Fourier series, curvature limited (zero to ± value) profiles, and
limited Wolf pruning height (100 % to smaller positive percentage) segments.
Note 2 to entry: An example of a primary mathematical model using a truncated Fourier series is given in A.1.
3.2.1
nesting index
NI
value indicating the relative level of nested hierarchy for a particular primary mathematical model (3.2)
Note 1 to entry: Given a particular nesting index, models with lower indices contain more surface information,
whereas models with higher nesting indices contain less surface information.
Note 2 to entry: By convention, as the nesting index approaches zero (or a series of all zeros), there exists a primary
mathematical model that approximates the real surface of a workpiece to within any given measure of closeness.
Note 3 to entry: The cut-off wavelength for the Gaussian filter is an example of a nesting index (see 3.2.1.1). For
the morphological filter, the nesting index is the size of the structuring element (e.g. the radius of the disc) which
is different from the wavelength concept that underlies the notion of “cut-off” (see 3.2.1.2 and 3.2.1.3).
Note 4 to entry: The term nesting index is derived from a combination of index from index set and nesting from
nested hierarchy, both of which are mathematical terms.
3.2.1.1
cut-off wavelength
particular type of nesting index (3.2.1) applicable to linear filters, used to separate surface components
into long and short wavelengths
Note 1 to entry: See, for example, ISO 16610-21, ISO 16610-22, and ISO 16610-61.
3.2.1.2
vertical circular disc radius
particular type of nesting index (3.2.1) applicable to profile morphological filters with a structuring
element in terms of a circular disc
Note 1 to entry: See, for example, ISO 16610-41 and ISO 16610-49.
3.2.1.3
horizontal line length
particular type of nesting index (3.2.1) applicable to profile morphological filters with a structuring
element in terms of a horizontal line
Note 1 to entry: See, for example, ISO 16610-41 and ISO 16610-49.
3.2.1.4
sphere radius
particular type of nesting index (3.2.1) applicable to areal morphological filters with a structuring
element in terms of a sphere radius
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ISO 16610-1:2015(E)
3.2.1.5
circular disc radius
particular type of nesting index (3.2.1) applicable to areal morphological filters with a structuring
element in terms of a circular disc
Note 1 to entry: See, for example, ISO 16610-40 and ISO 16610-41.
3.2.1.6
Wolf pruning height
particular type of nesting index (3.2.1) applicable to areal segmentation filters used to discriminate
between significant and non-significant surface features
Note 1 to entry: See, for example, ISO 16610-85.
3.2.2
degree of freedom
primary mathematical model number of independent parameters required to fully describe a particular
primary mathematical model (3.2)
3.3
primary surface
PS
surface portion (3.1.1) obtained when the latter is represented as a specified primary mathematical
model (3.2) with specified nesting index (3.2.1)
3.3.1
primary profile
line resulting from the intersection between the primary surface (3.3) and an ideal plane
Note 1 to entry: The concept of profiles is under development and it is possible that the definition of primary
profile will be revised.
3.4
primary mapping
mapping indexed by the nesting index (3.2.1) used to identify a particular primary surface (3.3) with a
specified nesting index (3.2.1) in order to represent a surface portion (3.1.1) that satisfies the sieve and
projection criteria
Note 1 to entry: A primary mapping identifies surface portions which have “features” larger than a particular
nesting index.
3.4.1
sieve criterion
criterion where two primary mappings (3.4) applied one after another to a surface portion is entirely
equivalent to only applying one of these two primary mappings to the surface portion namely that
primary mapping with the highest nesting index (3.2.1)
3.4.2
projection criterion
criterion wherein a primary surface (3.3) with a specified nesting index (3.2.1) is mapped onto itself
using the primary mapping (3.4) with the same specified nesting index (3.2.1)
Note 1 to entry: This implies that if you apply the primary mapping twice with the same nesting index to a surface,
one obtains the same surface as if the primary mapping was applied only once. For example, applying a closing
filter with a circular structural element of a given radius twice to a profile results in the same filtered profile as if
the closing filter is only applied once.
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ISO 16610-1:2015(E)
3.4.3
basic scale
scale established when using a nesting index (3.2.1) assigned to an associated primary mapping (3.4) as
a numerical relational system
Note 1 to entry: An example is a basic scale based on sinewaves when using cut-off values associated with a
primary mapping derived from a truncated Fourier series.
Note 2 to entry: For a relational system to be stable, the set of entities with their relations have to form a partially
ordered set with a greatest element.
3.5
filtration
feature operation used to create a non-ideal feature from a non-ideal feature or to transform one
variation curve to another by reducing the level of information
Note 1 to entry: For the purposes of this series of International Standards, a filter is either a primary mapping or
can be constructed using a combination of primary mappings, e.g. the weighted mean of primary mappings, the
supremum of primary mappings, etc. For example, a Gaussian filter can be constructed from a weighted sum of
primary mappings derived from a truncated Fourier series.
[SOURCE: ISO 17450-1:2011, 3.4.1.3, modified — Note 1 to entry has been added.]
3.5.1
profile filter
operator consisting of a filtration (3.5) operation for use on a surface profile (3.1.2)
Note 1 to entry: Throughout this International Standard, the term “operator” is interpreted in its mathematical
context. When it is used in the context of ISO 17450-2:2012, the qualifier “specification” or “verification” is used
in front of the term “operator”.
3.5.2
areal filter
operator consisting of a filtration (3.5) operation for use on a surface portion (3.1.1)
3.6
outlier
local portion in a data set that is not representative or not typical for the partitioned integral feature
(3.1) and which is characterized by magnitude and scale
Note 1 to entry: Not all outliers can be determined using data alone, but only those that are physically inconsistent
with stylus tip geometry. It is sometimes possible to give a warning based on magnitude/scale criteria.
3.7
open profile
finite length surface profile (3.1.2) with two ends
Note 1 to entry: The surface profile does not intersect with itself.
3.8
closed profile
connected finite length surface profile (3.1.2) without ends
Note 1 to entry: The surface profile does not intersect with itself, i.e. it is a simple closed curve or Jordan curve.
3.9
robustness
insensitivity of the output data against specific phenomena in the input data
Note 1 to entry: Outliers, scratches, and steps are examples of specific phenomena. More details can be found in
ISO 16610-30.
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ISO 16610-1:2015(E)
3.10
filter equation
equation for the mathematical description of the filter
Note 1 to entry: Filter equations do not necessarily specify an algorithm for the numerical realization of the filter.
4 General discussion
4.1 General
Filtration is a way of separating features of interest from other features in the data.
EXAMPLE Sieving particles where soil particles are filtered into different sizes, depending on the size of the
sieve holes.
The nesting index is the size at which features are separated. In the above example, the nesting index
corresponds to the size of the holes in the sieve.
More precisely, filtration exists in the first place of defining a set of nested hierarchical representations
(similar to a set of Russian dolls), to be used to model the real surface, such that the further into the
nesting hierarchy, the smoother the model used to represent the surface. The nesting index is a number
that indicates the level of the hierarchy (nesting/smoothness) of the model, such that the higher the
value of the nesting index, the smoother the model used to represent the surface. By convention, as the
nesting index approaches zero, there exists a model that represents the real surface.
Secondly, a primary mapping is defined. The primary mapping is a method of choosing a particular
model with a specified nesting index and which satisfies certain properties to represent a real surface.
The primary mapping is a basic filter from which other filters can be constructed. Illustrative examples
are given in Annex A.
A toolbox of new and novel filter tools is recommended which includes mean line filters, morphological
filters, robust filters, and techniques that decompose surface texture into different scale components.
The filtration masterplan (see Annex B) shows the structure of the part number allocation for the
ISO 16610-series. The particular filter tool and its default value are provided in other ISO application
documents.
The advantages and disadvantages of different filter types are given in Annex C, concept diagrams for
the basic concepts of filtration are given in Annex D, and the relationship to the filtration matrix is given
in Annex E.
4.2 Primary mathematical models
The primary mathematical models have been developed to generalize the concept of wavelength band.
The aim of the nesting index is to generalize the concept of wavelength value.
Given a particular model within a set of nested models, higher nestings (with a smaller nesting index)
contain more surface information, whereas lower nestings (with a larger nesting index) contain less
surface information. By convention, as the nesting index approaches zero, there exists a primary
mathematical model that approximates the partitioned integral feature to within any given measure of
closeness (as defined by a suitable mathematical norm).
[35]
The sieve criterion is derived from Matheron’s size criterion and is a necessary condition for the
following reason; if a primary mapping is applied to a partitioned integral feature, any further primary
mapping with a larger nesting index is exactly equivalent to applying the second primary mapping
with the larger nesting index directly to the partitioned integral feature. In other words, for a primary
mapping with a specified nesting index, no information is lost concerning primary mappings of the
partitioned integral feature with a larger nesting index.
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ISO 16610-1:2015(E)
The projection criterion is necessary in order to ensure that the primary mapping is idempotent and
that the nesting index corresponds to Matheron’s definition of size. The projection criterion, together
with the sieve criterion, ensures that the nesting index assigned to a primary mapping is a basic scale.
Since the nesting index of the primary mathematical models corresponds to scale, the nesting index can
be used to define the generalized concept of wavelength.
5 Filter designations
Table 1 indicates the basic semantics in designating filters. Table 2, on the other hand, indicates the filter
designations.
Table 1 — Basic semantics in designating filters
Filter Type Category
L = Linear
A = Areal (3D) M = Morphological
R = Robust
F = Filter
L = Linear
P = Profile (2D) M = Morphological
R = Robust
Table 2 — Filter designations
Type Category Symbol Designation Name ISO document
G FALG Gaussian 16610-61
a
FAL S FALS Spline 16610-62
a
SW FALSW Spline Wavelet 16610-69
a
CB FAMCB Closing Ball 16610-81
a
CH FAMCH Closing Horizontal segment 16610-81
a
FA OB FAMOB Opening Ball 16610-81
FAM
a
OH FAMOH Opening Horizontal segment 16610-81
a
AB FAMAB Alternating series Ball 16610-89
a
AH FAMAH Alternating series Horizontal segment 16610-89
G FARG Gaussian 16610-71
FAR
a
S FARS Spline 16610-72
a
Planned.
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