F01 - Electronics

ABSTRACT
This specification covers the properties and requirements for round, copper-coated 42 % nickel-iron wire, commonly known as dumet, intended primarily for sealing to soft glass. The wires shall conform to requirements stated for chemical composition, oxide coatings, dimension, internal and surface workmanship, and storage characteristics. Materials shall also undergo tests for thermal expansion, color of coating, diameter, reducible oxides, copper analysis, and metallography.
SCOPE
1.1 This specification covers round, copper-coated 42 % nickel-iron wire, commonly known as dumet, intended primarily for sealing to soft glass.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers an iron-nickel-cobalt alloy for use in sealing to glass in electronic applications. The alloy shall conform to the chemical composition specified and shall be manufactured in the form of wire, rod, bar, strip, sheet, and tube, with each form available in the specified temper condition. For example, tubes shall be bright annealed and supplied in the annealed temper condition. Strip and sheet shall be of temper A, B, C, D, or E or in deep-drawing temper condition, while wire and rod shall be bright annealed and supplied in temper A condition unless specified otherwise. The material shall be smooth, uniform in cross section, composition, and temper, and free of scale, corrosion, cracks, seams, scratches, slivers, and other defects. Tests for hardness, tensile strength, thermal expansion, and transformation shall be performed and shall conform to the requirements specified.
SCOPE
1.1 This specification covers an iron-nickel-cobalt alloy, UNS K94610 containing nominally 29 % nickel, 17 % cobalt, and 53 % iron, in the forms of wire, rod, bar, strip, sheet, and tubing, intended primarily for sealing to glass in electronic applications.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following hazard caveat pertains only to the test method portion, Sections 13 and 14 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers iron-nickel-chromium alloy (UNS K94760) used primarily for glass-sealing applications in electronic devices. The chemical composition of the material shall conform to the requirements prescribed. Chemical analysis shall be made, when desired, in accordance with the prescribed requirements. The average linear coefficient of thermal expansion shall be within limits of the requirements specified. The material shall be commercially smooth, uniform in cross section, in composition, and in temper; it shall be free of scale, corrosion, cracks, seams, scratches, slivers, and other defects.
SCOPE
1.1 This specification covers two iron-nickel-chromium alloys (UNS K94760 and UNS K95150) used primarily for glass-sealing applications in electronic devices.  
1.2 The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers the requirements and corresponding test methods for two iron-nickel alloys and one iron-nickel-cobalt alloy, for low thermal expansion applications. The two iron-nickel alloys, which both contain nominally 36 % nickel and 64 % iron, are the conventional alloy designated as UNS No. K93603 and the free-machining alloy designated as UNS No. K93050. On the other hand, the iron-nickel-cobalt alloy contains nominally 32 % nickel, 5 % cobalt and 63 % iron, and is designated as UNS No. K93500. UNS No. K93603 and UNS No. K93500 shall be in the forms of wire, rod, bar, strip, sheet plate, and tubing, while UNS No. K93050 shall be for bar products only. When test, the alloys shall comply to specified requirements for chemical composition, surface finish, temper, grain size, hardness, tensile strength, thermal expansion, transformation, and dimensions.
SCOPE
1.1 This specification covers two iron-nickel alloys and one iron-nickel-cobalt alloy, for low thermal expansion applications. The two iron-nickel alloys, both containing nominally 36 % nickel and 64 % iron, with the conventional alloy designated by UNS No. K93603, and the free-machining alloy designated as UNS No. K93050. The iron-nickel-cobalt alloy, containing nominally 32 % nickel, 5 % cobalt and 63 % iron, is designated by UNS No. K93500. This specification defines the following product forms for UNS No. K93603 and UNS No. K93500: wire, rod, bar, strip, sheet plate, and tubing. The free-machining alloy, UNS No. K93050, is defined for bar products only. Unless otherwise indicated, all articles apply to all three alloys.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This pertains only to the test method section, Section 13. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers the property requirements and corresponding test methods for two iron-nickel-cobalt alloys in the forms of wire, rod, bar, strip, sheet, and tubing, intended primarily for brazed metal-to-ceramic seals with alumina ceramics, for vacuum electronic applications. The two alloys covered here are UNS K94630 that contains nominally 29 % nickel, 17 % cobalt, and 53 % iron, and UNS K94620 that contains nominally 27 % nickel, 25 % cobalt and 48 % iron. When tested, the alloys shall comply to specified requirements for chemical composition, surface finish, temper, grain size, tensile strength, hardness, inclusion content, thermal expansion, transformation, and dimensions.
SCOPE
1.1 This specification covers two iron-nickel-cobalt alloys, the former, (UNS No. K94630), containing nominally 29 % nickel, 17 % cobalt, and 53 % iron, the latter, (UNS No. K94620), nominally 27 % nickel, 25 % cobalt and 48 % iron, in the forms of wire, rod, bar, strip, sheet, and tubing, intended primarily for brazed metal-to-ceramic seals with alumina ceramics, for vacuum electronic applications. Unless otherwise indicated, all articles apply to both alloys.  
1.2 The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are provided for information only and are not considered standard.  
1.3 The following hazard caveat pertains only to the test method portion, Sections 14 and 16 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers round wires made from UNS N02211, UNS N10001, or N03300 nickel alloy or molybdenum, with diameters within a specified range, for winding electron tube grid laterals. The wires are classified into five classes based on tensile properties. All wires should conform to the required values of tensile strength, yield strength, working range, and elongation properties. The surface of each bare wire should be bright and free from cracks, slivers, fissures, lubricants, or other detrimental defects, while all platings should be free from bubbles, flakes, blisters, porosity, and plating salts. Wires should be spooled in one continuous length and in such a manner that it can be unwound under reasonable tension without binding or becoming distorted.
SCOPE
1.1 This specification covers round wire up to 0.006 in. (0.15 mm) in diameter for use as electron tube grid lateral winding wire.  
1.2 Five classes of wire are covered based on their tensile properties (see 5.2 and 5.3).  
1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers two types of molybdenum flattened wire for electron tubes. These types are UNS R03604 and UNS R03603. The material shall conform to the prescribed limits of chemical composition such as carbon, oxygen, nitrogen, hydrogen, aluminum, calcium, silicon, iron, tungsten, potassium, and tin contents. The material shall be tested for hardness, temper, bending, and delamination.
SCOPE
1.1 This specification covers two types of molybdenum flattened wire up to 0.050 in. (1.27 mm) thick and up to 0.375 in. (9.52 mm) wide, specifically for use in electron tubes. The two grades have UNS numbers R03604 and R03603.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following safety hazards caveat pertains only to the test method described in this specification (see 10.2). This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification deals with molybdenum wire and rod for electronic applications. The following grades of molybdenum wire and rod are covered in this specification: Grade 1—commercially pure molybdenum wire suitable for leads, hooks, supports, heaters, and metal-to-glass seals; Grade 2—commercially pure molybdenum wire suitable for mandrel either black or cleaned; and Grade 3—commercially pure molybdenum rod suitable for leads, hooks, supports, and metal-to-glass seals. Materials shall be tested and the individual grades shall conform to specified values of chemical composition, minimum tensile strength, elongation, ductility, surface finish, dimensional tolerances, and straightness.
SCOPE
1.1 This specification covers two grades of molybdenum wire less than 0.050 in. (1.27 mm) in diameter and one grade of molybdenum rod 1.00 in. (25.4 mm) or less in diameter as follows:  
1.1.1 Grade 1—Commercially pure molybdenum wire suitable for leads, hooks, supports, heaters, and metal-to-glass seals.  
1.1.2 Grade 2—Commercially pure molybdenum wire suitable for mandrel either black or cleaned.  
1.1.3 Grade 3—Commercially pure molybdenum rod suitable for leads, hooks, supports, and metal-to-glass seals.  
1.2 The term wire applies to all spooled or coiled material and 0.050 in. (1.3 mm) or less in diameter and to short cut lengths 0.020 in. (0.51 mm) or less in diameter.  
1.3 The term rod applies to all material over 0.020 in. (0.51 mm) in diameter, supplied in straight lengths.  
1.4 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This test method covers a determination of the sag properties of tungsten wire. The specimen of tungsten wire to be tested for sag shall have a clean, bright surface and should have the required length. With the aid of external heat, the test specimen shall be bent into a hairpin-shape until it reached the required distance between the ends. The formed test specimen shall be of sufficient length so that when clamped in the fixture, the exposed lengths measured from the top of the apex will be of required distance.
SCOPE
1.1 This test method covers a determination of the sag properties of tungsten wire 0.030 in. (0.76 mm) and over in diameter.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers three types of drawn pure and thoriated tungsten wire suitable for fabrication into parts for electron tubes, lamps, and other electron devices, and one type of rod for metal-to-glass sealing (grid wire is excepted): Type 1A, Type 1B, Type 2A, and Type 2B. Types 1A and 1B are designated as UNS R07005; Type 2A is designated as UNS R07911; and Type 2B is designated as UNS R07912. The wire and rod shall conform to the prescribed chemical requirements for thoria and tungsten and to the specified physical properties such as tensile strength, ductility, and surface defects. The weight/diameter conversion formulas are given. Wires shall be furnished in the following specified finishes: Finish 1, Finish 2, Finish 3, Finish 4, Finish 5, Finish 6, and Finish 7. The material shall be smooth, free of twists, bends, kinks, curls, and as free of dents, swaging marks, scratches, die marks, laps, seams, splits, slivers, inclusions, bumps, pits, grooves, cracks, and other physical defects Unless black finish is specified, all types of wire shall have a clean finish, free of graphite, grease, oil, and lubricants. Wire for hooks, supports, springs, anchors, and mesh shall have a bright smooth surface free of cracks holes, or craters. The requirements for straightness, and coiling and spooling are detailed as well. The following analysis and tests shall be performed: chemical analysis, tensile test, ductility test, visual inspection, dimensional measurements, and examination for surface flaws.
SCOPE
1.1 This specification covers three types of drawn wire suitable for fabrication into parts for electron tubes, lamps, and other devices; and one type of rod for metal-to-glass sealing (grid wire is excepted):  
1.1.1 Type 1A—Commercially pure nonsag wire (Note 2 and Note 3).  
1.1.2 Type 1B—Commercially pure rod suitable for metal-to-glass sealing.  
1.1.3 Type 2A—Thoriated filament wire containing 1 % thoria.  
1.1.4 Type 2B—Thoriated filament wire containing 2 % thoria.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 Types 1A and 1B are designated as UNS R07005. Type 2A is designated as UNS R07911. Type 2B is designated as UNS R07912.  
1.4 The following precautionary caveat pertains only to the Chemical Analysis, Section 12 of this specification: This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
Note 1: A dimensional measurement method for testing nonsag tungsten wire above 0.030 in. (0.76 mm) in diameter is provided in Test Method F269.
Note 2: Acceptance of nonsag wire characteristics for particular applications of size shall be by agreement between producer and consumer based on either a flashed microstructure as shown by photomicrographs, or on dimensional measurement limits determined in accordance with Test Method F269.  
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This test method establishes the apparatuses to be used, specimen preparation methods, and standard procedures for determining the presence of surface flaws in tungsten-seal rods and wires of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.
SCOPE
1.1 This test method covers the determination of the presence of surface flaws in tungsten-seal rod and wire of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers the characteristics and requirements for iron-nickel alloys intended primarily for sealing to glass in electronic applications. The alloys shall conform to chemical composition, surface finish, temper, grain size, and thermal expansion requirements as stated herein.
SCOPE
1.1 This specification covers iron-nickel alloys that are intended primarily for sealing to glass in electronic applications.  
Note 1: Some of these alloys may be used for sealing to ceramics, but this specification in its present form is not intended to cover material for metal-to-ceramic seals.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. The hazard statement pertains only to the test method sections, Sections 10 and 12.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers tungsten-rhenium alloy wire suitable for use in electron devices and lamps. The material is known as UNS R07031. This wire shall conform to the requirements as to chemical composition prescribed. The wire shall be furnished in the following finishes: Finish 1; Finish 2; Finish 3; Finish 4; and Finish 5. The following test methods shall be performed to conform with the specified requirements: chemical analysis; tensile strength; ductility; visual inspection; and dimensional measurements.
SCOPE
1.1 This specification covers tungsten-rhenium alloy wire suitable for use in electron devices and lamps. The material is known as UNS R07031.  
1.2 The term wire as used in this specification applies to all material 0.020 in. (0.51 mm) or less in diameter that is spooled or coiled.  
1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers round drawn/extruded gold wires for internal semiconductor device electrical connections. The wires are available in four classifications, namely: copper-modified wire, beryllium-modified wire, high-strength wire, and special purpose wire. Aptly sampled wires shall be examined by test methods suggested herein, and each class shall conform correspondingly to specified requirements for chemical composition, mechanical properties (breaking load and elongation), dimension (diameter and weight), and workmanship and finish. The wires shall also undergo wire curl, wire axial twist, and wire roundness tests.
SCOPE
1.1 This specification covers round drawn/extruded gold wire for internal semiconductor device electrical connections. Four classifications of wire are distinguished, (1) copper-modified wire, (2) beryllium-modified wire, (3) high-strength wire, and (4) special purpose wire.  
Note 1: Trace metallic elements have a significant effect upon the mechanical properties and thermal stability of high-purity gold wire. It is customary in manufacturing to add controlled amounts of selected impurities to gold to modify or stabilize bonding wire properties, or both. This practice is known variously as “modifying,” “stabilizing,” or “doping.” The first two wire classifications denoted in this specification refer to wire made with either of two particular modifiers, copper or beryllium, in general use. In the third and fourth wire classifications, “high-strength” and “special purpose” wire, the identity of modifying additives is not restricted.  
1.2 The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are provided for information only and are not considered standard.  
1.3 The following hazard caveat pertains only to the test method portion, Section 9, of this specification.  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers brazing filler metals for use in electron devices in a nonoxidizing atmosphere. Material covered by this specification consists of vacuum grade (Grades 1 and 2) brazing filler metals manufactured in the form of strip, wire, or preforms made by blanking the trip or bending the wire. Brazing filler metals in the form of powder are also available. Filler metals in wire form shall be in soft temper condition, most suitable for hand feeding or ring winding in mandrels, while those in strip form shall be in hard as-rolled temper condition to facilitate clean blanking of thin shims or preforms. The surface of the filler metal, whether strip, wire, or preform, shall be as smooth and free of dirt, oxide, pits, deep scratches, seams, slivers, stains, scale, blisters, edge cracks, trimming burrs, waves, wrinkles, and other defects as commercially possible. Melting test for cleanness and spatter shall be performed and shall conform to the requirements specified.
SCOPE
1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices in a nonoxidizing atmosphere (Note 1).  
1.2 These materials are available in strip or wire or preforms made by blanking the strip or bending the wire. Powders are also available.  
Note 1: Brazing filler metals for general applications are specified in AWS Specification A 5.8.  
1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers round drawn/extruded gold wires for internal semiconductor device electrical connections. The wires are available in four classifications, namely: copper-modified wire, beryllium-modified wire, high-strength wire, and special purpose wire. Aptly sampled wires shall be examined by test methods suggested herein, and each class shall conform correspondingly to specified requirements for chemical composition, mechanical properties (breaking load and elongation), dimension (diameter and weight), and workmanship and finish. The wires shall also undergo wire curl, wire axial twist, and wire roundness tests.
SCOPE
1.1 This specification covers round drawn/extruded gold wire for internal semiconductor device electrical connections. Four classifications of wire are distinguished, (1) copper-modified wire, (2) beryllium-modified wire, (3) high-strength wire, and (4) special purpose wire.  
Note 1: Trace metallic elements have a significant effect upon the mechanical properties and thermal stability of high-purity gold wire. It is customary in manufacturing to add controlled amounts of selected impurities to gold to modify or stabilize bonding wire properties, or both. This practice is known variously as “modifying,” “stabilizing,” or “doping.” The first two wire classifications denoted in this specification refer to wire made with either of two particular modifiers, copper or beryllium, in general use. In the third and fourth wire classifications, “high-strength” and “special purpose” wire, the identity of modifying additives is not restricted.  
1.2 The values stated in SI units shall be regarded as the standard.  
1.2.1 A mixed system of metric and inch-pound units is in widespread use for specifying semiconductor lead-bonding wire. SI-equivalent values of other commonly used units are denoted by parentheses in text and tables.  
1.3 The following hazard caveat pertains only to the test method portion, Section 9, of this specification. This standard does not purport to address all of the safety, health, and environmental concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers round drawn/extruded gold wires for internal semiconductor device electrical connections. The wires are available in four classifications, namely: copper-modified wire, beryllium-modified wire, high-strength wire, and special purpose wire. Aptly sampled wires shall be examined by test methods suggested herein, and each class shall conform correspondingly to specified requirements for chemical composition, mechanical properties (breaking load and elongation), dimension (diameter and weight), and workmanship and finish. The wires shall also undergo wire curl, wire axial twist, and wire roundness tests.
SCOPE
1.1 This specification covers round drawn/extruded gold wire for internal semiconductor device electrical connections. Four classifications of wire are distinguished, (1) copper-modified wire, (2) beryllium-modified wire, (3) high-strength wire, and (4) special purpose wire.  
Note 1: Trace metallic elements have a significant effect upon the mechanical properties and thermal stability of high-purity gold wire. It is customary in manufacturing to add controlled amounts of selected impurities to gold to modify or stabilize bonding wire properties, or both. This practice is known variously as “modifying,” “stabilizing,” or “doping.” The first two wire classifications denoted in this specification refer to wire made with either of two particular modifiers, copper or beryllium, in general use. In the third and fourth wire classifications, “high-strength” and “special purpose” wire, the identity of modifying additives is not restricted.  
1.2 The values stated in SI units shall be regarded as the standard.  
1.2.1 A mixed system of metric and inch-pound units is in widespread use for specifying semiconductor lead-bonding wire. SI-equivalent values of other commonly used units are denoted by parentheses in text and tables.  
1.3 The following hazard caveat pertains only to the test method portion, Section 9, of this specification.  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers an iron-nickel-cobalt alloy for use in sealing to glass in electronic applications. The alloy shall conform to the chemical composition specified and shall be manufactured in the form of wire, rod, bar, strip, sheet, and tube, with each form available in the specified temper condition. For example, tubes shall be bright annealed and supplied in the annealed temper condition. Strip and sheet shall be of temper A, B, C, D, or E or in deep-drawing temper condition, while wire and rod shall be bright annealed and supplied in temper A condition unless specified otherwise. The material shall be smooth, uniform in cross section, composition, and temper, and free of scale, corrosion, cracks, seams, scratches, slivers, and other defects. Tests for hardness, tensile strength, thermal expansion, and transformation shall be performed and shall conform to the requirements specified.
SCOPE
1.1 This specification covers an iron-nickel-cobalt alloy, UNS K94610 containing nominally 29 % nickel, 17 % cobalt, and 53 % iron, in the forms of wire, rod, bar, strip, sheet, and tubing, intended primarily for sealing to glass in electronic applications.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following hazard caveat pertains only to the test method portion, Sections 13 and 14 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

SCOPE
1.1 This specification and test method cover acceptance requirements for headers used in electron devices and describes procedures for determining conformance to these requirements.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following safety hazard caveat pertains only to the test method (Sections 7 – 13) described in this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
These test methods cover procedures for measuring the diameter or thickness of round and flat wire (ribbon) used in electronic devices and lamps. Anvils shall be used in determining the thickness. The flatness and parallelism of the wire shall be checked using a monochromatic light source, a small optical parallel, and a cylindrical master standard wire gage.
SIGNIFICANCE AND USE
3.1 The methods contained in this standard are intended primarily for referee use, for laboratory measuring, and for certifying size of standard samples used for checking other measuring equipment that may be agreed upon between the supplier and the purchaser.
SCOPE
1.1 These test methods cover procedures for measuring the diameter or thickness of round and flat wire (ribbon) 0.060 in. (1.52 mm) maximum used in electronic devices and lamps.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers the properties and requirements for round, copper-coated 42 % nickel-iron wire, commonly known as dumet, intended primarily for sealing to soft glass. The wires shall conform to requirements stated for chemical composition, oxide coatings, dimension, internal and surface workmanship, and storage characteristics. Materials shall also undergo tests for thermal expansion, color of coating, diameter, reducible oxides, copper analysis, and metallography.
SCOPE
1.1 This specification covers round, copper-coated 42 % nickel-iron wire, commonly known as dumet, intended primarily for sealing to soft glass.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ABSTRACT
This specification covers requirements for powdered refractory metal coatings produced with or without additives. These coatings are applied to ceramic bodies in order to join ceramic bodies to metals or to other metallized ceramics by means of brazing or soldering. Included in this specification are requirements for a secondary metallic layer which is usually applied over the refractory metal layer. Two levels of quality for uniformity of metallizing are discussed, Level A and Level B. These levels discuss conditions and requirements needed in order to accept the uniformity of metallizing. Thickness of metallizing shall be measured using a metallurgical microscope. A polished cross-section that is perpendicular to the metallized surfaced is measured. The particles in the metallized layer must be sintered in order to form a dense matrix when viewed in cross section at 400 times. This cross section will indicate the extent of threedimensional sintering. A torque peel test and a tension test shall be performed in order to determine the bond strength of brazed metallized ceramics. Vacuum tightness of the brazed metallized ceramics shall also be determined.
SCOPE
1.1 This specification covers requirements for powdered refractory metal coatings produced with or without additives. These coatings are applied to ceramic bodies in order to join ceramic bodies to metals or to other metallized ceramics by means of brazing or soldering. Included in this specification are requirements for a secondary metallic layer which is usually applied over the refractory metal layer.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

ABSTRACT
This specification covers iron-nickel-chromium alloy (UNS K94760) used primarily for glass-sealing applications in electronic devices. The chemical composition of the material shall conform to the requirements prescribed. Chemical analysis shall be made, when desired, in accordance with the prescribed requirements. The average linear coefficient of thermal expansion shall be within limits of the requirements specified. The material shall be commercially smooth, uniform in cross section, in composition, and in temper; it shall be free of scale, corrosion, cracks, seams, scratches, slivers, and other defects.
SCOPE
1.1 This specification covers two iron-nickel-chromium alloys (UNS K94760 and UNS K95150) used primarily for glass-sealing applications in electronic devices.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers aluminum oxide (alumina) powder in two classes of particle size, two chemical grades, and two levels of acidity. Aluminum oxide powder shall conform to the chemical composition requirements indicated in this specification. The alumina powder shall be tested for water-soluble content, particle size, and hydrogen-ion concentration according to the procedures in this specification.
SCOPE
1.1 This specification covers aluminum oxide (alumina) powder in two classes of particle size, two chemical grades, and two levels of acidity, for use as an insulating coating or as an ingredient of ceramic mixtures for components of electronic devices as follows:  
1.1.1 Particle Sizes:
1.1.1.1 Class A—Particle size No. 500 nominal mesh (nominal average particle size = 24.3 μm).
1.1.1.2 Class B—Particle size No. 900 nominal mesh (nominal average particle size = 1.7 μm).  
1.1.2 Chemical Grades—Grades 1 and 2 as specified under chemical requirements in Section 3.  
1.1.3 Acidity Levels: pH (acid) 4.5 to 6.5 and pH (neutral) 6.5 to 7.5.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 The following safety hazards caveat pertains only to the test methods in this specification.  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers the requirements and corresponding test methods for two iron-nickel alloys and one iron-nickel-cobalt alloy, for low thermal expansion applications. The two iron-nickel alloys, which both contain nominally 36 % nickel and 64 % iron, are the conventional alloy designated as UNS No. K93603 and the free-machining alloy designated as UNS No. K93050. On the other hand, the iron-nickel-cobalt alloy contains nominally 32 % nickel, 5 % cobalt and 63 % iron, and is designated as UNS No. K93500. UNS No. K93603 and UNS No. K93500 shall be in the forms of wire, rod, bar, strip, sheet plate, and tubing, while UNS No. K93050 shall be for bar products only. When test, the alloys shall comply to specified requirements for chemical composition, surface finish, temper, grain size, hardness, tensile strength, thermal expansion, transformation, and dimensions.
SCOPE
1.1 This specification covers two iron-nickel alloys and one iron-nickel-cobalt alloy, for low thermal expansion applications. The two iron-nickel alloys, both containing nominally 36 % nickel and 64 % iron, with the conventional alloy designated by UNS No. K93603, and the free-machining alloy designated as UNS No. K93050. The iron-nickel-cobalt alloy, containing nominally 32 % nickel, 5 % cobalt and 63 % iron, is designated by UNS No. K93500. This specification defines the following product forms for UNS No. K93603 and UNS No. K93500: wire, rod, bar, strip, sheet plate, and tubing. The free-machining alloy, UNS No. K93050, is defined for bar products only. Unless otherwise indicated, all articles apply to all three alloys.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This pertains only to the test method section, Section 13.  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This test method establishes the standard procedures for conducting tension and vacuum tests on metal-ceramic seals to determine the bond strength of brazed, metalized ceramics. This test method is, however, not to be considered as an absolute tension test for the ceramic. This method requires the use of appropriate testing machines and various types of gripping devices.
SIGNIFICANCE AND USE
4.1 This test method covers procedures for conducting tension and vacuum tests on metal-ceramic seals.  
4.2 This test method is not to be considered as an absolute tension test for the ceramic.  
4.3 This test method is suitable for quality control and research and development use.
SCOPE
1.1 This test method covers procedures for conducting tension and vacuum tests on metal-ceramic seals to determine the bond strength of brazed, metallized ceramics.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

SIGNIFICANCE AND USE
4.1 In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall coefficient, and Hall mobility is useful. Under certain conditions, as outlined in the Appendix, other useful quantities for materials specification, including the charge carrier density and the drift mobility, can be inferred.
SCOPE
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens. These test methods differ most substantially in their test specimen requirements.  
1.1.1 Test Method A, van der Pauw (1) 2—This test method requires a singly connected test specimen (without any isolated holes), homogeneous in thickness, but of  arbitrary shape. The contacts must be sufficiently small and located at the periphery of the specimen. The measurement is most easily interpreted for an isotropic semiconductor whose conduction is dominated by a single type of carrier.  
1.1.2 Test Method B, Parallelepiped or Bridge-Type—This test method requires a specimen homogeneous in thickness and of specified  shape. Contact requirements are specified for both the parallelepiped and bridge geometries. These test specimen geometries are desirable for anisotropic semiconductors for which the measured parameters depend on the direction of current flow. The test method is also most easily interpreted when conduction is dominated by a single type of carrier.  
1.2 These test methods do not provide procedures for shaping, cleaning, or contacting specimens; however, a procedure for verifying contact quality is given.  
Note 1: Practice F418 covers the preparation of gallium arsenide phosphide specimens.  
1.3 The method in Practice F418 does not provide an interpretation of the results in terms of basic semiconductor properties (for example, majority and minority carrier mobilities and densities). Some general guidance, applicable to certain semiconductors and temperature ranges, is provided in the Appendix. For the most part, however, the interpretation is left to the user.  
1.4 Interlaboratory tests of these test methods (Section 19) have been conducted only over a limited range of resistivities and for the semiconductors, germanium, silicon, and gallium arsenide. However, the method is applicable to other semiconductors provided suitable specimen preparation and contacting procedures are known. The resistivity range over which the method is applicable is limited by the test specimen geometry and instrumentation sensitivity.  
1.5 The values stated in acceptable metric units are to be regarded as the standard. The values given in parentheses are for information only. (See also 3.1.4.)  
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers the property requirements and corresponding test methods for two iron-nickel-cobalt alloys in the forms of wire, rod, bar, strip, sheet, and tubing, intended primarily for brazed metal-to-ceramic seals with alumina ceramics, for vacuum electronic applications. The two alloys covered here are UNS K94630 that contains nominally 29 % nickel, 17 % cobalt, and 53 % iron, and UNS K94620 that contains nominally 27 % nickel, 25 % cobalt and 48 % iron. When tested, the alloys shall comply to specified requirements for chemical composition, surface finish, temper, grain size, tensile strength, hardness, inclusion content, thermal expansion, transformation, and dimensions.
SCOPE
1.1 This specification covers two iron-nickel-cobalt alloys, the former, (UNS No. K94630), containing nominally 29 % nickel, 17 % cobalt, and 53 % iron, the latter, (UNS No. K94620), nominally 27 % nickel, 25 % cobalt and 48 % iron, in the forms of wire, rod, bar, strip, sheet, and tubing, intended primarily for brazed metal-to-ceramic seals with alumina ceramics, for vacuum electronic applications. Unless otherwise indicated, all articles apply to both alloys.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following hazard caveat pertains only to the test method portion, Sections 14 and 16 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers electronic grade alloys of copper and nickel in wrought forms suitable for external and internal use in electron devices. The alloy shall be free from directional properties and shall be handled in such a manner that oxide contamination is minimized. The material shall conform to the chemical composition requirements which include nickel, cobalt, iron, zinc, manganese, lead, carbon, silicon, sulfur, aluminum, phosphorus, and copper contents. Grain size, mechanical properties, and magnetic permeability shall conform to the requirements of this specification. The alloys shall be tested for macroscopical and microscopical examinations. Packaging and marking shall be in accordance to this specification.
SCOPE
1.1 This specification covers alloys of copper and nickel in a variety of wrought shapes suitable for external and internal use in electron devices.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 The following safety hazards caveat applies to Test Methods Section 8 only:  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers two chromium-iron alloys, one is UNS K91800 with nominally 18% chromium, balance iron, and the other is UNS K92801 with nominally 28% chromium, both in strip, bar, wire, and rod forms intended primarily for sealing to glass in electronic applications. The alloys are classified by nominal chemical composition, specifically by chromium content, in two types: Type I (UNS K91800) and Type II (UNS K92801). The materials shall show no evidence of transformation to martensite. For Type I alloy, the austenite formed during heat treating will transform to martensite at or above room temperature. The presence of austenite, as may be noted in Type II alloy, is acceptable if the thermal expansion requirement is met. Different tests shall be performed in order to determine the following properties of the alloys: thermal expansion, Rockwell hardness, and tensile strength.
SCOPE
1.1 This specification covers two chromium-iron alloys, the former, (UNS K91800), nominally 18 % chromium, balance iron, the latter, (UNS K92801), nominally 28 % chromium, in strip, bar, wire, and rod forms intended primarily for sealing to glass in electronic applications.
Note 1: UNS K92801 should only be considered for use at service temperatures below 300°C. The alloy is prone to sigma phase formation at temperatures close to 620°C, and exhibits brittle mechanical behavior after prolonged exposures at temperatures close to 475°C.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following hazard caveat pertains only to the test method portion, Sections 16 and 17, of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers the special requirements for a metal strip used in the fabrication of integrated-circuit lead frames by stamping or photochemical milling. The metal strip shall be manufactured from copper and copper alloys, ferrous alloys containing nickel, cobalt, or chromium, nickel and nickel alloys, or other metallic materials and shall conform to the chemical, physical, and mechanical property requirements specified, including the limitation on the severity and number of inclusions, the surface finish, and the coil size. Tests for straightness, flatness, coil set, and grain size shall be performed and shall conform to the requirements specified.
SCOPE
1.1 This specification covers the special requirements for metal strip to be used to fabricate integrated-circuit lead frames by stamping or photochemical milling.  
1.2 The metals that are applicable to these parts include copper and copper alloys, ferrous alloys usually containing nickel or cobalt or chromium, nickel and nickel alloys, and other metallic materials.  
1.3 The general chemical, physical, and mechanical property requirements of these materials are covered by other ASTM specifications (specifically Specifications B103/B103M, B122/B122M, B152/B152M, B162, B465, F15, F30, F31, F49 and F68), and these should be consulted for properties and tempers that are different for the different metals. For metals for which no ASTM specification is available, other specifications should be adopted by agreement of the parties concerned.  
1.4 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

SIGNIFICANCE AND USE
3.1 Membrane switch keys are subjected to repeated actuations, usually by a human finger. This can transfer body oil, hand creams, automotive fluids and so forth. Materials are often subjected to other conditions (for example, wiping, cleaning, rubbing) during handling, end-use, shipment, or storage that may cause abrasion damage. The result may be a significant removal of the coatings, text, or decorative inks.  
3.2 This test method is applicable to a wide range of materials. The main criterion is that the abrasion process produces visible wear or breakthrough of the surface being tested.  
3.3 The amount of abrasion damage to a surface is dependent on numerous variables. This test method provides a way of comparing relative abrasion resistance and the effect of chemicals on inks, coatings, and substrates. In no way do the results provide a correlation value of the number of human finger touches before coating failure. It only provides a means to compare results of tests performed using the same equipment, abrasive materials and loading conditions.  
3.4 The test method can be used for quality control purposes, as a research and development tool, to evaluate material combinations for a given application, or for the comparison of materials with relatively similar properties and the effect of chemicals on the abrasion resistance.
SCOPE
1.1 This test method describes the procedure for subjecting inks or coatings on membrane switches to an abrasive medium, with or without the application of chemicals, at a specified force.  
1.2 Within certain limitations, as described in this standard, this test method is applicable for materials including, but not limited to: printed or coated polyester, polycarbonate, and silicone rubber. The samples can be either flat or contoured.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This test method establishes the standard procedures and calculations used (including precision and biases) for determining, to an accuracy of 1.0 %, the density of fine wires and ribbon wires that are used in electronic devices. This test method requires the use of the following apparatuses: chemical balance, micrometer, standard volume cylinder, thermometer, vacuum pump and desiccator, and hook and cradle suspended by a fine wire.
SCOPE
1.1 This test method covers the determination of, to an accuracy of 1.0 %, the density of fine wires ranging from 0.25 to 0.02 mm in diameter, or ribbons of similar thicknesses, for electronic devices.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard statements are given in Section 4.

ABSTRACT
This specification covers round wires made from UNS N02211, UNS N10001, or N03300 nickel alloy or molybdenum, with diameters within a specified range, for winding electron tube grid laterals. The wires are classified into five classes based on tensile properties. All wires should conform to the required values of tensile strength, yield strength, working range, and elongation properties. The surface of each bare wire should be bright and free from cracks, slivers, fissures, lubricants, or other detrimental defects, while all platings should be free from bubbles, flakes, blisters, porosity, and plating salts. Wires should be spooled in one continuous length and in such a manner that it can be unwound under reasonable tension without binding or becoming distorted.
SCOPE
1.1 This specification covers round wire up to 0.006 in. (0.15 mm) in diameter for use as electron tube grid lateral winding wire.  
1.2 Five classes of wire are covered based on their tensile properties (see 5.2 and 5.3).  
1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This test method establishes the apparatuses required, specimen preparation steps, and standard procedures and calculations involved in the measurement of the average diameter of fine wires by means of weighing a known length. This applies particularly to wires of specified sizes used in electron devices and lamps.
SCOPE
1.1 This test method covers the measurement of the average diameter of fine wire by weighing a known length; it applies particularly to sizes up to 0.13 mm used in electron devices and lamps.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers round drawn/extruded gold wires for internal semiconductor device electrical connections. The wires are available in four classifications, namely: copper-modified wire, beryllium-modified wire, high-strength wire, and special purpose wire. Aptly sampled wires shall be examined by test methods suggested herein, and each class shall conform correspondingly to specified requirements for chemical composition, mechanical properties (breaking load and elongation), dimension (diameter and weight), and workmanship and finish. The wires shall also undergo wire curl, wire axial twist, and wire roundness tests.
SCOPE
1.1 This specification covers round drawn/extruded gold wire for internal semiconductor device electrical connections. Four classifications of wire are distinguished, (1) copper-modified wire, (2) beryllium-modified wire, ( 3) high-strength wire, and (4) special purpose wire. Note 1Trace metallic elements have a significant effect upon the mechanical properties and thermal stability of high-purity gold wire. It is customary in manufacturing to add controlled amounts of selected impurities to gold to modify or stabilize bonding wire properties or both. This practice is known variously as "modifying," "stabilizing," or "doping." The first two wire classifications denoted in this specification refer to wire made with either of two particular modifiers, copper or beryllium, in general use. In the third and fourth wire classifications, "high-strength" and "special purpose" wire, the identity of modifying additives is not restricted.
1.2 The values stated in SI units shall be regarded as the standard.
1.2.1 A mixed system of metric and inch-pound units is in widespread use for specifying semiconductor lead-bonding wire. SI-equivalent values of other commonly used units are denoted by parentheses in text and tables.
The following hazard caveat pertains only to the test method portion, Section , of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
WITHDRAWN RATIONALE
This specification covers round drawn/extruded gold wire for internal semiconductor device electrical connections.
Formerly under the jurisdiction of Committee F01 on Electronics, this specification was withdrawn in January 2015 in accordance with section 10.6.3 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

ABSTRACT
This specification covers two types of molybdenum flattened wire for electron tubes. These types are UNS R03604 and UNS R03603. The material shall conform to the prescribed limits of chemical composition such as carbon, oxygen, nitrogen, hydrogen, aluminum, calcium, silicon, iron, tungsten, potassium, and tin contents. The material shall be tested for hardness, temper, bending, and delamination.
SCOPE
1.1 This specification covers two types of molybdenum flattened wire up to 0.050 in. (1.27 mm) thick and up to 0.375 in. (9.52 mm) wide, specifically for use in electron tubes. The two grades have UNS numbers R03604 and R03603.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following safety hazards caveat pertains only to the test method described in this specification (see 10.2). This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification deals with molybdenum wire and rod for electronic applications. The following grades of molybdenum wire and rod are covered in this specification: Grade 1—commercially pure molybdenum wire suitable for leads, hooks, supports, heaters, and metal-to-glass seals; Grade 2—commercially pure molybdenum wire suitable for mandrel either black or cleaned; and Grade 3—commercially pure molybdenum rod suitable for leads, hooks, supports, and metal-to-glass seals. Materials shall be tested and the individual grades shall conform to specified values of chemical composition, minimum tensile strength, elongation, ductility, surface finish, dimensional tolerances, and straightness.
SCOPE
1.1 This specification covers two grades of molybdenum wire less than 0.050 in. (1.27 mm) in diameter and one grade of molybdenum rod 1.00 in. (25.4 mm) or less in diameter as follows:  
1.1.1 Grade 1—Commercially pure molybdenum wire suitable for leads, hooks, supports, heaters, and metal-to-glass seals.  
1.1.2 Grade 2—Commercially pure molybdenum wire suitable for mandrel either black or cleaned.  
1.1.3 Grade 3—Commercially pure molybdenum rod suitable for leads, hooks, supports, and metal-to-glass seals.  
1.2 The term wire applies to all spooled or coiled material and 0.050 in. (1.3 mm) or less in diameter and to short cut lengths 0.020 in. (0.51 mm) or less in diameter.  
1.3 The term rod applies to all material over 0.020 in. (0.51 mm) in diameter, supplied in straight lengths.  
1.4 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers three types of drawn pure and thoriated tungsten wire suitable for fabrication into parts for electron tubes, lamps, and other electron devices, and one type of rod for metal-to-glass sealing (grid wire is excepted): Type 1A, Type 1B, Type 2A, and Type 2B. Types 1A and 1B are designated as UNS R07005; Type 2A is designated as UNS R07911; and Type 2B is designated as UNS R07912. The wire and rod shall conform to the prescribed chemical requirements for thoria and tungsten and to the specified physical properties such as tensile strength, ductility, and surface defects. The weight/diameter conversion formulas are given. Wires shall be furnished in the following specified finishes: Finish 1, Finish 2, Finish 3, Finish 4, Finish 5, Finish 6, and Finish 7. The material shall be smooth, free of twists, bends, kinks, curls, and as free of dents, swaging marks, scratches, die marks, laps, seams, splits, slivers, inclusions, bumps, pits, grooves, cracks, and other physical defects Unless black finish is specified, all types of wire shall have a clean finish, free of graphite, grease, oil, and lubricants. Wire for hooks, supports, springs, anchors, and mesh shall have a bright smooth surface free of cracks holes, or craters. The requirements for straightness, and coiling and spooling are detailed as well. The following analysis and tests shall be performed: chemical analysis, tensile test, ductility test, visual inspection, dimensional measurements, and examination for surface flaws.
SCOPE
1.1 This specification covers three types of drawn wire suitable for fabrication into parts for electron tubes, lamps, and other devices; and one type of rod for metal-to-glass sealing (grid wire is excepted):  
1.1.1 Type 1A—Commercially pure nonsag wire (Note 2 and Note 3).  
1.1.2 Type 1B—Commercially pure rod suitable for metal-to-glass sealing.  
1.1.3 Type 2A—Thoriated filament wire containing 1 % thoria.  
1.1.4 Type 2B—Thoriated filament wire containing 2 % thoria.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 Types 1A and 1B are designated as UNS R07005. Type 2A is designated as UNS R07911. Type 2B is designated as UNS R07912.  
1.4 The following precautionary caveat pertains only to the Chemical Analysis, Section 12 of this specification: This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
Note 1: A dimensional measurement method for testing nonsag tungsten wire above 0.030 in. (0.76 mm) in diameter is provided in Test Method F269.
Note 2: Acceptance of nonsag wire characteristics for particular applications of size shall be by agreement between producer and consumer based on either a flashed microstructure as shown by photomicrographs, or on dimensional measurement limits determined in accordance with Test Method F269.

ABSTRACT
This test method covers a determination of the sag properties of tungsten wire. The specimen of tungsten wire to be tested for sag shall have a clean, bright surface and should have the required length. With the aid of external heat, the test specimen shall be bent into a hairpin-shape until it reached the required distance between the ends. The formed test specimen shall be of sufficient length so that when clamped in the fixture, the exposed lengths measured from the top of the apex will be of required distance.
SCOPE
1.1 This test method covers a determination of the sag properties of tungsten wire 0.030 in. (0.76 mm) and over in diameter.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers tungsten-rhenium alloy wire suitable for use in electron devices and lamps. The material is known as UNS R07031. This wire shall conform to the requirements as to chemical composition prescribed. The wire shall be furnished in the following finishes: Finish 1; Finish 2; Finish 3; Finish 4; and Finish 5. The following test methods shall be performed to conform with the specified requirements: chemical analysis; tensile strength; ductility; visual inspection; and dimensional measurements.
SCOPE
1.1 This specification covers tungsten-rhenium alloy wire suitable for use in electron devices and lamps. The material is known as UNS R07031.  
1.2 The term wire as used in this specification applies to all material 0.020 in. (0.51 mm) or less in diameter that is spooled or coiled.  
1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This test method establishes the apparatuses to be used, specimen preparation methods, and standard procedures for determining the presence of surface flaws in tungsten-seal rods and wires of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.
SCOPE
1.1 This test method covers the determination of the presence of surface flaws in tungsten-seal rod and wire of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This practice covers the rules for naming one, two, or three-piece round wire leads used as conductors through glass seals in electron tubes, excluding stranded leads and leads for semiconductors. Each portion of designation should be separated by a dash (-). Materials for a component lead are generally designated using the chemical symbols. Claddings or platings are represented by numerical suffixes at the end of the material designation preceded by "C" (coating). For alloys that are unspecified, a numerical value between chemical symbols indicates the percent content of the material preceding the value. Descriptive suffixes are used to specify annealing conditions.
SCOPE
1.1 This practice covers rules for designating one, two, or three-piece round wire leads used as conductors through glass seals in electron tubes. Stranded leads and leads for semiconductors are excluded.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This specification covers an iron-nickel-cobalt alloy for use in sealing to glass in electronic applications. The alloy shall conform to the chemical composition specified and shall be manufactured in the form of wire, rod, bar, strip, sheet, and tube, with each form available in the specified temper condition. For example, tubes shall be bright annealed and supplied in the annealed temper condition. Strip and sheet shall be of temper A, B, C, D, or E or in deep-drawing temper condition, while wire and rod shall be bright annealed and supplied in temper A condition unless specified otherwise. The material shall be smooth, uniform in cross section, composition, and temper, and free of scale, corrosion, cracks, seams, scratches, slivers, and other defects. Tests for hardness, tensile strength, thermal expansion, and transformation shall be performed and shall conform to the requirements specified.
SCOPE
1.1 This specification covers an iron-nickel-cobalt alloy, UNS K94610 containing nominally 29 % nickel, 17 % cobalt, and 53 % iron, in the forms of wire, rod, bar, strip, sheet, and tubing, intended primarily for sealing to glass in electronic applications.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 The following hazard caveat pertains only to the test method portion, Sections 13 and 14 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

SIGNIFICANCE AND USE
3.1 The different combinations of SMD types, attachment medias, circuit substrates, plating options, and process variation can account for significant variation in test outcome.  
3.2 The SMD shear strength test is useful to manufacturers and users for determining the bond strength of the component to the membrane switch circuit.
SCOPE
1.1 This test method covers the determination of the shear integrity of materials and procedures used to attach surface mount devices (SMD) to a membrane switch circuit.  
1.2 This test method is typically used to indicate the sufficient cure of conductive adhesive or underfill, or both. In general, this test method should be used prior to encapsulant. This test may also be used to demonstrate the Shear Force with encapsulation.  
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
This practice covers the definition and interpretation of the commonly used thermionic constants of electron emitters with appended standard methods of measurement. Cathode materials shall alternatively be evaluated by relating the temperature-limited emission to fundamental properties of the emitter, particularly the work function. Comparisons are made between emitters using the thermionic constants such as the work function, emission constant, and the temperature dependence of the work function. These thermionic constants are geometry and field effects-independent, but exhibit variations under different conditions. The pertinent equations the Richardson-Dushman equation of electron emission to evaluate the effective work function, which in turn, shall be used to find the Richardson work function and the true work function. Sample computations are also detailed.
SCOPE
1.1 This practice covers the definition and interpretation of the commonly used thermionic constants of electron emitters (1, 2, 3),2 with appended standard methods of measurement.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ABSTRACT
These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps. Chemical analysis of the material shall be made in accordance with the requirements prescribed. The procedures in determining the out-of-roundness, edgewise curvature of ribbon, and straightness of straightened round wire are presented in details. Tension test and electrical resistivity test shall be performed to meet the requirements prescribed.
SCOPE
1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps.  
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

SIGNIFICANCE AND USE
5.1 Failure of microelectronic devices is often due to failure of an interconnection bond. A common type of interconnection bond is a wire bond. These methods can assist in maintaining control of the process of making wire bonds. They can be used to distinguish between weak, nonadherent wire bonds and acceptably strong wire bonds. The methods are destructive.  
5.2 These test methods are appropriate for on-line use for process control, for purchase specifications, and for research in support of improved yield or reliability. The referee method should be used for quantitative comparison of pull strengths of wire bonds.
SCOPE
1.1 These test methods cover tests to determine the pull strength of a series of wire bonds. Instructions are provided to modify the methods for use as a referee method. The methods can be used for wire bonds made with wire having a diameter of from 0.0007 to 0.003 in. (18 to 76 μm). Note 1—Common usage at the present time considers the term “wire bond” to include the entire interconnection: both welds and the intervening wire span.  
1.2 These test methods can be used only when the loop height of the wire bond is large enough to allow a suitable hook for pulling (see Fig. 1) to be placed under the wire.
FIG. 1 Suggested Configuration for a Pulling Hook  
1.3 The precision of these methods has been evaluated for aluminum ultra-sonic wedge bonds; however, these methods can be used for gold and copper wedge or ball bonds.2  
1.4 These methods are destructive. They are appropriate for use in process development or, with a proper sampling plan, for process control or quality assurance.  
1.5 A nondestructive procedure is described in Practice F458.  
1.6 The values in SI units are to be regarded as standard.  
1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

SIGNIFICANCE AND USE
5.1 Ingression protection classifications are widely used by manufacturers for specifying the level of protection offered by enclosures.  
5.2 An example of such a classification scheme is IEC 60529. Membrane switch manufacturers are often asked to meet these standards, however the test methods specified within these standards do not address considerations specific to membrane switches.  
5.3 The MSIP classification system considers the membrane switch separately from the testing and IP codes used for classifying the enclosure when subject to similar test conditions.  
5.4 Ingression testing can be useful to identify design deficiencies.
SCOPE
1.1 This guide establishes a classification system and references test methods for verifying the degrees of:  
1.1.1 The ingress of dust into the internal layers of a membrane switch.  
1.1.2 Ingress of water into the internal layers of a membrane switch.  
1.1.3 Where external test methods are referenced, this guide specifies the special conditions that shall be considered in applying these tests to membrane switches and how the results are interpreted.  
1.2 This guide references test methods that can be used to establish the ingress classification of a membrane switch.  
1.3 This guide utilizes the test methods and reporting structure of IEC 60529 – (Degrees of Protection Provided by Enclosures) modified for membrane switches.

ABSTRACT
This specification covers aluminum-1 % silicon alloy wire for semiconductor devices lead-bonding and is limited to wire of diameter up to and including 0.0020 in. (0.051 mm). The wire surface shall be clean and free of finger oils, lubricant residues, stains, and particulate matter. The elongation and breaking load shall be tested to meet the requirements prescribed. The methods in determining the wire dimensions are presented in details. Verify that the chemical requirements are satisfied by means of spectrographic analysis.
SCOPE
1.1 This specification covers aluminum–1 % silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 μm (0.003 in.). For diameters larger than 76 μm (0.003 in.), the specifications are to be agreed upon between the purchaser and the supplier.  
1.2 The values stated in SI units are to be regarded as the standard, regardless of whether they appear first or second in a table. Values given in parentheses are for information only.