ASTM D2520-21

Standard Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials at Microwave Frequencies and Temperatures to 1650 °C

SIGNIFICANCE AND USE
4.1 Design calculations for such components as transmission lines, antennas, radomes, resonators, phase shifters, etc., require knowledge of values of complex permittivity at operating frequencies. The related microwave measurements substitute distributed field techniques for low-frequency lumped-circuit impedance techniques.  
4.2 Further information on the significance of permittivity is contained in Test Methods D150.  
4.3 These test methods are useful for specification acceptance, service evaluation, manufacturing control, and research and development of ceramics, glasses, and organic dielectric materials.
SCOPE
1.1 These test methods cover the determination of relative (Note 1) complex permittivity (dielectric constant and dissipation factor) of nonmagnetic solid dielectric materials.  
Note 1: The word “relative” is often omitted.  
1.1.1 Test Method A is for specimens precisely formed to the inside dimension of a waveguide.  
1.1.2 Test Method B is for specimens of specified geometry that occupy a very small portion of the space inside a resonant cavity.  
1.1.3 Test Method C uses a resonant cavity with fewer restrictions on specimen size, geometry, and placement than Test Methods A and B.  
1.2 Although these test methods are used over the microwave frequency spectrum from around 0.5 to 50.0 GHz, each octave increase usually requires a different generator and a smaller test waveguide or resonant cavity.  
1.3 Tests at elevated temperatures are made using special high-temperature waveguide and resonant cavities.  
1.4 The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are inch-pound units that are provided for information only and are not considered standard.  
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

General Information

• Status: Published
• Publication Date: 31-Mar-2021
• ICS: 29.035.01 - Insulating materials in general
• Technical Committee: D09 - Electrical and Electronic Insulating Materials
• Drafting Committee: D09.12 - Electrical Tests

Standards Content (Sample)

This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: D2520 − 21
Standard Test Methods for
Complex Permittivity (Dielectric Constant) of Solid Electrical
Insulating Materials at Microwave Frequencies and
1
Temperatures to 1650 °C
This standard is issued under the fixed designation D2520; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope mendations issued by the World Trade Organization Technical
Barriers to Trade (TBT) Committee.
1.1 These test methods cover the determination of relative
(Note 1) complex permittivity (dielectric constant and dissipa-
2. Referenced Documents
tion factor) of nonmagnetic solid dielectric materials.
2
2.1 ASTM Standards:
NOTE 1—The word “relative” is often omitted.
A893/A893MTest Method for Complex Dielectric Constant
1.1.1 TestMethodAisforspecimenspreciselyformedtothe
of Nonmetallic Magnetic Materials at Microwave Fre-
inside dimension of a waveguide.
quencies
1.1.2 Test Method B is for specimens of specified geometry
D150Test Methods forAC Loss Characteristics and Permit-
that occupy a very small portion of the space inside a resonant
tivity (Dielectric Constant) of Solid Electrical Insulation
cavity.
D1711Terminology Relating to Electrical Insulation
1.1.3 Test Method C uses a resonant cavity with fewer
restrictions on specimen size, geometry, and placement than
3. Terminology
Test Methods A and B.
3.1 Definitions:
1.2 Although these test methods are used over the micro-
3.1.1 For definitions of terms used in this test method, refer
wave frequency spectrum from around 0.5 to 50.0 GHz, each
to Terminology D1711.
octave increase usually requires a different generator and a
3.2 Definitions of Terms Specific to This Standard:
smaller test waveguide or resonant cavity.
3.2.1 neper, n—a division of the logarithmic scale wherein
the number of nepers is equal to the natural logarithm of the
1.3 Tests at elevated temperatures are made using special
scalar ratio of either two voltages or two currents.
high-temperature waveguide and resonant cavities.
NOTE 2—The neper is a dimensionless unit. 1 neper equals 0.8686 bel.
1.4 The values stated in SI units are to be regarded as
With I and I denoting the scalar values of two currents and n being the
standard. The values given in parentheses after SI units are x y
number of nepers denoted by their scalar ratio, then:
inch-poundunitsthatareprovidedforinformationonlyandare
not considered standard.
n 5ln ~l ⁄ l !
e x y
1.5 This standard does not purport to address all of the
where:
safety concerns, if any, associated with its use. It is the
ln = logarithm to base e.
e
responsibility of the user of this standard to establish appro-
3.3 Definitions of Terms Specific to Test Methods B and C:
priate safety, health, and environmental practices and deter-
3.3.1 electrical skin depth, n—the effective depth of field
mine the applicability of regulatory limitations prior to use.
penetration at high frequencies where electric currents are
1.6 This international standard was developed in accor-
confinedtoathinlayeratthesurfaceofconductorsduetobasic
dance with internationally recognized principles on standard-
electromagnetic phenomena.
ization established in the Decision on Principles for the
3.3.1.1 Discussion—The skin depth for copper and silver is
Development of International Standards, Guides and Recom-
approximately0.002mmat1GHzanddecreasesbyafactorof
10 at 100GHz.
1
These test methods are under the jurisdiction of ASTM Committee D09 on
Electrical and Electronic Insulating Materials and is the direct responsibility of
2
Subcommittee D09.12 on Electrical Tests. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved April 1, 2021. Published June 2021. Originally contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
approved in 1966. Last previous edition approved in 2013 as D2520–13. DOI: Standards volume information, refer to the standard’s Document Summary page on
10.1520/D2520-21. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
D2520 − 21
3.3.2 high Q cavity, n—a rectangular cavity having a Q able. Transmission lines capable of withstanding temperatures
greater than 2000. up to 1650°C in an oxidizing atmosphere can be used to hold
3.3.2.1 Discussion—Q defines the bandwidth (or sharpness) the specimen.
of the resonance curve of
...

This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: D2520 − 13 D2520 − 21
Standard Test Methods for
Complex Permittivity (Dielectric Constant) of Solid Electrical
Insulating Materials at Microwave Frequencies and
1
Temperatures to 1650°C1650 °C
This standard is issued under the fixed designation D2520; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 These test methods cover the determination of relative (Note 1) complex permittivity (dielectric constant and dissipation
factor) of nonmagnetic solid dielectric materials.
NOTE 1—The word “relative” is often omitted.
1.1.1 Test Method A is for specimens precisely formed to the inside dimension of a waveguide.
1.1.2 Test Method B is for specimens of specified geometry that occupy a very small portion of the space inside a resonant cavity.
1.1.3 Test Method C uses a resonant cavity with fewer restrictions on specimen size, geometry, and placement than Test Methods
A and B.
1.2 Although these test methods are used over the microwave frequency spectrum from around 0.5 to 50.0 GHz, each octave
increase usually requires a different generator and a smaller test waveguide or resonant cavity.
1.3 Tests at elevated temperatures are made using special high-temperature waveguide and resonant cavities.
1.4 The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are inch-pound units
that are provided for information only and are not considered standard.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety safety, health, and healthenvironmental practices and determine the
applicability of regulatory limitations prior to use.
1.6 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
1
These test methods are under the jurisdiction of ASTM Committee D09 on Electrical and Electronic Insulating Materials and is the direct responsibility of Subcommittee
D09.12 on Electrical Tests.
Current edition approved May 1, 2013April 1, 2021. Published August 2013June 2021. Originally approved in 1966. Last previous edition approved in 20012013 as
D2520D2520 – 13.–01 which was with drawn in 2010 and reinstated in May 2013. DOI: 10.1520/D2520-13 DOI: 10.1520/D2520-21.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
D2520 − 21
2. Referenced Documents
2
2.1 ASTM Standards:
A893/A893M Test Method for Complex Dielectric Constant of Nonmetallic Magnetic Materials at Microwave Frequencies
D150 Test Methods for AC Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical Insulation
D1711 Terminology Relating to Electrical Insulation
3. Terminology
3.1 Definitions of Terms. For definitions of terms used in this test method, refer to Terminology D1711.
3.1 Definitions:
3.1.1 For definitions of terms used in this test method, refer to Terminology D1711.
3.2 Definitions of Terms Specific to This Standard:
3.2.1 neper, n—a division of the logarithmic scale wherein the number of nepers is equal to the natural logarithm of the scalar ratio
of either two voltages or two currents.
NOTE 2—The neper is a dimensionless unit. 1 neper equals 0.8686 bel. With I and I denoting the scalar values of two currents and n being the number
x y
of nepers denoted by their scalar ratio, then:
n 5 ln ~l ⁄ l !
e x y
where:
ln = logarithm to base e.
e
3.2.2 For other definitions used in these test methods, refer to Terminology D1711.
3.3 Definitions of Terms Specific to Test Methods B and C:
3.3.1 electrical skin depth, n—the effective depth of field penetration at high frequencies where electric currents are confined to
a thin layer at the surface of conductors due to basic electromagnetic phenomena.
3.3.1.1 Discussion—
The skin depth for copper and silver is approximately 0.002 mm at 1 GHz and decreases by a factor of 10 at 100 GHz.
3.3.2 high Q cavity, n—a rectangular cavity having a
...