ASTM E2627-13(2019)
(Practice)Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
SIGNIFICANCE AND USE
5.1 This practice provides a way to estimate the average grain size of polycrystalline materials. It is based on EBSD measurements of crystallographic orientation which are inherently quantitative in nature. This method has specific advantage over traditional optical grain size measurements in some materials, where it is difficult to find appropriate metallographic preparation procedures to adequately delineate grain boundaries.
SCOPE
1.1 This practice is used to determine grain size from measurements of grain areas from automated electron backscatter diffraction (EBSD) scans of polycrystalline materials.
1.2 The intent of this practice is to standardize operation of an automated EBSD instrument to measure ASTM G directly from crystal orientation. The guidelines and caveats of E112 apply here, but the focus of this standard is on EBSD practice.
1.3 This practice is only applicable to fully recrystallized materials.
1.4 This practice is applicable to any crystalline material which produces EBSD patterns of sufficient quality that a high percentage of the patterns can be reliably indexed using automated indexing software.
1.5 The practice is applicable to any type of grain structure or grain size distribution.
1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.8 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
General Information
Relations
Standards Content (Sample)
This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E2627 − 13 (Reapproved 2019)
Standard Practice for
Determining Average Grain Size Using Electron Backscatter
Diffraction (EBSD) in Fully Recrystallized Polycrystalline
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Materials
This standard is issued under the fixed designation E2627; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 2. Referenced Documents
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2.1 ASTM Standards:
1.1 This practice is used to determine grain size from
E7 Terminology Relating to Metallography
measurements of grain areas from automated electron back-
E112 Test Methods for Determining Average Grain Size
scatter diffraction (EBSD) scans of polycrystalline materials.
E177 Practice for Use of the Terms Precision and Bias in
1.2 The intent of this practice is to standardize operation of
ASTM Test Methods
an automated EBSD instrument to measure ASTM G directly
E691 Practice for Conducting an Interlaboratory Study to
from crystal orientation. The guidelines and caveats of E112
Determine the Precision of a Test Method
apply here, but the focus of this standard is on EBSD practice.
E766 Practice for Calibrating the Magnification of a Scan-
ning Electron Microscope
1.3 This practice is only applicable to fully recrystallized
E1181 Test Methods for Characterizing Duplex Grain Sizes
materials.
E1382 Test Methods for Determining Average Grain Size
1.4 This practice is applicable to any crystalline material
Using Semiautomatic and Automatic Image Analysis
which produces EBSD patterns of sufficient quality that a high
percentage of the patterns can be reliably indexed using 3. Terminology
automated indexing software.
3.1 Definitions:
3.1.1 cleanup—Post processing applied to EBSD scan data
1.5 The practice is applicable to any type of grain structure
to reassign extraneous points in the scan grid to neighboring
or grain size distribution.
points. The extraneous points are assumed to arise from
1.6 The values stated in SI units are to be regarded as
non-indexed or misindexed EBSD patterns.
standard. No other units of measurement are included in this
3.1.2 (crystallographic) orientation—The rotation required
standard.
tobringtheprincipleaxesofacrystalintocoincidencewiththe
1.7 This standard does not purport to address all of the principle axes assigned to a specimen. For example, in a rolled
safety concerns, if any, associated with its use. It is the material with cubic crystal symmetry, it is the set of rotations
responsibility of the user of this standard to establish appro- required to bring the [100], [010] and [001] axes of the crystal
into coincidence with the rolling, transverse and normal
priate safety, health, and environmental practices and deter-
directions of the specimen. Orientations may be described in
mine the applicability of regulatory limitations prior to use.
terms of various sets of angles, a matrix of direction cosines or
1.8 This international standard was developed in accor-
a rotation vector.
dance with internationally recognized principles on standard-
ization established in the Decision on Principles for the 3.1.3 electron backscatter diffraction (EBSD)—Acrystalline
specimenisplacedinascanningelectronmicroscope(SEM)at
Development of International Standards, Guides and Recom-
a high tilt angle (~70°). When a stationary electron beam is
mendations issued by the World Trade Organization Technical
positioned on a grain, the electrons are scattered in a small
Barriers to Trade (TBT) Committee.
volume (typically 30nm in the tilt direction, 10nm in the
transversedirectionand20nmindepthforafieldemissiongun
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This practice is under the jurisdiction of ASTM Committee E04 on Metallog-
raphy and is the direct responsibility of Subcommittee E04.11 on X-Ray and
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Electron Metallography. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved Nov. 1, 2019. Published December 2019. Originally contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
approved in 2010. Last previous edition approved in 2013 as E2627–13. DOI: Standards volume information, refer to the standard’s Document Summary page on
10.1520/E2627–13R19. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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E2627 − 13 (2019)
SEM and approximately an order of magnitude larger in the materials, where it is difficult to find appropriate metallo
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