ASTM F1661-08
(Test Method)Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
SIGNIFICANCE AND USE
Contact bounce time is essential to manufacturers and users when designing interface circuitry because it specifies the time delay necessary in the decoder circuitry to avoid any false signals caused by contact bounce. Allowing for time delay makes the switch operation considerably more reliable.
SCOPE
1.1 This test method covers the determination of the contact bounce time of a membrane switch.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation:F 1661–08
Standard Test Method for
Determining the Contact Bounce Time of a Membrane
1
Switch
This standard is issued under the fixed designation F 1661; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the determination of the contact
bounce time of a membrane switch.
1.2 This standard does not purport to address all of the
safety concerns, if any, associated with its use. It is the
responsibility of the user of this standard to establish appro-
priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
D 2240 Test Method for Rubber Property—Durometer
Hardness
F 2592 Test Method for Measuring the Force-Displacement
FIG. 1 Contact Bounce on Switch Break
of a Membrane Switch
F 1680 TestMethodforDeterminingCircuitResistanceofa
Membrane Switch
3.1.5 membrane switch—a momentary switching device in
which at least one contact is on, or made of, a flexible
3. Terminology
substrate.
3.1 Definitions:
3.1.6 resistor, load, R —load resistance in series with
L
3.1.1 contact bounce—intermittent contact opening and
switch under test.
contact closure that may occur after switch operation.
3.1.7 specified lower transition voltage, SLTV—minimum
3.1.2 contact bounce time (break), T —the time period
CBB
allowable LTV.
measured from the first instant V is equal to the SUTV until
M
3.1.8 specified upper transition voltage, SUTV—minimum
it constantly remains below the SLTV after the last instant it
allowable UTV.
rises above the SUTV. If V does not rise above SUTV during
M
3.1.9 upper transition voltage, UTV—the voltage at which
the time interval, T = 0, (see Fig. 1).
CBB
the switched logic device transitions to an 88on” state.
3.1.3 contact bounce time (make), T —the time period
CBM
measured from the first instant V is equal to the SLTV until
M
it constantly remains above the SUTV after the last instant it
falls below the SLTV. If V does not fall below SLTV during
M
the time interval, T = 0, (see Fig. 2).
CBM
3.1.4 lower transition voltage, LTV—the voltage at which
the switched logic device transitions to an “off” state.
1
This test method is under the jurisdiction of ASTM Committee F01 on
Electronics and is the direct responsibility of Subcommittee F01.18 on Membrane
Switches.
Current edition approved Nov. 1, 2008. Published December 2008. Originally
approved in 1995. Last previous edition approved in 2002 as F 1661 – 96(2002).
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. FIG. 2 Contact Bounce on Switch Make
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1
---------------------- Page: 1 ----------------------
F 1661–08
3.1.10 voltage, measured, V —voltage measured across
M
load Resistor (R ) by the oscilloscope and measured on it’s
L
screen or voltage measured across the switch under test when
a contact bounce measuring device is used.
4. Significance and Use
4.1 Contact bounce time is essential to manufacturers and
userswhendesigninginterfacecircuitrybecauseitspecifiesthe
time delay necessary in the decoder circuitry to avoid any false
signals caused by contact bounce. Allowing for time delay
makes the switch operation considerably more reliable.
FIG. 4 Test Probe Option
5. Interference
5.1 The following parameters may affect the results of this
test:
5.1.1 Mechanical probe materials (hardness) and speed will
affect results.
6. Apparatus
6.1 Test Probe, built to either of the configuration shown in
Fig. 3 and Fig. 4 are acceptable but must be made of an inert
elastomeric material with a hardness number equivalent to
FIG. 5 Test Setup Option
A/45 6 5 as measured in accordance with Test Method
D 2240.Test probes that do not meet the above criteria must be
7.1.5.1 One half to 1.0 V/cm vertical, and
fully specified and recorded.
7.1.5.2 Two to 3 ms/cm horizontal.
6.2 Test Surface—flat, smooth, unyielding, and larger than
7.1.5.3 Set SUTV per Table 1 if known. If not known,
switch under test.
default SUTV will be 2.0 VDC.
6.3 Oscilloscope, with recording capabilities and power
7.1.5.4 Set SLTV per Table 1 if known. If not known,
supply, or suitable contact bounce time measuring instrument.
default SLTV will be 0.9 VDC.
6.4 Device, which will consistently move probe into and
7.1.6 Adjust power supply to test voltage per Ta
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:F 1661–96 (Reapproved 2002) Designation:F 1661–08
Standard Test Method for
Determining the Contact Bounce Time of a Membrane
1
Switch
This standard is issued under the fixed designation F 1661; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the determination of the contact bounce time of a membrane switch.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
D 2240 Test Method for Rubber Property—Durometer Hardness Test Method for Rubber PropertyDurometer Hardness
F 2592 Test Method for Measuring the Force-Displacement of a Membrane Switch
F 1680 Test Method for Determining Circuit Resistance of a Membrane Switch
3. Terminology
3.1 Definitions:
3.1.1 contact bounce—intermittent contact opening and contact closure that may occur after switch operation.
3.1.2 contact bounce time (break), T —the time period measured from the first instant V is equal to the SLTVSUTV until
CBB M
the first instant it again fallsconstantly remains below the SLTV after the last instant it rises above the SUTV. If V does not rise
M
above SUTV during the time interval, T = 0, (see Fig. 1).
CBB
3.1.3 contact bounce time (make), T —the time period measured from the first instant V is equal to the SUTVSLTV until
CBM M
the first instant it again risesconstantly remains above the SUTV after the last instant it falls below the SLTV. If V does not fall
M
below SLTV during the time interval, T = 0, (see Fig. 2).
CBM
3.1.4 lower transition voltage, LTV—the voltage at which the switched logic device transitions to an “off” state.
3.1.5 membrane switch—a momentary switching device in which at least one contact is on, or made of, a flexible substrate.
3.1.6 resistor, load, R —load resistance in series with switch under test.
L
3.1.7 specified lower transition voltage, SLTV— minimum allowable LTV.
3.1.8 specified resistance, R —maximum allowable resistance measured between two terminations whose internal switch
S
contacts, when held closed, complete a circuit.
3.1.9specified upper transition voltage, SUTV— minimum allowable UTV.
3.1.10
3.1.9 upper transition voltage, UTV—the voltage at which the switched logic device transitions to an 88on” state.
3.1.11
3.1.10 voltage, measured, V —voltage measured across load Resistor (R ) by the oscilloscope and measured on it’s screen or
M L
voltage measured across the switch under test when a contact bounce measuring device is used.
4. Significance and Use
4.1 Contact bounce time is essential to manufacturers and users when designing interface circuitry because it specifies the time
delay necessary in the decoder circuitry to avoid any false signals caused by contact bounce. Allowing for time delay makes the
switch operation considerably more reliable.
1
This test method is under the jurisdiction of ASTM Committee F01 on Electronics and is the direct responsibility of Subcommittee F01.18 on Membrane Switches.
Current edition approved Dec. 10, 1996. Published February 1997. Originally published as F1661–95. Last previous edition F1661–95.
Current edition approved Nov. 1, 2008. Published December 2008. Originally approved in 1995. Last previous edition approved in 2002 as F 1661 – 96(2002).
2
For referencedASTM standards, visit theASTM website, www.astm.org, or contactASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
, Vol 09.01.volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1
---------------------- Page: 1 ----------------------
F 1661–08
FIG. 1 Contact Bounce on Switch Break
FIG. 2 Contact Bounce on Switch Make
5. Interference
5.1 The following parameters may affect the results of this test:
5.1.1If a human finger is used in place of a mechanical probe the results are more varied and larger sample sizes should be used,
and
5.1.2Mechanical probe materials (hardness) and speed will affect results.
5.1.1 Mechanical probe materials (h
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:F 1661–96 (Reapproved 2002) Designation:F 1661–08
Standard Test Method for
Determining the Contact Bounce Time of a Membrane
1
Switch
This standard is issued under the fixed designation F 1661; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the determination of the contact bounce time of a membrane switch.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
D 2240 Test Method for Rubber Property—Durometer Hardness Test Method for Rubber PropertyDurometer Hardness
F 2592 Test Method for Measuring the Force-Displacement of a Membrane Switch
F 1680 Test Method for Determining Circuit Resistance of a Membrane Switch
3. Terminology
3.1 Definitions:
3.1.1 contact bounce—intermittent contact opening and contact closure that may occur after switch operation.
3.1.2 contact bounce time (break), T —the time period measured from the first instant V is equal to the SLTVSUTV until
CBB M
the first instant it again fallsconstantly remains below the SLTV after the last instant it rises above the SUTV. If V does not rise
M
above SUTV during the time interval, T = 0, (see Fig. 1).
CBB
3.1.3 contact bounce time (make), T —the time period measured from the first instant V is equal to the SUTVSLTV until
CBM M
the first instant it again risesconstantly remains above the SUTV after the last instant it falls below the SLTV. If V does not fall
M
below SLTV during the time interval, T = 0, (see Fig. 2).
CBM
3.1.4 lower transition voltage, LTV—the voltage at which the switched logic device transitions to an “off” state.
3.1.5 membrane switch—a momentary switching device in which at least one contact is on, or made of, a flexible substrate.
3.1.6 resistor, load, R —load resistance in series with switch under test.
L
3.1.7 specified lower transition voltage, SLTV— minimum allowable LTV.
3.1.8 specified resistance, R —maximum allowable resistance measured between two terminations whose internal switch
S
contacts, when held closed, complete a circuit.
3.1.9specified upper transition voltage, SUTV— minimum allowable UTV.
3.1.10
3.1.9 upper transition voltage, UTV—the voltage at which the switched logic device transitions to an 88on” state.
3.1.11
3.1.10 voltage, measured, V —voltage measured across load Resistor (R ) by the oscilloscope and measured on it’s screen or
M L
voltage measured across the switch under test when a contact bounce measuring device is used.
4. Significance and Use
4.1 Contact bounce time is essential to manufacturers and users when designing interface circuitry because it specifies the time
delay necessary in the decoder circuitry to avoid any false signals caused by contact bounce. Allowing for time delay makes the
switch operation considerably more reliable.
1
This test method is under the jurisdiction of ASTM Committee F01 on Electronics and is the direct responsibility of Subcommittee F01.18 on Membrane Switches.
Current edition approved Dec. 10, 1996. Published February 1997. Originally published as F1661–95. Last previous edition F1661–95.
Current edition approved Nov. 1, 2008. Published December 2008. Originally approved in 1995. Last previous edition approved in 2002 as F 1661 – 96(2002).
2
For referencedASTM standards, visit theASTM website, www.astm.org, or contactASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
, Vol 09.01.volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1
---------------------- Page: 1 ----------------------
F 1661–08
FIG. 1 Contact Bounce on Switch Break
FIG. 2 Contact Bounce on Switch Make
5. Interference
5.1 The following parameters may affect the results of this test:
5.1.1If a human finger is used in place of a mechanical probe the results are more varied and larger sample sizes should be used,
and
5.1.2Mechanical probe materials (hardness) and speed will affect results.
5.1.1 Mechanical probe materials (h
...
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