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ASTM E2735-14(2020)

(Guide)

Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments

Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments

SIGNIFICANCE AND USE
4.1 The purpose of this guide is assist users and analysts in selecting the standardization procedures relevant to a defined XPS experiment. These experiments may be based, for example, upon material failure analysis, the determination of surface chemistry of a solid, or the composition profile of a thin film or coating. A series of options will be summarized giving the standards that are related to specific information requirements. ISO 15470 and ISO 10810 also aid XPS users in experiment design for typical samples. ASTM Committee E42 and ISO TC201 are in a continuous process of updating and adding standards and guides. It is recommended to refer to the ASTM and ISO websites for a current list of standards.
SCOPE
1.1 This guide describes an approach to enable users and analysts to determine the calibrations and standards useful to obtain meaningful surface chemistry data with X-ray photoelectron spectroscopy (XPS) and to optimize the instrument for specific analysis objectives and data collection time.  
1.2 This guide offers an organized collection of information or a series of options and does not recommend a specific course of action. This guide cannot replace education or experience and should be used in conjunction with professional judgment. Not all aspects of this guide will be applicable in all circumstances.  
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.4 This standard is not intended to represent or replace the standard of care by which the adequacy of a given professional service must be judged, nor should this document be applied without consideration of a project’s many unique aspects. The word “Standard” in the title of this document means only that the document has been approved through the ASTM consensus process.  
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

General Information

Status
Published
Publication Date
30-Nov-2020
ICS
71.040.50 - Physicochemical methods of analysis
Technical Committee
E42 - Surface Analysis
Drafting Committee
E42.03 - Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Current Stage
Ref Project

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ASTM E2735-14(2020) - Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) ExperimentsASTM E2735-14(2020) - Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
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ASTM E2735-14(2020) - Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
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This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E2735 − 14 (Reapproved 2020)
Standard Guide for
Selection of Calibrations Needed for X-ray Photoelectron
1
Spectroscopy (XPS) Experiments
This standard is issued under the fixed designation E2735; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 2. Referenced Documents
2
2.1 ASTM Standards:
1.1 This guide describes an approach to enable users and
E995 Guide for Background Subtraction Techniques in Au-
analysts to determine the calibrations and standards useful to
ger Electron Spectroscopy and X-Ray Photoelectron
obtain meaningful surface chemistry data with X-ray photo-
Spectroscopy
electron spectroscopy (XPS) and to optimize the instrument for
E996 Practice for Reporting Data in Auger Electron Spec-
specific analysis objectives and data collection time.
troscopy and X-ray Photoelectron Spectroscopy
1.2 This guide offers an organized collection of information
E1078 Guide for Specimen Preparation and Mounting in
or a series of options and does not recommend a specific course
Surface Analysis
of action. This guide cannot replace education or experience
E1127 Guide for Depth Profiling in Auger Electron Spec-
and should be used in conjunction with professional judgment.
troscopy
Not all aspects of this guide will be applicable in all circum-
E1217 Practice for Determination of the Specimen Area
stances.
Contributing to the Detected Signal in Auger Electron
Spectrometers and Some X-Ray Photoelectron Spectrom-
1.3 The values stated in SI units are to be regarded as
eters
standard. No other units of measurement are included in this
E1523 Guide to Charge Control and Charge Referencing
standard.
Techniques in X-Ray Photoelectron Spectroscopy
1.4 This standard is not intended to represent or replace the
E1577 Guide for Reporting of Ion Beam Parameters Used in
3
standard of care by which the adequacy of a given professional
Surface Analysis (Withdrawn 2020)
service must be judged, nor should this document be applied
E1634 Guide for Performing Sputter Crater Depth Measure-
without consideration of a project’s many unique aspects. The
ments
word “Standard” in the title of this document means only that
E1636 Practice for Analytically Describing Depth-Profile
the document has been approved through the ASTM consensus
and Linescan-Profile Data by an Extended Logistic Func-
process. 3
tion (Withdrawn 2019)
E1829 Guide for Handling Specimens Prior to Surface
1.5 This standard does not purport to address all of the
Analysis
safety concerns, if any, associated with its use. It is the
E2108 Practice for Calibration of the Electron Binding-
responsibility of the user of this standard to establish appro-
Energy Scale of an X-Ray Photoelectron Spectrometer
priate safety, health, and environmental practices and deter-
4
mine the applicability of regulatory limitations prior to use. 2.2 ISO Standards:
ISO 10810 Surface Chemical Analysis—Depth Profiling—
1.6 This international standard was developed in accor-
Measurement of Sputtered Depth
dance with internationally recognized principles on standard-
ISO 14606 Surface Chemical Analysis—Sputter Depth
ization established in the Decision on Principles for the
Profiling—Optimisation Using Layered Systems as Ref-
Development of International Standards, Guides and Recom-
erence Materials
mendations issued by the World Trade Organization Technical
Barriers to Trade (TBT) Committee.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
1
This guide is under the jurisdiction of ASTM Committee E42 on Surface Standards volume information, refer to the standard’s Document Summary page on
Analysis and is the direct responsibility of Subcommittee E42.03 on Auger Electron the ASTM website.
3
Spectroscopy and X-Ray Photoelectron Spectroscopy. The last approved version of this historical standard is referenced on
Current edition approved Dec. 1, 2020. Published December 2020. Originally www.astm.org.
4
approved in 2013. Last previous edition approved in 2014 as E2735–14. DOI: Available from American National Standards Institute (ANSI), 25 W. 43rd St.,
10.1520/E2735-14R20. 4th Floor, New York, NY 10036, http://www.ansi.org.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E2735 − 14 (2020)
ISO 14701 Surface
...

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4.1 Proper preparation and mounting of specimens is particularly critical for surface analysis. Improper preparation of specimens can result in alteration of the surface composition and unreliable data. Specimens should be handled carefully so as to avoid the introduction of spurious contaminants in the preparation and mounting process. The goal must be to preserve the state of the surface so that the analysis remains representative of the original.  
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4.1 Proper handling and preparation of specimens is particularly critical for analysis. Improper handling of specimens can result in alteration of the surface composition and unreliable data. Specimens should be handled carefully so as to avoid the introduction of spurious contaminants. The goal must be to preserve the state of the surface so that analysis remains representative of the original subject.  
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4.1 PFAS are widely used in commercial and industrial applications worldwide (see Fig. 1). PFAS are of concern due to their documented persistence and their studied impacts on human health and the environmental. While there is no comprehensive source of information on the many individual PFAS substances and their functions in different applications, a range of resources are available to the practitioner. This guide provides information to assist the practitioner in navigating these challenges during the initial screening and site characterization process.
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5.1 The determination of the boiling point distribution of crude oils and vacuum residues, as well as other petroleum fractions, yields important information for refinery operation. These boiling point distributions provide information as to the potential mass percent yield of products. This test method may provide useful information that can aid in establishing operational conditions in the refinery. Knowledge of the amount of residue produced is important in determining the economics of the refining process.
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1.5 A correlation between boiling range distribution results from Test Method D2892, and the weight percentage data determined via this method, is presented in Appendix X2.  
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ASTM E135-23a(Terminology)
Standard Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials

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3.1 Definitions given in Section 4 are intended for use in all standards on analytical chemistry for metals, ores, and related materials. The definitions should be used uniformly and consistently. The purpose of these definitions is to promote clear understanding and interpretation of the standards in which the terms are used.
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1.3 The date of last reapproval or revision of a term is in parentheses at the end of the definition.  
1.4 Definitions identical to those published by another standards organization or ASTM committee are identified with the name of the organization and the identifying document or ASTM committee and standard.  
1.5 Definitions specific to a particular field (such as emission spectrometry) are identified with an italicized introductory phrase.  
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ASTM E1999-23(Test Method)
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5.1 The chemical composition of cast iron alloys shall be determined accurately in order to ensure the desired metallurgical properties. This procedure is suitable for manufacturing control and inspection testing.
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1.1 This test method covers the analysis of cast iron by spark atomic emission spectrometry for the following elements in the ranges shown (Note 1):
Ranges, %  
Elements  
Applicable Range, %  
Quantitative Range, %A  
Carbon  
1.9 to 3.8  
1.90 to 3.8  
Chromium  
0 to 2.0  
0.025 to 2.0  
Copper  
0 to 0.75  
0.015 to 0.75  
Manganese  
0 to 1.8  
0.03 to 1.8  
Molybdenum  
0 to 1.2  
0.01 to 1.2  
Nickel  
0 to 2.0  
0.02 to 2.0  
Phosphorus  
0 to 0.4  
0.005 to 0.4  
Silicon  
0 to 2.5  
0.15 to 2.5  
Sulfur  
0 to 0.08  
0.01 to 0.08  
Tin  
0 to 0.14  
0.004 to 0.14  
Titanium  
0 to 0.12  
0.003 to 0.12  
Vanadium  
0 to 0.22  
0.008 to 0.22
Note 1: The ranges of the elements listed have been established through cooperative testing of reference materials. These ranges can be extended by the use of suitable reference materials.  
1.2 This test method covers analysis of specimens having a diameter adequate to overlap the bore of the spark stand opening (to effect an argon seal). The specimen thickness should be sufficient to prevent overheating during excitation. A heat sink backing may be used. The maximum thickness is limited only by the height that the stand will permit.  
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