ASTM C1118-07
(Guide)Standard Guide for Selecting Components for Wavelength-Dispersive X-Ray Fluorescence (XRF) Systems (Withdrawn 2011)
Standard Guide for Selecting Components for Wavelength-Dispersive X-Ray Fluorescence (XRF) Systems (Withdrawn 2011)
SIGNIFICANCE AND USE
This guide describes typical prospective analytical X-ray fluorescence systems that may be used for qualitative and quantitative elemental analyses of materials related to the nuclear fuel cycle.
Standard test methods for the determination of materials using wavelength-dispersive XRF4 usually employ apparatus with the components described in this guide.
SCOPE
1.1 This guide describes the components for a wavelength-dispersive X-ray fluorescence system for materials analysis. This guide can be used as a reference in the apparatus section of test methods for wavelength-dispersive X-ray fluorescence (WDXRF) analyses of nuclear materials.
1.2 The components recommended include X-ray detectors, signal processing electronics, excitation sources, and dispersing crystals.
1.3 Detailed data analysis procedures are not described or recommended, as they may be unique to a particular analysis problem. Some applications may require the use of complex computer software during data reduction to correct for matrix effects.
1.4 The values stated in SI units are to be regarded as the standard.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
WITHDRAWN RATIONALE
This guide describes the components for a wavelength-dispersive X-ray fluorescence system for materials analysis. This guide can be used as a reference in the apparatus section of test methods for wavelength-dispersive X-ray fluorescence (WDXRF ) analyses of nuclear materials.
Formerly under the jurisdiction of Committee C26 on Nuclear Fuel Cycle, this guide was withdrawn in June 2011. This standard is being withdrawn without replacement due to its limited use.
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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation:C1118–07
Standard Guide for
Selecting Components for Wavelength-Dispersive X-Ray
1
Fluorescence (XRF) Systems
This standard is issued under the fixed designation C1118; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 3.2 Standard test methods for the determination of materials
4
using wavelength-dispersive XRF usually employ apparatus
1.1 This guide describes the components for a wavelength-
with the components described in this guide.
dispersive X-ray fluorescence system for materials analysis.
This guide can be used as a reference in the apparatus section
4. Technical Precautions
of test methods for wavelength-dispersive X-ray fluorescence
2 4.1 XRF equipment analyzes by the interaction of ionizing
(WDXRF ) analyses of nuclear materials.
radiation with the sample. Applicable safety regulation and
1.2 The components recommended include X-ray detectors,
standard operating procedures must be reviewed before use of
signal processing electronics, excitation sources, and dispers-
such equipment. All current XRF spectrometers are equipped
ing crystals.
with safety interlocks to prevent accidental penetration of
1.3 Detailed data analysis procedures are not described or
X-ray beam by the user. Do not override these interlocks
recommended, as they may be unique to a particular analysis
without proper training or a second person present during such
problem. Some applications may require the use of complex
5
operation. (See NBS Handbook 111 and ANSI/HPS N43.2-
computer software during data reduction to correct for matrix
5
2001 )
effects.
4.2 Instrument performance may be influenced by environ-
1.4 The values stated in SI units are to be regarded as the
mental factors such as heat, vibration, humidity, dust, stray
standard.
electronic noise, and line voltage stability. These factors and
1.5 This standard does not purport to address all of the
performance criteria should be reviewed with equipment
safety concerns, if any, associated with its use. It is the
manufacturers.
responsibility of the user of this standard to establish appro-
4.3 The quality of quantitative XRF results can be depen-
priate safety and health practices and determine the applica-
dent on a variety of factors, such as sample preparation and
bility of regulatory limitations prior to use.
mounting. Consult the specific analysis method for recom-
2. Referenced Documents mended procedures.
3 4.4 Sample chambers are available commercially for opera-
2.1 ASTM Standards:
tion in air, vacuum, or helium atmospheres, depending on the
E135 Terminology Relating to Analytical Chemistry for
elementstobedeterminedandthephysicalformofthesample.
Metals, Ores, and Related Materials
5. Excitation Sources
3. Significance and Use
5.1 X-Ray Generator— The X-ray generator should consist
3.1 This guide describes typical prospective analytical
of, but not be limited to, an X-ray power supply with an output
X-ray fluorescence systems that may be used for qualitative
rating of at least 3000-W constant power. The voltage should
and quantitative elemental analyses of materials related to the
be adjustable from at least 10 to 60 kVin not greater than 5-kV
nuclear fuel cycle.
4
General references for XRF include the following:
1
This guide is under the jurisdiction ofASTM Committee C26 on Nuclear Fuel Bertin, Eugene P., Principles and Practices of X-ray Spectrometric Analysis,
Cycle and is the direct responsibility of Subcommittee C26.05 on Methods of Test. Second Edition, Plenum Press, New York and London, 1975.
Current edition approved Feb. 1, 2007. Published March 2007. Originally Jenkins, Ron, An Introduction to X-ray Spectrometry, Hayden and Sons Limited,
approved in 1989. Last previous edition approved in 2000 as C1118–89(2000) DOI: London, New York, Rhine, 1974.
10.1520/C1118-07. Jenkins, Ron, Gould, R. W., and Gedke, Dale, Quantitative X-ray Spectrometry,
2
WDXRF is described at http://www.learnxrf.com/WDXRF.htm. Marcel Dekker, Inc., New York and Basel.
3 5
For referenced ASTM standards, visit the ASTM website, www.astm.org, or NBS Handbook 111, Radiation Safety for X-Ray Diffraction and X-Ray
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Fluorescence Analysis Equipment, National Institute of Standards and Technology,
Standards volume information, refer to the standard’s Document Summary page on Washington, DC. and American National Standard N43-2-2001 (http://hps.org/
the ASTM website. hpssc/N43_2_2001.html)
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