ASTM C1118-89(2000)
(Guide)Standard Guide for Selecting Components for Wavelength-Dispersive X-Ray Fluorescence (XRF) Systems
Standard Guide for Selecting Components for Wavelength-Dispersive X-Ray Fluorescence (XRF) Systems
SCOPE
1.1 This guide describes the components for a wavelength-dispersive X-ray fluorescence system for materials analysis. This guide can be used as a reference in the apparatus section of test methods for wavelength-dispersive X-ray fluorescence (XRF) analyses of nuclear materials.
1.2 The components recommended include X-ray detectors, signal processing electronics, excitation sources, and dispersing crystals.
1.3 Detailed data analysis procedures are not described or recommended, as they may be unique to a particular analysis problem. Some applications may require the use of complex computer software during data reduction to correct for matrix effects.
1.4 The values stated in SI units are to be regarded as the standard.
1.5 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation:C1118–89(Reapproved 2000)
Standard Guide for
Selecting Components for Wavelength-Dispersive X-Ray
Fluorescence (XRF) Systems
This standard is issued under the fixed designation C 1118; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope 3.2 Standard test methods for the determination of materials
using wavelength-dispersive XRF usually employ apparatus
1.1 This guide describes the components for a wavelength-
with the components described in this guide.
dispersive X-ray fluorescence system for materials analysis.
This guide can be used as a reference in the apparatus section
4. Technical Precautions
of test methods for wavelength-dispersive X-ray fluorescence
4.1 XRF equipment analyzes by the interaction of ionizing
(XRF) analyses of nuclear materials.
radiation with the sample. Applicable safety regulation and
1.2 The components recommended include X-ray detectors,
standard operating procedures must be reviewed before use of
signal processing electronics, excitation sources, and dispers-
such equipment. All current XRF spectrometers are equipped
ing crystals.
with safety interlocks to prevent accidental penetration of
1.3 Detailed data analysis procedures are not described or
X-ray beam by the user. Do not override these interlocks
recommended, as they may be unique to a particular analysis
without proper training or a second person present during such
problem. Some applications may require the use of complex
operation. (See NBS Handbook 111 )
computer software during data reduction to correct for matrix
4.2 Instrument performance may be influenced by environ-
effects.
mental factors such as heat, vibration, humidity, dust, stray
1.4 The values stated in SI units are to be regarded as the
electronic noise, and line voltage stability. These factors and
standard.
performance criteria should be reviewed with equipment
1.5 This standard does not purport to address all of the
manufacturers.
safety concerns, if any, associated with its use. It is the
4.3 The quality of quantitative XRF results can be depen-
responsibility of the user of this standard to establish appro-
dent on a variety of factors, such as sample preparation and
priate safety and health practices and determine the applica-
mounting. Consult the specific analysis method for recom-
bility of regulatory limitations prior to use.
mended procedures.
2. Referenced Documents 4.4 Sample chambers are available commercially for opera-
tion in air, vacuum, or helium atmospheres, depending on the
2.1 ASTM Standards:
elements to be determined and the physical form of the sample.
E 135 Terminology Relating to Analytical Chemistry for
Metals, Ores, and Related Materials
5. Excitation Sources
3. Significance and Use 5.1 X-Ray Generator— The X-ray generator should consist
of, but not be limited to, an X-ray power supply with an output
3.1 This guide describes typical prospective analytical
rating of at least 3000-W constant power. The voltage should
X-ray fluorescence systems that may be used for qualitative
be adjustable from at least 10 to 60 kVin not greater than 5-kV
and quantitative elemental analyses of materials related to the
increments (100-kV generators are available if the specific
nuclear fuel cycle.
applicationrequires).Tubecurrentshouldbeadjustablefromat
General references for XRF include the following:
Bertin, Eugene P., Principles and Practices of X-ray Spectrometric Analysis,
Second Edition, Plenum Press, New York and London, 1975.
Jenkins, Ron, An Introduction to X-ray Spectrometry, Hayden and Sons Limited,
London, New York, Rhine, 1974.
Jenkins, Ron, Gould, R. W., and Gedke, Dale, Quantitative X-ray Spectrometry,
This guide is under the jurisdiction ofASTM Committee C-26 on Nuclear Fuel Marcel Dekker, Inc., New York and Basel.
Cycle and is the direct responsibility of Subcommittee C26.05 on Methods of Test. NBS Handbook 111, Radiation Safety for X-Ray Diffraction and X-Ray
Current edition approved May 26, 1989. Published July 1989. Fluorescence Analysis Equipment, National Institute of Standards and Technology,
Annual Book of ASTM Standards, Vol 03.05. Washington, DC.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
C 1118
least 5 to 80 mAin suitable increments.The current increments separately or in tandem.Alternately, a third sealed gas detector
should be no greater than 5 mA between 5 and 40 mA and no may be included for use over the analytical range in which
greaterthan10mAbetween40and80mA.Adjustmentofboth tandem counting with the scintillation and flow-proportional
X-ray tube voltage and current should be either manual or counters would be done.
automatic by means of the hardware and software programs at
NOTE 1—If the quality of P-10 gas is not well known or controlled, a
the user’s option. The kilovolt and milliamp adjustments
gas dryer may be required.The gas used for any flow-proportional counter
should be interlocked such that if the maximum safe power of
should be moisture free.
the X-ray tube or the power supply is exceeded the generator
6.4 Crystal Chamber and Analyzing Crystals:
will either shut off automatically or will limit itself to the
6.4.1 An evacuable crystal chamber containing the crystal
maximum safe power. Stability and reproducibility of high
changer and the gas counter(s) should be supplied. The crystal
voltage and tube current should be at least 0.05 % or better for
changer should accommodate at least four (4) analyzing
a 610 % change in line voltage and for ambient temperature
crystals. The crystal chamber should be temperature stabilized.
variation of 15°C.
6.4.2 The choice of analyzing crystals will be dependent on
5.2 Cooling System— The system should be equipped with
the user’s application. A complete list of available crystals is
a recirculating cooling unit for cooling the X-ray power supply
outside the scope of this guide. Normal usage within the
and the X-ray tube. The cooling water unit should have
nuclear field would include LiF , LiF , and PET . All
220 200 002
sufficient volume and cooling capacity to supply the recom-
crystals should be mounted in me
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