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ASTM

ASTM F1996-14

(Test Method)

Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

SIGNIFICANCE AND USE
4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.  
4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).
SCOPE
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.  
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
WITHDRAWN RATIONALE
This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
Formerly under the jurisdiction of Committee F01 on Electronics, this test method was withdrawn in January 2023 in accordance with section 10.6.3 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

General Information

Status
Withdrawn
Publication Date
30-Sep-2014
Withdrawal Date
11-Jan-2023
ICS
77.120.99 - Other non-ferrous metals and their alloys
Technical Committee
F01 - Electronics
Drafting Committee
F01.18 - Printed Electronics
Current Stage
Ref Project

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ASTM F1996-14 - Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)ASTM F1996-14 - Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
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ASTM F1996-14 - Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
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Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: F1996 − 14
Standard Test Method for
1
Silver Migration for Membrane Switch Circuitry
This standard is issued under the fixed designation F1996; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 5.1.2 Relative Humidity.
5.1.3 Electrical Load (that is, current and voltage).
1.1 This test method is used to determine the susceptibility
5.1.4 Test surface.
of a membrane switch to the migration of the silver between
5.1.5 Flex tail connector area may be susceptible to silver
circuit traces under dc voltage potential.
migration which may or may not be a part of the scope of this
1.2 Silver migration will occur when special conditions of
test. If the flex tail is to be excluded from the test it should be
moisture and electrical energy are present.
sealed with an inert compound that has no influence on the test
or switch materials.
2. Referenced Documents
5.1.6 Post test handling may damage or destroy silver
2
2.1 ASTM Standards:
dendrites.
F1596 Test Method for Exposure of Membrane Switches to
5.1.7 Dendrites normally grow from the cathode conductor
Temperature and Relative Humidity
to the anode.To test both electrodes of a switch design connect
F1689 Test Method for Determining the Insulation Resis-
replicate specimens so that current flows through them in
tance of a Membrane Switch
opposite directions.
5.1.8 Without limited current, the migration could occur,
3. Terminology
causing a short and a dramatic current surge, which then
3.1 Definitions:
destroys the short and returns the circuit to a nonstandard, but
3.1.1 silver migration—A process by which silver, when in
functional condition. If an observer was not present (or the
contact with insulating materials under electrical potential, is
details were not continuously recorded) this most dramatic
removed ionically from its original location, and is redeposit as
failure might go unnoticed.
a metal (silver dendrite) at some other location.
5.1.9 Surfactants and other contaminants from the environ-
ment can be transferred to membrane switch components
4. Significance and Use
during handling. These contaminants can adversely affect the
4.1 The effects of silver migration are short circuiting or
results of this test.
reduction in insulation resistance. It is evidenced by staining or
dicoloration between the cathode and anode conductive traces.
6. Apparatus
4.2 Accelerated testing may be accomplished by increasing
6.1 Closed Environmental System , with temperature and
the voltage over the specified voltages. (Atypical starting point
humidity control (see Practice F1596).
would be 5Vdc 50mA).
6.2 Current-Limiting DC Power Source. (Series current
5. Interferences limiting resistor may be used with dc power supply).
5.1 The following parameters may affect the results of this 6.3 Milliamp Meter (see Test Method F1689).
test:
6.4 Megohm Meter.
5.1.1 Temperature.
6.5 Test Surface, flat, smooth, unyielding, nonporous, and
larger than switch under test.
1
This test method is under the jurisdiction of ASTM Committee F01 on
Electronics, and is the direct responsibility of Subcommittee F01.18 on Membrane
7. Procedure
Switches.
Current edition approved Oct. 1, 2014. Published November 2014. Originally
7.1 Pretest Setup:
approved in 1999. Last previous edition approved in 2006 as F1996–06. DOI:
7.1.1 Testspecimen(s)shallbepermittedtostabilizeat20to
10.1520/F1996-14.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or 25°C and 40 to 60 % relative humidity (RH) for a minimum of
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
24 h.
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. 7.2 Test Setup (Fig. 1):
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
F1996 − 14
FIG. 1 Test Setup
7.2.1 Secure switch on test surface and measure initial 7.4.2 An insulation resistance measurement below specified
insulation resistance between test points and record results. value constitutes a failure of this test.
Protect connector as necessary (see 5.1.5). 7.4.3 If a failure, inspect visually (without magnification)
7.2.2 Orient switch and flex tail in positions that simulate for staining or discoloration.
the end use application positions unless otherwise specified.
The flex tail orientation (bent down, up or back) may differ 8. Report
from the orientation of the switch (horizontal, vertical or
8.1 Report the following information:
angled).
8.1.1 Humidity,
7.2.3
...

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