Test Method for Measurement and Calculation of Reflecting Characteristics of Metallic Surfaces Using Integrating Sphere Instruments (Withdrawn 1996)

General Information

Status
Withdrawn
Publication Date
31-Dec-1990
Withdrawal Date
09-Nov-1996
Technical Committee
Drafting Committee
Current Stage
Ref Project

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ASTM E429-78(1991)E01 - Test Method for Measurement and Calculation of Reflecting Characteristics of Metallic Surfaces Using Integrating Sphere Instruments (Withdrawn 1996)
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Standards Content (Sample)


4STM E429*E1 78 0759510 0079715 7 =
An American National Standard
([lb Designation: E 429 - 78 (Reapproved 1991)E'
AMERICAN SOCIETY FOR TESTING AND MATERIAL
1916 RaceSt Philadelphia, Pa 19103
Reprinted from the Annual Book of ASTM Standards. Copyright ASTM
li not listed in the current combined index, will appear in the next edition.
Standard ~~~t Method for
Measurement and Calculation of Reflecting Characteristics of
Metallic Surfaces Using Integrating Sphere Instruments'
This standard is issued under the fixed designation E 429; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
NOTE-Section 2 was added editorially, and editorial changes were made throughout, in June 1991.
been subjected to buffing: for example, color buffing. This misuse
1. Scope
should be avoided.
1.1 This test method covers measurement of total and
3.1.6 diffuse reflectance (DJ-the ratio of the reflected
diffuse luminous reflectance characteristics of metallic sur-
(luminous) flux, in all directions except that specular direc-
faces. This test method is also applicable to the measurement
tion, to that similarly reflected from an ideal, perfectly
and calculation of specular reflectance ratio, as defined by
reflecting, isotropically diffusing surface.
this test method.
1.2 This test method is limited to specimens having flat,
NOTE 2-In CIE terminology, this is the diffuse luminous reflectance
homogeneous metallic surfaces with or without subsequent
factor.
mechanical, chemical, or electrochemical finishing treat-
3.1.7 diffuse reflectance ratio (DRR)-the ratio of diffuse
ments and coatings. The surface should be free of extraneous
reflectance to total reflectance, multiplied by 100 to provide
and undesirable oils, oxides, and other contaminants.
a scale upon which the diffuse reflectance ratio of an ideal,
1.3 This standard does not purport to address all of the
perfectly reflecting, isotropically diffusing surface is 1 OO.
safety problems, if any, associated with its use. It is the
3.1.8 luminance-the luminous flux per unit solid angle
of the user of this standard to establish appro-
responsibility
and per unit area (measured normal to the direction of
priate ssfety and health practices and determine rhe applica-
propagation of the flux).
bility of regulatory limitations prior to use.
3.1.9 luminous-pertaining to electromagnetic radiation
as perceived by the eye; that is, with the contributions at
2. Referenced Documents
V(X),
wavelengths in the visible region weighted according to
2.1 ASTM Standards:
the spectral luminous efficiency function.
E 259 Practice for Preparation of Reference White Reflec-
3.1.10 reflectance-the ratio of reflected (luminous) flux
tance Standards2
to that reflected from an ideal, perfectly reflecting, isotropi-
E 306 Method for Absolute Calibration of Reflectance
cally diffusing surface when similarly illuminated.
Standards2
NOTE 3-In CIE terminology, this is the luminous reflectance factor.
3. Terminology
3.1.11 total reflectance (TJ-the ratio of the reflected
(luminous) flux, in all directions including specular and
3.1 Definitions:
diffuse, to that similarly reflected from an ideal, perfectly
3.1.1 achromatic-having no hue.
reflecting, isotropically diffusing surface.
3.1.2 angle of reflection-the angle between the axis of a
reflected light beam and a line perpendicular to the specimen
NOTE 4-In CIE terminology, this is the total luminous reflectance
surface.
factor.
3.1.3 brightness-the perceived correlate of the measured
3.1.12 specular reflectance (SJ-the difference between
quantity, luminance.
the total and diffuse reflectances, T, - D,.
3.1.4 CIE-the abbreviation for the French name for the
3.1.13 specular reflectance ratio (SRñ)-the ratio of spec-
International Commission on Illumination.
ular reflectance to total reflectance, multiplied by 100.
3.1.5 color-the aspect of the appearance of an object
dependent upon the spectral composition of the incident
4. Summary of Test Method
light, the spectral reflectance or transmittance of the object,
4.1 This test method employs an integrating-sphere in-
and the spectral response of an observer.
strument to measure the total and diffuse reflected light at
NOTE I-The term color is frequently incorrectly used to define the
angles of incidence near normal. Only achromatic properties
degree of specularity or distinctness of image of metallic surfaces having
of surfaces are measured by this test method.
5. Significance and Use
'This method is under the jurisdiction of ASTM Committee 512 on
Appearance of Materials and is the direct responsibility of Subcommittee E12.03
5.1 This test method is useful in the numerical description
on Infrared Spectroscopy.
of surfaces of metallic materials with or without supplemen-
Current edition approved April 28, 1978. Published June 1978. Originally
tary finishing treatments to describe the surface brightness,
published as E 429 - 71. Last previous edition E 429 - 71.
Annual Book of ASTM Standards, Vol 14.02. specularity, diffusivity, tofal reflectance, and directionality.

9STM E429*E1 78 0759510 0079716 9
PHOTO CELL - CONVERSION ALTER
.* -- --
COMPARISON PHOTO CELL
LENS
O DEG. INCIDENCE FOR DIFFUSED REFLECTANCE
--
MITE COATED INTEGRATING SPHERE
FIG. 1 Schematic Optical Plan of a Pivotable-Sphere Hazemeter.
( ON AXIS POSITION 1
SPHERE
PIVOTED POSITION i
\,u SPECULAR BEAM.
SPHERE IN PIVOT POS.
ENTRANCE PORT
Ø /
‘--/
lN;e,r6} ON AXIS POSITION
EXIT PORT
PIVOTED POSiiION
LIGHT BEAM
BEAM
RECEPTOR 7
APERTURE
\
FILTER,
CON. CON. LENS LENS
SOURCE SOURCE
FIG. 2 Geometry of a Reflectance Hazemeter.
5. This test method is applicable to describing the 7. Apparatus3
appearance charactehtim of many
7.1 Instmments for the masurement of metallic surfaces
materials.
consist of a suitable light source, an integrating sphere, a
5*3 The test method is useful for providing data for
photoelectnc cell, signal multipfier, and recording, indi-
specifications related to appearance of materials and the
cating¶ or computing equipment, The incident light beam is
applicable ranges of reflectance for metallic surfaces.
allowed to fall on the sample with the reflecting light
automatically integrated inside a white coated sphere. The
average light flux, as measured by the photometer, is a
6. Interferences
6.1 The correlatioii between instrumentally derived reflec-
tance characteristics of achromatic metallic surfaces with 31nstniments applicable to this test method are manufactured by Hunter
Associates Laboratories, Fairfax, Va., and Gardner Laboratories, Bethesda, Md.
visual observations has been shown to be satisfactory.
Other instruments may be used when found to give equival
...

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