ASTM E1172-16
(Practice)Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
SIGNIFICANCE AND USE
4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.
4.2 It is understood that a laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should have an idea of the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so they may develop an analytical method which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.
SCOPE
1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be specified.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section 7.
General Information
Buy Standard
Standards Content (Sample)
NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E1172 − 16
Standard Practice for
Describing and Specifying a Wavelength Dispersive X-Ray
1
Spectrometer
This standard is issued under the fixed designation E1172; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope different systems as well as understanding the capabilities and
limitations of each instrument.
1.1 This practice covers the components of a wavelength
dispersive X-ray spectrometer that are basic to its operation
4.2 It is understood that a laboratory may implement this
and to the quality of its performance. It is not the intent of this
practice or an X-ray fluorescence method in partnership with a
practice to specify component tolerances or performance
manufacturer of the analytical instrumentation. If a laboratory
criteria, as these are unique for each instrument. However, the
chooses to consult with an instrument manufacturer, then the
practice does attempt to identify which tolerances are critical
following should be considered.The laboratory should have an
and thus which should be specified.
idea of the alloy matrices to be analyzed, elements and mass
1.2 This standard does not purport to address all of the fraction ranges to be determined, and the expected perfor-
safety concerns, if any, associated with its use. It is the
mance requirements for each of these elements.The laboratory
responsibility of the user of this standard to establish appro-
should inform the instrument manufacturer of these require-
priate safety and health practices and to determine the
ments so they may develop an analytical method which meets
applicability of regulatory limitations prior to use. Specific
the laboratory’s expectations. Typically, instrument manufac-
safetyhazardstatementsaregivenin5.3.1.2and5.3.2.4,andin
turers customize the instrument configuration to satisfy the
Section 7.
end-user’s requirements for elemental coverage, elemental
precision, and detection limits. Instrument manufacturer devel-
2. Referenced Documents
oped analytical methods may include specific parameters for
2
2.1 ASTM Standards: sample excitation, wavelengths, inter-element interference
E135 Terminology Relating to Analytical Chemistry for corrections, calibration and regression, equipment
Metals, Ores, and Related Materials
configuration/installation, and sample preparation require-
E2857 Guide for Validating Analytical Methods
ments. Laboratories should have a basic understanding of the
parameters derived by the manufacturer.
3. Terminology
3.1 For terminology relating to X-ray spectrometry, refer to 5. Description of Equipment
Terminology E135.
5.1 Types of Spectrometers—X-ray spectrometers can be
classified as sequential, simultaneous, or hybrid (see 5.1.3).
4. Significance and Use
5.1.1 Sequential Spectrometers—The sequential spectrom-
4.1 This practice describes the essential components of a
eter disperses and detects secondary X-rays by means of an
wavelength dispersive X-ray spectrometer. This description is
adjustable monochromator called a goniometer. Secondary
presented so that the user or potential user may gain a cursory
X-rays emitted from the specimen pass through a mask that
understanding of the structure of an X-ray spectrometer sys-
defines the viewed region of the specimen. Next, they enter a
tem. It also provides a means for comparing and evaluating
collimator, typically a Soller slit, and nonparallel X-rays are
eliminated by being absorbed by the blades of the collimator.
1
The parallel beam of X-rays strikes an analyzing crystal that
This practice is under the jurisdiction of ASTM Committee E01 on Analytical
Chemistry for Metals, Ores, and Related Materials and is the direct responsibility of
disperses the X-rays according to their wavelengths. The
Subcommittee E01.20 on Fundamental Practices.
dispersed X-rays are measured by suitable detectors, which
Current edition approved June 1, 2016. Published June 2016. Originally
may have an attached collimator in front of the entrance
approved in 1987. Last previous edition approved in 2011 as E1172 – 87(2011).
DOI: 10.1520/E1172-16.
window. Adjustment of the goniometer changes the angle
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
between the specimen, crystal, and detector, permitting the
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
measurement of different wavelengths, and therefore, of dif-
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. ferent elements.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: E1172 − 87 (Reapproved 2011) E1172 − 16
Standard Practice for
Describing and Specifying a Wavelength-Dispersive
1
Wavelength Dispersive X-Ray Spectrometer
This standard is issued under the fixed designation E1172; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This practice covers the components of a wavelength-dispersive wavelength dispersive X-ray spectrometer that are basic to
its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or
performance criteria, as these are unique for each instrument. The document does, however,However, the practice does attempt to
identify which of these tolerances are critical and thus which should be specified.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory
limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section 7.
2
1.3 There are several books and publications from the National Institute of Standards and Technology and the U.S. Government
3,4 5
Printing Office which deal with the subject of X-ray safety. Refer also to Practice E416.
2. Referenced Documents
2
2.1 ASTM Standards:
E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials
E416E2857 Practice for Planning and Safe Operation of a Spectrochemical LaboratoryGuide for Validating Analytical Methods
(Withdrawn 2005)
6
E876 Practice for Use of Statistics in the Evaluation of Spectrometric Data (Withdrawn 2003)
3. Terminology
3.1 For terminology relating to X-ray spectrometry, refer to Terminology E135.
4. Significance and Use
4.1 This practice describes the essential components of a wavelength-dispersive wavelength dispersive X-ray spectrometer. This
description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray
spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the
capabilities and limitations of each instrument.
4.2 It is understood that a laboratory may implement this practice or an X-ray fluorescence method in partnership with a
manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the
following should be considered. The laboratory should have an idea of the alloy matrices to be analyzed, elements and mass
fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should
inform the instrument manufacturer of these requirements so they may develop an analytical method which meets the laboratory’s
1
This practice is under the jurisdiction of ASTM Committee E01 on Analytical Chemistry for Metals, Ores, and Related Materials and is the direct responsibility of
Subcommittee E01.20 on Fundamental Practices.
Current edition approved Nov. 15, 2011June 1, 2016. Published June 2012June 2016. Originally approved in 1987. Last previous edition approved in 20032011 as
E1172 – 87(2003).(2011). DOI: 10.1520/E1172-87R11.10.1520/E1172-16.
2
NBS Handbook, X-Ray Protection, HB76, and NBS Handbook 111, ANSI N43.2-1971, available from National Institute of Standards and Technology, Gaithersburg, MD
20899.
3
Radiation Safety Recommendations for X-Ray Diffraction and Spectrographic Equipment, No. MORP 68-14, 1968, available from U.S. Department of Health, Education,
and Welfare, Rockville, MD 20850.
4
U.S. Government Handbook 93, Safety Standards for Non-Medical X-Ray and Sealed Gamma-Ray Sources, Part 1, General, Superintendent of Documents, available from
U.S. Government Printing Office, Washington, DC 22025.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ---------------------
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.