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CEN/TR 10354:2011

(Main)

Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry

Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry

This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in Ferro Silicon materials.
The method is applicable to:
- Si content between 40 and 90 %;
- Al content between 0,5 and 6 %.
The Technical Report specifies the general requirements for analysis by X-ray fluorescence spectrometry and the preparation of the test sample.
The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines:
- Si Kα 7.126 (for element contents between 45 and 90 %);
- Al Kα 8.339 (for element contents between 0,8 and 6 %);
- Fe Kα 1.937 (for element contents between 10 and 58 %).
NOTE   For matrix matching purposes, iron is included in the analytical program to be prepared.
Within the conditions here above, spectral interferences don’t need to be calculated.

Chemische Analyse von Ferrolegierungen - Analyse von Ferrosilizium - Bestimmung von Si und Al in Ferrolegierungen durch Röntgenfluoreszenzanalyse

Analyse chimique des matériaux ferreux - Analyse du ferro-silicium - Détermination de Si et Al dans le ferro-silicium par spectrométrie de fluorescence de rayons X

Le présent Rapport Technique décrit une méthode par spectrométrie de fluorescence de rayons X pour la
détermination de la teneur en Si et Al des alliages ferro-silicium.
La méthode est applicable aux :
- teneurs en Si comprises entre 40 et 90 % ;
- teneurs en Al comprises entre 0,5 et 6,0 %.
La correction de la mesure spectrométrique pour les interférences spectrales affectant les raies analytiques
utilisées est essentielle. Le présent Rapport Technique n’est applicable que pour les raies analytiques :
- Si Ka 7.126 (pour des teneurs comprises entre 45 et 90 %) ;
- Al Ka 8.339 (pour des teneurs comprises entre 0,8 et 6,0 %) ;
- Fe Ka 1.937 (pour des teneurs comprises entre 10 et 58 %).
NOTE Le fer est inclus dans le programme analytique à mettre en oeuvre pour des raisons d’effets de matrice.
Dans les conditions définies ci-dessus, les interférences spectrales n’ont pas besoin d’être calculées.

Kemična analiza železovih zlitin - Analiza ferosilicija - Določevanje Si in Al v ferosiliciju s fluorescenčno spektrometrijo

To tehnično poročilo opisuje rentgensko fluorescenčno (XRF) spektrometrično metodo za določevanje Si in Al v ferosilikonskih materialih. Ta metoda se uporablja za: vsebnost Si med 40 % in 90 %; vsebnost Al med 0,5 % in 6 %. Korekcija spektrometričnih meritev zaradi spektralnih interferenc na uporabljenih analitičnih linijah je bistvenega pomena. To tehnično poročilo je potrjeno za analitične linije: Si Kα 7.126 (za vsebnost elementa med 45 % in 90 %); Al Kα 8.339 (za vsebnost elementa med 0,8 % in 6 %); Fe Kα 1.937 (za vsebnost elementa med 10 % in 58 %).

General Information

Status
Published
Publication Date
01-Nov-2011
ICS
77.080.10 - Irons
Technical Committee
ECISS/TC 102 - Methods of chemical analysis for iron and steel
Drafting Committee
ECISS/TC 102 - Methods of chemical analysis for iron and steel
Current Stage
6060 - Definitive text made available (DAV) - Publishing
Start Date
02-Nov-2011
Due Date
21-Jul-2012
Completion Date
02-Nov-2011
Ref Project
SIST-TP CEN/TR 10354:2012 - Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST-TP CEN/TR 10354:2012
01-januar-2012
.HPLþQDDQDOL]DåHOH]RYLK]OLWLQ$QDOL]DIHURVLOLFLMD'RORþHYDQMH6LLQ$OY
IHURVLOLFLMXVIOXRUHVFHQþQRVSHNWURPHWULMR
Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and
Al by X-ray fluorescence spectrometry
Chemische Analyse von Ferrolegierungen - Analyse von Ferrosilicium - Bestimmung von
Si und Al in Ferrolegierungen durch Röntgenfluoreszenzanalyse
Analyse chimique des matériaux ferreux - Analyse du ferro-silicium - Détermination de Si
et Al dans le ferro-silicium par spectrométrie de fluorescence de rayons X
Ta slovenski standard je istoveten z: CEN/TR 10354:2011
ICS:
77.040.30 Kemijska analiza kovin Chemical analysis of metals
77.080.10 Železo Irons
SIST-TP CEN/TR 10354:2012 en,fr
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST-TP CEN/TR 10354:2012

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SIST-TP CEN/TR 10354:2012


TECHNICAL REPORT
CEN/TR 10354

RAPPORT TECHNIQUE

TECHNISCHER BERICHT
November 2011
ICS 77.080.10
English Version
Chemical analysis of ferrous materials - Analysis of ferro-silicon
- Determination of Si and Al by X-ray fluorescence spectrometry
Analyse chimique des matériaux ferreux - Analyse du ferro- Chemische Analyse von Ferrolegierungen - Analyse von
silicium - Détermination de Si et Al dans le ferro-silicium Ferrosilizium - Bestimmung von Si und Al in
par spectrométrie de fluorescence de rayons X Ferrolegierungen durch Röntgenfluoreszenzanalyse


This Technical Report was approved by CEN on 24 April 2011. It has been drawn up by the Technical Committee ECISS/TC 102.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.





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COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2011 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN/TR 10354:2011: E
worldwide for CEN national Members.

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SIST-TP CEN/TR 10354:2012
CEN/TR 10354:2011 (E)
Contents Page
Foreword .3
1 Scope .4
2 Principle .4
3 Reagents .5
4 Apparatus .5
5 Safety precautions .5
6 Sampling .5
7 Procedure .6
8 Expression of results .7
9 Precision .7
10 Test report .8
Annex A (informative) Test samples used for the precision test .9
Annex B (informative) Detailed results obtained from the precision test . 10
Annex C (informative) Calibration curve - Preparation of oxide beads with pure metals and/or
oxides . 17
Bibliography .
...

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This Technical Report describes an inductively coupled plasma optical emission spectrometric method for the determination of Al, Ti and P contents in Ferro Silicon materials.
The method is applicable to:
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This Technical Report also describes the general requirements for analysis by inductively coupled plasma optical emission spectrometry, the preparation and dissolution of the test sample and the method of calculation of the results.
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Element   Wavelength (nm)   Interferences
Al   308,22   V
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