EN ISO 11254-1:2000

Lasers and laser-related equipment - Determination of laser-induced damage threshold of optical surfaces - Part 1: 1 on 1 test (ISO 11254-1:2000)

This Standard specifies a test method for determining the single shot laser radiation induced damage threshold of optical surfaces.

Laser und Laseranlagen - Bestimmung der laserinduzierten Zerstörschwelle optischer Oberflächen - Teil 1: 1 auf 1 Prüfung (ISO 11254-1:2000)

Dieser Teil von ISO 11254 legt ein Prüfverfahren fest zur Bestimmung der laserstrahlungsinduzierten Einzelschuß-Zerstörschwelle optischer Oberflächen. Dieses Prüfverfahren ist anwendbar für alle Kombinationen von Laserwellenlängen und Pulsdauern. Trotzdem kann der Vergleich von Zerstörschwellen-Daten irreführend sein, wenn die Messungen nicht bei identischen Wellenlängen, Pulsdauern und Strahldurchmessern durchgeführt wurden. Dieser Teil von ISO 11254 ist vorläufig beschränkt auf die irreversible Beschädigung von optischen Oberflächen.

Lasers et équipements associés aux lasers - Détermination du seuil d'endommagement provoqué par laser sur les surfaces optiques - Partie 1: Essai 1 sur 1 (ISO 11254-1:2000)

La présente partie de l'ISO 11254 spécifie une méthode d'essai de détermination du seuil d'endommagement causé sur les surfaces optiques par un rayonnement laser simple.  Cette procédure d'essai s'applique à toutes les différentes combinaisons de longueur d'onde et de durée d'impulsion de laser. Toutefois, la comparaison des données du seuil d'endommagement peut être erronée, à moins que les mesures aient été effectuées avec une même longueur d'onde, une même durée d'impulsion et un même diamètre de faisceau.  La présente partie de l'ISO 11254 est provisoirement limitée aux dommages irréversibles des surfaces optiques.  
NOTE : Des exemples pour les unités et échelles de seuil d'endommagement causé par laser sont donnés en annexe C.  AVERTISSEMNT - L'extrapolation des données d'endommagement peut conduire à des résultats de calcul erronés et à une surestimation du seuil d'endommagement. Dans le cas des matériaux toxiques (par exemple: ZnSe, GaAs, CdTe, ThF4, chalcogénides, Be, Cr, Ni), cela peut conduire à de sérieux risques pour la santé. Voir en annexe C pour des commentaires supplémentaires.

Laserji in laserska oprema - Ugotavljanje praga poškodbe na optični površini, povzročene z laserjem - 1. del: Preskus 1 na 1 (ISO 11254-1:2000)

General Information

• Status: Withdrawn
• Publication Date: 31-May-2000
• Withdrawal Date: 14-Jul-2011
• ICS: 31.260 - Optoelectronics. Laser equipment
• Technical Committee: CEN/TC 123 - Lasers and photonics
• Drafting Committee: CEN/TC 123 - Lasers and photonics
• Current Stage: 9960 - Withdrawal effective - Withdrawal
• Start Date: 15-Jul-2011
• Completion Date: 15-Jul-2011
• Ref Project: SIST EN ISO 11254-1:2000 - Lasers and laser-related equipment - Determination of laser-induced damage threshold of optical surfaces - Part 1: 1 on 1 test (ISO 11254-1:2000)

Relations

• Replaced By: EN ISO 21254-2:2011 - Lasers and laser-related equipment - Test methods for laser-induced damage threshold - Part 2: Threshold determination (ISO 21254-2:2011)
• Effective Date: 08-Jun-2022
• Replaced By: EN ISO 21254-1:2011 - Lasers and laser-related equipment - Test methods for laser-induced damage threshold - Part 1: Definitions and general principles (ISO 21254-1:2011)
• Effective Date: 08-Jun-2022

Standards Content (Sample)

SLOVENSKI STANDARD
01-november-2000
/DVHUMLLQODVHUVNDRSUHPD8JRWDYOMDQMHSUDJDSRãNRGEHQDRSWLþQLSRYUãLQL
SRY]URþHQH]ODVHUMHPGHO3UHVNXVQD,62
Lasers and laser-related equipment - Determination of laser-induced damage threshold
of optical surfaces - Part 1: 1 on 1 test (ISO 11254-1:2000)
Laser und Laseranlagen - Bestimmung der laserinduzierten Zerstörschwelle optischer
Oberflächen - Teil 1: 1 auf 1 Prüfung (ISO 11254-1:2000)
Lasers et équipements associés aux lasers - Détermination du seuil d'endommagement
provoqué par laser sur les surfaces optiques - Partie 1: Essai 1 sur 1 (ISO 11254-
1:2000)
Ta slovenski standard je istoveten z: EN ISO 11254-1:2000
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

INTERNATIONAL ISO
STANDARD 11254-1
First edition
2000-06-01
Laser and laser-related equipment —
Determination of laser-induced damage
threshold of optical surfaces —
Part 1:
1-on-1 test
Lasers et équipements associés aux lasers — Détermination du seuil
d’endommagement provoqué par laser sur les surfaces optiques —
Partie 1: Essai 1 sur 1
Reference number
ISO 11254-1:2000(E)
©
ISO 2000
ISO 11254-1:2000(E)
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ii © ISO 2000 – All rights reserved

ISO 11254-1:2000(E)
Contents
Foreword.iv
Introduction.v
1 Scope .1
2 Normative references .1
3 Terms and definitions .1
4 Symbols and units.3
5 Sampling.4
6 Test method.4
6.1 Principle.4
6.2 Apparatus .5
6.3 Preparation of test specimens .8
6.4 Procedure .9
7 Evaluation.9
8 Accuracy.10
9 Test report .10
Annex A (informative) Test report example.12
Annex B (informative) Example of a measurement procedure.15
Annex C (informative) Units and scaling of laser-induced damage thresholds .21
Bibliography.22
ISO 11254-1:2000(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO
member bodies). The work of preparing International Standards is normally carried out through ISO technical
committees. Each member body interested in a subject for which a technical committee has been established has
the right to be represented on that committee. International organizations, governmental and non-governmental, in
liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical
Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.
Draft International Standards adopted by the technical committees are circulated to the member bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this part of ISO 11254 may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights.
International Standard ISO 11254-1 was prepared by Technical Committee ISO/TC 172, Optics and optical
instruments, Subcommittee SC 9, Electro-optical systems.
ISO 11254 consists of the following parts, under the general title Laser and laser-related equipment —
Determination of laser-induced damage threshold of optical surfaces:
� Part 1: 1-on-1 test
� Part 2: S-on-1 test
Annexes A, B and C of this part of ISO 11254 are for information only.
iv © ISO 2000 – All rights reserved

ISO 11254-1:2000(E)
Introduction
Optical components can be damaged by laser irradiation of sufficiently high energy or power. At any specified laser
irradiation level, the probability for laser damage is usually higher for the surface of a component than for the bulk.
Thus the limiting value of an optical component is usually given by the damage threshold of its surface.
This part of ISO 11254 describes a standard procedure for determining the laser-induced damage threshold (LIDT)
of optical surfaces, both coated and uncoated. The procedure has been promulgated in order to provide a method
for obtaining consistent measurement results, which may be rapidly and accurately compared among different
testing laboratories. In order to simplify the comparison of laser-damage measurement facilities, laser groups are
defined in this part of ISO 11254.
This part of ISO 11254 is applicable to single-shot testing only (1-on-1 tests). For multi-shot testing (S-on-1) refer to
ISO 11254-2.
INTERNATIONAL STANDARD ISO 11254-1:2000(E)
Laser and laser-related equipment — Determination
of laser-induced damage threshold of optical surfaces —
Part 1:
1-on-1 test
1 Scope
This part of ISO 11254 specifies a test method for determining the single-shot laser radiation-induced damage
threshold (LIDT) of optical surfaces.
This test procedure is applicable to all combinations of different laser wavelengths and pulse lengths. However
comparison of laser damage threshold data may be misleading unless the measurements have been carried out at
identical wavelengths, pulse lengths and beam diameters.
Application of this part of ISO 11254 is provisionally restricted to irreversible damage of optical surfaces.
NOTE Examples of units and scaling of laser-induced damage thresholds are given in annex C.
WARNING — The extrapolation of damage data can lead to inaccurate or wrong calculated results and to
an overestimation of the LIDT. In the case of toxic materials (e.g. ZnSe, GaAs, CdTe, ThF , chalcogenides,
Be, Cr, Ni) this could lead to severe health hazards.
2 Normative references
The following normative documents contain provisions which, through reference in this text, constitute provisions of
this part of ISO 11254. For dated references, subsequent amendments to, or revisions of, any of these publications
do not apply. However, parties to agreements based on this part of ISO 11254 are encouraged to investigate the
possibility of applying the most recent editions of the normative documents indicated below. For undated
references, the latest edition of the normative document referred to applies. Members of ISO and IEC maintain
registers of currently valid International Standards.
ISO 10110-7:1996, Optics and optical instruments — Preparation of drawings for optical elements and systems —
Part 7: Surface imperfection tolerances.
ISO 11145:1994, Optics and optical instruments — Lasers and laser-related equipment — Vocabulary and
symbols.
3 Terms and definitions
For the purposes of this part of ISO 11254, the terms and definitions given in ISO 11145 and the following apply.
3.1
surface damage
any permanent laser radiation-induced change of the surface characteristics of the specimen which can be
observed by an inspection technique described within this part of ISO 11254
ISO 11254-1:2000(E)
3.2
1-on-1 test
test programme that uses one shot of laser radiation on each unexposed site on the specimen surface
3.3
threshold
highest quantity of laser radiation incident upon the optical surface for which the extrapolated probability of damage
is zero
NOTE The quantity of laser radiation may be expressed as energy density H or power density E (see annex C).
max max
3.4
target plane
plane tangential to the surface of the specimen at the point of intersection of the test laser beam axis with the
surface of the specimen
3.5
effective area
A
T,eff
ratio of power [pulse energy] to maximum power [energy] density
NOTE 1 For spatial beam profiling perpendicular to the direction of beam propagation and angles of incidence differing from
0 rad, the cosine of the angle of incidence is included in the calculation of the effective area. In this case, the effective area may
be approximated by the following formulae:
Q
A � (1)
T,eff
H cos(� )
max
P
A � (2)
T,eff
E cos()�
max
NOTE 2 For the special case of a circular flat-top beam profile with diameter d , the effective area is given by:
Q Hd� 1
max 100 2
A �� � �d (3)
T,eff 100
H 4H 4
max max
For a focused Gaussian beam (circular beam) with a beam diameter d86,5, the effectiveareaisgiven by:
xy�
� 8
��
d
86,5
8r
Hxeddy
max �
�� �
d
Q 1
���� 86,5 2
Ae�� �2d�rr��d (4)
T,eff 86,5
�
HH 8
max max
With the definition of the second moment of the energy density distribution function H(x,y,z) at the location z,
� 2�
rH(,r��)r ddr
z z
2 0 0
� ()z � (5)
� 2�
Hr(,��)rddr
z z
0 0
and the definition of the beam diameter d as a function of the second moment
�
dz()�22�()z (6)
�
2 © ISO 2000 – All rights reserved

ISO 11254-1:2000(E)
theeffective area canbeexpressedinthefollowingforms:
1 1
22 2
a) flat-top beam: Ad����d� 2��;(d�d 7)
T,eff 100��100
4 4
1 1
22 2
b) Gaussian beam: Ad����d��� ;d�d (8)
T,eff 86,5��
86,5
8 8
3.6
effective beam diameter
d
T,eff
double the square root of the effective area divided by the factor pi
A
T,eff
d � 2 (9)
T,eff
�
3.7
effective pulse duration
ratio of total pulse energy to maximum pulse power
4 Symbols and units
Table 1 — Symbols and units of measurement
Symbol Unit Term
nm wavelength
�
� rad angle of incidence
p
degree of polarization
d mm beam diameter in the target plane
T
d mm effective beam diameter in target plane
T,eff
A cm effective area in the target plane
T,eff
t
ns, μs, s pulse duration
H
t
ns, μs, s effective pulse duration (see 6.2.6.2)
eff
Q
J pulse energy
P
W peak pulse power
pk
P
W power
H J/cm maximum energy density
max
E
W/cm maximum power density
max
H
J/cm threshold energy density
th
E W/cm threshold power density
th
F W/cm threshold linear power density
th
N total number of sites for the test
TS
ISO 11254-1:2000(E)
5 Sampling
Either a functional component or a witness specimen shall be tested. If a witness specimen is tested, the subs
...