EN ISO 5436-1:2000

Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures (ISO 5436-1:2000)

Migrated from Progress Sheet (TC Comment) (2000-07-10): !! Publication stage : check German title (see part 2)

Geometrische Produktspezifikationen (GPS) - Oberflächenbeschaffenheit: Tastschnittverfahren; Normale - Teil 1: Maßverkörperungen (ISO 5436-1:2000)

Dieser Teil von ISO 5436 legt die Eigenschaften von Maßverkörperungen fest, die als Normale (Etalons) zur Kalibrierung von messtechnischen Eigenschaften der Messgeräte zur Messung von Oberflächenstrukturen nach dem Tastschnitt-Verfahren nach ISO 3274 benutzt werden.

Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil; Etalons - Partie 1: Mesures matérialisées (ISO 5436-1:2000)

La présente partie de l'ISO 5436 spécifie les caractéristiques des mesures matérialisées utilisées comme étalons pour l'étalonnage des caractéristiques métrologiques des instruments de mesure d'état de surface par la méthode du profil, comme défini dans l'ISO 3274.

Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures (ISO 5436-1:2000)

General Information

• Status: Published
• Publication Date: 14-Mar-2000
• ICS: 17.040.30 - Measuring instruments
• Technical Committee: CEN/TC 290 - Dimensional and geometrical product specification and verification
• Drafting Committee: CEN/TC 290 - Dimensional and geometrical product specification and verification
• Current Stage: 9093 - Decision to confirm - Review Enquiry
• Start Date: 10-Jul-2008
• Completion Date: 10-Jul-2008
• Ref Project: SIST EN ISO 5436-1:2000 - Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures (ISO 5436-1:2000)

Overview

EN ISO 5436-1:2000 is a Geometrical Product Specification (GPS) standard that defines material measurement standards for calibrating instruments that measure surface texture using the profile method (stylus/profilometer techniques). Part 1 (Material measures) specifies design, types and metrological characteristics of physical standards used to validate vertical and horizontal profile components, stylus tip condition, spacing and roughness, and the profile coordinate system.

Key topics and technical requirements

• Scope & purpose
  • Calibration of metrological characteristics of profile-based surface texture instruments (see ISO 3274).
  • Provides traceable, standardized measurement standards (formerly “calibration specimens”).
• Design requirements
  • Material must be hard and stable with sufficiently smooth, flat surfaces to avoid influencing evaluations.
  • Measurement window size must cover traverse lengths required for intended calibrations.
• Types of measurement standards (A–E)
  • Type A - Depth: Wide grooves with flat (A1) or rounded (A2) bottoms for vertical-profile calibration and depth checks.
  • Type B - Tip condition: Narrow grooves, paired-pattern grooves, or fine edges (B1, B2, B3) to assess stylus tip shape/condition.
  • Type C - Spacing: Repetitive groove grids (sinusoidal/triangular/arcuate) for spacing/transmission checks.
  • Type D - Roughness: Irregular profiles (unidirectional or circular, D1/D2) for overall instrument calibration and averaging checks.
  • Type E - Profile coordinate: Precision spheres/hemispheres or trapezoidal prism forms (E1/E2) to calibrate the instrument’s profile coordinate system.
• Metrological aspects
  • Characteristics, measurands, and certification of standards (including measurement uncertainty guidance) are defined.
  • A measurement standard certificate is required for traceability.

Practical applications and users

• Who uses EN ISO 5436-1:
  • Calibration and metrology laboratories, instrument manufacturers (profilometers/stylus instruments), quality engineers, production inspection teams, and research labs.
• Typical applications:
  • Calibrating vertical/horizontal response of profilometers.
  • Verifying stylus tip condition and its effect on measured profiles.
  • Checking instrument transmission for various groove spacings and amplitudes.
  • Performing final overall checks of surface-roughness measurement chains and validating coordinate systems for accurate profile location.
• Benefits:
  • Improves instrument traceability, repeatability and comparability of surface texture measurements across labs and production sites.

Related standards

• ISO 5436-2 (Software measurement standards)
• ISO 3274, ISO 4287, ISO 4288, ISO 12085
• ISO/TS 14253-2; ISO 10012-1; VIM and GUM guidance on uncertainty

Keywords: ISO 5436-1, EN ISO 5436-1:2000, surface texture, profile method, measurement standards, GPS, profilometer calibration, stylus instrument calibration, roughness standards.

Standards Content (Sample)

SLOVENSKI STANDARD
01-december-2000
Geometrical Product Specifications (GPS) - Surface texture: Profile method;
Measurement standards - Part 1: Material measures (ISO 5436-1:2000)
Geometrical Product Specifications (GPS) - Surface texture: Profile method;
Measurement standards - Part 1: Material measures (ISO 5436-1:2000)
Geometrische Produktspezifikationen (GPS) - Oberflächenbeschaffenheit:
Tastschnittverfahren; Normale - Teil 1: Maßverkörperungen (ISO 5436-1:2000)
Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil;
Etalons - Partie 1: Mesures matérialisées (ISO 5436-1:2000)
Ta slovenski standard je istoveten z: EN ISO 5436-1:2000
ICS:
17.040.30 Merila Measuring instruments
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

INTERNATIONAL ISO
STANDARD 5436-1
First edition
2000-03-15
Geometrical Product Specifications
(GPS) — Surface texture: Profile method;
Measurement standards —
Part 1:
Material measures
Spécification géométrique des produits (GPS) — État de surface: Méthode
du profil; Étalons —
Partie 1: Mesures matérialisées
Reference number
ISO 5436-1:2000(E)
©
ISO 2000
ISO 5436-1:2000(E)
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ii © ISO 2000 – All rights reserved

ISO 5436-1:2000(E)
Contents Page
1 Scope .1
2 Normative references .1
3 Terms and definitions .1
4 Design requirements .2
4.1 Material .2
4.2 Size of measurement standard.2
5 Types, purposes and metrological characteristics of measurement standards .2
5.1 General.2
5.2 Type A — Depth measurement standard .2
5.3 Type B — Tip condition measurement standard.3
5.4 Type C — Spacing measurement standard .3
5.5 Type D — Roughness measurement standard.3
5.6 Type E — Profile coordinate measurement standard.4
6 Measurement standard requirements .4
6.1 Type A — Depth measurement standard .4
6.2 Type B — Tip condition measurement standard.5
6.3 Type C — Spacing measurement standard .6
6.4 Type D — Roughness measurement standard.7
6.5 Type E — Profile coordinate measurement standard.8
7 Definition of the measurands for the measurement standards .9
7.1 Type A1 .9
7.2 Type A2 .10
7.3 Type B2 .10
7.4 Type B3 .10
7.5 Types C1 to C4, and D.11
7.6 Type E1 .11
7.7 Type E2 .11
8 Measurement standard certificate .12
Annex A (informative) Relation to the GPS matrix model.13
Bibliography.14
ISO 5436-1:2000(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO
member bodies). The work of preparing International Standards is normally carried out through ISO technical
committees. Each member body interested in a subject for which a technical committee has been established has
the right to be represented on that committee. International organizations, governmental and non-governmental, in
liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical
Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.
Draft International Standards adopted by the technical committees are circulated to the member bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this part of ISO 5436 may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
International Standard ISO 5436-1 was prepared by Technical Committee ISO/TC 213, Dimensional and
geometrical product specifications and verification.
This first edition of ISO 5436-1, together with ISO 5436-2, cancels and replaces (ISO 5436:1985), which has been
technically revised.
ISO 5436 consists of the following parts, under the general title Geometrical Product Specifications (GPS) —
Surface texture: Profile method; Measurement standards:
� Part 1: Material measures
� Part 2: Software measurement standards
Annex A of this part of ISO 5436 is for information only.
iv © ISO 2000 – All rights reserved

ISO 5436-1:2000(E)
Introduction
This part of ISO 5436 is a geometrical product specification (GPS) standard and is to be regarded as a general
GPS standard (see ISO/TR 14638). It influences chain link 6 of the chain of standards on roughness, waviness and
primary profile.
For more detailed information of the relation of this part of ISO 5436 to the GPS matrix model, see annex A.
This part of ISO 5436 introduces a new measurement standard, namely Type E, to calibrate the profile co-ordinate
system.
NOTE "Measurement standards" were formerly referred to as "calibration specimens".
INTERNATIONAL STANDARD ISO 5436-1:2000(E)
Geometrical Product Specifications (GPS) — Surface texture:
Profile method; Measurement standards —
Part 1:
Material measures
1 Scope
This part of ISO 5436 specifies the characteristics of material measures used as measurement standards (etalons)
for the calibration of metrological characteristics of instruments for the measurement of surface texture by the
profile method as defined in ISO 3274.
2 Normative references
The following normative documents contain provisions which, through reference in this text, constitute provisions of
this part of ISO 5436. For dated references, subsequent amendments to, or revisions of, any of these publications
do not apply. However, parties to agreements based on this part of ISO 5436 are encouraged to investigate the
possibility of applying the most recent editions of the normative documents indicated below. For undated
references, the latest edition of the normative document referred to applies. Members of ISO and IEC maintain
registers of currently valid International Standards.
ISO 3274:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal
characteristics of contact (stylus) instruments.
ISO 4287:1997, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions
and surface texture parameters.
ISO 4288:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and
procedures for the assessment of surface texture.
ISO 10012-1:1992, Quality assurance requirements for measuring equipment — Part 1: Metrological confirmation
system for measuring equipment.
ISO 12085:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif parameters.
ISO/TS 14253-2:1999, Geometrical Product Specifications (GPS) — Inspection by measurement of workpieces
and measuring equipment — Part 2: Guide to the estimation of uncertainty in GPS measurement, in calibration of
measuring equipment and in product verification.
BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML. International vocabulary of basic and general terms used in
metrology (VIM), 1993.
BIPM,IEC IFCC,ISO,IUPAC,IUPAP,OIML. Guide to the expression of uncertainty in measurement (GUM), 1993.
3 Terms and definitions
For the purposes of this part of ISO 5436, the terms and definitions given in ISO 3274, ISO 4287 and VIM apply.
ISO 5436-1:2000(E)
4 Design requirements
4.1 Material
The material used for measurement standards A to E shall be hard enough to ensure adequate life in relation to
cost (manufacturing and calibration). Its surface shall be smooth and flat enough not to affect the evaluation.
4.2 Size of measurement standard
The measurement window shall be large enough to provide for the total length of traverse required for all intended
determinations. The measurement window consists of that region of the total surface over which calibration
measurements are made. One or more kinds of measurement standards may be provided on a single block. To
ensure the best possible economic conditions, overall dimensions of measurement standards are not given.
5 Types, purposes and metrological characteristics of measurement standards
5.1 General
The calibration of the existing wide range of instruments in all modes of operation calls for more than one type of
measurement standard. Each measurement standard may have a limited range of application according to its own
characteristics and those of the instrument to be calibrated. The validity of the calibration of an instrument will be
dependent on the correct association of these characteristics.
To cover the range of requirements, five types of measurement standards are described, each of which may have a
number of variants (see Table 1).
Table 1 — Types and names of measurement standards
Type Name
A Depth measurement standard
B Tip condition measurement standard
C Spacing measurement standard
D Roughness measurement standard
E Profile coordinate measurement standard
5.2 Type A — Depth measurement standard
These measurement standards are for calibrating the vertical profile component of stylus instruments.
5.2.1 Type A1 — Wide grooves with flat bottoms
These measurement standards have a wide calibrated groove with a flat bottom, a ridge with a flat top, or a number
of such separated features of equal or increasing depth or height. Each feature is wide enough to be insensitive to
the shape or condition of the stylus tip (see Figure 1).
5.2.2 Type A2 — Wide grooves with rounded bottoms
These measurement standards are similar to type A1, except that the grooves have rounded bottoms of sufficient
radius to be insensitive to the shape or condition of the stylus tip (see Figure 2).
2 © ISO 2000 – All rights reserved

ISO 5436-1:2000(E)
5.3 Type B — Tip condition measurement standard
These measurement standards are primarily for calibrating the condition of the stylus tip.
5.3.1 Type B1
These measurement standards have a narrow groove or a number of separated grooves proportioned to be
increasingly sensitive to the dimensions of the stylus tip. The narrow grooves have rounded bottoms of sufficient
radius to be sensitive to the shape or condition of the stylus tip.
5.3.2 Type B2
These measurement standards have two groove patterns of nominally equal Ra values, one being sensitive and the
other insensitive to the dimensions of the stylus tip (see Figures 3 and 4).
5.3.3 Type B3
These measurement standards have a fine protruding edge. Uncoated razor blades, for example, have edge
widths of approximately 0,1 μm or less. The stylus condition may be assessed by traversing such a specimen and
recording the surface profile.
5.4 Type C — Spacing measurement standard
These measurement standards are used primarily for calibrating vertical profile components. They may also be
used for calibrating horizontal profile components if the spacing of the groves is held within limits acceptable for this
purpose. The purpose of the series of measurement standards is to enable the transm
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