EN ISO 14880-4:2006
(Main)Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006)
Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006)
ISO 14880-4:2006 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.
Optik und Photonik - Mikrolinsenarrays - Teil 4: Prüfverfahren für geometrische Eigenschaften (ISO 14880-4:2006)
Dieser Teil der ISO 14880 Norm legt Verfahren zum Prüfen der geometrischen Eigenschaften von Mikrolinsen in Mikrolinsenarrays fest. Die Norm gilt für Mikrolinsenarrays mit sehr kleinen Linsen, die auf einer oder mehreren Oberflächen eines gemeinsamen Substrats angeordnet sind, und für Gradientenindex-Mikrolinsen.
Optique et photonique - Réseaux de microlentilles - Partie 4: Méthodes d'essai pour les propriétés géométriques (ISO 14880-4:2006)
L'ISO 14880-4:2006 spécifie des méthodes d'essai pour les propriétés géométriques des microlentilles dans les réseaux de microlentilles. Elle s'applique aux réseaux de microlentilles avec de très petites lentilles qui composent une ou plusieurs surfaces d'un substrat commun et aux microlentilles à gradient d'indice.
Optika in fotonska tehnologija - Vrste mikroleč - 4. del: Preskusne metode za geometrične lastnosti (ISO 14880-4:2006)
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Standards Content (Sample)
SLOVENSKI STANDARD
01-julij-2006
2SWLNDLQIRWRQVNDWHKQRORJLMD9UVWHPLNUROHþGHO 3UHVNXVQHPHWRGH]D
JHRPHWULþQHODVWQRVWL ,62
Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
(ISO 14880-4:2006)
Optik und Photonik - Mikrolinsenarrays - Teil 4: Prüfverfahren für geometrische
Eigenschaften (ISO 14880-4:2006)
Optique et photonique - Réseaux de microlentilles - Partie 4: Méthodes d'essai pour les
propriétés géométriques (ISO 14880-4:2006)
Ta slovenski standard je istoveten z: EN ISO 14880-4:2006
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN ISO 14880-4
NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2006
ICS 31.260
English Version
Optics and photonics - Microlens arrays - Part 4: Test methods
for geometrical properties (ISO 14880-4:2006)
Optique et photonique - Réseaux de microlentilles - Partie Optik und Photonik - Mikrolinsenarrays - Teil 4:
4: Méthodes d'essai pour les propriétés géométriques (ISO Prüfverfahren für geometrische Eigenschaften (ISO 14880-
14880-4:2006) 4:2006)
This European Standard was approved by CEN on 3 May 2006.
CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national
standards may be obtained on application to the Central Secretariat or to any CEN member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
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© 2006 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 14880-4:2006: E
worldwide for CEN national Members.
Foreword
This document (EN ISO 14880-4:2006) has been prepared by Technical Committee ISO/TC 172
"Optics and optical instruments" in collaboration with Technical Committee CEN/TC 123 "Lasers
and photonics ", the secretariat of which is held by DIN.
This European Standard shall be given the status of a national standard, either by publication of
an identical text or by endorsement, at the latest by December 2006, and conflicting national
standards shall be withdrawn at the latest by December 2006.
According to the CEN/CENELEC Internal Regulations, the national standards organizations of
the following countries are bound to implement this European Standard: Austria, Belgium,
Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary,
Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.
Endorsement notice
The text of ISO 14880-4:2006 has been approved by CEN as EN ISO 14880-4:2006 without any
modifications.
INTERNATIONAL ISO
STANDARD 14880-4
First edition
2006-06-01
Optics and photonics — Microlens
arrays —
Part 4:
Test methods for geometrical properties
Optique et photonique — Réseaux de microlentilles —
Partie 4: Méthodes d'essai pour les propriétés géométriques
Reference number
ISO 14880-4:2006(E)
©
ISO 2006
ISO 14880-4:2006(E)
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ii © ISO 2006 – All rights reserved
ISO 14880-4:2006(E)
Contents Page
Foreword. iv
Introduction . v
1 Scope . 1
2 Normative references . 1
3 Terms, definitions and symbols. 1
4 Coordinate system. 3
5 Test methods. 4
5.1 Pitch and surface modulation depth measurement . 4
5.2 Physical thickness. 9
5.3 Radius of curvature . 9
5.4 Surface preparation of microlens array for measurement . 12
6 Procedure . 13
6.1 Measurement of pitch and surface modulation depth (lens sag) . 13
6.2 Measurement of physical thickness . 13
6.3 Measurement of radius of curvature. 13
7 Results and uncertainties . 13
8 Test report . 14
Annex A (normative) Measurement with a Fizeau interferometer system . 16
Annex B (informative) Uniformity of array spacing . 19
Bibliography . 22
ISO 14880-4:2006(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 14880-4 was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 9,
Electro-optical systems.
ISO 14880 consists of the following parts, under the general title Optics and photonics — Microlens arrays:
⎯ Part 1: Vocabulary
⎯ Part 2: Test methods for wavefront aberrations
⎯ Part 3: Test methods for optical properties other than wavefront aberrations
⎯ Part 4: Test methods for geometrical properties
iv © ISO 2006 – All rights reserved
ISO 14880-4:2006(E)
Introduction
This part of ISO 14880 specifies methods for testing geometrical properties of microlens arrays. Examples of
applications for microlens arrays include three-dimensional displays, coupling optics associated with arrayed
light sources and photo-detectors, enhanced optics for liquid crystal displays, and optical parallel processor
elements.
The market in microlens arrays has generated a need for agreement on basic terminology and test methods.
Standard terminology and clear definitions are needed not only to promote applications but also to encourage
scientists and engineers to exchange ideas and new concepts based on common understanding.
This part of ISO 14880 contributes to the purpose of the series of ISO 14880 standards, which is to improve
the compatibility and interchangeability of lens arrays from different suppliers and to enhance development of
the technology using microlens arrays.
The measurement of physical characteristics of pitch and surface modulation depth can be made using a
stylus instrument and non-contact optical probe system. Physical thickness can be measured with a
micrometer. The measurement processes are described in the body of this part of ISO 14880.
INTERNATIONAL STANDARD ISO 14880-4:2006(E)
Optics and photonics — Microlens arrays —
Part 4:
Test methods for geometrical properties
1 Scope
This part of ISO 14880 specifies methods for testing geometrical properties of microlenses in microlens arrays.
It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common
substrate and to graded index microlenses.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO 14880-1, Optics and photonics — Microlens arrays — Part 1. Vocabulary
3 Terms, definitions and symbols
For the purposes of this document, the terms, definitions given in ISO 14880-1 and the following apply.
NOTE 1 The symbols adopted for this part of ISO 14880 are chosen for clarity in this application to microlens arrays
but some may not be those commonly used for surface texture measurement.
NOTE 2 The parameters P , P and h are used in this part of ISO 14880 to describe geometrical parameters
x y
encountered in the measurement of surface texture. P , P are spacing parameters and are defined as the average value
x y
of the length of the mean line section containing a profile peak and adjacent valley. An amplitude parameter, h, is defined
as the average difference between peak of the lens profile and the rim. Figure 1 illustrates the geometrical properties of
microlens arrays which are to be measured.
3.1
pitch
P , P
x y
distance between the centres of adjacent lenses which may vary across and will vary with direction
See Figure 1.
NOTE 1 The pitch is expressed in millimetres.
[ISO 14880-1:2001, term 6.2.1.5]
NOTE 2 For a stylus instrument this will generally equate to the mean width of the profile elements calculated from the
roughness profile, RS (see 3.2.2 and 4.3.1 in ISO 4287:1997).
m
ISO 14880-4:2006(E)
3.2
surface modulation depth
h
peak-to-valley variation of the surface height
See Figure 1.
NOTE 1 For a purely refractive microlens, this will be the same as the lens sag.
NOTE 2 The surface modulation depth is expressed in millimetres.
[ISO 14880-1:2001, term 6.2.1.8]
NOTE 3 For stylus instruments this will generally equate to Rz (see 4.1.3 in ISO 4287:1997).
3.3
physical thickness
T
c
maximum local thickness of the array
See Figure 1.
NOTE The physical thickness is expressed in millimetres.
[ISO 14880-1:2001; term 6.2.1.9]
3.4
radius of curvature
R
c
distance from the vertex of the microlens to the centre of curvature of the lens surface
See Figure 1.
NOTE 1 The radius of curvature is expressed in millimetres.
[ISO 14880-1:2001;
...
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