Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

Metallische Überzüge - Messung der Schichtdicke - Verfahren mit Rasterelektronenmikroskop (ISO 9220:1988)

Diese Internationale Norm legt ein Verfahren zur Messung der örtlichen Dicke metallischer Überzüge fest, in dem Querschnitte mit einem Rasterelektronenmikroskop (REM) untersucht werden. Es handelt sich um ein zerstörendes Verfahren, das eine Messunsicherheit von weniger als 10 % oder 0,1 micro m hat. Dieses Verfahren kann für Schichtdicken bis zu mehreren Millimetern verwendet werden, es ist jedoch im allgemeinen zweckmässiger, hierfür ein Lichtmikroskop (ISO 1463) anzuwenden, sofern das möglich ist.

Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage (ISO 9220:1988)

La présente Norme internationale prescrit une méthode pour le mesurage de l'épaisseur locale des revêtements métalliques par examen de coupes transversales au microscope électronique à balayage. La méthode est destructive et a une incertitude correspondant à la plus grande des deux valeurs 10 % ou 0,1 µm. Elle est utilisable pour des épaisseurs pouvant atteindre plusieurs millimètres, mais il est habituellement plus pratique, si cela est possible, d'utiliser un microscope optique (ISO 1463).

Kovinske prevleke - Merjenje debeline prevleke - Postopek z vrstičnim elektronskim mikroskopom (ISO 9220:1988)

General Information

Status
Withdrawn
Publication Date
27-Oct-1994
Withdrawal Date
22-Feb-2022
Current Stage
9960 - Withdrawal effective - Withdrawal
Completion Date
23-Feb-2022

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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.þQLPMetallische Überzüge - Messung der Schichtdicke - Verfahren mit Rasterelektronenmikroskop (ISO 9220:1988)Revetements métalliques - Mesurage de l'épaisseur de revetement - Méthode au microscope électronique a balayage (ISO 9220:1988)Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)25.220.40Kovinske prevlekeMetallic coatings17.040.20Lastnosti površinProperties of surfacesICS:Ta slovenski standard je istoveten z:EN ISO 9220:1994SIST EN ISO 9220:1999en01-oktober-1999SIST EN ISO 9220:1999SLOVENSKI
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SIST EN ISO 9220:1999



SIST EN ISO 9220:1999



SIST EN ISO 9220:1999



SIST EN ISO 9220:1999



SIST EN ISO 9220:1999



INTERNATIONAL STANDARD INTERNATIONAL ORGANIZATION FOR STANDARDIZATION ORGANISATION INTERNATIONALE DE NORMALISATION MEX)JYHAPOaHAfl OPTAHM3A~Mfl IlO CTAHJJAPTM3A~MM Metallic coatings - Measurement of coating thickness - Scanning electron microscope method Rev& temen ts rnt5 talliques - Mesurage de f%paisseur de revetement - M&bode au microscope &ectronique h bala yage IS0 9220 First edition 1988-10-01 Reference number IS0 9220 : 1988 (E) SIST EN ISO 9220:1999



IS0 9220 : 1988 (E) Foreword IS0 (the International Organization for Standardization) is a worldwide federation of national standards bodies (IS0 member bodies). The work of preparing International Standards is normally carried out through IS0 technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, govern- mental and non-governmental, in liaison with ISO, also take part in the work. IS0 collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. Draft International Standards adopted by the technical committees are circulated to the member bodies for approval before their acceptance as International Standards by the IS0 Council. They are approved in accordance with IS0 procedures requiring at least 75 % approval by the member bodies voting. International Standard IS0 9220 was prepared by Technical Committee ISO/TC 107, Metallic and other inorganic coatings. Annex A of this International Standard is for information only. 0 International Organization for Standardization, 1988 Printed in Switzerland SIST EN ISO 9220:1999



INTERNATIONAL STANDARD IS0 9220 : 1988 (E) Metallic coatings - Measurement of coating thickness - Scanning electron microscope method 1 Scope This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron micro- scope (SEM). It is destructive and has an uncertainty of less than 10 96 or 0,l pm, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a light microscope (IS0 1463) when applicable. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the standards listed below. Members of IEC and IS0 maintain registers of currently valid International Standards. I SO 1463 : 1982, Metallic and oxide coatings - Measurement of coating thickness - Microscopical method. IS0 2064 : 1980, Metallic and other non-organic coatings - Definitions and conventions concerning the measurement of thickness. 3 Definition For the purposes of this International Standard, the following definition applies. local thickness: The mean of the thickness measurements, of which a specified number is made within a reference area. (See IS0 2064.) 4 Principle A test specimen is cut, ground, and polished from a cross- section of the coating for metallographic examination by a scanning electron microscope. The measurement is made on a conventional micrograph or on a photograph of the video waveform signal for a single scan across the coating. 5 Instrumentation 5.1 Scanning electron microscope (SEM) The SEM shall have a resolution capability of 50 nm or better. Suitable instruments are available commercially. 5.2 SEM stage micrometer A stage micrometer or graticule is required for calibration of the magnification of the SEM. The stage micrometer or graticule shall have an uncertainty of less than 5 % for the magnification employed. Suitable stage micrometers or graticules are available commercially. 6 Factors influencing the measurement results The following factors may affect the accuracy of a measure- ment of coating thickness. 6.1 Surface roughness If the coa
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