EN 62024-1:2008
(Main)High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
Specifies electrical characteristics and measuring methods for the nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range. This edition includes the following significant technical changes with respect to the previous edition: a) sizes 0402 added in Table 1 and Table 2; b) contents of 4.4 reviewed for easier understanding; c) correct errors in 3.1.4.2. The contents of the corrigendum of July 2008 have been included in this copy.
Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden - Teil 1: Chipinduktivitäten im Nanohenry-Bereich
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure - Partie 1: Inductance à puce de l'ordre du nanohenry
La CEI 62024-1:2008 spécifie les caractéristiques électriques et les méthodes de mesure pour l'inductance pastille de l'ordre du nanohenry qui est normalement utilisée dans la gamme des hautes fréquences (supérieures à 100 kHz). Par rapport à l'édition précédente, les principales modifications techniques sont les suivantes: a) tailles 0402 ajoutées dans le Tableau 1 et le Tableau 2; b) contenu de 4.4 révisé pour en faciliter la compréhension; c) erreurs de 3.1.4.2 corrigées.
Visokofrekvenčne induktivne komponente - Električne karakteristike in merilne metode - 1. del: Čipni induktor v območju nanohenrijev (IEC 62024-1:2008)
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Standards Content (Sample)
SLOVENSKI STANDARD
01-julij-2008
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SIST EN 62024-1:2004
9LVRNRIUHNYHQþQHLQGXNWLYQHNRPSRQHQWH(OHNWULþQHNDUDNWHULVWLNHLQPHULOQH
PHWRGHGHO ýLSQLLQGXNWRUYREPRþMXQDQRKHQULMHY ,(&
High frequency inductive components - Electrical characteristics and measuring methods
- Part 1: Nanohenry range chip inductor (IEC 62024-1:2008)
Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden -
Teil 1: Chipinduktivitäten im Nanohenry-Bereich (IEC 62024-1:2008)
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de
mesure - Partie 1: Inductance à puce de l'ordre du nanohenry (CEI 62024-1:2008)
Ta slovenski standard je istoveten z: EN 62024-1:2008
ICS:
29.100.10 Magnetne komponente Magnetic components
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 62024-1
NORME EUROPÉENNE
May 2008
EUROPÄISCHE NORM
ICS 29.100.10 Supersedes EN 62024-1:2002
English version
High frequency inductive components -
Electrical characteristics and measuring methods -
Part 1: Nanohenry range chip inductor
(IEC 62024-1:2008)
Composants inductifs à haute fréquence - Induktive Hochfrequenz-Bauelemente -
Caractéristiques électriques Elektrische Eigenschaften
et méthodes de mesure - und Messmethoden -
Partie 1: Inductance à puce Teil 1: Chipinduktivitäten
de l'ordre du nanohenry im Nanohenry-Bereich
(CEI 62024-1:2008) (IEC 62024-1:2008)
This European Standard was approved by CENELEC on 2008-03-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in two official versions (English and German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62024-1:2008 E
Foreword
The text of document 51/908/FDIS, future edition 2 of IEC 62024-1, prepared by IEC TC 51, Magnetic
components and ferrite materials, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 62024-1 on 2008-03-01.
This European Standard supersedes EN 62024-1:2002.
– size 0402 added in Table 1 and Table 2;
– contents of 4.4 reviewed for easier understanding;
– errors in 3.1.4.2 corrected.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2008-12-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2011-03-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62024-1:2008 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 62024-1:2008
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1) 2)
IEC 61249-2-7 - Materials for printed boards and other EN 61249-2-7 2002
interconnecting structures - + corr. September 2005
Part 2-7: Reinforced base materials, clad and
unclad - Epoxide woven E-glass laminated
sheet of defined flammability (vertical burning
test) copper-clad
1)
ISO 6353-3 - Reagents for chemical analysis - - -
Part 3: Specifications - Second series
1)
ISO 9453 - Soft solder alloys - Chemical compositions - -
and forms
1)
Undated reference.
2)
Valid edition at date of issue.
IEC 62024-1
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 29.100.10 ISBN 2-8318-9631-2
– 2 – 62024-1 © IEC:2008(E)
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Inductance, Q-factor and impedance .6
3.1 Inductance .6
3.1.1 Measuring circuit .7
3.1.2 Mounting of the inductor to the test fixture .7
3.1.3 Measurement method and calculation.9
3.1.4 Notes on measurement.9
3.2 Quality factor.10
3.2.1 Measurement method .10
3.2.2 Measurement circuit .11
3.2.3 Mounting of the inductor .11
3.2.4 Methods of measurement and calculation .11
3.2.5 Notes on measurement.11
3.3 Impedance .11
3.3.1 Measurement method .11
3.3.2 Measurement circuit .11
3.3.3 Measurement method and calculation.11
3.3.4 Notes on measurement.12
4 Resonance frequency.12
4.1 Self-resonance frequency.12
4.2 Minimum output method .12
4.2.1 Measurement circuit .12
4.2.2 Mounting the inductor for test .13
4.2.3 Measuring method .13
4.2.4 Note on measurement .14
4.3 Reflection method .14
4.3.1 Measurement circuit .14
4.3.2 Mounting the inductor for test .14
4.3.3 Measurement method .15
4.3.4 Notes on measurement.15
4.4 Measurement by analyser.16
4.4.1 Measurement by impedance analyser.16
4.4.2 Measurement by network analyser.16
5 DC resistance.16
5.1 Measuring circuit (Bridge method) .16
5.2 Measuring method and calculation formula.17
5.3 Precaution for measurement.17
5.4 Measuring temperature.18
Annex A (normative) Mounting method for a surface mounting coil .19
Figure 1 – Example of circuit for vector voltage/current method .7
Figure 2 – Fixture A .8
62024-1 © IEC:2008(E) – 3 –
Figure 3 – Fixture B .8
Figure 4 – Short device shape .10
Figure 5 – Example of test circuit for the minimum output method.12
Figure 6 – Self-resonance frequency test board (minimum output method) .13
Figure 7 – Example of test circuit for the reflection method .14
Figure 8 – Self-resonance frequency test board (reflection method).15
Figure 9 – Suitable test fixture for measuring self-resonance frequency.16
Figure 10 – Example of measuring circuit of d.c. resistance.17
Table 1 – Dimensions of l and d.8
Table 2 – Short device dimensions and inductances .10
– 4 – 62024-1 © IEC:2008(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –
Part 1: Nanohenry range chip inductor
FOREWORD
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