EN 62754:2017
(Main)Computation of waveform Parameter uncertainties
Computation of waveform Parameter uncertainties
IEC 62754:2017 This document specifies methods for the computation of the temporal and amplitude parameters and their associated uncertainty for step-like and impulse-like waveforms. This document is applicable to any and all industries that generate, transmit, detect, receive, measure, and/or analyse these types of pulses.
Berechnung der Messunsicherheiten von Schwingungsabbildparametern
Calcul des incertitudes des paramètres des formes d'onde
L'IEC 62754:2017 Le présent document spécifie les méthodes de calcul des paramètres temporels et d'amplitude des formes d'onde échelonnées et de type impulsion, ainsi que leurs incertitudes associées. Le présent document concerne tous les secteurs industriels qui génèrent, transmettent, détectent, reçoivent, mesurent et/ou analysent ces types d'impulsions.
Izračun negotovosti parametrov valovne oblike (IEC 62754:2017)
IEC 62754:2017: Ta dokument določa metode za izračun časovnih in amplitudnih parametrov ter njihove povezane negotovosti intervalnih ali impulznih valovnih oblik. Ta dokument se uporablja za vse industrije, ki ustvarjajo, prenašajo, zaznavajo, sprejemajo, merijo in/ali analizirajo takšne vrste pulzov.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-december-2017
,]UDþXQQHJRWRYRVWLSDUDPHWURYYDORYQHREOLNH ,(&
Computation of waveform parameter uncertainties (IEC 62754:2017)
Berechnung der Messunsicherheiten von Schwingungsabbildparametern (IEC
62754:2017)
Calcul des incertitudes des paramètres des formes d'onde (IEC 62754:2017)
Ta slovenski standard je istoveten z: EN 62754:2017
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN 62754
NORME EUROPÉENNE
EUROPÄISCHE NORM
September 2017
ICS 17.220.20
English Version
Computation of waveform Parameter uncertainties
(IEC 62754:2017)
Calcul des incertitudes des paramètres des formes d'onde Berechnung der Messunsicherheiten von
(IEC 62754:2017) Schwingungsabbildparametern
(IEC 62754:2017)
This European Standard was approved by CENELEC on 2017-06-28. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62754:2017 E
European foreword
The text of document 85/585/FDIS, future edition 1 of IEC 62754, prepared by IEC/TC 85 "Measuring
equipment for electrical and electromagnetic quantities" was submitted to the IEC-CENELEC parallel
vote and approved by CENELEC as EN 62754:2017.
The following dates are fixed:
(dop) 2018-03-28
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2020-06-28
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62754:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standard indicated :
IEC 60359:2001 NOTE Harmonized as EN 60359:2002.
- EN 62754:2017
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60469 2013 Transitions, pulses and related waveforms EN 60469 2013
- Terms, definitions and algorithms
IEC 62754 ®
Edition 1.0 2017-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Computation of waveform parameter uncertainties
Calcul des incertitudes des paramètres des formes d'onde
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20 ISBN 978-2-8322-4345-9
– 2 – IEC 62754:2017 IEC 2017
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Waveform measurement . 16
4.1 General . 16
4.2 Waveform parameters . 17
4.3 Waveform measurement process . 17
4.3.1 General . 17
4.3.2 General description of the measurement system . 18
5 Waveform and waveform parameter corrections . 19
5.1 General . 19
5.2 Waveform parameter corrections . 19
5.3 Waveform corrections and waveform reconstruction. 20
5.3.1 General . 20
5.3.2 Sample-by-sample correction . 20
5.3.3 Entire waveform correction . 20
6 Uncertainties . 22
6.1 General . 22
6.2 Propagation of uncertainties . 22
6.2.1 General . 22
6.2.2 Uncorrelated input quantities . 23
6.2.3 Correlated input quantities . 23
6.3 Pooled data and its standard deviation. 23
6.4 Expanded uncertainty and coverage factor. 25
6.4.1 General . 25
6.4.2 Effective degrees of freedom . 27
6.5 Entire waveform uncertainties . 28
7 Waveform parameter uncertainties . 29
7.1 General . 29
7.2 Amplitude parameters . 30
7.2.1 State levels. 30
7.2.2 State boundaries . 35
7.2.3 Waveform amplitude (state levels) . 36
7.2.4 Impulse amplitude (state levels) . 37
7.2.5 Percent reference levels (state levels, waveform amplitude) . 37
7.2.6 Transition settling error (state levels, waveform amplitude) . 38
7.2.7 Overshoot aberration (state levels, waveform amplitude) . 38
7.2.8 Undershoot aberration (state levels, waveform amplitude) . 39
7.3 Temporal parameters . 39
7.3.1 Initial instant . 39
7.3.2 Waveform epoch . 40
7.3.3 Reference level instants (percent reference levels, waveform epoch,
initial instant) . 41
7.3.4 Impulse centre instant (impulse amplitude, reference level instants) . 42
7.3.5 Transition duration (reference level instants) . 42
IEC 62754:2017 IEC 2017 – 3 –
7.3.6 Transition settling duration (reference level instants) . 43
7.3.7 Pulse duration (reference level instants) . 43
7.3.8 Pulse separation (reference level instants) . 43
7.3.9 Waveform delay (advance) (reference level instants) . 44
8 Monte Carlo method for waveform parameter uncertainty estimates . 44
8.1 General guidance and considerations . 44
8.2 Example: state level . 44
Annex A (informative) Demonstration example for the calculation of the uncertainty of
state levels using the histogram mode according to 7.2.1.2. 46
A.1 Waveform measurement . 46
A.2 Splitting the bimodal histogram and determining the state levels . 46
A.3 Uncertainty of state levels . 47
Annex B (informative) Computation of Σ andΣ for estimating the uncertainty of
L Y
state levels using the shorth method according to 7.2.1.3 . 49
Bibliography . 52
Figure 1 – Reference levels, reference level instants, waveform amplitude, and
transition duration for a single positive-going transition . 7
Figure 2 – Overshoot, undershoot, state levels, and state boundaries for a single
positive-going transition . 11
Figure 3 – Creation of measured, corrected, and reconstructed waveforms and the
final estimate of the input signal . 17
Figure 4 – Example of waveform bounds focusing on the trajectories that impact pulse
parameter measurements . 28
Figure 5 – Relationship between selected waveform parameters . 30
Figure A.1 – Waveform obtained from the measurement of a step-like signal from
which the state levels and uncertainties are calculated . 46
Figure A.2 – Histograms of state s1 (a) and state s2 (b) of the step-like waveform
plotted in Figure A.1 . 47
(α)
Figure B.1 – Diagram showing location of waveform elements, y , in Y and Y , and
(β) 1 2
the construction of Y from Y and Y . 49
1 2
Table 1 – Value of the coverage factor k that encompasses the fraction p of the t -
p
distribution for different degrees of freedom (from ISO/IEC Guide 98-3) . 26
Table 2 – Different methods for determining state levels, as given in IEC 60469, and
their uncertainty type and method of computation .
...
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