IEC 60444-11:2010

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f_L and the effective load capacitance C_Leff using automatic network analyzer techniques and error correction

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

Mesure des paramètres des résonateurs à quartz - Partie 11: Méthode normalisée pour la détermination de la fréquence de_résonance à la charge f_L et de la capacité de charge efficace C_Leff utilisant des analyseurs automatiques de réseaux et correction des erreurs

La CEI 60444-11:2010 définit la méthode normalisée de mesure de la fréquence de résonance à la charge fL à la valeur nominale de CL et la détermination de la capacité de charge efficace CLeff à la fréquence nominale pour des résonateurs de facteur de mérite M > 4.

General Information

• Status: Published
• Publication Date: 06-Oct-2010
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 11 - TC 49/WG 11
• Current Stage: PPUB - Publication issued
• Start Date: 31-Dec-2010
• Completion Date: 07-Oct-2010

Standards Content (Sample)

IEC 60444-11 ®
Edition 1.0 2010-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement of quartz crystal unit parameters –
Part 11: Standard method for the determination of the load resonance frequency
f and the effective load capacitance C using automatic network analyzer
L Leff
techniques and error correction

Mesure des paramètres des résonateurs à quartz –
Partie 11: Méthode normalisée pour la détermination de la fréquence de
résonance à la charge f et de la capacité de charge efficace C utilisant des
L Leff
analyseurs automatiques de réseaux et correction des erreurs

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IEC 60444-11 ®
Edition 1.0 2010-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement of quartz crystal unit parameters –
Part 11: Standard method for the determination of the load resonance frequency
f and the effective load capacitance C using automatic network analyzer
L Leff
techniques and error correction

Mesure des paramètres des résonateurs à quartz –
Partie 11: Méthode normalisée pour la détermination de la fréquence de
résonance à la charge f et de la capacité de charge efficace C utilisant des
L Leff
analyseurs automatiques de réseaux et correction des erreurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
N
CODE PRIX
ICS 31.140 ISBN 978-2-88912-210-3
– 2 – 60444-11 © IEC:2010
CONTENTS
FOREWORD.3
1 Scope.5
2 Normative references .5
3 General concepts .6
3.1 Load resonance frequencies f and f .6
Lr La
3.2 Effective load capacitance C .6
Leff
4 Reference plane and test conditions.7
4.1 General .7
4.2 Principle of measurement .7
4.3 Evaluation of errors .10
Bibliography.14

Figure 1 – Admittance of a quartz crystal unit .6
Figure 2 – X as a function of frequency (solid line) in the vicinity of f .9
C L
Figure 3 – Level of drive of a crystal in a π-network vs. frequency .9
Figure 4 – Error of the load resonance frequency due to the inaccuracy of the
measured voltages (dashed line) and the calibration resistances (soft line) .11
Figure 5 – C -error resulting from f error (due to inaccuracy of the measured voltages
L L
and the calibration resistances) for the same crystal as in Figure 4.11
Figure 6 – Frequency error due to noise of the measured voltages .12
Figure 7 – Error of load resonance frequency f at 30 pF and 10 pF for typical
L
equivalent parameters of quartz crystal units .12
Figure 8 – Error of C for typical equivalent parameters of quartz crystal units .13
Leff
60444-11 © IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 11: Standard method for the determination of the load resonance
frequency f and the effective load capacitance C using automatic
L Leff
network analyzer techniques and error correction

FOREWORD
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International Standard IEC 60444-11 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
The text of this standard is based on the following documents:
CDV Report on voting
49/852/CDV 49/883/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 4 – 60444-11 © IEC:2010
A list of all parts of the IEC 60444 series under the general title Measurement of quartz crystal
unit parameters can be found on the IEC website.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
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• reconfirmed,
• withdrawn,
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• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
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understanding of its contents. Users should therefore print this document using a
colour printer.
60444-11 © IEC:2010 – 5 –
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 11: Standard method for the determination of the load resonance
frequency f and the effective load capacitance C using automatic
L Leff
network analyzer techniques and error correction

1 Scope
This part of IEC 60444 defines the standard method of measuring load resonance frequency
f at the nominal value of C , and the determination of the effective load capacitance C at
L L Leff
the nominal frequency for crystals with the figure of merit M > 4.
M, according to Table 1 of IEC 60122-1:2002, is expressed in the following equation:
Q 1
M = = (1)
r ωC0R1
This gives good results in a frequency range up to 200 MHz. This method allows the
calculation of load resonance frequency offset Δf , frequency pulling range Δf and pulling
L L1,L2
sensitivity S as described in 2.2.31 of IEC 60122-1:2002. In contrary to the simple method of
IEC 60444-4, this measurement technique avoids the use of physical load capacitors, and
allows higher accuracy, better reproducibility and correlation to the application. It extends the
upper frequency limit from 30MHz by
...